JPH02431B2 - - Google Patents

Info

Publication number
JPH02431B2
JPH02431B2 JP17520283A JP17520283A JPH02431B2 JP H02431 B2 JPH02431 B2 JP H02431B2 JP 17520283 A JP17520283 A JP 17520283A JP 17520283 A JP17520283 A JP 17520283A JP H02431 B2 JPH02431 B2 JP H02431B2
Authority
JP
Japan
Prior art keywords
thin film
film forming
chamber
flexible substrate
forming chamber
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP17520283A
Other languages
Japanese (ja)
Other versions
JPS6067671A (en
Inventor
Hideo Mito
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Canon Anelva Corp
Original Assignee
Anelva Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Anelva Corp filed Critical Anelva Corp
Priority to JP17520283A priority Critical patent/JPS6067671A/en
Publication of JPS6067671A publication Critical patent/JPS6067671A/en
Publication of JPH02431B2 publication Critical patent/JPH02431B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/56Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks
    • C23C14/562Apparatus specially adapted for continuous coating; Arrangements for maintaining the vacuum, e.g. vacuum locks for coating elongated substrates

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physical Vapour Deposition (AREA)
  • Chemical Vapour Deposition (AREA)

Description

【発明の詳細な説明】 本発明は電極を同軸型に配置し、電極間に生起
させたプラズマを利用して薄膜を作成する装置に
係わり、特に、可撓性基板に連続的に薄膜をコー
テイングする為の薄膜作成装置に関する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an apparatus for forming a thin film by arranging electrodes in a coaxial manner and utilizing plasma generated between the electrodes, and particularly relates to a device for continuously coating a flexible substrate with a thin film. The present invention relates to a thin film forming device for the purpose of forming a thin film.

従来、プラズマを利用して薄膜を作成する装置
であつて、膜を堆積させる基板を移動できるよう
にし、薄膜の作成を連続的に行い得るようにした
装置としては、第1図又は第2図に示したような
ものが知られている。
Conventionally, apparatuses for forming thin films using plasma, in which the substrate on which the film is deposited can be moved and thin films can be continuously formed, are shown in Fig. 1 or 2. The ones shown in are known.

第1図は薄膜作成チヤンバ1内に高周波電極2
と回転自在なローラ型の接地電極3を対設すると
共に接地電極3の、一方の側に可撓性基板4を繰
り出す送出しリール5を、他方の側に可撓性基板
4を巻取る巻取りリール6を設置し、可撓性基板
4を、矢印7の如く、送出しリール5から巻取り
リール6へ移動させるようにしたスパツタ装置で
ある。又第2図は薄膜作成チヤンバ1内に、平行
平板型の高周波電極2と接地電極3を対設すると
共に、薄膜作成チヤンバ1の、一方の側に送出し
リール5を架設した送出し室8を設け、他方の側
に巻取りリール6を架設した巻取り室9を設け
て、可撓性基板4を、矢印7の如く、送出しリー
ル5から巻取りリール6へ移動させるようにした
プラズマCVD装置である。然し乍、これら第1
図及び第2図に示した薄膜作成装置は、何れも平
行平板型のプラズマ装置を応用した装置であつ
て、プラズマを生起させる為に薄膜作成チヤンバ
1内に流し込む反応ガスの使用効率若しくはスパ
ツタリング物利用効率の点で不利となる問題点が
あつた。
Figure 1 shows a high-frequency electrode 2 inside a thin film forming chamber 1.
A rotatable roller-type ground electrode 3 is disposed opposite the ground electrode 3, and a feed reel 5 for feeding out the flexible substrate 4 is placed on one side of the ground electrode 3, and a winding reel 5 for winding up the flexible substrate 4 is placed on the other side of the ground electrode 3. This is a sputtering device in which a take-up reel 6 is installed and a flexible substrate 4 is moved from a delivery reel 5 to a take-up reel 6 as shown by an arrow 7. Further, FIG. 2 shows a delivery chamber 8 in which a parallel plate type high-frequency electrode 2 and a ground electrode 3 are disposed opposite each other in the thin film production chamber 1, and a delivery reel 5 is installed on one side of the thin film production chamber 1. and a take-up chamber 9 with a take-up reel 6 installed on the other side, and the flexible substrate 4 is moved from the delivery reel 5 to the take-up reel 6 as shown by the arrow 7. It is a CVD device. However, these first
The thin film forming apparatuses shown in the figures and FIG. 2 are all apparatuses that apply parallel plate type plasma apparatuses, and the use efficiency of the reaction gas flowed into the thin film forming chamber 1 to generate plasma or the sputtering material is important. There were some disadvantages in terms of utilization efficiency.

これらの効率の点では、前記高周波電極2と接
地電極3を同軸上に配置した、いわゆる同軸型の
スパツタ装置或いはプラズマCVD装置が優れて
いることが知られている。然し乍、従来の同軸型
の薄膜作成装置においては、膜を堆積させる基板
を移動させて、薄膜の作成を連続的にできるよう
にしたものが今までに堤供されていなかつた。
In terms of these efficiencies, it is known that a so-called coaxial type sputtering device or plasma CVD device in which the high frequency electrode 2 and the ground electrode 3 are arranged coaxially is superior. However, in the conventional coaxial type thin film forming apparatus, one that can move the substrate on which the film is deposited and continuously form the thin film has not been provided to date.

