JPH0239157A - Developer for photosensitive planographic printing plate - Google Patents
Developer for photosensitive planographic printing plateInfo
- Publication number
- JPH0239157A JPH0239157A JP19030088A JP19030088A JPH0239157A JP H0239157 A JPH0239157 A JP H0239157A JP 19030088 A JP19030088 A JP 19030088A JP 19030088 A JP19030088 A JP 19030088A JP H0239157 A JPH0239157 A JP H0239157A
- Authority
- JP
- Japan
- Prior art keywords
- developer
- acid
- developing
- ethylene oxide
- photosensitive
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- IAYPIBMASNFSPL-UHFFFAOYSA-N Ethylene oxide Chemical compound C1CO1 IAYPIBMASNFSPL-UHFFFAOYSA-N 0.000 claims abstract description 16
- 239000002253 acid Substances 0.000 claims abstract description 11
- 229910052910 alkali metal silicate Inorganic materials 0.000 claims abstract description 8
- LFQSCWFLJHTTHZ-UHFFFAOYSA-N Ethanol Chemical compound CCO LFQSCWFLJHTTHZ-UHFFFAOYSA-N 0.000 claims abstract description 5
- 229910052783 alkali metal Inorganic materials 0.000 claims abstract description 4
- 150000001340 alkali metals Chemical class 0.000 claims abstract description 4
- 150000001875 compounds Chemical class 0.000 claims description 18
- 150000004760 silicates Chemical class 0.000 claims description 2
- LSNNMFCWUKXFEE-UHFFFAOYSA-M Bisulfite Chemical compound OS([O-])=O LSNNMFCWUKXFEE-UHFFFAOYSA-M 0.000 abstract description 7
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 abstract description 5
- 238000009833 condensation Methods 0.000 abstract description 5
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract description 4
- 238000005187 foaming Methods 0.000 abstract description 3
- 239000000463 material Substances 0.000 abstract description 3
- 235000012239 silicon dioxide Nutrition 0.000 abstract description 3
- 229910052681 coesite Inorganic materials 0.000 abstract description 2
- 229910052906 cristobalite Inorganic materials 0.000 abstract description 2
- 125000002887 hydroxy group Chemical group [H]O* 0.000 abstract description 2
- 239000000377 silicon dioxide Substances 0.000 abstract description 2
- 229910052682 stishovite Inorganic materials 0.000 abstract description 2
- BDHFUVZGWQCTTF-UHFFFAOYSA-M sulfonate Chemical compound [O-]S(=O)=O BDHFUVZGWQCTTF-UHFFFAOYSA-M 0.000 abstract description 2
- 229910052905 tridymite Inorganic materials 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 17
- 229920005989 resin Polymers 0.000 description 16
- 239000011347 resin Substances 0.000 description 16
- 239000000243 solution Substances 0.000 description 14
- 229910052782 aluminium Inorganic materials 0.000 description 13
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 13
- -1 aluminum Chemical class 0.000 description 11
- 239000007864 aqueous solution Substances 0.000 description 11
- 239000004115 Sodium Silicate Substances 0.000 description 10
- NTHWMYGWWRZVTN-UHFFFAOYSA-N sodium silicate Chemical compound [Na+].[Na+].[O-][Si]([O-])=O NTHWMYGWWRZVTN-UHFFFAOYSA-N 0.000 description 10
- 229910052911 sodium silicate Inorganic materials 0.000 description 10
- HEMHJVSKTPXQMS-UHFFFAOYSA-M Sodium hydroxide Chemical compound [OH-].[Na+] HEMHJVSKTPXQMS-UHFFFAOYSA-M 0.000 description 9
- KKCBUQHMOMHUOY-UHFFFAOYSA-N sodium oxide Chemical compound [O-2].[Na+].[Na+] KKCBUQHMOMHUOY-UHFFFAOYSA-N 0.000 description 8
- 238000011282 treatment Methods 0.000 description 8
- 239000000203 mixture Substances 0.000 description 7
- WSFSSNUMVMOOMR-UHFFFAOYSA-N Formaldehyde Chemical compound O=C WSFSSNUMVMOOMR-UHFFFAOYSA-N 0.000 description 6
- 239000004111 Potassium silicate Substances 0.000 description 6
- 238000005530 etching Methods 0.000 description 6
- NNHHDJVEYQHLHG-UHFFFAOYSA-N potassium silicate Chemical compound [K+].[K+].[O-][Si]([O-])=O NNHHDJVEYQHLHG-UHFFFAOYSA-N 0.000 description 6
- 229910052913 potassium silicate Inorganic materials 0.000 description 6
- 235000019353 potassium silicate Nutrition 0.000 description 6
- 229920001577 copolymer Polymers 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 239000002699 waste material Substances 0.000 description 5
- CSCPPACGZOOCGX-UHFFFAOYSA-N Acetone Chemical compound CC(C)=O CSCPPACGZOOCGX-UHFFFAOYSA-N 0.000 description 4
- WVDDGKGOMKODPV-UHFFFAOYSA-N Benzyl alcohol Chemical compound OCC1=CC=CC=C1 WVDDGKGOMKODPV-UHFFFAOYSA-N 0.000 description 4
- AMQJEAYHLZJPGS-UHFFFAOYSA-N N-Pentanol Chemical compound CCCCCO AMQJEAYHLZJPGS-UHFFFAOYSA-N 0.000 description 4
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 description 4
- 239000003513 alkali Substances 0.000 description 4
- 230000005494 condensation Effects 0.000 description 4
- QNVRIHYSUZMSGM-UHFFFAOYSA-N hexan-2-ol Chemical compound CCCCC(C)O QNVRIHYSUZMSGM-UHFFFAOYSA-N 0.000 description 4
- 239000007788 liquid Substances 0.000 description 4
- 229920003986 novolac Polymers 0.000 description 4
- WQGWDDDVZFFDIG-UHFFFAOYSA-N pyrogallol Chemical compound OC1=CC=CC(O)=C1O WQGWDDDVZFFDIG-UHFFFAOYSA-N 0.000 description 4
