JPH0247491Y2 - - Google Patents

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Publication number
JPH0247491Y2
JPH0247491Y2 JP5753482U JP5753482U JPH0247491Y2 JP H0247491 Y2 JPH0247491 Y2 JP H0247491Y2 JP 5753482 U JP5753482 U JP 5753482U JP 5753482 U JP5753482 U JP 5753482U JP H0247491 Y2 JPH0247491 Y2 JP H0247491Y2
Authority
JP
Japan
Prior art keywords
rod
inspected
actuator
measurement area
defect
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP5753482U
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Japanese (ja)
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JPS58160342U (en
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Priority to JP5753482U priority Critical patent/JPS58160342U/en
Publication of JPS58160342U publication Critical patent/JPS58160342U/en
Application granted granted Critical
Publication of JPH0247491Y2 publication Critical patent/JPH0247491Y2/ja
Granted legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Closed-Circuit Television Systems (AREA)

Description

【考案の詳細な説明】 本考案は、ロツド等の表面の打痕、スリ傷等の
欠陥を簡単且つ確実に検出しうる表面欠陥検査装
置を提供することを目的とする。
[Detailed Description of the Invention] An object of the present invention is to provide a surface defect inspection device that can easily and reliably detect defects such as dents and scratches on the surface of rods and the like.

従来、ロツド等の表面の欠陥を検出するには、
ロツドの表面を布等でぬぐつて表面の塵埃を完全
に除去した状態として、光源により表面を照明し
その反射光を検査者が目視する。ロツド表面に欠
陥が無い場合は反射光は一様に暗く見え、又欠陥
があるとその面積及び深さが大であるほど光が乱
反射して局部的に明るく輝いて見え欠陥を判別し
うる。
Conventionally, to detect surface defects such as rods,
After wiping the surface of the rod with a cloth or the like to completely remove dust from the surface, the surface is illuminated with a light source and the reflected light is visually observed by the inspector. If there are no defects on the rod surface, the reflected light looks uniformly dark, and if there is a defect, the larger the area and depth, the more diffusely the light is reflected and locally shines brightly, making it possible to identify the defect.

しかるに、上記従来の方法によれば、反射光度
の大小を単に検査者のカンにより判断するため、
熟練を要するし、検査者にとつて検査結果が異な
ることもあり、検査結果が不安定であるという欠
点があり、又ロツド表面の塵埃は完全に除去する
のは実際上困難であり、表面に塵埃が残つている
と、光が塵埃により乱反射して欠陥と誤認するお
それがあるという欠点があつた。(この欠点につ
いては再び表面を布でぬぐつてみたり、反射光の
角度を変化させてみたりすることによつてある程
度誤認を防止しうるが、やはり経験とカンを要し
検査結果が不安定である) 本考案は、被検査部材の測定領域内の二種の明
るさの格子数の比率を、反射光条件の異なる二態
様において夫々求め、2個の比率が共に一定値よ
り大なるとき欠陥があると判定することにより、
検査の不安定を無くし上記従来の欠点を除去した
表面欠陥検査装置を提供することを目的としたも
のであり、その構成は、被検査部材の表面を照明
する照明手段と、該表面よりの反射光を入射され
該表面を撮像する撮像手段と、該表面の測定領域
を画成してなる複数の区画を少なくとも二種の明
るさ別に比較識別する比較手段と、該二種の明る
さの区画個数を夫々求めその比率を演算する演算
手段と同一の該測定領域より該撮像手段への反射
光の条件が異なる二態様において夫々上記演算手
段により演算された二個の比率が共に一定値より
大なるとき該被検査部材の表面に欠陥があると判
定する判定手段とよりなるものである。
However, according to the above-mentioned conventional method, the magnitude of the reflected light intensity is determined simply by the inspector's intuition.
It requires skill, the test results may vary depending on the inspector, and the test results are unstable.Also, it is practically difficult to completely remove dust from the rod surface, and it is difficult to remove dust from the surface. If dust remains, there is a drawback that light may be diffusely reflected by the dust and may be mistaken for a defect. (This defect can be prevented to some extent by wiping the surface with a cloth or changing the angle of the reflected light, but it still requires experience and skill, and the test results are unstable.) This invention calculates the ratio of the number of gratings of two types of brightness in the measurement area of the inspected member under two different reflected light conditions, and when both ratios are larger than a certain value, By determining that there is a defect,
The purpose of the present invention is to provide a surface defect inspection device that eliminates the instability of inspection and eliminates the above-mentioned conventional drawbacks, and its configuration includes an illumination means for illuminating the surface of a member to be inspected, and an illumination means for illuminating the surface of the inspected member. an imaging means for capturing an image of the surface upon incident light; a comparison means for comparing and identifying a plurality of divisions defining a measurement area of the surface according to at least two types of brightness; and divisions of the two types of brightness. The two ratios calculated by the calculation means are both larger than a certain value in two cases in which the conditions of the reflected light from the same measurement area to the imaging means are different from the calculation means that calculates the number of objects and calculates the ratio. and determining means for determining that there is a defect on the surface of the inspected member when the inspection target member has a defect.

次にその各実施例につき説明する。 Next, each example will be explained.

第1図及び第2図は夫々本考案になる表面欠陥
検査装置の1実施例の側面図及び平面図である。
図中、表面欠陥検査装置1は、床面にアクチユエ
ータ2を有し、該アクチユエータ2の矢印A,B
方向スライド自在の支柱2a上端に固定したロツ
ド受け3上面凹部に後述の如く被検査部材として
のロツド4が載置される。ロツド4は第3図の如
く丸棒状被検査部4aの両端に夫々軸部4bを有
する。
1 and 2 are a side view and a plan view, respectively, of an embodiment of the surface defect inspection apparatus according to the present invention.
In the figure, the surface defect inspection device 1 has an actuator 2 on the floor, and the actuator 2 has arrows A and B.
As will be described later, a rod 4 as a member to be inspected is placed in a concave portion on the upper surface of a rod receiver 3 fixed to the upper end of a column 2a which is slidable in any direction. As shown in FIG. 3, the rod 4 has a shaft portion 4b at each end of a round bar-shaped portion to be inspected 4a.

