JPS60106162U - Eddy current flaw detection equipment - Google Patents

Eddy current flaw detection equipment

Info

Publication number
JPS60106162U
JPS60106162U JP19977183U JP19977183U JPS60106162U JP S60106162 U JPS60106162 U JP S60106162U JP 19977183 U JP19977183 U JP 19977183U JP 19977183 U JP19977183 U JP 19977183U JP S60106162 U JPS60106162 U JP S60106162U
Authority
JP
Japan
Prior art keywords
eddy current
flaw detection
current flaw
detection equipment
coil
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP19977183U
Other languages
Japanese (ja)
Inventor
順次郎 山崎
林部 昭治
Original Assignee
川崎製鉄株式会社
原電子測器株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 川崎製鉄株式会社, 原電子測器株式会社 filed Critical 川崎製鉄株式会社
Priority to JP19977183U priority Critical patent/JPS60106162U/en
Publication of JPS60106162U publication Critical patent/JPS60106162U/en
Pending legal-status Critical Current

Links

Abstract

(57)【要約】本公報は電子出願前の出願データであるた
め要約のデータは記録されません。
(57) [Summary] This bulletin contains application data before electronic filing, so abstract data is not recorded.

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は差動型コイルによる表面疵の測定原理の説明図
、第2図は本考の一つの実施例に係る渦流探傷装置の斜
視図、第3図はそのプロー/の斜親図、第4図は表面疵
長さとS/N比との関係を示すグラフ、第5図はプロー
ブコイル検出有効中とS/N比の関係を示すグラフ、第
6図はプローブコイル配列の一例を示す斜視図、第7図
は本考案に係る装置が組込まれたローラテーブルめ一例
の正面図である。 符号1・・・・・・プローブ、2・・・・・・プローブ
コイルζ10・・・・・・角ビレット、11・・・・・
・テーブルローラ、12・・・・・・底板、13・・・
・・・プローブ、14’a、14b・・・・・・プロー
ブコイル、15・・・・・・表面疵、16・・・・・・
交流電源、17・・・・・・可変抵抗、18・・・・・
・テーブルローラ、19・・・・・・渦流探傷装置、2
0・・・・・・エアーシリンダ。
Fig. 1 is an explanatory diagram of the principle of measuring surface flaws using a differential coil, Fig. 2 is a perspective view of an eddy current flaw detection device according to one embodiment of this study, and Fig. 3 is a perspective view of its probe. Figure 4 is a graph showing the relationship between surface flaw length and S/N ratio, Figure 5 is a graph showing the relationship between probe coil detection being enabled and S/N ratio, and Figure 6 is an example of probe coil arrangement. The perspective view and FIG. 7 are front views of an example of a roller table incorporating the device according to the present invention. Code 1...Probe, 2...Probe coil ζ10...Square billet, 11...
・Table roller, 12...Bottom plate, 13...
...Probe, 14'a, 14b...Probe coil, 15...Surface flaw, 16...
AC power supply, 17... Variable resistance, 18...
・Table roller, 19... Eddy current flaw detection device, 2
0...Air cylinder.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] コイル間隔がビレットの長手方向にある疵の長さの11
5〜1/加倍のコイル間隔において巻回された2つのコ
イルを具える差動型の角型プローブをビレット等の長手
方向に直交する方向に並べ、しかも、ビレット等の長手
方向において隣接プローブ間で各コイルがコイル巾の1
/2〜1/3倍程度ラップされるよう、配置されて成る
ことを特徴とする渦流探傷装置。
11 of the length of the flaw where the coil spacing is in the longitudinal direction of the billet
Differential square probes each having two coils wound at a coil spacing of 5 to 1/multiply are arranged in a direction perpendicular to the longitudinal direction of the billet, etc. and each coil is 1 of the coil width
An eddy current flaw detection device characterized in that the eddy current flaw detection device is arranged so as to be lapped by a factor of approximately 1/2 to 1/3.
JP19977183U 1983-12-23 1983-12-23 Eddy current flaw detection equipment Pending JPS60106162U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19977183U JPS60106162U (en) 1983-12-23 1983-12-23 Eddy current flaw detection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19977183U JPS60106162U (en) 1983-12-23 1983-12-23 Eddy current flaw detection equipment

Publications (1)

Publication Number Publication Date
JPS60106162U true JPS60106162U (en) 1985-07-19

Family

ID=30760001

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19977183U Pending JPS60106162U (en) 1983-12-23 1983-12-23 Eddy current flaw detection equipment

Country Status (1)

Country Link
JP (1) JPS60106162U (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007026506A1 (en) * 2005-08-31 2007-03-08 Nidec Sankyo Corporation Magnetic sensor device, method for manufacturing magnetic sensor device and sheet discriminating device
JP2007064839A (en) * 2005-08-31 2007-03-15 Nidec Sankyo Corp Magnetic sensor device, method of manufacturing magnetic sensor device, and paper sheet discrimination device
JP2007064840A (en) * 2005-08-31 2007-03-15 Nidec Sankyo Corp Magnetic sensor device and paper sheet discrimination device
JP2011191326A (en) * 2011-07-08 2011-09-29 Jfe Steel Corp Method for detecting surface defect on plate using vortex sensor

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2007026506A1 (en) * 2005-08-31 2007-03-08 Nidec Sankyo Corporation Magnetic sensor device, method for manufacturing magnetic sensor device and sheet discriminating device
JP2007064839A (en) * 2005-08-31 2007-03-15 Nidec Sankyo Corp Magnetic sensor device, method of manufacturing magnetic sensor device, and paper sheet discrimination device
JP2007064840A (en) * 2005-08-31 2007-03-15 Nidec Sankyo Corp Magnetic sensor device and paper sheet discrimination device
JP4758182B2 (en) * 2005-08-31 2011-08-24 日本電産サンキョー株式会社 Magnetic sensor device, method of manufacturing magnetic sensor device, and paper sheet identification device
JP2011191326A (en) * 2011-07-08 2011-09-29 Jfe Steel Corp Method for detecting surface defect on plate using vortex sensor

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