JPS6347929A - Developing apparatus - Google Patents

Developing apparatus

Info

Publication number
JPS6347929A
JPS6347929A JP19356686A JP19356686A JPS6347929A JP S6347929 A JPS6347929 A JP S6347929A JP 19356686 A JP19356686 A JP 19356686A JP 19356686 A JP19356686 A JP 19356686A JP S6347929 A JPS6347929 A JP S6347929A
Authority
JP
Japan
Prior art keywords
semiconductor substrate
nozzle
dropping
chemicals
developer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19356686A
Other languages
Japanese (ja)
Inventor
Shuichi Hayashida
林田 秀一
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Kyushu Ltd
Original Assignee
NEC Kyushu Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Kyushu Ltd filed Critical NEC Kyushu Ltd
Priority to JP19356686A priority Critical patent/JPS6347929A/en
Publication of JPS6347929A publication Critical patent/JPS6347929A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To enable the uniform treatment of a semiconductor substrate and the reduction of the quantity of chemicals employed, by a construction wherein a dropping nozzle has a plurality of dropping ports and drops chemicals while it moves. CONSTITUTION:In a developing apparatus wherein chemicals are atomized or dropped onto a semiconductor substrate 3 coated with a photoresist and printed in a prescribed pattern, a dropping nozzle 1 is designed to have a plurality of dropping ports and to drop chemicals while it moves. For instance, the semiconductor substrate 3 is supported on a base body 5, the tip of the nozzle 1 is positioned in the central part, the semiconductor substrate 3 is rotated by a spin motor 7, and simultaneously a developer is made to start to drop from a plurality of dropping ports of the nozzle 1. Furthermore a moving stage 8 is reciprocated at a certain speed in the directions of A and B so that the tip of the nozzle 1 is directed toward the peripheral part of the semiconductor substrate 3. By this construction, the developer is distributed uniformly on the whole surface of the semiconductor substrate. Therefore the nonuniformity in treatment can be eliminated, and moreover the quantity of the developer used is reduced since surplus dropping becomes unnecessary.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は、半導体製造装置、特にフォトレジストの現像
装置に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a semiconductor manufacturing apparatus, and particularly to a photoresist developing apparatus.

〔従来の技術〕[Conventional technology]

従来、半導体製造におけるフォトレジストの現像装置は
、単数の滴下口より薬液が滴下されノズルは、固定され
た構造となっていた。
Conventionally, a photoresist developing device used in semiconductor manufacturing has a structure in which a chemical solution is dropped from a single dropping port and the nozzle is fixed.

〔発明が解決しようとする問題点〕[Problem that the invention seeks to solve]

上述した従来の構造の現像装置を用いると、半導体基板
の一定の部分より薬液が滴下される為、均一な広がりが
得られず、多くの薬液を使用していた。さらに、薬液の
滴下点と広がりによって薬液がもられた面の処理の不均
一さが出るという欠点がある。
When a developing device having the conventional structure described above is used, the chemical solution is dropped from a certain portion of the semiconductor substrate, so that a uniform spread cannot be obtained, and a large amount of the chemical solution is used. Furthermore, there is a drawback that the treatment on the surface soaked with the chemical solution may be uneven depending on the dropping point and spread of the chemical solution.

〔問題点を解決するだめの手段〕[Failure to solve the problem]

この発明の目的は半導体基板の処理を均一に行ない、か
つ使用薬品の量と低減することにある。
An object of the present invention is to process semiconductor substrates uniformly and to reduce the amount of chemicals used.

この発明の特徴は、半導体基板面に均一に薬液と滴下す
るノズルを有していることである。
A feature of this invention is that it has a nozzle that drops the chemical solution uniformly onto the surface of the semiconductor substrate.

〔実施例〕〔Example〕

次に1本発明について図面を参照して説明する。 Next, one embodiment of the present invention will be explained with reference to the drawings.