5,6,7,8は同じく床面の四隅に配したア
クチユエータで、夫々矢印A,B方向スライド自
在の支柱5a,6a,7a,8aを有する。
Actuators 5, 6, 7, and 8 are similarly arranged at the four corners of the floor surface, and have pillars 5a, 6a, 7a, and 8a that are slidable in the directions of arrows A and B, respectively.

9,10は1対の下レールで、下レール9は支
柱5a,7a上端に連結され、又下レール10は
支柱6a,8a上端に連結され、両レール9,1
0は平行となる。
9 and 10 are a pair of lower rails, the lower rail 9 is connected to the upper ends of the columns 5a and 7a, the lower rail 10 is connected to the upper ends of the columns 6a and 8a, and both rails 9 and 1 are connected to the upper ends of the columns 5a and 7a.
0 is parallel.

11,12,13,14は夫々所定高さ位置に
配したアクチユエータであり、アクチユエータ1
3は矢印C,D方向スライド自在の支柱13aを
有し、且つアクチユエータ14はその矢印E,F
方向スライド自在の支柱14aがアクチユエータ
13に固着されている。
11, 12, 13, and 14 are actuators arranged at predetermined height positions, respectively.
3 has a column 13a that is slidable in the directions of arrows C and D, and the actuator 14 is slidable in the directions of arrows E and F.
A column 14a that is slidable in any direction is fixed to the actuator 13.

15,16は1対の上レールで、上レール15
はアクチユエータ11に取付けられ、又上レール
16は同様にアクチユエータ12に取付けられ、
夫々矢印C,D方向スライド自在とされる。尚、
上レール15,16(夫々右端上部にカム部15
a,16aを有する)は夫々下レール9,10上
方に離間対向し且つ互いに平行に配される。
15 and 16 are a pair of upper rails, the upper rail 15
is attached to the actuator 11, and the upper rail 16 is similarly attached to the actuator 12,
They can be slid in the directions of arrows C and D, respectively. still,
Upper rails 15, 16 (cam part 15 at the upper right end of each
a, 16a) are spaced apart from each other above the lower rails 9, 10, and are arranged parallel to each other.

21はITVカメラ、22は該カメラ21の両
側に一体的に配した1対の照明装置であり、(第
3図にその態様を示す)支柱13a先端に固着さ
れ、矢印C,D方向スライド自在である。
21 is an ITV camera, and 22 is a pair of illumination devices integrally arranged on both sides of the camera 21, which are fixed to the tip of the support column 13a (the mode is shown in FIG. 3) and can be slid in the directions of arrows C and D. It is.

23はリミツトスイツチで、直立ロツド24に
固着され、後述する如く、上レール15のカム部
15aにより切換えられる。
A limit switch 23 is fixed to the upright rod 24 and is switched by a cam portion 15a of the upper rail 15, as will be described later.

25,26,27は夫々ベルトコンベヤであ
る。コンベヤ25は検査前のロツド搬送用であ
り、コンピユータ24により間欠的に走行するよ
う制御される。コンベヤ26,27は夫々検査後
の良品及び不良品ロツド搬送用であり、常時矢印
方向に走行している。
25, 26, and 27 are belt conveyors, respectively. The conveyor 25 is for transporting rods before inspection, and is controlled by the computer 24 to run intermittently. Conveyors 26 and 27 are for conveying good and defective rods after inspection, respectively, and always travel in the direction of the arrow.

28はコンピユータで、アクチユエータ5〜
8、11〜14の駆動、リミツトスイツチ23の
入力信号処理、ロツド4の欠陥判定処理を行な
う。
28 is a computer, actuator 5~
8, 11 to 14, input signal processing for the limit switch 23, and defect determination processing for the rod 4.

次に、上記表面欠陥検査装置1の動作に付き説
明する。予め、第1図中、アクチユエータ11,
12の動作により上レール15,16は図示の位
置より矢印C方向へ所定寸法引込みスライドした
位置にあり、又アクチユエータ5,6及び7,8
の各動作により支柱5a〜8aが完全に上方へ伸
び切らない状態で下レール9,10は第1図中右
方部の方が左方部より上方へ持上つて傾いた状態
にあり、又アクチユエータ2の動作により支柱2
aが矢印A方向へ略伸び切りロツド受け3は上動
限にある。
Next, the operation of the surface defect inspection apparatus 1 will be explained. In advance, in FIG. 1, the actuator 11,
12, the upper rails 15 and 16 are in a position where they have been retracted and slid by a predetermined distance in the direction of arrow C from the position shown in the figure, and the actuators 5, 6 and 7, 8
As a result of the respective operations, the lower rails 9 and 10 are in a state where the right side in FIG. The pillar 2 is moved by the operation of the actuator 2.
a is substantially fully extended in the direction of arrow A, and the rod receiver 3 is at its upper limit of movement.

ここで、ベルトコンベヤ25により、ロツド4
が搬送されて落下し、両端軸部4bが夫々下レー
ル9,10に当接載置される。下レール9,10
は上記の如く傾いているのでロツド4は第1図、
第2図中左方へころがつて移動しロツド受け3の
上面凹部に収まり静止する。
Here, the belt conveyor 25 moves the rod 4
is transported and dropped, and both end shaft portions 4b are placed in contact with the lower rails 9 and 10, respectively. Lower rail 9, 10
Since it is tilted as shown above, rod 4 is shown in Figure 1.
It rolls to the left in FIG. 2, fits into the recess on the upper surface of the rod receiver 3, and comes to rest.

