JPS6347929A - Developing apparatus - Google Patents
Developing apparatusInfo
- Publication number
- JPS6347929A JPS6347929A JP19356686A JP19356686A JPS6347929A JP S6347929 A JPS6347929 A JP S6347929A JP 19356686 A JP19356686 A JP 19356686A JP 19356686 A JP19356686 A JP 19356686A JP S6347929 A JPS6347929 A JP S6347929A
- Authority
- JP
- Japan
- Prior art keywords
- semiconductor substrate
- nozzle
- dropping
- chemicals
- developer
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000004065 semiconductor Substances 0.000 claims abstract description 22
- 239000000758 substrate Substances 0.000 claims abstract description 20
- 239000000126 substance Substances 0.000 claims abstract description 13
- 229920002120 photoresistant polymer Polymers 0.000 claims abstract description 4
- 238000005507 spraying Methods 0.000 claims 1
- 238000010276 construction Methods 0.000 abstract 2
- 230000002093 peripheral effect Effects 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 239000007788 liquid Substances 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は、半導体製造装置、特にフォトレジストの現像
装置に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a semiconductor manufacturing apparatus, and particularly to a photoresist developing apparatus.
従来、半導体製造におけるフォトレジストの現像装置は
、単数の滴下口より薬液が滴下されノズルは、固定され
た構造となっていた。Conventionally, a photoresist developing device used in semiconductor manufacturing has a structure in which a chemical solution is dropped from a single dropping port and the nozzle is fixed.
上述した従来の構造の現像装置を用いると、半導体基板
の一定の部分より薬液が滴下される為、均一な広がりが
得られず、多くの薬液を使用していた。さらに、薬液の
滴下点と広がりによって薬液がもられた面の処理の不均
一さが出るという欠点がある。When a developing device having the conventional structure described above is used, the chemical solution is dropped from a certain portion of the semiconductor substrate, so that a uniform spread cannot be obtained, and a large amount of the chemical solution is used. Furthermore, there is a drawback that the treatment on the surface soaked with the chemical solution may be uneven depending on the dropping point and spread of the chemical solution.
この発明の目的は半導体基板の処理を均一に行ない、か
つ使用薬品の量と低減することにある。An object of the present invention is to process semiconductor substrates uniformly and to reduce the amount of chemicals used.
この発明の特徴は、半導体基板面に均一に薬液と滴下す
るノズルを有していることである。A feature of this invention is that it has a nozzle that drops the chemical solution uniformly onto the surface of the semiconductor substrate.
次に1本発明について図面を参照して説明する。 Next, one embodiment of the present invention will be explained with reference to the drawings.
第1図は、この発明の一実施例を説明する為の、現像装
置の断面スである。この実施例の現1象衾遣は、半導体
基板3を真空吸着しスピンモータ7を介して回転運動さ
せる基体5と、所定の現像液を配管2を通して複数個の
滴下口を有するノズル1の先端より半導体基板3へ滴下
する配管系と、ノズル1を支持しノズル1の先端と半導
体基板の中心部上から周辺部上へ一定の速度で平行移動
させる為の移動ステージ8とを有している。即ち半導体
基板3を基体に支持し、ノズル1先端を中心部ニ位置さ
せスピンセータ−7により半導体基板を回転させると同
時に配管2を通して現像液をノズル1の複数個の滴下口
より滴下開始、さらに、移動ステージ8をノズル先端が
半導体基板の周辺部に向かうよう一定速度でA%B方向
へ往復運動をさせる。この方法により半導体基板表面に
は現像液の滴下される部分が多くなる為、全面に統一さ
れた時間で平均した現像液の分布となる。FIG. 1 is a cross-sectional view of a developing device for explaining one embodiment of the present invention. The present invention of this embodiment includes a base 5 that vacuum-chucks a semiconductor substrate 3 and rotates it via a spin motor 7, and a tip of a nozzle 1 having a plurality of drip openings through which a predetermined developer is passed through a pipe 2. It has a piping system for dropping the liquid onto the semiconductor substrate 3, and a moving stage 8 that supports the nozzle 1 and moves the tip of the nozzle 1 in parallel from the center of the semiconductor substrate to the periphery at a constant speed. . That is, the semiconductor substrate 3 is supported on the base, the tip of the nozzle 1 is positioned at the center, the semiconductor substrate is rotated by the spin sweater 7, and at the same time, the developer is started to be dripped from the plurality of drip ports of the nozzle 1 through the pipe 2, and further, The moving stage 8 is reciprocated in the A%B direction at a constant speed so that the nozzle tip moves toward the periphery of the semiconductor substrate. This method increases the number of parts on the surface of the semiconductor substrate where the developer is dropped, so that the distribution of the developer is averaged over the entire surface over a uniform period of time.
