JPH0251158A - Developing device - Google Patents
Developing deviceInfo
- Publication number
- JPH0251158A JPH0251158A JP20125588A JP20125588A JPH0251158A JP H0251158 A JPH0251158 A JP H0251158A JP 20125588 A JP20125588 A JP 20125588A JP 20125588 A JP20125588 A JP 20125588A JP H0251158 A JPH0251158 A JP H0251158A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor substrates
- developer
- semiconductor substrate
- semiconductor
- liquid
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000758 substrate Substances 0.000 claims abstract description 31
- 239000004065 semiconductor Substances 0.000 claims abstract description 30
- 230000007246 mechanism Effects 0.000 claims abstract description 6
- 238000007654 immersion Methods 0.000 claims description 7
- 239000000126 substance Substances 0.000 abstract description 12
- 239000007788 liquid Substances 0.000 abstract description 7
- 238000007598 dipping method Methods 0.000 abstract description 5
- 238000000034 method Methods 0.000 abstract description 5
- 238000003860 storage Methods 0.000 abstract description 5
- 239000000243 solution Substances 0.000 description 11
- 238000004519 manufacturing process Methods 0.000 description 2
- 229920002120 photoresistant polymer Polymers 0.000 description 2
- 238000009826 distribution Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000002347 injection Methods 0.000 description 1
- 239000007924 injection Substances 0.000 description 1
Landscapes
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、半導体製造装置、特にフォトレジストの現像
装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a semiconductor manufacturing apparatus, and particularly to a photoresist developing apparatus.
従来、半導体製造に於けるフォトレジストの現像装置は
半導体基板を回転基体で支持し基板表面にノズルより薬
液が滴下され1枚ごと回転処理する機構となっていた。Conventionally, a photoresist developing apparatus used in semiconductor manufacturing has a mechanism in which a semiconductor substrate is supported by a rotating base, a chemical solution is dropped from a nozzle onto the surface of the substrate, and the substrate is rotated one by one.
上述した従来の構造の現像装置を用いると、半導体基板
の1枚ごとに薬液の滴下が必要となり、薬液の滴下点と
広がりによって薬液がちられた面の処理の不均一さが生
じ、かつ、一定の薬液の広がりを得る為に多量の薬液を
使用する欠点がある。When a developing device with the conventional structure described above is used, it is necessary to drop a chemical solution onto each semiconductor substrate, and the dropping point and spread of the chemical solution cause non-uniformity in the processing of the surface where the chemical solution has been dropped. The disadvantage is that a large amount of chemical solution is used to spread the chemical solution.
この発明の目的は半導体基板の処理を均一に行ないかつ
使用薬品の量を低減することにある。An object of this invention is to process semiconductor substrates uniformly and to reduce the amount of chemicals used.
この発明の特徴は複数の半導体基板を処理する構造で薬
液の広がりを均一に得、かつ、小量の薬品(l/2浸漬
槽)で処理出来るように、薬液を満し、半導体基板が投
入される浸漬槽内底部に、投入された半導体基板を回転
させる回転機構を有していることである。The feature of this invention is that it has a structure that processes multiple semiconductor substrates, and the chemical solution is spread uniformly, and the semiconductor substrates are filled with the chemical solution so that it can be processed with a small amount of chemicals (l/2 immersion tank). The immersion tank has a rotation mechanism at the bottom thereof that rotates the semiconductor substrate placed therein.
〔実施例1〕
次に、本発明について図面を参照して説明する。第1図
、第2図は、この発明の一実施例を説明する為の、現像
装置の縦断図、横断面図である。この実施例の現像装置
は、半導体基板1を半導体基板1を支持、回転させる回
転ローラ4と、回転ローラを駆動する駆動用モーター5
を有している。複数枚の半導体基板1が収納された半導
体基板収納箱2を浸漬槽3に投入すると、投入された半
導体基板1は回転ローラ4に支持され、半導体基板収納
箱2とは遊嵌状態となる。現像処理は、薬液注入ロアよ
り現像液6を半導体基板1の中央部迄注入゛し、さらに
、半導体基板全体が現像液に浸るよう回転ローラ4を定
時間駆動させ半導体基板の回転運動をさせて行う。使用
済みの現像液は排液口8より排出する。この方法により
全面に統一された時間で平均した現像液の分布となりか
つ、全体浸漬の必要がなく最少限の現像液で処理出来る
。[Example 1] Next, the present invention will be described with reference to the drawings. 1 and 2 are a longitudinal sectional view and a transverse sectional view of a developing device for explaining one embodiment of the present invention. The developing device of this embodiment includes a rotating roller 4 that supports and rotates the semiconductor substrate 1, and a drive motor 5 that drives the rotating roller.