次に、アクチユエータ11,12動作し、上レ
ール15,16が矢印D方向へ突出スライドし
て、第1図、第2図の位置へ至り、カム部15a
がリミツトスイツチ23に当接して動作させる。
これによりアクチユエータ11,12の動作が停
止され上レール15,16のスライドも停止し、
このときITVカメラ21はロツド受け3のロツ
ド4中心の直上方に対応位置する。続いてアクチ
ユエータ5〜8が動作して支柱5a〜8aが矢印
A方向へ上動スライドして下レール9,10を
夫々水平状態にしつつ上方へ持上げ、下レール9
及び上レール15間、下レール10及び上レール
16間に夫々ロツド4の両端軸部4bを圧接挟持
する。その後アクチユエータ2が動作してロツド
受け3が下動しロツド4の回転に支障のない位置
に離間する。
Next, the actuators 11 and 12 operate, and the upper rails 15 and 16 protrude and slide in the direction of arrow D, reaching the positions shown in FIGS. 1 and 2, and the cam portion 15a
contacts the limit switch 23 and operates it.
As a result, the operation of the actuators 11 and 12 is stopped, and the sliding of the upper rails 15 and 16 is also stopped.
At this time, the ITV camera 21 is located directly above the center of the rod 4 of the rod receiver 3. Subsequently, the actuators 5 to 8 operate, and the columns 5a to 8a slide upward in the direction of arrow A, raising the lower rails 9 and 10 upward while keeping them in a horizontal state, and lowering the lower rail 9.
Both end shaft portions 4b of the rod 4 are pressed and held between the upper rail 15 and between the lower rail 10 and the upper rail 16, respectively. Thereafter, the actuator 2 operates and the rod receiver 3 is moved downward and separated to a position where rotation of the rod 4 is not hindered.

次に、アクチユエータ11,12が動作して上
レール15,16が同期的に矢印C方向へ寸法x
分(xはカム部15aがリミツトスイツチ23を
動作させるに必要な寸法)矢印C方向へスライド
し、この間ロツド4が第1図中反時計方向へ回動
して上レール15,16とのころがり摩擦により
ロツド4中心が同方向へ寸法x/2分移動する。
(一般に回転体を平行な二面により圧接挟持した
状態で、一面をその面延在方向にスライドさせて
回転体をころがり摩擦的に移動させるとき、該一
面が寸法xスライドすると回転体中心の移動距離
はx/2である) この状態より、ロツド4表面の欠陥検査を開始
するわけであるが、ロツド4の被検査部4a表面
に、第3図、第4図、第5図Aの如く、ITVカ
メラ21による観測領域29(ロツド4軸方向巾
寸法lを有する)の中に特に測定領域301(同じ
く巾寸法mを有する)が設定されているとする。
この測定領域301は、例えば縦、横各8等分し
て64個の格子に画成されている。従つて測定領域
301が照明装置22により照明され、ITVカメ
ラ21がこの測定領域301を撮像し、その画像
信号を第3図の如く画像メモリ31に送る。
Next, the actuators 11 and 12 operate to move the upper rails 15 and 16 synchronously in the direction of arrow C by the dimension x.
minute (x is the dimension required for the cam portion 15a to operate the limit switch 23).During this period, the rod 4 rotates counterclockwise in FIG. 1, causing rolling friction with the upper rails 15 and 16. The center of rod 4 moves in the same direction by a distance of x/2.
(Generally, when a rotating body is held between two parallel surfaces under pressure and the rotating body is moved by rolling and friction by sliding one side in the direction in which the surfaces extend, the center of the rotating body will move when the one surface slides by a dimension x (The distance is x/2) From this state, the defect inspection on the surface of the rod 4 is started. , it is assumed that a measurement area 30 1 (also having a width m) is particularly set in the observation area 29 (having a width l in the four-axis direction of the rod) by the ITV camera 21.
This measurement area 30 1 is divided into 64 grids, for example, by dividing it vertically and horizontally into 8 equal parts. Therefore, the measurement area 30 1 is illuminated by the illumination device 22, the ITV camera 21 images the measurement area 30 1 , and sends the image signal to the image memory 31 as shown in FIG.

画像メモリ31では、上記64個の格子の明るさ
を個別に比較し、これを例えば最明部、明部、暗
部、最暗部の四段階のグループに識別してデイジ
タル信号として第3図の如くデータ処理判定装置
32に送る。データ処理判定装置32では各グル
ープのうち特に最明部数と明部数とを夫々計数し
その比α(=最明部数/明部数)を演算する。(尚
最明部が多いほど打痕、スリ傷等の欠陥及び塵埃
等の存在程度が高いことを意味し、αの値は大と
なる) 次に、アクチユエータ11,12が再び動作し
て上レール15,16が寸法y矢印C方向へスラ
イドし、ロツド4が同方向へころがりつつ寸法
y/2移動し、この間ITVカメラ21もアクチユ
エータ13の動作により同方向へ寸法y/2移動
して第5図Aの状態より第5図Bの状態となる。
このとき第4図の如くITVカメラ21の観測領
域29中測定領域301は二点鎖線で示す位置に
移動しており、測定領域301からITVカメラ2
1へ入射する反射光の条件が先程とは異なつてい
る。ここで再び測定領域301の上記64個の格子
の四段階のグループのうち最明部数、明部数が
夫々計数されその比βが演算される。ここで、
α,βの値が共に一定値より大なるとき後述する
如くコンビユータ28で測定領域301に欠陥が
あると判定される。尚α,βの二つの値を取る理
由としては、例えばαが一定値より大であるのみ
であると、欠陥でなく塵埃(ノイズ:この場合の
ノイズとは人間が認識しえない小さな傷である)
が各格子にまたがつて存在するのみかもしれない
が、ロツド4を一定角度回動させて反射条件を異
ならせると塵埃の場合は乱反射が弱まりβが一定
値より小となるからであり、これにより塵埃の存
在を無視して打痕、スリ傷等の欠陥の存在のみを
選択的に判定することが可能となる。
The image memory 31 compares the brightness of the 64 grids individually, classifies them into groups of four levels, for example, the brightest part, the brightest part, the darkest part, and the darkest part, and outputs them as digital signals as shown in FIG. The data is sent to the data processing determination device 32. The data processing/judgment device 32 specifically counts the number of brightest parts and the number of bright parts of each group, respectively, and calculates the ratio α (=number of brightest parts/number of bright parts). (The more brightest parts there are, the higher the presence of defects such as dents and scratches, and the higher the degree of dust, so the value of α is larger.) Next, the actuators 11 and 12 operate again and the upper The rails 15 and 16 slide in the direction of the arrow C, and the rod 4 rolls in the same direction and moves by y/ 2 . During this time, the ITV camera 21 also moves in the same direction by y/ 2 due to the operation of the actuator 13. The state shown in FIG. 5A changes to the state shown in FIG. 5B.
At this time, as shown in FIG. 4, the measurement area 30 1 in the observation area 29 of the ITV camera 21 has moved to the position indicated by the two-dot chain line, and from the measurement area 30 1 to the ITV camera 2
The conditions for the reflected light incident on 1 are different from the previous one. Here again, the number of brightest parts and the number of bright parts among the four-stage groups of the 64 gratings in the measurement area 30 1 are counted, respectively, and the ratio β is calculated. here,
When the values of α and β are both larger than a certain value, the computer 28 determines that there is a defect in the measurement area 30 1 as will be described later. The reason for taking two values α and β is that, for example, if α is only larger than a certain value, it is not a defect but dust (noise: in this case, noise is a small scratch that humans cannot recognize). be)
may only exist across each grid, but if the rod 4 is rotated by a certain angle to change the reflection conditions, the diffuse reflection will weaken in the case of dust and β will become smaller than a certain value. This makes it possible to selectively determine only the presence of defects such as dents and scratches while ignoring the presence of dust.