又、薄膜の作成に当つて、例えば用途が太陽電
池である場合のように、薄膜に所定のパターンを
描かせる必要がある場合には、膜を堆積させる基
板にマスクをかけて、パターニングをすることが
行なわれる。然し乍、上述した装置においては、
その構造上、パターニングを行えないという問題
点もあつた。
In addition, when creating a thin film, if it is necessary to draw a predetermined pattern on the thin film, for example when the application is for solar cells, patterning is performed by placing a mask on the substrate on which the film is deposited. things will be done. However, in the above-mentioned device,
There was also the problem that patterning could not be performed due to its structure.

本発明は、上記のような問題点に鑑みてなされ
たもので、その目的とする所は、反応ガスの使用
効率若しくはスパツタリング物利用効率の点で優
れている同軸型のプラズマ装置を応用した装置で
あつて、薄膜の作成が連続的に行い得るようにし
た薄膜作成装置を提供することにある。
The present invention has been made in view of the above-mentioned problems, and its purpose is to provide an apparatus to which a coaxial type plasma apparatus is applied, which is excellent in terms of the efficiency of using reaction gas or the efficiency of using sputtering material. An object of the present invention is to provide a thin film forming apparatus that can continuously form thin films.

本発明の他の目的は薄膜の作成過程でパターニ
ングのできる薄膜作成装置を提供することにあ
る。
Another object of the present invention is to provide a thin film forming apparatus that can perform patterning during the thin film forming process.

本発明によれば、薄膜作成チヤンバに隣接して
予備室を連設し、薄膜作成に有害なガスが前記薄
膜作成チヤンバ内へ混入するのを防止するととも
に、前記薄膜作成チヤンバ内に収容された電極を
中心軸をもつ同軸型に配置し、前記薄膜作成チヤ
ンバ内に被コーテイング物である可撓性基板の通
過通路をその断面形状が前記予備室より前記同軸
電極間の空間内でかつ前記中心軸を中心とした円
周上を通つて再び予備室に至るように形成し、前
記同軸型電極間に生起させたプラズマを利用して
前記可撓性基板上に薄膜を作成する装置におい
て、前記薄膜作成チヤンバ内の通過通路は、前記
可撓性基板の縁部と摺接もしくは係合し、かつ該
可撓性基板の移動と同期して駆動されるガイド枠
を介して形成されていることを特徴とする薄膜作
成装置が得られる。
According to the present invention, a preliminary chamber is provided adjacent to the thin film forming chamber to prevent gas harmful to thin film forming from entering the thin film forming chamber, and to prevent gases contained in the thin film forming chamber from entering the thin film forming chamber. The electrodes are arranged coaxially with a central axis, and a passage for a flexible substrate to be coated is provided in the thin film forming chamber so that its cross-sectional shape is within the space between the coaxial electrodes from the preliminary chamber and at the center. In the apparatus for forming a thin film on the flexible substrate using plasma generated between the coaxial electrodes, which is formed so as to pass through a circumference around an axis and reach the preparatory chamber again. The passageway in the thin film forming chamber is formed via a guide frame that slides or engages with the edge of the flexible substrate and is driven in synchronization with the movement of the flexible substrate. A thin film forming apparatus characterized by the following can be obtained.

又、本発明によれば、薄膜作成チヤンバ内の可
撓性基板が通過する通路を、可撓性基板の移動に
同期して駆動されるガイド枠を介して構成し、こ
のガイド枠に可撓性基板と密接するマスク板を配
した薄膜作成装置が得られる。
Further, according to the present invention, the passage through which the flexible substrate passes in the thin film forming chamber is configured via a guide frame that is driven in synchronization with the movement of the flexible substrate, and the guide frame is provided with a flexible substrate. A thin film forming apparatus is obtained in which a mask plate is disposed in close contact with a transparent substrate.

以下、本発明の実施例を添付の図面を参照して
説明する。
Embodiments of the present invention will be described below with reference to the accompanying drawings.

第3図は本発明による薄膜作成装置の一実施例
の構成を示した平面図であつて、円筒型のチヤン
バ11の中心軸上に高周波電極12を配置して薄
膜作成チヤンバ13を構成し、薄膜作成チヤンバ
13に隣接させて予備室14を設置し、薄膜作成
チヤンバ13と予備室14を断面矩形の通路1
5,16で連通させると共に、予備室14に隣接
させてフイルム収納室17を設置し、予備室14
とフイルム収納室17を断面矩形の通路18,1
9で連通させている。
FIG. 3 is a plan view showing the configuration of an embodiment of the thin film forming apparatus according to the present invention, in which a high frequency electrode 12 is arranged on the central axis of a cylindrical chamber 11 to form a thin film forming chamber 13. A preliminary chamber 14 is installed adjacent to the thin film forming chamber 13, and the thin film forming chamber 13 and the preliminary chamber 14 are connected to a passage 1 having a rectangular cross section.
5 and 16, and a film storage chamber 17 is installed adjacent to the preliminary chamber 14.
The film storage chamber 17 is connected to a passage 18, 1 having a rectangular cross section.
9 is used for communication.