- ZWEHNKRNPOVVGH-UHFFFAOYSA-N 2-Butanone Chemical compound CCC(C)=O ZWEHNKRNPOVVGH-UHFFFAOYSA-N 0.000 description 3
- MUBZPKHOEPUJKR-UHFFFAOYSA-N Oxalic acid Chemical compound OC(=O)C(O)=O MUBZPKHOEPUJKR-UHFFFAOYSA-N 0.000 description 3
- 238000006243 chemical reaction Methods 0.000 description 3
- 230000007423 decrease Effects 0.000 description 3
- FUZZWVXGSFPDMH-UHFFFAOYSA-N hexanoic acid Chemical compound CCCCCC(O)=O FUZZWVXGSFPDMH-UHFFFAOYSA-N 0.000 description 3
- 229910052751 metal Inorganic materials 0.000 description 3
- 239000002184 metal Substances 0.000 description 3
- 150000002739 metals Chemical class 0.000 description 3
- 239000003960 organic solvent Substances 0.000 description 3
- WQEPLUUGTLDZJY-UHFFFAOYSA-N pentadecanoic acid Chemical compound CCCCCCCCCCCCCCC(O)=O WQEPLUUGTLDZJY-UHFFFAOYSA-N 0.000 description 3
- 229920001568 phenolic resin Polymers 0.000 description 3
- 239000005011 phenolic resin Substances 0.000 description 3
- 150000003839 salts Chemical class 0.000 description 3
- LIVNPJMFVYWSIS-UHFFFAOYSA-N silicon monoxide Chemical compound [Si-]#[O+] LIVNPJMFVYWSIS-UHFFFAOYSA-N 0.000 description 3
- 235000011121 sodium hydroxide Nutrition 0.000 description 3
- NQPDZGIKBAWPEJ-UHFFFAOYSA-N valeric acid Chemical compound CCCCC(O)=O NQPDZGIKBAWPEJ-UHFFFAOYSA-N 0.000 description 3
- DNIAPMSPPWPWGF-GSVOUGTGSA-N (R)-(-)-Propylene glycol Chemical compound C[C@@H](O)CO DNIAPMSPPWPWGF-GSVOUGTGSA-N 0.000 description 2
- RWLALWYNXFYRGW-UHFFFAOYSA-N 2-Ethyl-1,3-hexanediol Chemical compound CCCC(O)C(CC)CO RWLALWYNXFYRGW-UHFFFAOYSA-N 0.000 description 2
- YIWUKEYIRIRTPP-UHFFFAOYSA-N 2-ethylhexan-1-ol Chemical compound CCCCC(CC)CO YIWUKEYIRIRTPP-UHFFFAOYSA-N 0.000 description 2
- XLLIQLLCWZCATF-UHFFFAOYSA-N 2-methoxyethyl acetate Chemical compound COCCOC(C)=O XLLIQLLCWZCATF-UHFFFAOYSA-N 0.000 description 2
- SVTBMSDMJJWYQN-UHFFFAOYSA-N 2-methylpentane-2,4-diol Chemical compound CC(O)CC(C)(C)O SVTBMSDMJJWYQN-UHFFFAOYSA-N 0.000 description 2
- QTWJRLJHJPIABL-UHFFFAOYSA-N 2-methylphenol;3-methylphenol;4-methylphenol Chemical compound CC1=CC=C(O)C=C1.CC1=CC=CC(O)=C1.CC1=CC=CC=C1O QTWJRLJHJPIABL-UHFFFAOYSA-N 0.000 description 2
- JWAZRIHNYRIHIV-UHFFFAOYSA-N 2-naphthol Chemical compound C1=CC=CC2=CC(O)=CC=C21 JWAZRIHNYRIHIV-UHFFFAOYSA-N 0.000 description 2
- CURLTUGMZLYLDI-UHFFFAOYSA-N Carbon dioxide Chemical compound O=C=O CURLTUGMZLYLDI-UHFFFAOYSA-N 0.000 description 2
- BPQQTUXANYXVAA-UHFFFAOYSA-N Orthosilicate Chemical compound [O-][Si]([O-])([O-])[O-] BPQQTUXANYXVAA-UHFFFAOYSA-N 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- GOOHAUXETOMSMM-UHFFFAOYSA-N Propylene oxide Chemical compound CC1CO1 GOOHAUXETOMSMM-UHFFFAOYSA-N 0.000 description 2
- 125000000217 alkyl group Chemical group 0.000 description 2
- 150000001408 amides Chemical class 0.000 description 2
- 239000002280 amphoteric surfactant Substances 0.000 description 2
- 239000003945 anionic surfactant Substances 0.000 description 2
- QUKGYYKBILRGFE-UHFFFAOYSA-N benzyl acetate Chemical compound CC(=O)OCC1=CC=CC=C1 QUKGYYKBILRGFE-UHFFFAOYSA-N 0.000 description 2
- 125000004432 carbon atom Chemical group C* 0.000 description 2
- 150000001733 carboxylic acid esters Chemical class 0.000 description 2
- NEHMKBQYUWJMIP-UHFFFAOYSA-N chloromethane Chemical compound ClC NEHMKBQYUWJMIP-UHFFFAOYSA-N 0.000 description 2
- 229930003836 cresol Natural products 0.000 description 2
- 239000013078 crystal Substances 0.000 description 2
- JHIVVAPYMSGYDF-UHFFFAOYSA-N cyclohexanone Chemical compound O=C1CCCCC1 JHIVVAPYMSGYDF-UHFFFAOYSA-N 0.000 description 2
- MWKFXSUHUHTGQN-UHFFFAOYSA-N decan-1-ol Chemical compound CCCCCCCCCCO MWKFXSUHUHTGQN-UHFFFAOYSA-N 0.000 description 2
- GHVNFZFCNZKVNT-UHFFFAOYSA-N decanoic acid Chemical compound CCCCCCCCCC(O)=O GHVNFZFCNZKVNT-UHFFFAOYSA-N 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- POULHZVOKOAJMA-UHFFFAOYSA-N dodecanoic acid Chemical compound CCCCCCCCCCCC(O)=O POULHZVOKOAJMA-UHFFFAOYSA-N 0.000 description 2
- 238000010828 elution Methods 0.000 description 2
- 150000002148 esters Chemical class 0.000 description 2
- 229960005082 etohexadiol Drugs 0.000 description 2
- GOQYKNQRPGWPLP-UHFFFAOYSA-N heptadecan-1-ol Chemical compound CCCCCCCCCCCCCCCCCO GOQYKNQRPGWPLP-UHFFFAOYSA-N 0.000 description 2
- KEMQGTRYUADPNZ-UHFFFAOYSA-N heptadecanoic acid Chemical compound CCCCCCCCCCCCCCCCC(O)=O KEMQGTRYUADPNZ-UHFFFAOYSA-N 0.000 description 2
- MNWFXJYAOYHMED-UHFFFAOYSA-N heptanoic acid Chemical compound CCCCCCC(O)=O MNWFXJYAOYHMED-UHFFFAOYSA-N 0.000 description 2
- IPCSVZSSVZVIGE-UHFFFAOYSA-N hexadecanoic acid Chemical compound CCCCCCCCCCCCCCCC(O)=O IPCSVZSSVZVIGE-UHFFFAOYSA-N 0.000 description 2
- ZSIAUFGUXNUGDI-UHFFFAOYSA-N hexan-1-ol Chemical compound CCCCCCO ZSIAUFGUXNUGDI-UHFFFAOYSA-N 0.000 description 2
- 230000005660 hydrophilic surface Effects 0.000 description 2
- PHTQWCKDNZKARW-UHFFFAOYSA-N isoamylol Chemical compound CC(C)CCO PHTQWCKDNZKARW-UHFFFAOYSA-N 0.000 description 2