have. When the semiconductor substrate storage box 2 containing a plurality of semiconductor substrates 1 is placed in the dipping tank 3, the semiconductor substrates 1 are supported by the rotating rollers 4 and loosely fitted into the semiconductor substrate storage box 2. In the development process, the developer 6 is injected from the chemical injection lower to the center of the semiconductor substrate 1, and the rotating roller 4 is driven for a certain period of time so that the entire semiconductor substrate is immersed in the developer to rotate the semiconductor substrate. conduct. The used developer is discharged from the drain port 8. This method provides an average developer distribution over the entire surface in a uniform time, does not require immersion of the entire surface, and can be processed with a minimum amount of developer.
〔実施例2〕
本発明の第2の実施例を第3図に示す。この実施例は、
前述の実施例の構成に加えて、現像液口渦用フィルター
9と、現像液循環用ポンプ10、給液バルブ11、排液
バルブ12を有し、処理液の再生が出来る利点がある。[Example 2] A second example of the present invention is shown in FIG. This example is
In addition to the configuration of the above-described embodiment, this embodiment has a developing solution inlet vortex filter 9, a developing solution circulation pump 10, a liquid supply valve 11, and a drain valve 12, and has the advantage that the processing liquid can be regenerated.
この機構により現像液の使用量はさらに低減出来る。With this mechanism, the amount of developer used can be further reduced.
〔発明の効果〕
以上説明したように、本発明の現像装置を使用すること
により、半導体基板全面に現像液を均一に分布させるこ
とが出来、滴下ノズル式に比べ、半導体基板面内、基板
間での処理の不均一さをなくすことが出来る。さらに、
過剰浸漬、滴下の必要がなく現像液の使用量低下にもな
る。[Effects of the Invention] As explained above, by using the developing device of the present invention, it is possible to uniformly distribute the developer over the entire surface of the semiconductor substrate, and compared to the drip nozzle type, it is possible to distribute the developer solution within the surface of the semiconductor substrate and between the substrates. It is possible to eliminate unevenness in processing. moreover,
There is no need for excessive immersion or dripping, and the amount of developer used can be reduced.
第1図、第2図は、本発明の一実施例を説明する為の縦
断面、横断面図である。第3図は実施例2の説明の為の
断面図である。
面図に於いて
1・・・半導体基板、2・・・半導体基板収納箱、3・
・・浸漬槽、4・・・回転ローラー、5・・・モーター
、6・・・現像液、7・・・給供口、8・・・排液口、
9・・・フィルタ10・・・ポンプ、11・・・給液バ
ルブ、12・・・排液バルブである。FIGS. 1 and 2 are longitudinal and transverse cross-sectional views for explaining one embodiment of the present invention. FIG. 3 is a sectional view for explaining the second embodiment. In the top view, 1... semiconductor substrate, 2... semiconductor substrate storage box, 3...
... Immersion tank, 4 ... Rotating roller, 5 ... Motor, 6 ... Developer, 7 ... Supply port, 8 ... Drain port,
9...Filter 10...Pump, 11...Liquid supply valve, 12...Drainage valve.
Claims (1)
導体基板を回転処理する回転機構とを有することを特徴
とする現像装置。A developing device comprising: an immersion tank filled with a developer; and a rotation mechanism for rotationally processing a plurality of semiconductor substrates set upright in the immersion tank.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20125588A JPH0251158A (en) | 1988-08-12 | 1988-08-12 | Developing device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP20125588A JPH0251158A (en) | 1988-08-12 | 1988-08-12 | Developing device |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0251158A true JPH0251158A (en) | 1990-02-21 |
Family
ID=16437912
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP20125588A Pending JPH0251158A (en) | 1988-08-12 | 1988-08-12 | Developing device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0251158A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2016181791A1 (en) * | 2015-05-11 | 2016-11-17 | 富士フイルム株式会社 | Image developing device, image developing method, pattern forming device, and pattern forming method |
-
1988
- 1988-08-12 JP JP20125588A patent/JPH0251158A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2016181791A1 (en) * | 2015-05-11 | 2016-11-17 | 富士フイルム株式会社 | Image developing device, image developing method, pattern forming device, and pattern forming method |
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