JPH0251158A - Developing device - Google Patents

Developing device

Info

Publication number
JPH0251158A
JPH0251158A JP20125588A JP20125588A JPH0251158A JP H0251158 A JPH0251158 A JP H0251158A JP 20125588 A JP20125588 A JP 20125588A JP 20125588 A JP20125588 A JP 20125588A JP H0251158 A JPH0251158 A JP H0251158A
Authority
JP
Japan
Prior art keywords
semiconductor substrates
developer
semiconductor substrate
semiconductor
liquid
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP20125588A
Other languages
Japanese (ja)
Inventor
Shuichi Hayashida
林田 秀一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Kyushu Ltd
Original Assignee
NEC Kyushu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Kyushu Ltd filed Critical NEC Kyushu Ltd
Priority to JP20125588A priority Critical patent/JPH0251158A/en
Publication of JPH0251158A publication Critical patent/JPH0251158A/en
Pending legal-status Critical Current

Links

Landscapes

  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)

Abstract

PURPOSE:To uniformly process semiconductor substrates and to reduce the amount of used chemicals by providing rotary mechanisms which rotate the semiconductor substrates stood in a dipping tank. CONSTITUTION:The rotary mechanisms 4 and 5 which rotate the fed semiconductor substrates are provided on the bottom part of the dip ping tank 3 where the semiconductor substrates 1 are put. The semiconductor substrate storage box 2 which contains the semiconductor substrates 1 is put in the dipping tank 3 and then the fed semiconductor substrates 1 are supported by a rotary roller 4 and become loose from the semiconductor substrate storage box 2. When development processing is carried out, the rotary roller 4 is driven for a constant so that the semiconductor substrates are dipped in a liquid developer entirely; and the liquid is discharged from a liquid draining port 8. Consequently, the developer is distributed uniformly over the entire surfaces, the need for entirety dipping is eliminated, and the processing is performed with the minimum amount of liquid developer.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、半導体製造装置、特にフォトレジストの現像
装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a semiconductor manufacturing apparatus, and particularly to a photoresist developing apparatus.

〔従来の技術〕[Conventional technology]

従来、半導体製造に於けるフォトレジストの現像装置は
半導体基板を回転基体で支持し基板表面にノズルより薬
液が滴下され1枚ごと回転処理する機構となっていた。
Conventionally, a photoresist developing apparatus used in semiconductor manufacturing has a mechanism in which a semiconductor substrate is supported by a rotating base, a chemical solution is dropped from a nozzle onto the surface of the substrate, and the substrate is rotated one by one.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来の構造の現像装置を用いると、半導体基板
の1枚ごとに薬液の滴下が必要となり、薬液の滴下点と
広がりによって薬液がちられた面の処理の不均一さが生
じ、かつ、一定の薬液の広がりを得る為に多量の薬液を
使用する欠点がある。
When a developing device with the conventional structure described above is used, it is necessary to drop a chemical solution onto each semiconductor substrate, and the dropping point and spread of the chemical solution cause non-uniformity in the processing of the surface where the chemical solution has been dropped. The disadvantage is that a large amount of chemical solution is used to spread the chemical solution.

この発明の目的は半導体基板の処理を均一に行ないかつ
使用薬品の量を低減することにある。
An object of this invention is to process semiconductor substrates uniformly and to reduce the amount of chemicals used.

〔課題を解決するための手段〕[Means to solve the problem]

この発明の特徴は複数の半導体基板を処理する構造で薬
液の広がりを均一に得、かつ、小量の薬品(l/2浸漬
槽)で処理出来るように、薬液を満し、半導体基板が投
入される浸漬槽内底部に、投入された半導体基板を回転
させる回転機構を有していることである。
The feature of this invention is that it has a structure that processes multiple semiconductor substrates, and the chemical solution is spread uniformly, and the semiconductor substrates are filled with the chemical solution so that it can be processed with a small amount of chemicals (l/2 immersion tank). The immersion tank has a rotation mechanism at the bottom thereof that rotates the semiconductor substrate placed therein.

