JPH0244234A - Soldering inspecting device - Google Patents
Soldering inspecting deviceInfo
- Publication number
- JPH0244234A JPH0244234A JP63195109A JP19510988A JPH0244234A JP H0244234 A JPH0244234 A JP H0244234A JP 63195109 A JP63195109 A JP 63195109A JP 19510988 A JP19510988 A JP 19510988A JP H0244234 A JPH0244234 A JP H0244234A
- Authority
- JP
- Japan
- Prior art keywords
- circuit
- soldering
- inspected
- image signal
- soldered
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005476 soldering Methods 0.000 title claims abstract description 28
- 238000005286 illumination Methods 0.000 claims abstract description 10
- 238000006243 chemical reaction Methods 0.000 claims abstract description 9
- 238000007689 inspection Methods 0.000 claims description 19
- 239000000284 extract Substances 0.000 claims description 2
- 238000010276 construction Methods 0.000 abstract 1
- 230000001678 irradiating effect Effects 0.000 abstract 1
- 230000000873 masking effect Effects 0.000 abstract 1
- 229910000679 solder Inorganic materials 0.000 description 19
- 238000010438 heat treatment Methods 0.000 description 4
- 238000007796 conventional method Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000003760 hair shine Effects 0.000 description 1
- 238000010561 standard procedure Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/956—Inspecting patterns on the surface of objects
- G01N21/95684—Patterns showing highly reflecting parts, e.g. metallic elements
Landscapes
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Image Processing (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
- Image Analysis (AREA)
- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は半田付検査装置、特に、プリント基板に実装さ
れたチップ部品、SOP、QFP等の表面実装部品の半
田付状態を検査する半田付検査装置に関する。[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a soldering inspection device, particularly a soldering inspection device for inspecting the soldering condition of surface-mounted components such as chip components, SOPs, and QFPs mounted on printed circuit boards. Regarding inspection equipment.
従来の技術としては、例えば特公昭61−241641
号公報に示されているようにハンダ付は検査装置がある
。As a conventional technique, for example, Japanese Patent Publication No. 61-241641
As shown in the publication, there is an inspection device for soldering.
従来のハンダ付は検査装置は半田部を加熱する加熱部と
、半田部の温度上昇を測定する温度測定部と、該温度測
定部により測定された温度変化分よりハンダ付は部の良
否を判定する判定部とを含んで構成される。Conventional soldering inspection equipment has a heating part that heats the soldering part, a temperature measuring part that measures the temperature rise of the soldering part, and a judgment of the quality of the soldering part based on the temperature change measured by the temperature measuring part. The configuration includes a determination unit that performs the following operations.
次に従来のハンダ付は検査装置について図面を参照して
詳細に説明する。Next, a conventional soldering inspection device will be explained in detail with reference to the drawings.
第3図は従来のハンダ付は検査装置の原理を示す側面図
である。FIG. 3 is a side view showing the principle of a conventional soldering inspection device.
第3図に示すハンダ付は検査装置は、プリント基板31
の上に実装されたFIC32の端子部33は加熱装置3
4により適当な温度まで加熱される。The soldering inspection device shown in FIG.
The terminal portion 33 of the FIC 32 mounted on the heating device 3
4 to an appropriate temperature.
端子部33の加熱された熱はハンダ部35との接触によ
り、ハンダ部35に伝熱され、ハンダ部35は暖められ
る。The heat generated by the terminal portion 33 is transferred to the solder portion 35 through contact with the solder portion 35, and the solder portion 35 is warmed.
ハンダ部35の温度を赤外検出器36により測定する。The temperature of the solder portion 35 is measured by an infrared detector 36.
この時端子部33とハンダ部35との接触が十分でない
場合、即ち端子部33とハンダ部35との熱伝導性が悪
い場合、ハンダ部35の温度上昇は時間がかかるが低い
温度におさえられる。At this time, if the contact between the terminal part 33 and the solder part 35 is insufficient, that is, if the thermal conductivity between the terminal part 33 and the solder part 35 is poor, the temperature of the solder part 35 can be suppressed to a low temperature although it takes time to rise. .