ここで、第5図B中、ITVカメラ21は同時
に正面の測定領域302も撮像してそのα値が求
められ、続いてロツド4が回動されて上記の場合
と同様にして該領域302のβ値が求められ、以
下同様にして逐次ロツド4が回動されつつ各測定
領域303,304,……,のα,βの値が求めら
れ欠陥の有無が判定される。
Here, in FIG. 5B, the ITV camera 21 simultaneously images the front measurement area 30 2 and its α value is determined, and then the rod 4 is rotated and the measurement area 30 2 is imaged in the same manner as in the above case. The β value of 2 is determined, and the values of α and β of each measurement area 30 3 , 30 4 , .

第6図に上記各測定領域301,302,303
……における最明部数(A1,A2)、明部数(B1
B2)を測定した結果を示す。
FIG. 6 shows the measurement areas 30 1 , 30 2 , 30 3 ,
The number of brightest parts (A 1 , A 2 ) and the number of bright parts (B 1 ,
The results of measuring B 2 ) are shown.

次に、上記の如くロツド4の巾寸法mの1周分
の測定が完了すると、アクチユエータ14が動作
して支柱14aが矢印E方向へ引込みスライドす
る。これによりITVカメラ21が同方向、即ち
ロツド4軸方向へ寸法m分スライドし、上記測定
完了した1周分の測定領域に隣接した巾寸法mの
領域に対応する。
Next, when the measurement of the width m of the rod 4 for one rotation is completed as described above, the actuator 14 is operated and the support column 14a is retracted and slid in the direction of the arrow E. As a result, the ITV camera 21 slides in the same direction, that is, in the direction of the four axes of the rod, by a distance m, and corresponds to an area having a width m adjacent to the measurement area for one revolution completed above.

次に、アクチユエータ11,12が動作して、
今度は上レール15,16が矢印D方向へ逐次突
出スライドして、ロツド4が第1図中時計方向へ
逐次回動し、ITVカメラ21もアクチユエータ
13の動作によりロツド4に追随して矢印D方向
へ移動しつつ、上記隣接した測定領域の測定を完
了する。
Next, the actuators 11 and 12 operate,
This time, the upper rails 15 and 16 successively protrude and slide in the direction of arrow D, and the rod 4 sequentially moves clockwise in FIG. While moving in the direction, the measurement of the adjacent measurement area is completed.

続いて、同様にしてロツド4及びITVカメラ
21が矢印C,D方向へ繰返し往復移動しつつカ
メラ21が順次ロツド4軸方向へ繰返し移動して
ロツド4の被検査部材4aの全周の測定を完了す
る。尚上記矢印C,D方向往復移動回数、及びロ
ツド4軸方向移動回数はロツド4の外径、長さに
応じてコンピユータ28に予めインプツトされて
おり、該コンピユータ28により制御される。
Subsequently, in the same manner, the rod 4 and the ITV camera 21 repeatedly move back and forth in the directions of arrows C and D, and the camera 21 sequentially moves repeatedly in the four axis directions of the rod to measure the entire circumference of the member to be inspected 4a of the rod 4. Complete. The number of reciprocating movements in the directions of arrows C and D and the number of movements of the rod in the four-axis directions are input in advance into the computer 28 according to the outer diameter and length of the rod 4, and are controlled by the computer 28.

ロツド4の全表面の測定が終了すると、コンピ
ユータ28は欠陥の有無を判定する。そして欠陥
が無い場合には、アクチユエータ7,8が動作し
て支柱7a,8aが下動して下レール9,10は
第1図中左方部が下がつて傾く。従つてロツド4
は自重により回転して良品搬送用ベルトコンベヤ
26に載置され良品グループに選別される。
When the measurement of the entire surface of the rod 4 is completed, the computer 28 determines the presence or absence of defects. If there is no defect, the actuators 7 and 8 operate to move the columns 7a and 8a downward, and the lower rails 9 and 10 are tilted so that the left side in FIG. 1 is lowered. Therefore, Rod 4
are rotated by their own weight and placed on the belt conveyor 26 for transporting non-defective products, where they are sorted into non-defective groups.

又欠陥が有つた場合には、アクチユエータ5,
6が動作して支柱5a,6aが下動して下レール
9,10は第1図中右方部が下がつて傾く。従つ
てロツド4は自重により回転して不良品搬送用ベ
ルトコンベヤ27に載置され不良品グループに選
別される。
In addition, if there is a defect, the actuator 5,
6 is operated, the columns 5a and 6a move downward, and the right side portions of the lower rails 9 and 10 in FIG. 1 are tilted downward. Therefore, the rods 4 are rotated by their own weight and placed on the belt conveyor 27 for transporting defective products, where they are sorted into groups of defective products.

上記の動作が終ると、全てのアクチユエータ5
〜8,11〜14は初期状態に動作復帰し、ベル
トコンベヤ25が次のロツド4を供給するのに必
要な距離のみ走行し、新しい未検査のロツド4が
上記の場合と同様にしてロツド受け3に供給さ
れ、同様にして欠陥検査がなされる。
After the above operation is completed, all actuators 5
8, 11 to 14 return to their initial state, the belt conveyor 25 travels only the distance necessary to supply the next rod 4, and the new uninspected rod 4 is received in the same way as in the above case. 3, and defect inspection is performed in the same manner.