〔実施例1〕 次に、本発明について図面を参照して説明する。第1図
、第2図は、この発明の一実施例を説明する為の、現像
装置の縦断図、横断面図である。この実施例の現像装置
は、半導体基板1を半導体基板1を支持、回転させる回
転ローラ4と、回転ローラを駆動する駆動用モーター5
を有している。複数枚の半導体基板1が収納された半導
体基板収納箱2を浸漬槽3に投入すると、投入された半
導体基板1は回転ローラ4に支持され、半導体基板収納
箱2とは遊嵌状態となる。現像処理は、薬液注入ロアよ
り現像液6を半導体基板1の中央部迄注入゛し、さらに
、半導体基板全体が現像液に浸るよう回転ローラ4を定
時間駆動させ半導体基板の回転運動をさせて行う。使用
済みの現像液は排液口8より排出する。この方法により
全面に統一された時間で平均した現像液の分布となりか
つ、全体浸漬の必要がなく最少限の現像液で処理出来る
[Example 1] Next, the present invention will be described with reference to the drawings. 1 and 2 are a longitudinal sectional view and a transverse sectional view of a developing device for explaining one embodiment of the present invention. The developing device of this embodiment includes a rotating roller 4 that supports and rotates the semiconductor substrate 1, and a drive motor 5 that drives the rotating roller.
have. When the semiconductor substrate storage box 2 containing a plurality of semiconductor substrates 1 is placed in the dipping tank 3, the semiconductor substrates 1 are supported by the rotating rollers 4 and loosely fitted into the semiconductor substrate storage box 2. In the development process, the developer 6 is injected from the chemical injection lower to the center of the semiconductor substrate 1, and the rotating roller 4 is driven for a certain period of time so that the entire semiconductor substrate is immersed in the developer to rotate the semiconductor substrate. conduct. The used developer is discharged from the drain port 8. This method provides an average developer distribution over the entire surface in a uniform time, does not require immersion of the entire surface, and can be processed with a minimum amount of developer.

〔実施例2〕 本発明の第2の実施例を第3図に示す。この実施例は、
前述の実施例の構成に加えて、現像液口渦用フィルター
9と、現像液循環用ポンプ10、給液バルブ11、排液
バルブ12を有し、処理液の再生が出来る利点がある。
[Example 2] A second example of the present invention is shown in FIG. This example is
In addition to the configuration of the above-described embodiment, this embodiment has a developing solution inlet vortex filter 9, a developing solution circulation pump 10, a liquid supply valve 11, and a drain valve 12, and has the advantage that the processing liquid can be regenerated.

この機構により現像液の使用量はさらに低減出来る。With this mechanism, the amount of developer used can be further reduced.

〔発明の効果〕 以上説明したように、本発明の現像装置を使用すること
により、半導体基板全面に現像液を均一に分布させるこ
とが出来、滴下ノズル式に比べ、半導体基板面内、基板
間での処理の不均一さをなくすことが出来る。さらに、
過剰浸漬、滴下の必要がなく現像液の使用量低下にもな
る。
[Effects of the Invention] As explained above, by using the developing device of the present invention, it is possible to uniformly distribute the developer over the entire surface of the semiconductor substrate, and compared to the drip nozzle type, it is possible to distribute the developer solution within the surface of the semiconductor substrate and between the substrates. It is possible to eliminate unevenness in processing. moreover,
There is no need for excessive immersion or dripping, and the amount of developer used can be reduced.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図、第2図は、本発明の一実施例を説明する為の縦
断面、横断面図である。第3図は実施例2の説明の為の
断面図である。 面図に於いて 1・・・半導体基板、2・・・半導体基板収納箱、3・
・・浸漬槽、4・・・回転ローラー、5・・・モーター
、6・・・現像液、7・・・給供口、8・・・排液口、
9・・・フィルタ10・・・ポンプ、11・・・給液バ
ルブ、12・・・排液バルブである。
FIGS. 1 and 2 are longitudinal and transverse cross-sectional views for explaining one embodiment of the present invention. FIG. 3 is a sectional view for explaining the second embodiment. In the top view, 1... semiconductor substrate, 2... semiconductor substrate storage box, 3...
... Immersion tank, 4 ... Rotating roller, 5 ... Motor, 6 ... Developer, 7 ... Supply port, 8 ... Drain port,
9...Filter 10...Pump, 11...Liquid supply valve, 12...Drainage valve.

Claims (1)

【特許請求の範囲】[Claims] 現像液を満す浸漬槽と、この浸漬槽に立設した複数の半
導体基板を回転処理する回転機構とを有することを特徴
とする現像装置。
A developing device comprising: an immersion tank filled with a developer; and a rotation mechanism for rotationally processing a plurality of semiconductor substrates set upright in the immersion tank.
JP20125588A 1988-08-12 1988-08-12 Developing device Pending JPH0251158A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP20125588A JPH0251158A (en) 1988-08-12 1988-08-12 Developing device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP20125588A JPH0251158A (en) 1988-08-12 1988-08-12 Developing device

Publications (1)

Publication Number Publication Date
JPH0251158A true JPH0251158A (en) 1990-02-21

Family

ID=16437912

Family Applications (1)

Application Number Title Priority Date Filing Date
JP20125588A Pending JPH0251158A (en) 1988-08-12 1988-08-12 Developing device

Country Status (1)

Country Link
JP (1) JPH0251158A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016181791A1 (en) * 2015-05-11 2016-11-17 富士フイルム株式会社 Image developing device, image developing method, pattern forming device, and pattern forming method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2016181791A1 (en) * 2015-05-11 2016-11-17 富士フイルム株式会社 Image developing device, image developing method, pattern forming device, and pattern forming method

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