- KWGKDLIKAYFUFQ-UHFFFAOYSA-M lithium chloride Chemical compound [Li+].[Cl-] KWGKDLIKAYFUFQ-UHFFFAOYSA-M 0.000 description 2
- 229910001507 metal halide Inorganic materials 0.000 description 2
- 150000005309 metal halides Chemical class 0.000 description 2
- 239000000178 monomer Substances 0.000 description 2
- ZWRUINPWMLAQRD-UHFFFAOYSA-N nonan-1-ol Chemical compound CCCCCCCCCO ZWRUINPWMLAQRD-UHFFFAOYSA-N 0.000 description 2
- FBUKVWPVBMHYJY-UHFFFAOYSA-N nonanoic acid Chemical compound CCCCCCCCC(O)=O FBUKVWPVBMHYJY-UHFFFAOYSA-N 0.000 description 2
- WWZKQHOCKIZLMA-UHFFFAOYSA-N octanoic acid Chemical compound CCCCCCCC(O)=O WWZKQHOCKIZLMA-UHFFFAOYSA-N 0.000 description 2
- AQIXEPGDORPWBJ-UHFFFAOYSA-N pentan-3-ol Chemical compound CCC(O)CC AQIXEPGDORPWBJ-UHFFFAOYSA-N 0.000 description 2
- 230000000737 periodic effect Effects 0.000 description 2
- WVDDGKGOMKODPV-ZQBYOMGUSA-N phenyl(114C)methanol Chemical compound O[14CH2]C1=CC=CC=C1 WVDDGKGOMKODPV-ZQBYOMGUSA-N 0.000 description 2
- 229920000642 polymer Polymers 0.000 description 2
- 239000002244 precipitate Substances 0.000 description 2
- 239000000047 product Substances 0.000 description 2
- BDERNNFJNOPAEC-UHFFFAOYSA-N propan-1-ol Chemical compound CCCO BDERNNFJNOPAEC-UHFFFAOYSA-N 0.000 description 2
- YPFDHNVEDLHUCE-UHFFFAOYSA-N propane-1,3-diol Chemical compound OCCCO YPFDHNVEDLHUCE-UHFFFAOYSA-N 0.000 description 2
- 229940079877 pyrogallol Drugs 0.000 description 2
- 229910052708 sodium Inorganic materials 0.000 description 2
- 239000011734 sodium Substances 0.000 description 2
- 239000001488 sodium phosphate Substances 0.000 description 2
- 235000019794 sodium silicate Nutrition 0.000 description 2
- GEHJYWRUCIMESM-UHFFFAOYSA-L sodium sulfite Chemical compound [Na+].[Na+].[O-]S([O-])=O GEHJYWRUCIMESM-UHFFFAOYSA-L 0.000 description 2
- 230000000087 stabilizing effect Effects 0.000 description 2
- 125000000542 sulfonic acid group Chemical group 0.000 description 2
- SZHOJFHSIKHZHA-UHFFFAOYSA-N tridecanoic acid Chemical compound CCCCCCCCCCCCC(O)=O SZHOJFHSIKHZHA-UHFFFAOYSA-N 0.000 description 2
- RYFMWSXOAZQYPI-UHFFFAOYSA-K trisodium phosphate Chemical compound [Na+].[Na+].[Na+].[O-]P([O-])([O-])=O RYFMWSXOAZQYPI-UHFFFAOYSA-K 0.000 description 2
- ZDPHROOEEOARMN-UHFFFAOYSA-N undecanoic acid Chemical compound CCCCCCCCCCC(O)=O ZDPHROOEEOARMN-UHFFFAOYSA-N 0.000 description 2
- WSLDOOZREJYCGB-UHFFFAOYSA-N 1,2-Dichloroethane Chemical compound ClCCCl WSLDOOZREJYCGB-UHFFFAOYSA-N 0.000 description 1
- FKASFBLJDCHBNZ-UHFFFAOYSA-N 1,3,4-oxadiazole Chemical compound C1=NN=CO1 FKASFBLJDCHBNZ-UHFFFAOYSA-N 0.000 description 1
- PQUXFUBNSYCQAL-UHFFFAOYSA-N 1-(2,3-difluorophenyl)ethanone Chemical compound CC(=O)C1=CC=CC(F)=C1F PQUXFUBNSYCQAL-UHFFFAOYSA-N 0.000 description 1
- KBPLFHHGFOOTCA-UHFFFAOYSA-N 1-Octanol Chemical compound CCCCCCCCO KBPLFHHGFOOTCA-UHFFFAOYSA-N 0.000 description 1
- XFRVVPUIAFSTFO-UHFFFAOYSA-N 1-Tridecanol Chemical compound CCCCCCCCCCCCCO XFRVVPUIAFSTFO-UHFFFAOYSA-N 0.000 description 1
- WAPNOHKVXSQRPX-UHFFFAOYSA-N 1-phenylethanol Chemical compound CC(O)C1=CC=CC=C1 WAPNOHKVXSQRPX-UHFFFAOYSA-N 0.000 description 1
- LXOFYPKXCSULTL-UHFFFAOYSA-N 2,4,7,9-tetramethyldec-5-yne-4,7-diol Chemical compound CC(C)CC(C)(O)C#CC(C)(O)CC(C)C LXOFYPKXCSULTL-UHFFFAOYSA-N 0.000 description 1
- POAOYUHQDCAZBD-UHFFFAOYSA-N 2-butoxyethanol Chemical compound CCCCOCCO POAOYUHQDCAZBD-UHFFFAOYSA-N 0.000 description 1
- HMWIHOZPGQRZLR-UHFFFAOYSA-N 2-hexadecylphenol Chemical compound CCCCCCCCCCCCCCCCC1=CC=CC=C1O HMWIHOZPGQRZLR-UHFFFAOYSA-N 0.000 description 1
- ZRUOTKQBVMWMDK-UHFFFAOYSA-N 2-hydroxy-6-methylbenzaldehyde Chemical compound CC1=CC=CC(O)=C1C=O ZRUOTKQBVMWMDK-UHFFFAOYSA-N 0.000 description 1
- QCDWFXQBSFUVSP-UHFFFAOYSA-N 2-phenoxyethanol Chemical compound OCCOC1=CC=CC=C1 QCDWFXQBSFUVSP-UHFFFAOYSA-N 0.000 description 1
- CUZKCNWZBXLAJX-UHFFFAOYSA-N 2-phenylmethoxyethanol Chemical compound OCCOCC1=CC=CC=C1 CUZKCNWZBXLAJX-UHFFFAOYSA-N 0.000 description 1
- LBBOQIHGWMYDPM-UHFFFAOYSA-N 2-tert-butylphenol;formaldehyde Chemical compound O=C.CC(C)(C)C1=CC=CC=C1O LBBOQIHGWMYDPM-UHFFFAOYSA-N 0.000 description 1
- BODRLKRKPXBDBN-UHFFFAOYSA-N 3,5,5-Trimethyl-1-hexanol Chemical compound OCCC(C)CC(C)(C)C BODRLKRKPXBDBN-UHFFFAOYSA-N 0.000 description 1
- PSVMSUCXHVHEEE-UHFFFAOYSA-N 3-ethylundecan-6-ol Chemical compound CCCCCC(O)CCC(CC)CC PSVMSUCXHVHEEE-UHFFFAOYSA-N 0.000 description 1
- ZRYCRPNCXLQHPN-UHFFFAOYSA-N 3-hydroxy-2-methylbenzaldehyde Chemical compound CC1=C(O)C=CC=C1C=O ZRYCRPNCXLQHPN-UHFFFAOYSA-N 0.000 description 1
- GDEHXPCZWFXRKC-UHFFFAOYSA-N 4-(2-methylpropyl)phenol Chemical compound CC(C)CC1=CC=C(O)C=C1 GDEHXPCZWFXRKC-UHFFFAOYSA-N 0.000 description 1
- FUGYGGDSWSUORM-UHFFFAOYSA-N 4-hydroxystyrene Chemical compound OC1=CC=C(C=C)C=C1 FUGYGGDSWSUORM-UHFFFAOYSA-N 0.000 description 1
- WYXKGYXADPUOOM-UHFFFAOYSA-N 5-ethylnonan-2-ol Chemical compound CCCCC(CC)CCC(C)O WYXKGYXADPUOOM-UHFFFAOYSA-N 0.000 description 1