上記ロツド4の欠陥検査方法によれば、測定領
域内の二種の明るさ(最明部、明部)の格子数の
比率を、反射光条件の異なる二態様において
ITVカメラ21及び付属回路により夫々求めて
α,βとし、α,βが共に一定値より大なるとき
欠陥があるとコンピユータ28により判定してい
るため、全てを人力によらずデイジタル的に且つ
自動的に判定、検査しえ、検査結果がきわめて良
好且つ安定している。又反射光条件の異なる二態
様で測定しているため、塵埃を欠陥と誤認するお
それがなく一層検査精度を向上しうる。
According to the defect inspection method of Rod 4 above, the ratio of the number of gratings of two types of brightness (brightest part, bright part) in the measurement area is determined in two ways with different reflected light conditions.
α and β are determined by the ITV camera 21 and attached circuit, and when both α and β are larger than a certain value, the computer 28 determines that there is a defect, so everything is done digitally and automatically without manual effort. It can be determined and inspected visually, and the inspection results are extremely good and stable. Furthermore, since the measurement is carried out under two different reflected light conditions, there is no risk of misidentifying dust as a defect, and the inspection accuracy can be further improved.

又、上記装置1によれば、ロツド4の両軸部4
bを夫々上下レール15,9;16,10により
挟持して回転させて欠陥検査を行なつているた
め、従来被検査部4aを持ち換えチヤツクしてい
たものに比して、被検査部4a全面を容易に検査
しうると共に被検査部4aにチヤツキング時の傷
を生ずるおそれもない。
Further, according to the device 1, both shaft portions 4 of the rod 4
Since the defect inspection is carried out by holding and rotating the parts b between the upper and lower rails 15, 9; 16, 10, respectively, the parts to be tested 4a The entire surface can be easily inspected, and there is no risk of scratches occurring on the inspected portion 4a during chucking.

又ITVカメラ21を上レール15,16のス
ライド速度の半分の速度で移動させることにより
容易にカメラ21を常時ロツド4の中心軸線に対
応させた状態で良好な検査を行ないうる。
Furthermore, by moving the ITV camera 21 at half the sliding speed of the upper rails 15 and 16, a good inspection can be easily performed with the camera 21 always aligned with the central axis of the rod 4.

又ロツド4の検査終了後、下レール9,10を
何れかの方向に択一的に傾けることのみにより、
ロツド4の良品、不良品のグループ分けを行ない
え便利である。
Also, after the inspection of the rod 4 is completed, by simply tilting the lower rails 9 and 10 in either direction,
It is convenient to group 4 rods into good and defective products.

第7図及び第8図は夫々上記表面欠陥検査装置
の他の実施例の全体平面図及びその要部の一部切
截側面図である。第7図中、表面欠陥検査装置4
1は、無端走行するベルトコンベヤ42外側面の
等ピツチ位置に設けたロツド収納袋43にロツド
44をロツド供給部45より順次供給されて矢印
の方向へ走行し、検査ユニツト46において欠陥
を検査された後、ロツド収容部47へ収納され
る。尚ロツド44は例えばシヨツクアブソーバ用
のものであり、第8図中丸棒状被検査部44aの
上部にネジ部44bを有し、上下端に夫々心出し
用円錐凸部44cを有する。
FIG. 7 and FIG. 8 are an overall plan view and a partially cutaway side view of the main parts of another embodiment of the above-mentioned surface defect inspection apparatus, respectively. In Fig. 7, surface defect inspection device 4
1, rods 44 are sequentially supplied from a rod supply section 45 to rod storage bags 43 provided at equal pitches on the outer surface of a belt conveyor 42 that runs endlessly, travel in the direction of the arrow, and are inspected for defects in an inspection unit 46. After that, it is stored in the rod storage section 47. The rod 44 is for a shock absorber, for example, and has a threaded portion 44b at the top of a round bar-shaped portion to be inspected 44a in FIG. 8, and conical convex portions 44c for centering at the upper and lower ends, respectively.

検査ユニツト46は第8図の如く、定位置のア
クチユエータ48を有し、該アクチユエータ48
の矢印A,B方向スライド自在のピストンロツド
48a先端の硬質樹脂製非磁性体48bの円錐孔
48cが、上記ロツド44下端の円錐凸部44c
に同心的に嵌合して上方へ押上げる。
The inspection unit 46 has an actuator 48 in a fixed position as shown in FIG.
The conical hole 48c of the hard resin non-magnetic material 48b at the tip of the piston rod 48a, which can freely slide in the directions of arrows A and B, is connected to the conical convex portion 44c at the lower end of the rod 44.
It fits concentrically to the top and pushes upward.

49は電磁石兼用ロータで、コイル50を巻回
されてなり、中央孔49a及びその底面円錐孔4
9b、コイル50両端が夫々接続された針状電極
51a,51b及び上端軸部49cに螺入された
ギヤ52を有する。尚53はパルスモータで、こ
れと同軸のギヤ54がギヤ52と噛合し、且つパ
ルスモータ53に接続したロータリエンコーダ5
5が該モータ53の回転数を検出してコンピユー
タ61に入力する。
49 is a rotor that also serves as an electromagnet, is wound with a coil 50, and has a central hole 49a and a conical hole 4 at its bottom.
9b, the coil 50 has needle electrodes 51a and 51b connected to both ends, respectively, and a gear 52 screwed into the upper end shaft portion 49c. 53 is a pulse motor, a gear 54 coaxial with this gear meshes with the gear 52, and a rotary encoder 5 connected to the pulse motor 53.
5 detects the rotation speed of the motor 53 and inputs it to the computer 61.