第1図は、この発明の一実施例を説明する為の、現像装
置の断面スである。この実施例の現1象衾遣は、半導体
基板3を真空吸着しスピンモータ7を介して回転運動さ
せる基体5と、所定の現像液を配管2を通して複数個の
滴下口を有するノズル1の先端より半導体基板3へ滴下
する配管系と、ノズル1を支持しノズル1の先端と半導
体基板の中心部上から周辺部上へ一定の速度で平行移動
させる為の移動ステージ8とを有している。即ち半導体
基板3を基体に支持し、ノズル1先端を中心部ニ位置さ
せスピンセータ−7により半導体基板を回転させると同
時に配管2を通して現像液をノズル1の複数個の滴下口
より滴下開始、さらに、移動ステージ8をノズル先端が
半導体基板の周辺部に向かうよう一定速度でA%B方向
へ往復運動をさせる。この方法により半導体基板表面に
は現像液の滴下される部分が多くなる為、全面に統一さ
れた時間で平均した現像液の分布となる。
FIG. 1 is a cross-sectional view of a developing device for explaining one embodiment of the present invention. The present invention of this embodiment includes a base 5 that vacuum-chucks a semiconductor substrate 3 and rotates it via a spin motor 7, and a tip of a nozzle 1 having a plurality of drip openings through which a predetermined developer is passed through a pipe 2. It has a piping system for dropping the liquid onto the semiconductor substrate 3, and a moving stage 8 that supports the nozzle 1 and moves the tip of the nozzle 1 in parallel from the center of the semiconductor substrate to the periphery at a constant speed. . That is, the semiconductor substrate 3 is supported on the base, the tip of the nozzle 1 is positioned at the center, the semiconductor substrate is rotated by the spin sweater 7, and at the same time, the developer is started to be dripped from the plurality of drip ports of the nozzle 1 through the pipe 2, and further, The moving stage 8 is reciprocated in the A%B direction at a constant speed so that the nozzle tip moves toward the periphery of the semiconductor substrate. This method increases the number of parts on the surface of the semiconductor substrate where the developer is dropped, so that the distribution of the developer is averaged over the entire surface over a uniform period of time.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明の現像機を使用することによ
り、滴下時に半導体基板全面に現Ugと均一分布させる
ことが田米、単数滴下口のノズルに比べ、半導体基板面
内での処理の不均一さをなくすことが出来る。さらに、
現像液の分布スピードが一定である為、過剰の滴下とす
る必要がなく現像液の使用液l低下にもなる。
As explained above, by using the developing machine of the present invention, it is possible to uniformly distribute the current Ug over the entire surface of the semiconductor substrate when dropping, compared to a nozzle with a single dropping port, which reduces processing errors within the surface of the semiconductor substrate. Uniformity can be eliminated. moreover,
Since the distribution speed of the developer is constant, there is no need for excessive dropping, and the amount of developer used can be reduced.

上述の実施例においてノズルの滴下口の形状、個数は自
由に選択出来る。
In the embodiments described above, the shape and number of the nozzle drip openings can be freely selected.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は、本発明の一実施例と説明する為の断面図であ
る。第2図、第3図はノズルの形状例を示す断面図であ
る。 同図に於いて、 1・・・・・・ノズル、1′ ・・・・・・滴下口、2
・・・・・・配管、3・・・・・・半導体基板、4・・
・・・・処理カップ、5・・・・・・基体、6・・・・
・・ドレン口、7・・・・・・スピンモーター、8・・
・・・・移動ステージである。
FIG. 1 is a sectional view for explaining one embodiment of the present invention. FIGS. 2 and 3 are cross-sectional views showing examples of the shape of the nozzle. In the same figure, 1...Nozzle, 1'...Dripping port, 2
...Piping, 3...Semiconductor substrate, 4...
...Processing cup, 5...Base, 6...
...Drain port, 7...Spin motor, 8...
...It is a moving stage.

Claims (1)

【特許請求の範囲】[Claims] フォトレジストを塗布し所定のパターンを焼付け処理さ
れた半導体基板に薬液を噴霧又は滴下して現像処理する
現像装置に於いて、滴下ノズルが複数の滴下口を有し移
動しながら薬液を滴下することを特徴とする現像装置。
In a developing device that performs development processing by spraying or dropping a chemical solution onto a semiconductor substrate that has been coated with photoresist and baked with a predetermined pattern, a dripping nozzle has a plurality of drip openings and drops the chemical solution while moving. A developing device characterized by:
JP19356686A 1986-08-18 1986-08-18 Developing apparatus Pending JPS6347929A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19356686A JPS6347929A (en) 1986-08-18 1986-08-18 Developing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19356686A JPS6347929A (en) 1986-08-18 1986-08-18 Developing apparatus

Publications (1)

Publication Number Publication Date
JPS6347929A true JPS6347929A (en) 1988-02-29

Family

ID=16310149

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19356686A Pending JPS6347929A (en) 1986-08-18 1986-08-18 Developing apparatus

Country Status (1)

Country Link
JP (1) JPS6347929A (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03136232A (en) * 1989-08-31 1991-06-11 Dainippon Screen Mfg Co Ltd Substrate surface treating device
US6334902B1 (en) * 1997-09-24 2002-01-01 Interuniversitair Microelektronica Centrum (Imec) Method and apparatus for removing a liquid from a surface
US7867565B2 (en) 2003-06-30 2011-01-11 Imec Method for coating substrates
JP2011203469A (en) * 2010-03-25 2011-10-13 Toppan Printing Co Ltd Developing method and developing device

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03136232A (en) * 1989-08-31 1991-06-11 Dainippon Screen Mfg Co Ltd Substrate surface treating device
JPH0568092B2 (en) * 1989-08-31 1993-09-28 Dainippon Screen Mfg
US6334902B1 (en) * 1997-09-24 2002-01-01 Interuniversitair Microelektronica Centrum (Imec) Method and apparatus for removing a liquid from a surface
US6821349B2 (en) 1997-09-24 2004-11-23 Interuniversitair Microelektronica Centrum (Imec) Method and apparatus for removing a liquid from a surface
US7867565B2 (en) 2003-06-30 2011-01-11 Imec Method for coating substrates
JP2011203469A (en) * 2010-03-25 2011-10-13 Toppan Printing Co Ltd Developing method and developing device

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