薄膜作成チヤンバ13、予備室14、及びフイ
ルム収納室17には夫々真空排気系20が接続さ
れて、各室13,14、及び17が排気されると
共に、各室13,14、及び17が夫々所定の真
空度に保たれるように差動排気構成になつてい
る。そしてフイルム収納室17内には、薄膜を堆
積させるための基板となる可撓性のフイルム21
の送出しリール22と巻取りリール23が回転自
在に架設してある。フイルム21は送出しリール
22より繰り出されて、通路18を通過して予備
室14内に入り、次いで通路15を通過して薄膜
作成チヤンバ13内に至り、薄膜作成チヤンバ1
3内からは通路16を通過して再び予備室14内
に入り、次いで通路19を通過して再びフイルム
収納室17内に入り、巻取りリール23で巻取り
得るようになつている。
A vacuum exhaust system 20 is connected to the thin film forming chamber 13, preliminary chamber 14, and film storage chamber 17, respectively, to evacuate each chamber 13, 14, and 17, and to evacuate each chamber 13, 14, and 17, respectively. It has a differential pumping configuration to maintain a predetermined degree of vacuum. Inside the film storage chamber 17, there is a flexible film 21 that will serve as a substrate for depositing a thin film.
A delivery reel 22 and a take-up reel 23 are rotatably installed. The film 21 is unwound from the feed reel 22, passes through the passage 18, enters the preliminary chamber 14, then passes through the passage 15, enters the thin film forming chamber 13, and enters the thin film forming chamber 1.
From inside 3, the film passes through a passage 16 and enters the preparatory chamber 14 again, then passes through a passage 19 and enters the film storage chamber 17 again, where it can be wound on a take-up reel 23.

薄膜作成チヤンバ13内には、通路15に近接
して案内ローラ24が、通路16に近接して案内
ローラ25が夫々立設されていると共に、高周波
電極12の外側同軸上に、第4図に示したよう
な、ガイド枠26が設置してあり、このガイド枠
26を介して、薄膜作成チヤンバ13内に導かれ
たフイルム21が、高周波電極12と同軸の円周
上を通過するように通路27が形成されている。
然して予備室14側より通路15を通過して薄膜
作成チヤンバ13内に入つたフイルム21は、薄
膜作成チヤンバ13内において、案内ローラ24
とガイド枠26の間隙を通り、フイルム21の縁
部がガイド枠26に摺接し乍通路に沿つて薄膜作
成チヤンバ13内をほぼ一周する。その後、この
フイルム21は、薄膜作成チヤンバ13内の案内
ローラ25とガイド枠26の間隙を通り、通路1
6を通過して予備室14側へと移動するようにな
つたている。
Inside the thin film forming chamber 13, a guide roller 24 and a guide roller 25 are installed in the vicinity of the passage 15 and 16, respectively. As shown, a guide frame 26 is installed, and a passage is formed so that the film 21 guided into the thin film forming chamber 13 passes through the guide frame 26 on a circumference coaxial with the high-frequency electrode 12. 27 is formed.
The film 21 that has passed through the passage 15 from the preliminary chamber 14 side and entered the thin film forming chamber 13 is moved by the guide roller 24 in the thin film forming chamber 13.
The edge of the film 21 passes through the gap between the guide frame 26 and the guide frame 26, and the edge of the film 21 comes into sliding contact with the guide frame 26, while going around the inside of the thin film forming chamber 13 along the path. Thereafter, this film 21 passes through the gap between the guide roller 25 and the guide frame 26 in the thin film forming chamber 13, and passes through the passage 1.
6 and move toward the preliminary chamber 14 side.

又、第3図において、28は高周波電源、29
はガイド枠26の外側に配置したヒータ、30は
ガス導入系31は予備室14内に設置した予備加
熱ランプを示している。更に、第3図及び第4図
において点線で示された40は、フイルム21に
伴走させるやや剛性のあるフイルムであつて、案
内ローラ24,25、テンシヨン付与ローラ41
に沿い、フイルム21の裏面及びヒータ29の外
周を走る。これは、フイルム21をガイド枠26
に圧着して、フイルム21にしわが発生するのを
防止するものである。従つてフイルム21が充分
な剛性をもつときは省略できる。
In addition, in FIG. 3, 28 is a high frequency power supply, 29
Reference numeral 30 indicates a heater disposed outside the guide frame 26, and reference numeral 30 indicates a gas introduction system 31 which indicates a preheating lamp installed within the preparatory chamber 14. Furthermore, 40 indicated by a dotted line in FIGS. 3 and 4 is a slightly rigid film that is accompanied by the film 21, and includes guide rollers 24, 25, a tension applying roller 41,
It runs along the back surface of the film 21 and the outer periphery of the heater 29. This allows the film 21 to be moved through the guide frame 26.
This prevents wrinkles from forming on the film 21. Therefore, if the film 21 has sufficient rigidity, it can be omitted.