62は電磁石兼用ロータ49に駆動電流を供給
する電流供給ユニツトであり、第8図、第9図の
如く、絶縁円板63下面の1対の同心リング形溝
に夫々リング形導体64,65(夫々断面V字形
の円形溝64a,65aを有する)を埋設してな
り、各導体64,65は夫々直流電源66の陽極
及び陰極に接続される。又、円板63の中央孔3
6aがロータ49の軸部49cに遊嵌され、且つ
円板63の突板部63bの孔63cに固定アクチ
ユエータ67の支柱67aが嵌入固着されてい
る。従つて支柱67aが矢印A,B方向スライド
するに伴ない、ユニツト62も同方向へ往復スラ
イドし、1対の電極51a,51bは夫々溝64
a,65aに嵌入出し、嵌入時には、該溝64
a,65a内を接触走行して回転中のロータ49
のコイル50を継続的に励磁させる。
62 is a current supply unit that supplies a driving current to the rotor 49 which also serves as an electromagnet, and as shown in FIGS. 8 and 9, ring-shaped conductors 64 and 65 ( The conductors 64 and 65 are respectively connected to the anode and cathode of a DC power source 66. Also, the center hole 3 of the disc 63
6a is loosely fitted into the shaft portion 49c of the rotor 49, and a support column 67a of the fixed actuator 67 is fitted and fixed into the hole 63c of the projecting plate portion 63b of the disc 63. Therefore, as the support column 67a slides in the directions of arrows A and B, the unit 62 also slides back and forth in the same direction, and the pair of electrodes 51a and 51b are inserted into the grooves 64, respectively.
a, 65a, and when inserted, the groove 64
The rotor 49 is rotating in contact with the inside of a and 65a.
The coil 50 of is continuously excited.

68はITVカメラ、69は1対の照明装置で
あり、アクチユエータ70の矢印A,B方向スラ
イド自在の支柱70a先端に固着される。
Reference numeral 68 indicates an ITV camera, and reference numeral 69 indicates a pair of illumination devices, which are fixed to the tip of a support 70a of an actuator 70 that is slidable in the directions of arrows A and B.

71はマーカーで、マーカーアクチユエータ7
2により矢印C,D方向スライド自在である。
71 is a marker, marker actuator 7
2, it can be slid freely in the directions of arrows C and D.

次に、上記装置41の動作に付き説明する。ま
ずベルトコンベヤ42の袋43に収納されたロツ
ド44がアクチユエータ48のピストンロツド4
8aの軸線上に至ると、コンベヤ42は停止す
る。そして、アクチユエータ48が動作し、ピス
トンロツド48aが矢印A方向へ上動してロツド
44を上方へ持上げる。かくしてロツド44はそ
のネジ部44bがロータ49の孔49aに挿入さ
れ、被検査部44c上端面がロータ49下端面に
当接すると共に上下の円錐凸部44cが夫々ロー
タ49の円錐孔49b及びピストンロツド48a
の非磁性体部48bの円錐孔48cに嵌入され、
ロータ49及びピストンロツド48a間に正確に
同心的に保持され、第8図に示す状態となる。
Next, the operation of the device 41 will be explained. First, the rod 44 stored in the bag 43 of the belt conveyor 42 is connected to the piston rod 4 of the actuator 48.
When reaching the axis of 8a, the conveyor 42 stops. Then, the actuator 48 operates, and the piston rod 48a moves upward in the direction of arrow A, lifting the rod 44 upward. Thus, the threaded portion 44b of the rod 44 is inserted into the hole 49a of the rotor 49, the upper end surface of the portion to be inspected 44c abuts the lower end surface of the rotor 49, and the upper and lower conical convex portions 44c are inserted into the conical hole 49b of the rotor 49 and the piston rod 48a, respectively.
is inserted into the conical hole 48c of the non-magnetic part 48b,
The rotor 49 and the piston rod 48a are held exactly concentrically, resulting in the state shown in FIG.

次に、アクチユエータ67が動作し、支柱67
aを介して電流供給ユニツト62が矢印B方向へ
下動し、相対的にロータ49の針状電極51a,
51bが夫々導体64,65の溝64a,65a
に嵌入して接触し、第8図に示す状態となる。従
つて、直流電源66の陽極から導体64、電極5
1a、コイル50、電極51b、導体65を順次
介して直流電源66の陰極に戻る回路が閉成さ
れ、コイル50に電流が流れる。従つてロータ4
9は電磁石となりロツド44を強固に吸引し安定
に一体回転しうる状態になり、この後直流電源6
6は継続的にパワーオン状態となる。このとき
ITVカメラ68はロツド44の被検査部44a
の第8図中例えば下端の巾寸法lの部分を、上記
実施例と同様、第4図の如く観測し、巾寸法mの
所定の測定領域を格子状に画成した各格子の最明
部数、明部数を求めそのα値を求める。
Next, the actuator 67 operates, and the column 67
The current supply unit 62 moves downward in the direction of the arrow B through the arrow A, and the needle-shaped electrodes 51a and 51a of the rotor 49 are relatively connected to each other.
51b are grooves 64a and 65a of conductors 64 and 65, respectively.
8, and comes into contact with it, resulting in the state shown in FIG. Therefore, from the anode of the DC power supply 66 to the conductor 64 and the electrode 5
1a, the coil 50, the electrode 51b, and the conductor 65, a circuit returning to the cathode of the DC power supply 66 is closed, and current flows through the coil 50. Therefore, rotor 4
9 becomes an electromagnet and firmly attracts the rod 44, allowing it to rotate stably as a unit, after which the DC power supply 6
6 is continuously powered on. At this time
The ITV camera 68 is the inspected part 44a of the rod 44.
In FIG. 8, for example, the lower end width dimension l is observed as shown in FIG. , find the number of bright parts and find its α value.

次に、パルスモータ53が動作してギヤ54,
52を介して、上記一体のロータ49、ロツド4
4を所定角度回動させて反射光条件を異ならせて
上記測定領域を再び測定しβ値を求める。かくし
て、α,βが共に一定値より大なるときのみロツ
ド44表面に欠陥ありと判定される。同様にして
ロツド44の上記巾寸法mの1周分が測定され
る。
Next, the pulse motor 53 operates and the gears 54,
52, the integral rotor 49, rod 4
4 by a predetermined angle to change the reflected light conditions and measure the measurement area again to determine the β value. Thus, it is determined that there is a defect on the surface of the rod 44 only when α and β are both greater than a certain value. Similarly, one round of the width m of the rod 44 is measured.