従って、ハンダ部35の時間に対する温度変化を測定す
ることにより、ハンダ付は性の良否を判定している。Therefore, by measuring the temperature change of the solder portion 35 over time, the quality of soldering is determined.
上述した従来のハンダ付は検査装置は、検査箇所−カ所
−カ所に熱を加え温度上昇を測定しなければならないた
め、−カ所の検査に時間がかかる上、検査箇所分だけプ
リント基板を移動させなければならないため、プリント
基板をとりつけたステージの移動回数が多くなりトータ
ルの検査時間も長くなってしまうという欠点があった。The conventional soldering inspection equipment described above has to apply heat to multiple inspection points and measure the temperature rise, which takes time to inspect each location, and requires the printed circuit board to be moved by the number of inspection points. This has the drawback that the stage on which the printed circuit board is mounted must be moved many times, and the total inspection time becomes longer.
又、上述した従来のハンダ付は検査装置は、加熱装置及
び赤外検出器を使用するため高価であるという欠点があ
った。Furthermore, the conventional soldering inspection apparatus described above has the disadvantage of being expensive because it uses a heating device and an infrared detector.
本発明の半田付検査装置は、検査対象部品の半田付部を
斜方より照射する照明部と、前記半田付部のフィレット
部分からの前記照明部の反射光を最も多く入射する角度
にとりつけられた半田1寸部の画像を入力するカメラと
、該カメラから入力した画像をAD変換するAD変換回
路と、該AD変換回路から入力された画像データのうち
検査対象部分だけを抽出するマクス回路と、該マスク回
路によって抽出された部分の画像の濃淡値を全て加算す
る加算回路と、該加算回路から出力される加算値より検
査結果を判定する判定回路とを含んで構成される。The soldering inspection device of the present invention includes an illumination section that illuminates the soldered portion of the component to be inspected from an oblique direction, and an illumination section that is installed at an angle that allows the most reflected light from the illumination section to be incident from the fillet portion of the soldered section. A camera that inputs an image of a 1-inch portion of solder, an AD conversion circuit that performs AD conversion on the image input from the camera, and a mask circuit that extracts only the portion to be inspected from the image data input from the AD conversion circuit. , an adder circuit that adds all the grayscale values of the image of the portion extracted by the mask circuit, and a determination circuit that determines the test result based on the added value output from the adder circuit.
次に、本発明の実施例について、図面を参照して詳細に
説明する。Next, embodiments of the present invention will be described in detail with reference to the drawings.
第1図は本発明の一実施例を示すブロック図である。FIG. 1 is a block diagram showing one embodiment of the present invention.
プリント基板1上に実装されたFIC2の電極3の半田
付検査を行う場合を例にとって説明する。An example will be explained in which a soldering test is performed on the electrodes 3 of the FIC 2 mounted on the printed circuit board 1.
本説明により検査対象部品をFICに限定するものでは
なくチップ部品等表面実装部品が検査対象である。In this description, the parts to be inspected are not limited to FICs, but surface-mounted parts such as chip parts are to be inspected.
照明部5は、電f!3の半田付部分4を斜方より照射す
る。カメラ6は、半田付部分4を含む範囲の画像を取り
込みアナログ画像信号aをAD変換回路7に出力する。The lighting section 5 is an electric f! The soldered portion 4 of No. 3 is irradiated obliquely. The camera 6 captures an image of the range including the soldered portion 4 and outputs an analog image signal a to the AD conversion circuit 7.
AD変換回路7では、アナログ画像信号aを入力し、多
値階調のディジタル画像信号すに変換し、マスク回路8
に出力する。マスク回路8では、検査対象である半田付
部分4のみの情報を得るために、半田付部分4以外の部
分の濃淡値を最も暗い0にし、マスク画像信号Cを加算
回路9に出力する。加算回路9では、入力したマスク画
像信号Cの濃淡値をすべて足し込み、加算値を得る。加
算値信号dは判定回路10に入力される。判定回路10
ではあらかじめ設定された基準値と入力された加算値と
を比較し、加算値の方が大きければ半田付検査合格と判
定する。The AD conversion circuit 7 inputs the analog image signal a, converts it into a multi-level gradation digital image signal, and sends it to the mask circuit 8.
