JPH0241435U - - Google Patents

Info

Publication number
JPH0241435U
JPH0241435U JP1988120565U JP12056588U JPH0241435U JP H0241435 U JPH0241435 U JP H0241435U JP 1988120565 U JP1988120565 U JP 1988120565U JP 12056588 U JP12056588 U JP 12056588U JP H0241435 U JPH0241435 U JP H0241435U
Authority
JP
Japan
Prior art keywords
wafer
stage
prober
wafer prober
vacuum
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1988120565U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1988120565U priority Critical patent/JPH0241435U/ja
Publication of JPH0241435U publication Critical patent/JPH0241435U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP1988120565U 1988-09-14 1988-09-14 Pending JPH0241435U (enExample)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1988120565U JPH0241435U (enExample) 1988-09-14 1988-09-14

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1988120565U JPH0241435U (enExample) 1988-09-14 1988-09-14

Publications (1)

Publication Number Publication Date
JPH0241435U true JPH0241435U (enExample) 1990-03-22

Family

ID=31366789

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1988120565U Pending JPH0241435U (enExample) 1988-09-14 1988-09-14

Country Status (1)

Country Link
JP (1) JPH0241435U (enExample)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04105290U (ja) * 1991-02-15 1992-09-10 大阪瓦斯株式会社 管継手
JP2005156317A (ja) * 2003-11-25 2005-06-16 Sony Corp 電子部品測定装置及び電子部品測定方法
JP2017220484A (ja) * 2016-06-03 2017-12-14 日本特殊陶業株式会社 真空吸着装置

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04105290U (ja) * 1991-02-15 1992-09-10 大阪瓦斯株式会社 管継手
JP2005156317A (ja) * 2003-11-25 2005-06-16 Sony Corp 電子部品測定装置及び電子部品測定方法
JP2017220484A (ja) * 2016-06-03 2017-12-14 日本特殊陶業株式会社 真空吸着装置

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