次にITVカメラ68がアクチユエータ70の
動作により寸法m分矢印A方向へスライドし、続
いて同様にしてロツド44が回転して次の1周分
が測定され、同様にしてロツド44の被検査部4
4aの全てが測定検査される。
Next, the ITV camera 68 slides in the direction of the arrow A by a distance m by the operation of the actuator 70, and then the rod 44 rotates in the same manner to measure the next round. 4
4a are all measured and tested.

かくして、コンピユータ61がロツド44に欠
陥があるか否かを判定し、欠陥があると判定した
場合にはマーカーアクチユエータ72を動作させ
マーカー71を矢印C方向へ突出スライドさせて
ロツド44に接触させ赤色のペンキ等により不良
品の印をつけ、印をつけた後はマーカー71は引
込スライド変位する。
Thus, the computer 61 determines whether or not the rod 44 is defective, and if determined to be defective, the marker actuator 72 is operated to slide the marker 71 in the direction of arrow C to contact the rod 44. Then mark the defective product with red paint or the like, and after marking, the marker 71 is retracted and slid.

次いで、電流供給ユニツト62がアクチユエー
タ67の動作により、矢印A方向へ上動して、相
対的に電極51a,51bが夫々溝64a,65
aから抜け出し、ロータ49のコイル50の励磁
が解除されロツド44の吸引が解除される。尚こ
のときコイル50に交流電流を加えると、ロータ
49の残留磁気が早急に消滅しロツド44の吸引
解除を迅速に行ないうる。
Next, the current supply unit 62 is moved upward in the direction of arrow A by the operation of the actuator 67, and the electrodes 51a and 51b are relatively moved into the grooves 64a and 65, respectively.
a, the excitation of the coil 50 of the rotor 49 is released, and the attraction of the rod 44 is released. If an alternating current is applied to the coil 50 at this time, the residual magnetism of the rotor 49 disappears quickly, and the attraction of the rod 44 can be quickly released.

次に、アクチユエータ48が動作してピストン
ロツド48aが下動し、ロツド44が自重により
下動して収納袋43内に収納復帰される。尚ロツ
ド44の下方に更に別の電磁石を設けてこの電磁
石により検査終了後のロツド44を下方へ吸引ス
ライドさせ収納袋43に戻すようにしてもよく、
この方法によればロツド44を水平方向に置いて
検査することが可能となる。
Next, the actuator 48 is operated to move the piston rod 48a downward, and the rod 44 is moved downward by its own weight and returned to the storage bag 43. Furthermore, another electromagnet may be provided below the rod 44, and this electromagnet may be used to suck and slide the rod 44 downward after the inspection is completed, and return it to the storage bag 43.
This method allows the rod 44 to be placed horizontally for inspection.

ここで、ITVカメラ68及び照明装置69も
コンピユータ61の指令によるアクチユエータ7
0の動作により初期設定位置に復帰変位する。
Here, the ITV camera 68 and the lighting device 69 are also operated by the actuator 7 according to instructions from the computer 61.
0 returns to the initial setting position.

上記装置41によれば、ロツド44をロータ4
9の電磁石により吸引固定して回転させているた
め、従来ロツドを持ち換えチヤツキングしていた
方式に比して、ロツド44の持ち換えの必要なく
作業が容易であると共に、チヤツキング時の傷を
生ずるおそれもなく、又ロツド44を同一位置で
回転させているためスペースが小さくて済み、又
検査終了後ピストンロツド48aを下動させるの
みでロツド44を自重により下動させ収納袋43
内に収納しえ作業工数を低減しうる。
According to the device 41, the rod 44 is connected to the rotor 4.
Since the rod 44 is attracted and fixed by electromagnet 9 and rotated, it is easier to work without the need to change the rod 44 compared to the conventional method in which the rod was changed and chucked, and it also avoids scratches when chucking. There is no fear, and since the rod 44 is rotated at the same position, the space is small, and after the inspection is completed, the rod 44 can be moved down by its own weight by simply moving the piston rod 48a down, and the storage bag 43 can be moved down.
It can be stored inside the machine, reducing the number of work hours.

尚上記実施例中、電流供給ユニツト62及び針
状電極51a,51bの構成はこれらに限らず、
スペースがあれば通常のスリツプリング形式のも
のでもよい。
In the above embodiments, the configurations of the current supply unit 62 and the needle electrodes 51a, 51b are not limited to these.
If space is available, a normal slip-ring type may be used.

尚上記各実施例では、被検査部材は何れも丸棒
状ロツドであるが、これに限らず平板でもよく、
この場合平板をその平面延在方向に逐次移動させ
て上記α,βの両値を求めればよい。
In each of the above embodiments, the members to be inspected are all round rods, but they are not limited to this, and may be flat plates.
In this case, both values of α and β may be determined by sequentially moving the flat plate in the direction in which the flat plate extends.

上述の如く、本考案になる表面欠陥検査装置に
よれば、被検査部材の測定領域の複数の格子を比
較手段により少なくとも二種の明るさの格子に比
較識別し、演算手段により該二種の明るさの格子
数の比率を反射光条件の異なる二態様において
夫々求めてα,βとし、判定手段によりα,βが
共に一定値より大なるとき欠陥があると判定して
いるため、上記明るさの判定、α,βの計算、欠
陥の判定等の全ての作業をデイジタル的に自動的
に行ないえ、検査者の熟練度等関係なく安定した
検査結果を得て検査精度を向上しえ、又α,βの
二つの値が共に一定値より大なるとき欠陥ありと
判定しているため、塵埃等を欠陥と誤認するおそ
れなく打痕、スリ傷等の真の欠陥のみを正しく検
出しえ一層検査精度を向上しうる等の特長を有す
る。
As described above, according to the surface defect inspection apparatus of the present invention, the comparison means compares and identifies a plurality of gratings in the measurement area of the inspected member into gratings of at least two types of brightness, and the calculation means identifies the two types of brightness. The ratio of the number of brightness lattices is calculated under two different reflected light conditions as α and β, and the determination means determines that there is a defect when both α and β are larger than a certain value. All work such as determining the thickness, calculating α and β, and determining defects can be performed digitally and automatically, and stable inspection results can be obtained regardless of the inspector's skill level and inspection accuracy can be improved. In addition, since it is determined that there is a defect when the two values of α and β are both greater than a certain value, only true defects such as dents and scratches can be correctly detected without fear of mistaking dust etc. as defects. It has features such as being able to further improve inspection accuracy.