Output to. In the mask circuit 8, in order to obtain information only on the soldered portion 4 to be inspected, the gradation value of the portion other than the soldered portion 4 is set to the darkest 0, and the mask image signal C is outputted to the addition circuit 9. The adder circuit 9 adds up all the grayscale values of the input mask image signal C to obtain an added value. The addition value signal d is input to the determination circuit 10. Judgment circuit 10
Then, the preset reference value and the input added value are compared, and if the added value is larger, it is determined that the soldering test has passed.
第2図(a)〜(c)は本発明の詳細な説明するための
側面図である。第2図において21はプリント基板、2
2はパッド部、23は部品電極、24は半田付部分を示
している。FIGS. 2(a) to 2(c) are side views for explaining the present invention in detail. In Fig. 2, 21 is a printed circuit board;
2 is a pad portion, 23 is a component electrode, and 24 is a soldered portion.
第2図(a)は正常に半田付が行われている場合である
。半田付部分に照射された照明光eは半田付が正常に行
われている場合、鏡面状になったフィレット部表面で正
反射する。カメラは反射光fの方向に取り付けてあり、
カメラ画像で半田付部は明るく光る。FIG. 2(a) shows a case where soldering is performed normally. When soldering is performed normally, the illumination light e irradiated onto the soldered portion is regularly reflected on the mirror-like fillet surface. The camera is installed in the direction of the reflected light f,
The soldered area shines brightly in the camera image.
第2図(b)は半田過少又は半田なしの場合であり、半
田付部分に照射された照明光eはフィレットがないなめ
、パッド又は電極側面で乱反射し反射光fは散乱するた
めカメラ画像で半田付部は暗くなる。Figure 2 (b) shows the case where there is insufficient solder or no solder, and since there is no fillet, the illumination light e irradiated to the soldered part is diffusely reflected on the pad or electrode side surface, and the reflected light f is scattered, so it is not visible in the camera image. The soldered area will be dark.
第2図(c)は半田過多の場合であり、半田付部分に照
射された照明光eは半田部分で正反射しカメラに入力す
る光もあるが、半田過多のため半田部分の表面は凸曲面
になっており、反射光での大部分は散乱してしまいカメ
ラ画像では半田付部の一部だけ明るくなるが、全体とし
て暗くなる。Figure 2 (c) shows a case where there is too much solder, and the illumination light e irradiated on the soldered part is regularly reflected by the solder part and some light enters the camera, but due to too much solder, the surface of the soldered part is convex. It has a curved surface, and most of the reflected light is scattered, so in the camera image, only a part of the soldered area is bright, but the whole is dark.
以上の説明より半田付部だけの濃淡値を加算すると、次
の順番になることがわかる。From the above explanation, it can be seen that if the shading values of only the soldered parts are added, the following order will be obtained.
(正常)〉(半田過多)〉(半田なし・過少)従って、
正常な場合の加算値と、半田過多の場合の加算値の間に
判定回路で用いる基準値を設定しておけば、正常な場合
とそれ以外の場合を区別することができる。(Normal)〉(Too much solder)〉(No solder/Too much solder) Therefore,
By setting a reference value used in the determination circuit between the added value in the normal case and the added value in the case of excessive solder, it is possible to distinguish between the normal case and other cases.
本発明の半田付検査装置は、半田付部にあてた照明光の
反射光量により良否検査を行うので、高速に検査を行う
ことができ、かつ、構成部品が安価であるため装置も安
価になるという効果がある。The soldering inspection device of the present invention performs pass/fail inspection based on the amount of reflected light of the illumination light applied to the soldering part, so inspection can be performed at high speed, and since the component parts are inexpensive, the device is also inexpensive. There is an effect.