上記のような構成において、各真空排気系2
0,20及び20を駆動させて薄膜作成チヤンバ
13予備室14、及びフイルム収納室17を排気
すると共に、薄膜作成チヤンバ13内にはガス導
入系30を介して所定の反応ガス(例えばSiH4
+H2+B2H6)を導入し、高周波電極12へ高周
波電源28の高周波出力を与えると、高周波電極
12とチヤンバ11の器壁間に反応ガスのプラズ
マが生起されて、高周波電極12の周囲に配され
たフイルム21の表面に所定の薄膜を堆積させる
ことができる。そこで、フイルム収納室17に架
設した送出しリール22および巻取りリール23
を駆動してフイルム21を矢印32の方向へ順次
移動させれば、フイルム21の表面に連続的に薄
膜を堆積させることができる。このときフイルム
21の表面に堆積された薄膜の厚さは、薄膜作成
チヤンバ13内の圧力、高周波電源28により投
入されるパワー、およびフイルム21の移動速度
によつて決まる。
In the above configuration, each vacuum exhaust system 2
0, 20, and 20 are driven to evacuate the preliminary chamber 14 of the thin film forming chamber 13 and the film storage chamber 17, and a predetermined reaction gas (for example, SiH 4
+H 2 +B 2 H 6 ) is introduced and the high-frequency output of the high-frequency power supply 28 is applied to the high-frequency electrode 12 , a reactive gas plasma is generated between the high-frequency electrode 12 and the wall of the chamber 11 , and the plasma around the high-frequency electrode 12 is generated. A predetermined thin film can be deposited on the surface of the film 21 placed on the surface. Therefore, a feed reel 22 and a take-up reel 23 installed in the film storage chamber 17 are
By driving the film 21 to sequentially move the film 21 in the direction of the arrow 32, a thin film can be continuously deposited on the surface of the film 21. The thickness of the thin film deposited on the surface of the film 21 at this time is determined by the pressure inside the thin film forming chamber 13, the power applied by the high frequency power supply 28, and the moving speed of the film 21.

尚、フイルム21は可撓性のものであれば材質
的には制限されず、高分子フイルムや、ステンレ
スその他の金属フイルムを薄膜作成用の基板とす
ることができる。又、予備室14に設置した予備
加熱ランプ31と薄膜作成チヤンバ13内に設置
したヒータ29は、フイルム21に吸蔵されてい
る不純ガスを脱する際に使用されるもので、フイ
ルム21は、予備室14内で予備加熱ランプ31
により予備加熱された後、薄膜作成チヤンバ13
内でヒータ29により本加熱される。
The material of the film 21 is not limited as long as it is flexible, and a polymer film, stainless steel or other metal film can be used as a substrate for forming a thin film. The preheating lamp 31 installed in the preparatory chamber 14 and the heater 29 installed in the thin film forming chamber 13 are used to remove impurity gas occluded in the film 21. Preheating lamp 31 in chamber 14
After being preheated by
Main heating is performed by a heater 29 inside.

予備室14(フイルム収納室17も同様であ
る。)は、真空排気系20を接続して薄膜作成チ
ヤンバ13との間で差動排気構成としたが、要は
通路15,16を通して薄膜作成チヤンバ13内
へ薄膜作成の作業上有害なガス(例えば酸素)が
侵入しなければ良いのであるから、予備室14内
に無害なガスを送り込んで有害なガスを系外へ追
い出すようにしたガスパージ室としても良い。
又、この予備室14は、後に示す実施例のよう
に、薄膜作成チヤンバ13の前段側、即ちフイル
ム供給側と、後段側、即ちフイルム排出側を分離
して別室に構成しても良い。
The preliminary chamber 14 (the same applies to the film storage chamber 17) is connected to the vacuum evacuation system 20 to form a differential pumping configuration between the thin film forming chamber 13, but the point is that the thin film forming chamber is connected to the thin film forming chamber 13 through the passages 15 and 16. Since it is important that harmful gases (for example, oxygen) do not enter into the chamber 13 during the thin film production process, the chamber 14 is used as a gas purge chamber in which a harmless gas is sent into the preliminary chamber 14 and the harmful gas is expelled from the system. Also good.
Further, the preliminary chamber 14 may be configured as separate chambers by separating the front side, ie, the film supply side, and the rear side, ie, the film discharge side, of the thin film forming chamber 13, as in an embodiment shown later.

次に、薄膜作成チヤンバ13内に配置した同軸
型の電極構成についは、第3図に示したものは最
も一般的な構成であるが、高周波電源12の内部
に永久磁石を配置したり、或いは薄膜作成チヤン
バ13の外部にヘルムホルツコイル等の電磁石を
嵌装して、プラズマ生成空間に磁界を作用させ
て、プラズマ密度を制御できるようにしても良
い。前記永久磁石の場合、これを高周波電極12
の軸方向で移動できる駆動機構を付設して、プラ
ズマに作用させる磁界を変化させるようにしても
良い。
Next, regarding the coaxial type electrode configuration arranged inside the thin film forming chamber 13, the one shown in FIG. An electromagnet such as a Helmholtz coil may be fitted outside the thin film forming chamber 13 to apply a magnetic field to the plasma generation space, thereby controlling the plasma density. In the case of the permanent magnet, it is connected to the high frequency electrode 12
A drive mechanism that can be moved in the axial direction may be attached to change the magnetic field that acts on the plasma.

又、第5図に示すように、高周波電極12とフ
イルム21の間に、高周波電極12と同軸で円筒
状のメツシユ50を配置しても良い。このメツシ
ユ50を接地電位に置くことによつて、メツシユ
50の内外をプラズマ空間なる放電空間と膜堆積
空間とに電気的に分離することができ、膜質の向
上並びに生産性の向上が図れる。第5図におい
て、51は絶縁物である。
Further, as shown in FIG. 5, a cylindrical mesh 50 may be disposed between the high-frequency electrode 12 and the film 21 and coaxial with the high-frequency electrode 12. By placing the mesh 50 at ground potential, the inside and outside of the mesh 50 can be electrically separated into a discharge space, which is a plasma space, and a film deposition space, thereby improving film quality and productivity. In FIG. 5, 51 is an insulator.