- JKKBSZCOVNFRCQ-UHFFFAOYSA-N 7-ethyl-2-methylundecan-4-ol Chemical compound CCCCC(CC)CCC(O)CC(C)C JKKBSZCOVNFRCQ-UHFFFAOYSA-N 0.000 description 1
- QTBSBXVTEAMEQO-UHFFFAOYSA-N Acetic acid Chemical compound CC(O)=O QTBSBXVTEAMEQO-UHFFFAOYSA-N 0.000 description 1
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 1
- QGZKDVFQNNGYKY-UHFFFAOYSA-O Ammonium Chemical compound [NH4+] QGZKDVFQNNGYKY-UHFFFAOYSA-O 0.000 description 1
- DKPFZGUDAPQIHT-UHFFFAOYSA-N Butyl acetate Natural products CCCCOC(C)=O DKPFZGUDAPQIHT-UHFFFAOYSA-N 0.000 description 1
- MRABAEUHTLLEML-UHFFFAOYSA-N Butyl lactate Chemical compound CCCCOC(=O)C(C)O MRABAEUHTLLEML-UHFFFAOYSA-N 0.000 description 1
- ISBWNEKJSSLXOD-UHFFFAOYSA-N Butyl levulinate Chemical compound CCCCOC(=O)CCC(C)=O ISBWNEKJSSLXOD-UHFFFAOYSA-N 0.000 description 1
- 239000005632 Capric acid (CAS 334-48-5) Substances 0.000 description 1
- 239000005635 Caprylic acid (CAS 124-07-2) Substances 0.000 description 1
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- KCXVZYZYPLLWCC-UHFFFAOYSA-N EDTA Chemical compound OC(=O)CN(CC(O)=O)CCN(CC(O)=O)CC(O)=O KCXVZYZYPLLWCC-UHFFFAOYSA-N 0.000 description 1
- 239000005977 Ethylene Substances 0.000 description 1
- DGAQECJNVWCQMB-PUAWFVPOSA-M Ilexoside XXIX Chemical compound C[C@@H]1CC[C@@]2(CC[C@@]3(C(=CC[C@H]4[C@]3(CC[C@@H]5[C@@]4(CC[C@@H](C5(C)C)OS(=O)(=O)[O-])C)C)[C@@H]2[C@]1(C)O)C)C(=O)O[C@H]6[C@@H]([C@H]([C@@H]([C@H](O6)CO)O)O)O.[Na+] DGAQECJNVWCQMB-PUAWFVPOSA-M 0.000 description 1
- XUJNEKJLAYXESH-REOHCLBHSA-N L-Cysteine Chemical compound SC[C@H](N)C(O)=O XUJNEKJLAYXESH-REOHCLBHSA-N 0.000 description 1
- 239000005639 Lauric acid Substances 0.000 description 1
- NTIZESTWPVYFNL-UHFFFAOYSA-N Methyl isobutyl ketone Chemical compound CC(C)CC(C)=O NTIZESTWPVYFNL-UHFFFAOYSA-N 0.000 description 1
- UIHCLUNTQKBZGK-UHFFFAOYSA-N Methyl isobutyl ketone Natural products CCC(C)C(C)=O UIHCLUNTQKBZGK-UHFFFAOYSA-N 0.000 description 1
- VVQNEPGJFQJSBK-UHFFFAOYSA-N Methyl methacrylate Chemical compound COC(=O)C(C)=C VVQNEPGJFQJSBK-UHFFFAOYSA-N 0.000 description 1
- GRYLNZFGIOXLOG-UHFFFAOYSA-N Nitric acid Chemical compound O[N+]([O-])=O GRYLNZFGIOXLOG-UHFFFAOYSA-N 0.000 description 1
- 239000004677 Nylon Substances 0.000 description 1
- CTQNGGLPUBDAKN-UHFFFAOYSA-N O-Xylene Chemical compound CC1=CC=CC=C1C CTQNGGLPUBDAKN-UHFFFAOYSA-N 0.000 description 1
- 229910019142 PO4 Inorganic materials 0.000 description 1
- 235000021314 Palmitic acid Nutrition 0.000 description 1
- 239000005643 Pelargonic acid Substances 0.000 description 1
- ISWSIDIOOBJBQZ-UHFFFAOYSA-N Phenol Chemical compound OC1=CC=CC=C1 ISWSIDIOOBJBQZ-UHFFFAOYSA-N 0.000 description 1
- LGRFSURHDFAFJT-UHFFFAOYSA-N Phthalic anhydride Natural products C1=CC=C2C(=O)OC(=O)C2=C1 LGRFSURHDFAFJT-UHFFFAOYSA-N 0.000 description 1
- 239000004288 Sodium dehydroacetate Substances 0.000 description 1
- 235000021355 Stearic acid Nutrition 0.000 description 1
- DKGAVHZHDRPRBM-UHFFFAOYSA-N Tert-Butanol Chemical compound CC(C)(C)O DKGAVHZHDRPRBM-UHFFFAOYSA-N 0.000 description 1
- 235000010724 Wisteria floribunda Nutrition 0.000 description 1
- ZOIORXHNWRGPMV-UHFFFAOYSA-N acetic acid;zinc Chemical compound [Zn].CC(O)=O.CC(O)=O ZOIORXHNWRGPMV-UHFFFAOYSA-N 0.000 description 1
- 150000007513 acids Chemical class 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 150000001298 alcohols Chemical class 0.000 description 1
- 229910000272 alkali metal oxide Inorganic materials 0.000 description 1
- XPNGNIFUDRPBFJ-UHFFFAOYSA-N alpha-methylbenzylalcohol Natural products CC1=CC=CC=C1CO XPNGNIFUDRPBFJ-UHFFFAOYSA-N 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 229940072049 amyl acetate Drugs 0.000 description 1
- PGMYKACGEOXYJE-UHFFFAOYSA-N anhydrous amyl acetate Natural products CCCCCOC(C)=O PGMYKACGEOXYJE-UHFFFAOYSA-N 0.000 description 1
- 125000000129 anionic group Chemical group 0.000 description 1
- 238000002048 anodisation reaction Methods 0.000 description 1
- 238000007743 anodising Methods 0.000 description 1
- 150000004945 aromatic hydrocarbons Chemical class 0.000 description 1
- 125000003118 aryl group Chemical group 0.000 description 1
- 229940007550 benzyl acetate Drugs 0.000 description 1
- 235000019445 benzyl alcohol Nutrition 0.000 description 1
- XFOZBWSTIQRFQW-UHFFFAOYSA-M benzyl-dimethyl-prop-2-enylazanium;chloride Chemical compound [Cl-].C=CC[N+](C)(C)CC1=CC=CC=C1 XFOZBWSTIQRFQW-UHFFFAOYSA-M 0.000 description 1
- 229950011260 betanaphthol Drugs 0.000 description 1
- YXVFYQXJAXKLAK-UHFFFAOYSA-N biphenyl-4-ol Chemical compound C1=CC(O)=CC=C1C1=CC=CC=C1 YXVFYQXJAXKLAK-UHFFFAOYSA-N 0.000 description 1
- KGBXLFKZBHKPEV-UHFFFAOYSA-N boric acid Chemical compound OB(O)O KGBXLFKZBHKPEV-UHFFFAOYSA-N 0.000 description 1
- 239000004327 boric acid Substances 0.000 description 1
- BTANRVKWQNVYAZ-UHFFFAOYSA-N butan-2-ol Chemical compound CCC(C)O BTANRVKWQNVYAZ-UHFFFAOYSA-N 0.000 description 1
- CDQSJQSWAWPGKG-UHFFFAOYSA-N butane-1,1-diol Chemical compound CCCC(O)O CDQSJQSWAWPGKG-UHFFFAOYSA-N 0.000 description 1
