JPH0241175U - - Google Patents
Info
- Publication number
- JPH0241175U JPH0241175U JP12068088U JP12068088U JPH0241175U JP H0241175 U JPH0241175 U JP H0241175U JP 12068088 U JP12068088 U JP 12068088U JP 12068088 U JP12068088 U JP 12068088U JP H0241175 U JPH0241175 U JP H0241175U
- Authority
- JP
- Japan
- Prior art keywords
- coil
- magnetic field
- inspected
- voltage signal
- turns
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims description 4
- 230000004907 flux Effects 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Description
第1図は、本考案の一実施例に従うコイルの巻
数検査装置を示す全体図である。第2図は、本考
案の一実施例に従うコイルの巻数検査装置が有し
ている増幅器及び警報器の回路構成図である。第
3図は、本考案の他の実施例に従うコイルの巻数
検査装置を示す全体図である。第4図イは、本考
案に従う検査対象物たるコイル組立体を示した斜
視図である。第4図ロは、本考案に従う検査対象
物たるコイル組立体を示した縦断面図である。第
5図は、従来技術に従うコイル組立体の巻数検査
に使用される投影機の全体斜視図である。
1……磁石支持機構、3……回転機構、19…
…巻数下限値側基準コイル、21……検査対象物
たるコイル、25,31……差動増幅回路、35
……巻数上限値側基準コイル。
FIG. 1 is an overall view showing a coil turns inspection device according to an embodiment of the present invention. FIG. 2 is a circuit diagram of an amplifier and an alarm included in a coil turns inspection device according to an embodiment of the present invention. FIG. 3 is an overall view showing a coil turns inspection device according to another embodiment of the present invention. FIG. 4A is a perspective view showing a coil assembly as an object to be inspected according to the present invention. FIG. 4B is a longitudinal sectional view showing a coil assembly as an object to be inspected according to the present invention. FIG. 5 is an overall perspective view of a projector used for testing the number of turns of a coil assembly according to the prior art. 1... Magnet support mechanism, 3... Rotating mechanism, 19...
...Reference coil on the lower limit value side of the number of turns, 21...Coil to be inspected, 25, 31...Differential amplifier circuit, 35
...Reference coil on the upper limit value side of the number of turns.
Claims (1)
た磁界中を、検査対象物たるコイルと基準コイル
とを保持して前記各々のコイルが前記磁界を形成
している磁束と鎖交するように前記各々のコイル
を移動せしめるコイル保持手段と、前記コイル保
持手段によつて前記磁界中を移動している前記検
査対象物たるコイルから出力される電圧信号と前
記磁界中を移動している前記基準コイルから出力
される電圧信号とを比較演算することによつて前
記検査対象物たるコイルの巻数を検査する比較手
段とを有することを特徴とするコイルの巻数検査
装置。 a magnetic field generating means, and holding a coil serving as an object to be inspected and a reference coil in the magnetic field generated from the magnetic field generating means, so that each of the coils interlinks with the magnetic flux forming the magnetic field. a voltage signal output from the coil, which is the object to be inspected, which is moved in the magnetic field by the coil holding means; and a voltage signal output from the reference coil which is moved in the magnetic field. 1. A coil turns inspection device, comprising: comparison means for inspecting the turns of the coil, which is the object to be inspected, by performing a comparison operation with an output voltage signal.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12068088U JPH0241175U (en) | 1988-09-14 | 1988-09-14 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP12068088U JPH0241175U (en) | 1988-09-14 | 1988-09-14 |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0241175U true JPH0241175U (en) | 1990-03-22 |
Family
ID=31367003
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP12068088U Pending JPH0241175U (en) | 1988-09-14 | 1988-09-14 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0241175U (en) |
-
1988
- 1988-09-14 JP JP12068088U patent/JPH0241175U/ja active Pending
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