更にまた、第6図に示す如く、高周波電極12
を、円筒状メツシユで構成しかつその筒の径を大
きくして、接地円筒状メツシユ50に同心円状に
近接配置せしめるときは、電極12,50の狭い
間隙では放電を発生せず、それらの内部52にて
強力な光を伴なう中空陰極放電を発生する。この
場合は、膜堆積空間と放電空間の分離が一層強力
となるほか、膜堆積速度は、強いプラズマ発生と
光化学的活性化作用の参加により更に速度を増
す。しかも膜質は良好である。
Furthermore, as shown in FIG.
is constructed of a cylindrical mesh and the diameter of the cylinder is increased, and when it is placed concentrically close to the grounded cylindrical mesh 50, no discharge occurs in the narrow gap between the electrodes 12 and 50, and the internal At 52, a hollow cathode discharge accompanied by intense light is generated. In this case, the separation between the film deposition space and the discharge space becomes stronger, and the film deposition rate increases further due to the participation of strong plasma generation and photochemical activation. Moreover, the film quality is good.

次にガイド枠26は、第7図に示しように、フ
イルム21の縁部との間で係合するようにするこ
ともできる。即ち、フイルム21の縁部には係合
孔33,33を一定のピツチで穿設すると共に、
ガイド枠26の当接部にはフイルム21の係合孔
33,33と同一ピツチで係合突起34,34を
突設して、係合突起34,34が係合孔33,3
3に順次嵌入掛止するようにしてある。この場
合、ガイド枠26に対しては、これに、フイルム
巻取りの軽い力で容易に回転しうる構造を与える
か、又は送出しリール(第3図)および巻取りリ
ール23(第3図)の周速と同期する駆動装置を
設けて、装置の運転中、ガイド枠26を駆動する
ことは言うまでもない。このように駆動回転され
るガイド枠26を介して、フイルム21の移動通
路を構成した場合、比較的剛性の弱いフイルムで
もしわを生ずることなく搬送できる利点がある。
そしてフイルム21との係合部を構成した円盤3
5,35間には、図示した如く、フイルム21の
内側面に密接するマスク板36を張設しても良
い。このマスク板36は、フイルム21の移動と
周期して周回するから、フイルム21に堆積する
膜に一定のパターンを描かせることが可能とな
る。
Next, the guide frame 26 may be engaged with the edge of the film 21, as shown in FIG. That is, engagement holes 33, 33 are bored at a constant pitch in the edge of the film 21, and
Engagement protrusions 34, 34 are provided protruding from the abutting portion of the guide frame 26 at the same pitch as the engagement holes 33, 33 of the film 21, so that the engagement protrusions 34, 34 fit into the engagement holes 33, 3.
3, it is fitted and latched in sequence. In this case, the guide frame 26 should be provided with a structure that can be easily rotated with a light force of film winding, or the feed reel (FIG. 3) and the take-up reel 23 (FIG. 3) should be provided. Needless to say, a drive device synchronized with the circumferential speed of the guide frame 26 is provided to drive the guide frame 26 during operation of the device. When the moving path for the film 21 is constructed through the guide frame 26 which is driven and rotated in this manner, there is an advantage that even a film having relatively low rigidity can be transported without wrinkles.
A disk 3 constitutes an engaging portion with the film 21.
As shown in the figure, a mask plate 36 may be provided between the film 21 and the film 21 in close contact with the inner surface thereof. Since the mask plate 36 rotates periodically with the movement of the film 21, it is possible to draw a certain pattern on the film deposited on the film 21.

第8図および第9図は、第3図に示した本発明
の実施例の基本型を拡張して、薄膜作成チヤンバ
を複数室連設した実施例である。
FIGS. 8 and 9 show an embodiment in which the basic model of the embodiment of the present invention shown in FIG. 3 is expanded, and a plurality of thin film forming chambers are arranged in series.

第8図を参照すると、3室の薄膜作成チヤンバ
13a,13b,13cが連設されて、その一方
の側にフイルム収納室17aが通路18を介して
配され、他方の側にはフイルム収納室17bが通
路19を介して配されている。又、各室13a,
13b,13cには夫々予備室14a,14b,
14cが通路15a,16a,15b,16b,
15c,16cを介して配されている。可撓性を
有するフイルム21は、フイルム収納室17aの
送出しリール22から繰り出されて、3室の薄膜
作成チヤンバ13a,13b,13c内を順次通
過した後、フイルム収納室17bの巻取りリール
23に巻取られる。然して、フイルム21には三
層の膜を連続して形成させることができる。図中
37a,37bは、フイルム21の表面(膜堆積
面)を保護する為の保護フイルムである。このよ
うに複数の薄膜作成チヤンバを連設する場合、必
ずしも同一薄膜作成方式のみによらず、目的に応
じチヤンバとプラズマCVDとスパツタリングを
使い分けることはもちろんである。
Referring to FIG. 8, three thin film forming chambers 13a, 13b, and 13c are arranged in series, with a film storage chamber 17a disposed on one side via a passage 18, and a film storage chamber 17a on the other side. 17b is arranged via the passage 19. Also, each room 13a,
13b and 13c have preliminary rooms 14a and 14b, respectively.
14c is the passage 15a, 16a, 15b, 16b,
They are arranged via 15c and 16c. The flexible film 21 is unwound from the delivery reel 22 in the film storage chamber 17a, passes through the three thin film forming chambers 13a, 13b, and 13c in sequence, and then transferred to the take-up reel 23 in the film storage chamber 17b. It is wound up. Therefore, three layers can be formed in succession on the film 21. In the figure, 37a and 37b are protective films for protecting the surface (film deposition surface) of the film 21. When a plurality of thin film forming chambers are installed in series like this, it is not necessarily necessary to use the same thin film forming method, but it is of course possible to use chambers, plasma CVD, and sputtering depending on the purpose.