- 239000001191 butyl (2R)-2-hydroxypropanoate Substances 0.000 description 1
- JHIWVOJDXOSYLW-UHFFFAOYSA-N butyl 2,2-difluorocyclopropane-1-carboxylate Chemical compound CCCCOC(=O)C1CC1(F)F JHIWVOJDXOSYLW-UHFFFAOYSA-N 0.000 description 1
- 229940043232 butyl acetate Drugs 0.000 description 1
- HJZGNWSIJASHMX-UHFFFAOYSA-N butyl acetate;ethane-1,2-diol Chemical compound OCCO.CCCCOC(C)=O HJZGNWSIJASHMX-UHFFFAOYSA-N 0.000 description 1
- 229940005460 butyl levulinate Drugs 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000001569 carbon dioxide Substances 0.000 description 1
- 229910002092 carbon dioxide Inorganic materials 0.000 description 1
- 125000003178 carboxy group Chemical group [H]OC(*)=O 0.000 description 1
- 229920006317 cationic polymer Polymers 0.000 description 1
- 239000002738 chelating agent Substances 0.000 description 1
- 238000003486 chemical etching Methods 0.000 description 1
- MVPPADPHJFYWMZ-UHFFFAOYSA-N chlorobenzene Chemical compound ClC1=CC=CC=C1 MVPPADPHJFYWMZ-UHFFFAOYSA-N 0.000 description 1
- KRVSOGSZCMJSLX-UHFFFAOYSA-L chromic acid Substances O[Cr](O)(=O)=O KRVSOGSZCMJSLX-UHFFFAOYSA-L 0.000 description 1
- 239000011248 coating agent Substances 0.000 description 1
- 238000000576 coating method Methods 0.000 description 1
- 230000000052 comparative effect Effects 0.000 description 1
- 239000000306 component Substances 0.000 description 1
- HPXRVTGHNJAIIH-UHFFFAOYSA-N cyclohexanol Chemical compound OC1CCCCC1 HPXRVTGHNJAIIH-UHFFFAOYSA-N 0.000 description 1
- XUJNEKJLAYXESH-UHFFFAOYSA-N cysteine Natural products SCC(N)C(O)=O XUJNEKJLAYXESH-UHFFFAOYSA-N 0.000 description 1
- 235000018417 cysteine Nutrition 0.000 description 1
- 238000013480 data collection Methods 0.000 description 1
- 239000000645 desinfectant Substances 0.000 description 1
- 125000000664 diazo group Chemical group [N-]=[N+]=[*] 0.000 description 1
- BJZIJOLEWHWTJO-UHFFFAOYSA-H dipotassium;hexafluorozirconium(2-) Chemical compound [F-].[F-].[F-].[F-].[F-].[F-].[K+].[K+].[Zr+4] BJZIJOLEWHWTJO-UHFFFAOYSA-H 0.000 description 1
- FZFYOUJTOSBFPQ-UHFFFAOYSA-M dipotassium;hydroxide Chemical compound [OH-].[K+].[K+] FZFYOUJTOSBFPQ-UHFFFAOYSA-M 0.000 description 1
- 239000000975 dye Substances 0.000 description 1
- 238000004070 electrodeposition Methods 0.000 description 1
- 238000005868 electrolysis reaction Methods 0.000 description 1
- 239000003792 electrolyte Substances 0.000 description 1
- 239000006260 foam Substances 0.000 description 1
- VOOLKNUJNPZAHE-UHFFFAOYSA-N formaldehyde;2-methylphenol Chemical compound O=C.CC1=CC=CC=C1O VOOLKNUJNPZAHE-UHFFFAOYSA-N 0.000 description 1
- SLGWESQGEUXWJQ-UHFFFAOYSA-N formaldehyde;phenol Chemical compound O=C.OC1=CC=CC=C1 SLGWESQGEUXWJQ-UHFFFAOYSA-N 0.000 description 1
- AWJWCTOOIBYHON-UHFFFAOYSA-N furo[3,4-b]pyrazine-5,7-dione Chemical compound C1=CN=C2C(=O)OC(=O)C2=N1 AWJWCTOOIBYHON-UHFFFAOYSA-N 0.000 description 1
- 150000008282 halocarbons Chemical class 0.000 description 1
- NGAZZOYFWWSOGK-UHFFFAOYSA-N heptan-3-one Chemical compound CCCCC(=O)CC NGAZZOYFWWSOGK-UHFFFAOYSA-N 0.000 description 1
- MNWFXJYAOYHMED-UHFFFAOYSA-M heptanoate Chemical compound CCCCCCC([O-])=O MNWFXJYAOYHMED-UHFFFAOYSA-M 0.000 description 1
- 229940051250 hexylene glycol Drugs 0.000 description 1
- 229920001519 homopolymer Polymers 0.000 description 1
- 150000001261 hydroxy acids Chemical class 0.000 description 1
- 150000002440 hydroxy compounds Chemical class 0.000 description 1
- 238000007654 immersion Methods 0.000 description 1
- 150000002576 ketones Chemical class 0.000 description 1
- 229940031993 lithium benzoate Drugs 0.000 description 1
- 150000002642 lithium compounds Chemical class 0.000 description 1
- PAZHGORSDKKUPI-UHFFFAOYSA-N lithium metasilicate Chemical compound [Li+].[Li+].[O-][Si]([O-])=O PAZHGORSDKKUPI-UHFFFAOYSA-N 0.000 description 1
- 229910052912 lithium silicate Inorganic materials 0.000 description 1
- LDJNSLOKTFFLSL-UHFFFAOYSA-M lithium;benzoate Chemical compound [Li+].[O-]C(=O)C1=CC=CC=C1 LDJNSLOKTFFLSL-UHFFFAOYSA-M 0.000 description 1
- QSHDDOUJBYECFT-UHFFFAOYSA-N mercury Chemical compound [Hg] QSHDDOUJBYECFT-UHFFFAOYSA-N 0.000 description 1
- 229910052753 mercury Inorganic materials 0.000 description 1
- 229920003145 methacrylic acid copolymer Polymers 0.000 description 1
- 229940117841 methacrylic acid copolymer Drugs 0.000 description 1
- 229940050176 methyl chloride Drugs 0.000 description 1
- 125000000325 methylidene group Chemical group [H]C([H])=* 0.000 description 1
- 150000007522 mineralic acids Chemical class 0.000 description 1
- LNOPIUAQISRISI-UHFFFAOYSA-N n'-hydroxy-2-propan-2-ylsulfonylethanimidamide Chemical compound CC(C)S(=O)(=O)CC(N)=NO LNOPIUAQISRISI-UHFFFAOYSA-N 0.000 description 1
- YKYONYBAUNKHLG-UHFFFAOYSA-N n-Propyl acetate Natural products CCCOC(C)=O YKYONYBAUNKHLG-UHFFFAOYSA-N 0.000 description 1
- 230000007935 neutral effect Effects 0.000 description 1
