JPH01131181U - - Google Patents

Info

Publication number
JPH01131181U
JPH01131181U JP2787988U JP2787988U JPH01131181U JP H01131181 U JPH01131181 U JP H01131181U JP 2787988 U JP2787988 U JP 2787988U JP 2787988 U JP2787988 U JP 2787988U JP H01131181 U JPH01131181 U JP H01131181U
Authority
JP
Japan
Prior art keywords
bobbin member
epstein test
hollow part
epstein
test frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP2787988U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP2787988U priority Critical patent/JPH01131181U/ja
Publication of JPH01131181U publication Critical patent/JPH01131181U/ja
Pending legal-status Critical Current

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  • Measuring Magnetic Variables (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の実施例を示す構成図、第2図
は本考案主要部の具体的な実施例を示す構成図、
第3図は空隙補償演算器の実施例を示す回路構成
図、第4図は本考案の補償精度を説明するための
比較特性図、第5図、第6図は、従来技術による
エプスタイン測定装置の例を示す構成図である。 1……支持台、2A,2B,2C,2D……ボ
ビン部材、3,4……端子、6A,6B,6C,
6D……空隙補償コイル。
FIG. 1 is a block diagram showing an embodiment of the present invention, FIG. 2 is a block diagram showing a specific embodiment of the main part of the present invention,
Fig. 3 is a circuit configuration diagram showing an embodiment of the air gap compensation calculator, Fig. 4 is a comparative characteristic diagram for explaining the compensation accuracy of the present invention, and Figs. 5 and 6 are Epstein measuring devices according to the prior art. FIG. 2 is a configuration diagram showing an example. 1... Support stand, 2A, 2B, 2C, 2D... Bobbin member, 3, 4... Terminal, 6A, 6B, 6C,
6D...Air gap compensation coil.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] エプスタイン試験サンプルをその中空部内に挿
入するための開口部を両端に有するボビン部材と
、このボビン部材の両端部に形成されたフランジ
部材とよりなる枠材を複数個組み合わせて構成さ
れたエプスタイン試験枠において、上記ボビン部
材の一部又は全部の中空部内に空隙補償コイルを
配置したことを特徴とするエプスタイン試験枠。
An Epstein test frame constructed by combining a plurality of frame members each consisting of a bobbin member having openings at both ends for inserting the Epstein test sample into its hollow part, and flange members formed at both ends of the bobbin member. An Epstein test frame characterized in that a gap compensation coil is disposed within a part or all of the hollow part of the bobbin member.
JP2787988U 1988-03-02 1988-03-02 Pending JPH01131181U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP2787988U JPH01131181U (en) 1988-03-02 1988-03-02

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2787988U JPH01131181U (en) 1988-03-02 1988-03-02

Publications (1)

Publication Number Publication Date
JPH01131181U true JPH01131181U (en) 1989-09-06

Family

ID=31250762

Family Applications (1)

Application Number Title Priority Date Filing Date
JP2787988U Pending JPH01131181U (en) 1988-03-02 1988-03-02

Country Status (1)

Country Link
JP (1) JPH01131181U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018146335A (en) * 2017-03-03 2018-09-20 新日鐵住金株式会社 Device, system, and method for measuring magnetic characteristics

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2018146335A (en) * 2017-03-03 2018-09-20 新日鐵住金株式会社 Device, system, and method for measuring magnetic characteristics

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