第2図(a)〜(C)は本発明の詳細な説明するための
側面図、第3図は従来の一例を示す側面図である。FIGS. 2(a) to (C) are side views for explaining the present invention in detail, and FIG. 3 is a side view showing an example of the prior art.
1・・・プリント基板、2・・・FIC13・・・電極
、4・・・半田付部分、5・・・照明部、6・・・カメ
ラ、7・・・AD変換回路、8・・・マスク回路、9・
・・加算回路、10・・・判定回路、21・・・プリン
ト基板、22・・・パッド部、23・・・部品電極、2
4・・・半田付部分、31・・・プリント基板、32・
・・FIC133・・・端子部、34・・・加熱装置、
35・・・ハンダ部、36・・・赤外検出器、
a・・・アナログ画像信号、b・・・ディジタル画像信
号、C・・・マスク画像信号、d・・・加算値信号、e
・・・照明光、f・・・反射光。DESCRIPTION OF SYMBOLS 1... Printed circuit board, 2... FIC13... Electrode, 4... Soldering part, 5... Lighting part, 6... Camera, 7... AD conversion circuit, 8... Mask circuit, 9.
... Addition circuit, 10... Judgment circuit, 21... Printed circuit board, 22... Pad portion, 23... Component electrode, 2
4...Soldering part, 31...Printed circuit board, 32.
...FIC133...terminal part, 34...heating device,
35...Solder part, 36...Infrared detector, a...Analog image signal, b...Digital image signal, C...Mask image signal, d...Addition value signal, e
...Illumination light, f...Reflected light.
Claims (1)
前記半田付部のフィレット部分からの前記照明部の反射
光を最も多く入射する角度にとりつけられた半田付部の
画像を入力するカメラと、該カメラから入力した画像を
AD変換するAD変換回路と、該AD変換回路から入力
された画像データのうち検査対象部分だけを抽出するマ
クス回路と、該マスク回路によって抽出された部分の画
像の濃淡値を全て加算する加算回路と、該加算回路から
出力される加算値より検査結果を判定する判定回路とを
含むことを特徴とする半田付検査装置。a lighting section that illuminates the soldered portion of the component to be inspected from an oblique direction;
a camera that inputs an image of the soldering part installed at an angle where the most reflected light of the illumination part from the fillet part of the soldering part is incident; and an AD conversion circuit that converts the image input from the camera into an AD converter; , a mask circuit that extracts only the portion to be inspected from the image data input from the AD conversion circuit, an adder circuit that adds all the grayscale values of the portion of the image extracted by the mask circuit, and an output from the adder circuit. 1. A soldering inspection device comprising: a determination circuit that determines an inspection result based on an added value.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63195109A JPH0739995B2 (en) | 1988-08-03 | 1988-08-03 | Soldering inspection device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63195109A JPH0739995B2 (en) | 1988-08-03 | 1988-08-03 | Soldering inspection device |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0244234A true JPH0244234A (en) | 1990-02-14 |
JPH0739995B2 JPH0739995B2 (en) | 1995-05-01 |
Family
ID=16335653
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63195109A Expired - Lifetime JPH0739995B2 (en) | 1988-08-03 | 1988-08-03 | Soldering inspection device |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0739995B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5206705A (en) * | 1989-12-13 | 1993-04-27 | Matsushita Electric Industrial Co., Ltd. | Method of checking external shape of solder portion |
EP2241878A3 (en) * | 2009-04-15 | 2017-05-03 | Göpel electronic GmbH | Method for inspecting soldering points of electric and electronic components |
-
1988
- 1988-08-03 JP JP63195109A patent/JPH0739995B2/en not_active Expired - Lifetime
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5206705A (en) * | 1989-12-13 | 1993-04-27 | Matsushita Electric Industrial Co., Ltd. | Method of checking external shape of solder portion |
EP2241878A3 (en) * | 2009-04-15 | 2017-05-03 | Göpel electronic GmbH | Method for inspecting soldering points of electric and electronic components |
Also Published As
Publication number | Publication date |
---|---|
JPH0739995B2 (en) | 1995-05-01 |
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