【図面の簡単な説明】[Brief explanation of drawings]

第1図及び第2図は夫々本考案になる表面欠陥
検査装置の1実施例の側面図及び平面図、第3図
は上記装置の要部の正面図、第4図は上記装置に
より検査される被検査部材の観測領域及び測定領
域を示す図、第5図A,Bは夫々上記装置による
検査状況を被検査部材の位置変化を伴ない示す
図、第6図は上記被検査部材の測定領域毎の最明
部数及び明部数の変化を、異なる反射条件下で示
す図、第7図及び第8図は夫々上記表面欠陥検査
装置の他の実施例の全体平面図及びその要部の一
部切截側面図、第9図は上記装置の電流供給ユニ
ツトの下面図である。 1,41……表面欠陥検査装置、2,5〜8,
11〜14,48,67,70,72……アクチ
ユエータ、4,44……ロツド、9,10……下
レール、15,16……上レール、21,68…
…ITVカメラ、22,69……照明装置、25
〜27,42……コンベヤ、28,61……コン
ピユータ、29……観測領域、301,302……
測定領域、31……画像メモリ、32……データ
処理判定装置、43……ロツド収納袋、46……
検査ユニツト、49……ロータ、50……コイ
ル、51a,51b,64,65……電極、53
……パルスモータ、62……電流供給ユニツト、
63……絶縁円板、66……直流電源。
1 and 2 are a side view and a plan view, respectively, of an embodiment of the surface defect inspection device according to the present invention, FIG. 3 is a front view of the main parts of the device, and FIG. Figures 5A and 5B are diagrams showing the inspection status by the above apparatus with changes in the position of the inspected member, and Figure 6 is a diagram showing the measurement area of the inspected member. FIGS. 7 and 8 are diagrams showing the number of brightest areas and changes in the number of bright areas for each area under different reflection conditions, respectively, and FIGS. FIG. 9 is a partially cutaway side view and a bottom view of the current supply unit of the above device. 1,41...Surface defect inspection device, 2,5-8,
11-14, 48, 67, 70, 72... Actuator, 4, 44... Rod, 9, 10... Lower rail, 15, 16... Upper rail, 21, 68...
...ITV camera, 22,69...Lighting device, 25
~27,42... Conveyor, 28,61... Computer, 29... Observation area, 30 1 , 30 2 ...
Measurement area, 31... Image memory, 32... Data processing/judgment device, 43... Rod storage bag, 46...
Inspection unit, 49... Rotor, 50... Coil, 51a, 51b, 64, 65... Electrode, 53
...Pulse motor, 62...Current supply unit,
63...Insulating disc, 66...DC power supply.

Claims (1)

【実用新案登録請求の範囲】 1 被検査部材の表面を照明する照明手段と、該
表面よりの反射光を入射され該表面を撮像する
撮像手段と、該表面の測定領域を画成してなる
複数の区画を少なくとも二種の明るさを別に比
較識別する比較手段と、該二種の明るさの区画
個数を夫々求めその比率を演算する演算手段
と、同一の該測定領域より該撮像手段への反射
光の条件が異なる二態様において夫々上記演算
手段により演算された二個の比率が共に一定値
より大なるとき該被検査部材の表面に欠陥があ
ると判定する判定手段とより構成してなる表面
欠陥検査装置。 2 上記照明手段と撮像手段とは互いに一体構成
であり、該照明手段及び撮像手段と該被検査部
材とのうち少なくとも一方を他方に対し相対的
に変位駆動せしめることにより上記反射光の異
なる二態様を現出せしめる駆動手段を更に設け
た構成としてなる実用新案登録請求の範囲第1
項記載の表面欠陥検査装置。
[Claims for Utility Model Registration] 1. Illumination means for illuminating the surface of a member to be inspected, imaging means for capturing an image of the surface by receiving reflected light from the surface, and defining a measurement area on the surface. a comparison means for separately comparing and identifying a plurality of sections with at least two types of brightness, a calculation means for calculating the number of sections each having the two types of brightness and calculating a ratio thereof, and an imaging means from the same measurement area. and determining means for determining that there is a defect on the surface of the inspected member when the two ratios calculated by the calculating means are both greater than a certain value in two modes in which the conditions of the reflected light are different. A surface defect inspection device. 2. The illumination means and the imaging means are integrally configured with each other, and by displacing and driving at least one of the illumination means, the imaging means, and the member to be inspected relative to the other, two different modes of the reflected light can be obtained. Claim No. 1 for Utility Model Registration consists of a structure further provided with a driving means for causing the
The surface defect inspection device described in Section 1.
JP5753482U 1982-04-20 1982-04-20 Surface defect inspection equipment Granted JPS58160342U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP5753482U JPS58160342U (en) 1982-04-20 1982-04-20 Surface defect inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP5753482U JPS58160342U (en) 1982-04-20 1982-04-20 Surface defect inspection equipment

Publications (2)

Publication Number Publication Date
JPS58160342U JPS58160342U (en) 1983-10-25
JPH0247491Y2 true JPH0247491Y2 (en) 1990-12-13

Family

ID=30067978

Family Applications (1)

Application Number Title Priority Date Filing Date
JP5753482U Granted JPS58160342U (en) 1982-04-20 1982-04-20 Surface defect inspection equipment

Country Status (1)

Country Link
JP (1) JPS58160342U (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007285869A (en) * 2006-04-17 2007-11-01 Denso Corp Surface inspection system and surface inspection method
JP5506359B2 (en) * 2009-12-11 2014-05-28 三菱重工業株式会社 Crack inspection apparatus, crack analysis apparatus, method, and program

Also Published As

Publication number Publication date
JPS58160342U (en) 1983-10-25

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