又、第9図を参照すると、3室の薄膜作成チヤ
ンバ13a,13b,13cを連設し、各薄膜作
成チヤンバ13a,13b,13cの前段側と後
段側に別室の予備室14a,14b,14c,1
4dを設けてあり、薄膜作成チヤンバ13aの後
段側の予備室14bが薄膜作成チヤンバ13bの
前段側の予備室も兼ね、同様に薄膜作成チヤンバ
13bの後段側の予備室14cが薄膜作成チヤン
バ13cの前段側の予備室を兼ねている。そして
各薄膜作成チヤンバ13a,13b,13c内に
は、夫々高周波電極12a,12b,12cが水
平に設置されて、水平同軸の電極配置となつてい
る。この装置の場合、フイルム21は、フイルム
収納室17aより予備室14a、薄膜作成チヤン
バ13a、予備室14b、薄膜作成チヤンバ13
b、予備室14c、薄膜作成チヤンバ13c、予
備室14dの順に通過して、フイルム収納室17
bへと移動して、第8図に示した例と同様に三層
膜を連続的に作成することができる。各薄膜作成
チヤンバ13a,13b,13c内では、フイル
ム21に対する通路27a,27b,27cが
180度の角度範囲に亘つて形成されており、フイ
ルム21に対する膜の堆積は下向の状態で行なわ
れる。この実施例のように電極を水平に配置した
場合には、上向状態で膜を堆積すると、膜中に塵
埃の混入等の虞あり、膜の特性を損うので、膜の
堆積を下向で行うように通路27a,27b,2
7cを形成することが望ましい。その角度範囲は
180度以下ということになるが、空間の利用率を
考慮すれば90度〜180度の範囲が好ましいと考え
られる。
Also, referring to FIG. 9, three thin film forming chambers 13a, 13b, 13c are arranged in series, and separate preliminary chambers 14a, 14b, 14c are provided on the front and rear sides of each thin film forming chamber 13a, 13b, 13c. ,1
4d, the preliminary chamber 14b on the rear side of the thin film forming chamber 13a also serves as the preliminary chamber on the previous side of the thin film forming chamber 13b, and similarly the preliminary chamber 14c on the rear side of the thin film forming chamber 13b serves as the preliminary chamber on the preceding side of the thin film forming chamber 13b. It also serves as a spare room on the front stage side. High frequency electrodes 12a, 12b, 12c are horizontally installed in each thin film forming chamber 13a, 13b, 13c, respectively, to form a horizontally coaxial electrode arrangement. In this apparatus, the film 21 is stored in the film storage chamber 17a, the preliminary chamber 14a, the thin film forming chamber 13a, the preliminary chamber 14b, and the thin film forming chamber 13.
b, pass through the preparatory chamber 14c, the thin film forming chamber 13c, and the preparatory chamber 14d in this order, and enter the film storage chamber 17.
Moving to step b, a three-layer film can be successively created in the same manner as the example shown in FIG. In each thin film forming chamber 13a, 13b, 13c, passages 27a, 27b, 27c for the film 21 are provided.
It is formed over an angular range of 180 degrees, and the film is deposited on the film 21 in a downward state. When the electrodes are arranged horizontally as in this example, if the film is deposited upward, there is a risk of dust entering the film, which will impair the properties of the film, so the film should be deposited downward. Passages 27a, 27b, 2
It is desirable to form 7c. Its angular range is
Although the angle is 180 degrees or less, a range of 90 degrees to 180 degrees is considered preferable considering space utilization.

以上、基本型の拡張例について説明したが、上
記以外にも様々な態様で実施できることは言うま
でもない。そしてこれらの実施装置においても、
基本型で説明した各種の変形例を採用することが
できることは勿論である。
Although the example of expanding the basic type has been described above, it goes without saying that it can be implemented in various ways other than the above. And in these implementation devices,
It goes without saying that the various modifications described in the basic model can be employed.