- 238000006386 neutralization reaction Methods 0.000 description 1
- 230000003472 neutralizing effect Effects 0.000 description 1
- 229910017604 nitric acid Inorganic materials 0.000 description 1
- 239000002736 nonionic surfactant Substances 0.000 description 1
- 229920001778 nylon Polymers 0.000 description 1
- QIQXTHQIDYTFRH-UHFFFAOYSA-N octadecanoic acid Chemical compound CCCCCCCCCCCCCCCCCC(O)=O QIQXTHQIDYTFRH-UHFFFAOYSA-N 0.000 description 1
- OQCDKBAXFALNLD-UHFFFAOYSA-N octadecanoic acid Natural products CCCCCCCC(C)CCCCCCCCC(O)=O OQCDKBAXFALNLD-UHFFFAOYSA-N 0.000 description 1
- 229960002446 octanoic acid Drugs 0.000 description 1
- 150000007524 organic acids Chemical class 0.000 description 1
- 150000002900 organolithium compounds Chemical class 0.000 description 1
- 235000006408 oxalic acid Nutrition 0.000 description 1
- HWGNBUXHKFFFIH-UHFFFAOYSA-I pentasodium;[oxido(phosphonatooxy)phosphoryl] phosphate Chemical compound [Na+].[Na+].[Na+].[Na+].[Na+].[O-]P([O-])(=O)OP([O-])(=O)OP([O-])([O-])=O HWGNBUXHKFFFIH-UHFFFAOYSA-I 0.000 description 1
- 150000002989 phenols Chemical group 0.000 description 1
- 229960005323 phenoxyethanol Drugs 0.000 description 1
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 description 1
- 239000010452 phosphate Substances 0.000 description 1
- 238000001259 photo etching Methods 0.000 description 1
- 229920002120 photoresistant polymer Polymers 0.000 description 1
- 239000002985 plastic film Substances 0.000 description 1
- 229920006255 plastic film Polymers 0.000 description 1
- 239000004014 plasticizer Substances 0.000 description 1
- 229920000728 polyester Polymers 0.000 description 1
- 239000005518 polymer electrolyte Substances 0.000 description 1
- 229920005749 polyurethane resin Polymers 0.000 description 1
- 238000003672 processing method Methods 0.000 description 1
- 229940090181 propyl acetate Drugs 0.000 description 1
- 150000003242 quaternary ammonium salts Chemical class 0.000 description 1
- 238000007789 sealing Methods 0.000 description 1
- RMAQACBXLXPBSY-UHFFFAOYSA-N silicic acid Chemical compound O[Si](O)(O)O RMAQACBXLXPBSY-UHFFFAOYSA-N 0.000 description 1
- 229910052814 silicon oxide Inorganic materials 0.000 description 1
- 229940047670 sodium acrylate Drugs 0.000 description 1
- 229940079839 sodium dehydroacetate Drugs 0.000 description 1
- 235000019259 sodium dehydroacetate Nutrition 0.000 description 1
- 229910000162 sodium phosphate Inorganic materials 0.000 description 1
- 235000011008 sodium phosphates Nutrition 0.000 description 1
- 235000010265 sodium sulphite Nutrition 0.000 description 1
- 235000019832 sodium triphosphate Nutrition 0.000 description 1
- DSOWAKKSGYUMTF-GZOLSCHFSA-M sodium;(1e)-1-(6-methyl-2,4-dioxopyran-3-ylidene)ethanolate Chemical compound [Na+].C\C([O-])=C1/C(=O)OC(C)=CC1=O DSOWAKKSGYUMTF-GZOLSCHFSA-M 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 239000008117 stearic acid Substances 0.000 description 1
- 150000003459 sulfonic acid esters Chemical class 0.000 description 1
- 238000004381 surface treatment Methods 0.000 description 1
- 239000004094 surface-active agent Substances 0.000 description 1
- 125000005207 tetraalkylammonium group Chemical group 0.000 description 1
- TUNFSRHWOTWDNC-HKGQFRNVSA-N tetradecanoic acid Chemical compound CCCCCCCCCCCCC[14C](O)=O TUNFSRHWOTWDNC-HKGQFRNVSA-N 0.000 description 1
- UVZICZIVKIMRNE-UHFFFAOYSA-N thiodiacetic acid Chemical compound OC(=O)CSCC(O)=O UVZICZIVKIMRNE-UHFFFAOYSA-N 0.000 description 1
- 150000003568 thioethers Chemical class 0.000 description 1
- NBOMNTLFRHMDEZ-UHFFFAOYSA-N thiosalicylic acid Chemical compound OC(=O)C1=CC=CC=C1S NBOMNTLFRHMDEZ-UHFFFAOYSA-N 0.000 description 1
- 229940103494 thiosalicylic acid Drugs 0.000 description 1
- JOXIMZWYDAKGHI-UHFFFAOYSA-M toluene-4-sulfonate Chemical compound CC1=CC=C(S([O-])(=O)=O)C=C1 JOXIMZWYDAKGHI-UHFFFAOYSA-M 0.000 description 1
- 229910000406 trisodium phosphate Inorganic materials 0.000 description 1
- 235000019801 trisodium phosphate Nutrition 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- KJIOQYGWTQBHNH-UHFFFAOYSA-N undecanol Chemical compound CCCCCCCCCCCO KJIOQYGWTQBHNH-UHFFFAOYSA-N 0.000 description 1
- 229940005605 valeric acid Drugs 0.000 description 1
- 125000000391 vinyl group Chemical group [H]C([*])=C([H])[H] 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
- 229910052724 xenon Inorganic materials 0.000 description 1
- FHNFHKCVQCLJFQ-UHFFFAOYSA-N xenon atom Chemical compound [Xe] FHNFHKCVQCLJFQ-UHFFFAOYSA-N 0.000 description 1
- 239000008096 xylene Substances 0.000 description 1
- 239000004246 zinc acetate Substances 0.000 description 1
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は0−キノンジアジド化合物を感光性成分とする
感光性平版印刷版の現像液に関するものである。DETAILED DESCRIPTION OF THE INVENTION [Industrial Field of Application] The present invention relates to a developer for a photosensitive lithographic printing plate containing an 0-quinonediazide compound as a photosensitive component.