以上説明したように本発明の現像機を使用することによ
り、滴下時に半導体基板全面に現Ugと均一分布させる
ことが田米、単数滴下口のノズルに比べ、半導体基板面
内での処理の不均一さをなくすことが出来る。さらに、
現像液の分布スピードが一定である為、過剰の滴下とす
る必要がなく現像液の使用液l低下にもなる。As explained above, by using the developing machine of the present invention, it is possible to uniformly distribute the current Ug over the entire surface of the semiconductor substrate when dropping, compared to a nozzle with a single dropping port, which reduces processing errors within the surface of the semiconductor substrate. Uniformity can be eliminated. moreover,
Since the distribution speed of the developer is constant, there is no need for excessive dropping, and the amount of developer used can be reduced.
上述の実施例においてノズルの滴下口の形状、個数は自
由に選択出来る。In the embodiments described above, the shape and number of the nozzle drip openings can be freely selected.
第1図は、本発明の一実施例と説明する為の断面図であ
る。第2図、第3図はノズルの形状例を示す断面図であ
る。
同図に於いて、
1・・・・・・ノズル、1′ ・・・・・・滴下口、2
・・・・・・配管、3・・・・・・半導体基板、4・・
・・・・処理カップ、5・・・・・・基体、6・・・・
・・ドレン口、7・・・・・・スピンモーター、8・・
・・・・移動ステージである。FIG. 1 is a sectional view for explaining one embodiment of the present invention. FIGS. 2 and 3 are cross-sectional views showing examples of the shape of the nozzle. In the same figure, 1...Nozzle, 1'...Dripping port, 2
...Piping, 3...Semiconductor substrate, 4...
...Processing cup, 5...Base, 6...
...Drain port, 7...Spin motor, 8...
...It is a moving stage.
Claims (1)
れた半導体基板に薬液を噴霧又は滴下して現像処理する
現像装置に於いて、滴下ノズルが複数の滴下口を有し移
動しながら薬液を滴下することを特徴とする現像装置。In a developing device that performs development processing by spraying or dropping a chemical solution onto a semiconductor substrate that has been coated with photoresist and baked with a predetermined pattern, a dripping nozzle has a plurality of drip openings and drops the chemical solution while moving. A developing device characterized by:
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19356686A JPS6347929A (en) | 1986-08-18 | 1986-08-18 | Developing apparatus |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19356686A JPS6347929A (en) | 1986-08-18 | 1986-08-18 | Developing apparatus |
Publications (1)
Publication Number | Publication Date |
---|---|
JPS6347929A true JPS6347929A (en) | 1988-02-29 |
Family
ID=16310149
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19356686A Pending JPS6347929A (en) | 1986-08-18 | 1986-08-18 | Developing apparatus |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6347929A (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03136232A (en) * | 1989-08-31 | 1991-06-11 | Dainippon Screen Mfg Co Ltd | Substrate surface treating device |
US6334902B1 (en) * | 1997-09-24 | 2002-01-01 | Interuniversitair Microelektronica Centrum (Imec) | Method and apparatus for removing a liquid from a surface |
US7867565B2 (en) | 2003-06-30 | 2011-01-11 | Imec | Method for coating substrates |
JP2011203469A (en) * | 2010-03-25 | 2011-10-13 | Toppan Printing Co Ltd | Developing method and developing device |
-
1986
- 1986-08-18 JP JP19356686A patent/JPS6347929A/en active Pending
Cited By (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH03136232A (en) * | 1989-08-31 | 1991-06-11 | Dainippon Screen Mfg Co Ltd | Substrate surface treating device |
JPH0568092B2 (en) * | 1989-08-31 | 1993-09-28 | Dainippon Screen Mfg | |
US6334902B1 (en) * | 1997-09-24 | 2002-01-01 | Interuniversitair Microelektronica Centrum (Imec) | Method and apparatus for removing a liquid from a surface |
US6821349B2 (en) | 1997-09-24 | 2004-11-23 | Interuniversitair Microelektronica Centrum (Imec) | Method and apparatus for removing a liquid from a surface |
US7867565B2 (en) | 2003-06-30 | 2011-01-11 | Imec | Method for coating substrates |
JP2011203469A (en) * | 2010-03-25 | 2011-10-13 | Toppan Printing Co Ltd | Developing method and developing device |
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