以上に詳述した通り、本発明は、同軸型のプラ
ズマ装置を応用した装置であつて、膜を堆積させ
る基板である可撓性のあるフイルムを、膜堆積空
間に連続的に搬送できる装置であるので、反応ガ
スの使用効率若しくはスパツタリング物利用効率
を高く維持できると共に、可撓性のあるフイルム
に所望の膜を連続的に形成できる効果がある。更
に、薄膜作成チヤンバ内のフイルムに対する通路
を、フイルムの移動速度に同期して駆動されるガ
イド枠を介して構成し、このガイド枠にフイルム
と密接するマスク板を配することによつて、連続
的に形成される膜に一定のパターンを描かせるこ
ともできる効果がある。
As detailed above, the present invention is an apparatus that applies a coaxial plasma apparatus, and is an apparatus that can continuously convey a flexible film, which is a substrate on which a film is deposited, to a film deposition space. Therefore, the reaction gas usage efficiency or the sputtering material usage efficiency can be maintained at a high level, and a desired film can be continuously formed on a flexible film. Furthermore, the passage for the film in the thin film forming chamber is configured via a guide frame that is driven in synchronization with the moving speed of the film, and a mask plate that is in close contact with the film is disposed on this guide frame. It also has the effect of allowing a certain pattern to be drawn on the film that is formed.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は従来装置の一構成例を示した断面図、
第2図は従来装置の他の一構成例を示した断面
図、第3図は本発明による薄膜作成装置の一実施
例の構成を示した平面図、第4図は第3図のガイ
ド枠の一実施例の構造を示した一部破断面図、第
5図は本発明による薄膜作成装置の薄膜作成チヤ
ンバ一実施例の構成を示した概略図、第6図は本
発明による薄膜作成装置の薄膜作成チヤンバの他
の一実施例の構成を示した概略図、第7図は第3
図のガイド枠の他の一実施例の構造を示した一部
破断正面図、第8図は本発明による薄膜作成装置
の他の一実施例の構成を示した平面図、第9図は
本発明による薄膜作成装置の更に他の一実施例の
構成を示した正面図である。 12,12a,12b,12c……高周波電
極、13,13a,13b,13c……薄膜作成
チヤンバ、14,14a,14b,14c,14
d……予備室、15,15a,15b,15c…
…通路、16,16a,16b,16c……通
路、17,17a,17b……フイルム収納室、
18,19……通路、21……フイルム、22…
…送出しリール、23……巻取りリール、26…
…ガイド枠、27,27a,27b,27c……
通路、31……予備加熱ランプ、34……係合突
起、36……マスク板、50……円筒形メツシ
ユ。
FIG. 1 is a sectional view showing an example of the configuration of a conventional device.
FIG. 2 is a sectional view showing another example of the configuration of the conventional device, FIG. 3 is a plan view showing the configuration of an embodiment of the thin film forming device according to the present invention, and FIG. 4 is the guide frame of FIG. 3. FIG. 5 is a schematic view showing the structure of a thin film forming chamber of an embodiment of the thin film forming apparatus according to the present invention; FIG. 6 is a partially cutaway cross-sectional view showing the structure of an embodiment of the thin film forming apparatus according to the present invention. A schematic diagram showing the configuration of another embodiment of the thin film forming chamber, FIG.
FIG. 8 is a partially cutaway front view showing the structure of another embodiment of the guide frame shown in the figure, FIG. 8 is a plan view showing the structure of another embodiment of the thin film forming apparatus according to the present invention, and FIG. FIG. 3 is a front view showing the configuration of still another embodiment of the thin film forming apparatus according to the invention. 12, 12a, 12b, 12c...High frequency electrode, 13, 13a, 13b, 13c...Thin film forming chamber, 14, 14a, 14b, 14c, 14
d...Preliminary room, 15, 15a, 15b, 15c...
...Aisle, 16, 16a, 16b, 16c...Aisle, 17, 17a, 17b...Film storage chamber,
18, 19... passage, 21... film, 22...
...Delivery reel, 23...Take-up reel, 26...
...Guide frame, 27, 27a, 27b, 27c...
Passage, 31... Preheating lamp, 34... Engaging protrusion, 36... Mask plate, 50... Cylindrical mesh.

Claims (1)