0−キノンジアジド化合物は活性光線の照射によりジア
ゾ基が分解し、カルボキシル基を有する化合物となるこ
とが知られている。従って0−キノンジアジド化合物を
含む感光層は、画像露光後にアルカリ性現像液により処
理されると露光部分が除去され未露光部が画像となるの
で、所謂ポジポジ型感光性成分として特に近年感光性平
版印刷版の感光層あるいはエツチング用フォトレジスト
組成物として極めて重用されている。特に〇−キノンジ
アジド化合物にアルカリ可溶性樹脂を混合した組成物が
経済性、実用性の点から有利に使用され、中でもノボラ
ック型のフェノールホルムアルデヒド縮合樹脂、又はク
レゾールホルムアルデヒド縮合樹脂と混合されたものが
一般に用いられている。これら0−キノンジアジド感光
層の自動現像機用現像液としては第三燐酸ソーダ、苛性
ソーダ、珪酸ソーダ、珪酸カリウム、珪酸アンモニウム
等の単独あるいは混合された水溶液が用いられている。It is known that the diazo group of an 0-quinonediazide compound is decomposed by irradiation with actinic rays, resulting in a compound having a carboxyl group. Therefore, when a photosensitive layer containing an 0-quinonediazide compound is treated with an alkaline developer after image exposure, the exposed area is removed and the unexposed area becomes an image. It is extremely important as a photosensitive layer or a photoresist composition for etching. In particular, a composition in which an alkali-soluble resin is mixed with an 〇-quinonediazide compound is advantageously used from the point of view of economy and practicality, and among these, a composition in which it is mixed with a novolac type phenol formaldehyde condensation resin or a cresol formaldehyde condensation resin is generally used. It is being As developing solutions for automatic processing machines for these 0-quinonediazide photosensitive layers, aqueous solutions of sodium phosphate, caustic soda, sodium silicate, potassium silicate, ammonium silicate, etc., alone or in combination, are used.
しかし苛性ソーダ、第三燐酸ソーダ水溶液などはアルミ
ニウムなどの金属へのエツチング作用が強く現像時間が
長くなるような場合には金属支持体を使用した感光[生
平版印刷版の現像液としては不都合である。また現像結
果が極めて変動し易く甚だしい場合は、現像時間のわず
かの超過て画像が欠落してしまうことがあった。また反
復使用による現像能力の低下が激しく一定容量における
感光性平版印刷版の処理可能な量(処理能力)は非常に
少ない。そこで近年珪酸ソーダ水溶液又は珪酸カリウム
水溶液が比較的有利に使用されている。それは金属に対
するエツチング作用が弱いことと同時に珪酸ソーダ又は
珪酸カリウムの成分である酸化珪素(SiCh)と酸化
ナトリウム(Na2O)又は酸化カリウム(K2O)の
含有比率(一般に3102/Na2O又はSiO2/に
2Oのモル比で表わす)と濃度によっである程度現像性
の調整が可能とされるためである。すなわち5102が
多くなるに従い現像力が抑制され現像安定性が高まり、
Na2O又はに2Oが多くなると現像力が高まり現像安
定性が低下する。ここで云う現像安定性とは、現像時間
に対する画像の安定性のことでNa2O又はに2Oのみ
が多くなると短時間で画像の欠落が起り易くなる。However, caustic soda, trisodium phosphate aqueous solutions, etc. have a strong etching effect on metals such as aluminum, and if the development time becomes long, it is difficult to use them as a developing solution for lithographic printing plates. . Furthermore, the development results are extremely variable and in severe cases, images may be missing due to a slight excess of the development time. In addition, the developing ability is severely reduced by repeated use, and the processable amount (processing capacity) of a photosensitive lithographic printing plate at a given capacity is extremely small. Therefore, in recent years, a sodium silicate aqueous solution or a potassium silicate aqueous solution has been used relatively advantageously. It has a weak etching effect on metals, and at the same time the content ratio of silicon oxide (SiCh) and sodium oxide (Na2O) or potassium oxide (K2O), which are the components of sodium silicate or potassium silicate (generally 3102/Na2O or SiO2/ to 2O). This is because it is possible to adjust the developability to some extent by adjusting the molar ratio (expressed in molar ratio) and concentration. In other words, as the amount of 5102 increases, the developing power is suppressed and the development stability increases,
When Na2O or Na2O increases, the developing power increases and the development stability decreases. The development stability referred to here refers to the stability of the image with respect to the development time, and if the amount of Na2O or only Na2O is increased, the image is likely to be lost in a short period of time.
一定容量での処理能力はNa、 O又はに2O含有量の
高い方が良い。従ってS+02/Na2O比又は5i0
2/に2O比を現像力、現像安定性の面で調整しながら
全濃度を高めていくことによっである程度の現像力、安
定性と共に処理能力を得ることができる。しかし乍ら、
いずれの点をも満たすには不充分で現像力を基準におけ
ば安定性に欠け、安定性に基準をおけば現像力、処理能
力に欠ける傾向があった。又−船釣な自動現像機にはス
プレ一方式で現像液を供給して現像をするため空気中に
含まれている炭酸ガスによってアルカリ分が中和され処
理能力が劣化しやすい。そのために比較的高濃度とする
ため沈澱が生成し易く、使用後の廃液処理に際し中和用
の酸の使用量が多くなるなど欠点があった。以上述べた
苛性ソーダ、第三燐酸ソーダ、珪酸ソーダ、珪酸カリウ
ム等の現像液の問題点を要約すればアルカリ強度を高め
れば現像力、処理能力に秀れるが現像安定性に欠け、現
像安定性を得るた必にはアルカリ濃度を低くしなければ
ならず、従って処理能力に欠けることになる。従ってア
ルカリ強度の高い状態で現像安定性を得ることができれ
ば現像力、処理能力いずれにも秀れた現像液を得ること
ができる。The higher the Na, O, or 2O content, the better the treatment capacity at a given capacity. Therefore, S+02/Na2O ratio or 5i0
By increasing the total density while adjusting the 2/2O ratio in terms of developing power and development stability, it is possible to obtain a certain degree of developing power and stability as well as throughput. However,
It was insufficient to meet all of the requirements, and if developing power was taken as a standard, it lacked stability, and if stability was taken as a standard, it tended to be lacking in developing power and processing ability. Furthermore, since automatic developing machines operated by boat carry out development by supplying developing solution using a spray method, the alkaline content is likely to be neutralized by carbon dioxide gas contained in the air, resulting in a deterioration in processing capacity. Therefore, since the concentration is relatively high, precipitates are likely to form, and there are drawbacks such as a large amount of neutralizing acid being used when treating waste liquid after use. To summarize the problems with developing solutions such as caustic soda, sodium triphosphate, sodium silicate, and potassium silicate mentioned above, increasing the alkaline strength will improve developing power and processing ability, but they will lack development stability. In order to obtain this, the alkali concentration must be low, resulting in a lack of throughput. Therefore, if development stability can be obtained in a state of high alkaline strength, a developer excellent in both developing power and processing ability can be obtained.