【特許請求の範囲】 1 薄膜作成チヤンバに隣接して予備室を連設
し、薄膜作成に有害なガスが前記薄膜作成チヤン
バ内へ混入するのを防止するとともに、前記薄膜
作成チヤンバ内に収容された電極を中心軸をもつ
同軸型に配置し、前記薄膜作成チヤンバ内に被コ
ーテイング物である可撓性基板の通過通路をその
断面形状が前記予備室より前記同軸電極間の空間
内でかつ前記中心軸を中心とした円周上を通つて
再び予備室に至るように形成し、前記同軸型電極
間に生起させたプラズマを利用して前記可撓性基
板上に薄膜を作成する装置において、前記薄膜作
成チヤンバ内の通過通路は、前記可撓性基板の縁
部と摺接もしくは係合し、かつ該可撓性基板の移
動と同期して駆動されるガイド枠を介して形成さ
れていることを特徴とする薄膜作成装置。 2 前記薄膜作成チヤンバは前記同軸型電極間に
生起させたプラズマをとじ込める為の磁石を有し
ている特許請求の範囲第1項記載の薄膜作成装
置。 3 前記磁石が前記同軸型電極の中心電極内部に
配置された永久磁石である特許請求範囲第2項記
載の薄膜作成装置。 4 前記中心電極内部に配置された永久磁石が、
該中心電極の軸方向に移動可能に配置されている
特許請求の範囲第3項記載の薄膜作成装置。 5 前記磁石が前記薄膜作成チヤンバの外側に嵌
装した電磁石である特許請求の範囲第2項記載の
薄膜作成装置。 6 前記薄膜作成チヤンバは、前記同軸型電極間
に生起させたプラズマ空間と前記可撓性基板の通
過通路側の薄膜堆積空間とを電気的に分離する為
の筒状メツシユを有している特許請求の範囲第1
項記載の薄膜作成装置。 7 前記薄膜作成チヤンバの前記同軸型電極が、
内部に中空陰極放電を有し、外部に前記可撓性基
板の薄膜堆積空間を有する様な、同心円状でかつ
筒状メツシユの、高周波電極と該高周波電極に近
接する接地電極とから成る特許請求の範囲第1項
記載の薄膜作成装置。 8 前記可撓性基板の移動と同期して駆動される
ガイド枠が、前記可撓性基板の縁部との係合間に
該可撓性基板の内側面に密接する様に張設された
マスク板を有する特許請求の範囲第1項記載の薄
膜作成装置。 9 前記薄膜作成チヤンバ内の前記通過通路が90
度以上の角度範囲に亘つて形成してある特許請求
の範囲第1項記載の薄膜作成装置。 10 前記薄膜作成チヤンバが複数室連設されて
いる特許請求の範囲第1項記載の薄膜作成装置。
[Scope of Claims] 1. A preliminary chamber is provided adjacent to the thin film forming chamber to prevent gases harmful to thin film forming from entering the thin film forming chamber, and to prevent gases contained in the thin film forming chamber from entering the thin film forming chamber. The electrodes are arranged coaxially with a central axis, and a passage for a flexible substrate to be coated is provided in the thin film forming chamber so that its cross-sectional shape extends from the preparatory chamber to within the space between the coaxial electrodes and In an apparatus for forming a thin film on the flexible substrate using plasma generated between the coaxial electrodes, which is formed so as to pass through a circumference around a central axis and reach the preparatory chamber again, The passageway in the thin film forming chamber is formed via a guide frame that slides or engages with the edge of the flexible substrate and is driven in synchronization with the movement of the flexible substrate. A thin film forming device characterized by the following. 2. The thin film forming apparatus according to claim 1, wherein the thin film forming chamber has a magnet for trapping the plasma generated between the coaxial electrodes. 3. The thin film forming apparatus according to claim 2, wherein the magnet is a permanent magnet placed inside the center electrode of the coaxial electrode. 4. A permanent magnet disposed inside the center electrode,
4. The thin film forming apparatus according to claim 3, wherein the thin film forming apparatus is disposed so as to be movable in the axial direction of the center electrode. 5. The thin film forming apparatus according to claim 2, wherein the magnet is an electromagnet fitted outside the thin film forming chamber. 6 Patent that the thin film forming chamber has a cylindrical mesh for electrically separating the plasma space generated between the coaxial electrodes and the thin film deposition space on the passage side of the flexible substrate. Claim 1
The thin film forming apparatus described in . 7 The coaxial type electrode of the thin film forming chamber is
A patent claim consisting of a concentric circular cylindrical mesh high-frequency electrode and a ground electrode adjacent to the high-frequency electrode, the mesh having a hollow cathode discharge inside and a thin film deposition space for the flexible substrate outside. The thin film forming apparatus according to item 1. 8. A mask in which a guide frame driven in synchronization with the movement of the flexible substrate is stretched so as to be in close contact with the inner surface of the flexible substrate while engaging with the edge of the flexible substrate. A thin film forming apparatus according to claim 1, comprising a plate. 9 The passageway in the thin film forming chamber is 90
2. The thin film forming apparatus according to claim 1, wherein the thin film is formed over an angular range of 1° or more. 10. The thin film forming apparatus according to claim 1, wherein a plurality of the thin film forming chambers are arranged in series.
JP17520283A 1983-09-24 1983-09-24 Thin film forming apparatus Granted JPS6067671A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17520283A JPS6067671A (en) 1983-09-24 1983-09-24 Thin film forming apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17520283A JPS6067671A (en) 1983-09-24 1983-09-24 Thin film forming apparatus

Publications (2)

Publication Number Publication Date
JPS6067671A JPS6067671A (en) 1985-04-18
JPH02431B2 true JPH02431B2 (en) 1990-01-08

Family

ID=15992075

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17520283A Granted JPS6067671A (en) 1983-09-24 1983-09-24 Thin film forming apparatus

Country Status (1)

Country Link
JP (1) JPS6067671A (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3675270D1 (en) * 1985-05-21 1990-12-06 Toyoda Gosei Kk SPRAYER.
JPS61266572A (en) * 1985-05-21 1986-11-26 Toyoda Gosei Co Ltd Sputtering device
JPH0220211Y2 (en) * 1985-09-19 1990-06-01
JPH0230444Y2 (en) * 1985-09-28 1990-08-16
JPH07100857B2 (en) * 1985-10-09 1995-11-01 株式会社日立製作所 Carbon film forming method and apparatus
JPH0782959B2 (en) * 1993-06-14 1995-09-06 株式会社半導体エネルギー研究所 Method for producing magnetic member coated with carbon film
JP2008150677A (en) * 2006-12-19 2008-07-03 Miyako Roller Industry Co Continuous coating method to film and continuous coating device
JP5736857B2 (en) * 2011-03-09 2015-06-17 凸版印刷株式会社 Deposition equipment

Also Published As

Publication number Publication date
JPS6067671A (en) 1985-04-18

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