アルカリ強度の高い状態で現像安定性を得る方法として
現像液にアニオン界面活性剤又は両性界面活性剤を添加
する方法が特開昭50−51324号公報に、また水溶
性力チオニックポリマーを添加する方法が特開昭55−
95946号公報に、水溶性の両性高分子電解質を添加
する方法が特開昭56−142528号公報に記載され
ている。JP-A-50-51324 discloses a method of adding an anionic surfactant or an amphoteric surfactant to the developer as a method of obtaining development stability in a state of high alkaline strength, and a method of adding a water-soluble thionic polymer. The method is JP-A-55-
95946, and JP-A-56-142528 describes a method of adding a water-soluble amphoteric polymer electrolyte.
しかしこれらの現像液はいずれも自動現像機を用いて現
像すると現像途中で発泡するという欠点を有していた。However, all of these developers have the disadvantage that they foam during development when developed using an automatic processor.
また特開昭55−25100号公報には周期率表I[A
、IIIAおよびII[Bの遷移元素のイオン性化合物
を添加することが記載されている。Furthermore, in Japanese Patent Application Laid-open No. 55-25100, periodic table I [A
, IIIA and II[B are described.
この場合陽極酸化したアルミニウム支持体の強アルカリ
によるエツチングを抑える効果はあるが、現像安定性は
十分でなかった。In this case, although there was an effect of suppressing etching of the anodized aluminum support due to strong alkali, the development stability was not sufficient.
従って本発明の目的は、長期間にわたり現像安定性、現
像処理能力にすぐれ、かつ発泡I生が低い、特に自動現
像機に使用するのに適した現像液を提供することである
。Therefore, an object of the present invention is to provide a developer which has excellent development stability and processing ability over a long period of time, and has low foaming I, and is particularly suitable for use in automatic processors.
本発明の他の目的は、上記現像液を用い、インキ着肉性
にすぐれた平版印刷版を与えることができる現像方法を
提供することである。Another object of the present invention is to provide a developing method that uses the above-mentioned developer and can provide a lithographic printing plate with excellent ink receptivity.
上記目的は、SiO□/M2O (Mはアルカリ金属を
示す)の比が0.6〜2.0の珪酸アルカリ金属塩と、
酸又はアルコールに4モル以上のエチレンオキシドを付
加して得られる水溶性エチレンオキシド付加化合物とを
含有することを特徴とする特許−キノンジアジド化合物
含有感光層を有する感光性平版印刷版の現像液により達
成された。The above purpose is to use an alkali metal silicate salt having a SiO□/M2O (M represents an alkali metal) ratio of 0.6 to 2.0;
A patent characterized by containing a water-soluble ethylene oxide adduct compound obtained by adding 4 moles or more of ethylene oxide to an acid or alcohol - achieved by a developer for a photosensitive lithographic printing plate having a photosensitive layer containing a quinonediazide compound .
本発明に用いられる珪酸アルカリとしては珪酸ナトリウ
ム、珪酸カリウム、珪酸リチウムがあり、単独又は組合
せて用いることが出来る。珪酸アルカリのSiO□/M
2Oモル比(Mはアルカリ金属をあられす。)は0.6
〜2.0が好ましく、0.8〜1.5が特に好ましい。The alkali silicate used in the present invention includes sodium silicate, potassium silicate, and lithium silicate, which can be used alone or in combination. Alkali silicate SiO□/M
2O molar ratio (M stands for alkali metal) is 0.6
-2.0 is preferable, and 0.8-1.5 is especially preferable.
上記のモル比が2.0を越えるにつれて現像性が低下す
る傾向がある。また上記モル比が0.6より小さくなる
につれてアルカリ強度が高くなっていくので感光性平版
印刷版の支持体として汎用されているアルミニウム板等
の金属をエツチングする弊害が出てくるようになる。As the above molar ratio exceeds 2.0, developability tends to decrease. In addition, as the molar ratio becomes smaller than 0.6, the alkaline strength increases, causing the problem of etching metals such as aluminum plates, which are commonly used as supports for photosensitive planographic printing plates.
現像液中の珪酸アルカリの濃度は1〜10重量%が好ま
しく、1.5〜5重量%が特に好ましい。10重量%よ
り高くなると沈澱や結晶が生成しやすくなり、また廃液
時の中和に際してゲル化しやすくなるので廃液処理がめ
んどうとなる。また、1重量%より低くなると現像力、
処理能力が低くなる。The concentration of alkali silicate in the developer is preferably 1 to 10% by weight, particularly preferably 1.5 to 5% by weight. When the content is higher than 10% by weight, precipitates and crystals tend to form, and the waste liquid tends to gel during neutralization, making waste liquid treatment troublesome. In addition, when it is lower than 1% by weight, the developing power
Processing capacity decreases.
本発明の現像液に使用される水溶性エチレンオキシド付
加化合物は、脂肪族又は芳香族のアルコールもしくはヒ
ドロキシ化合物又は酸にエチレンオキシドを付加縮合し
て得られる化合物およびこれらにさらにスルホン酸また
はスルホン酸塩基を結合して得られる化合物であり、脂
肪族アルコールを使用する場合、該アルコールの炭素数
は3以上が好ましく、5以上がさらに好ましい。アルコ
ールの例としては、n−プロピルアルコール、イソープ
ロピルアルコーノペn−ブタノーノベイソブタノール、
第2ブタノール、第3ブタノール、n−アミルアルコー
ル、イソアミルアルコール、3−ペンタノール、n−ヘ
キサノール、メチルアミルアルコール、2−エチルブク
ノール、n−ヘプタツール、n−オクタツール、2−エ
チルヘキサノール、ノナノール、n−デカノール、ウン
デカノール、n−ドデカノーノベ 3,5.5−トリメ
チルヘキサノール、n−ドデカノーノベ トリメチルノ
ニルアルコーノベテトラデカノール、ヘプタデカノール
、シクロヘキサノール、ベンジルアルコール、2,6.
8−)ツメチル−4−ノナノール、2−メチル−7−エ
チル−4−ウンデカノール、5−エチル−2−ノナノー
ル、3−エチル−6−ウンデカノール、3.9−ジエチ
ル−6−ウンデカノール、3.9−ジエチル−6−ウン
デカノール、3.9−ジエチル−6−トリデカノール、
トリデカノール、オレイルアルコーノベラウリルアルコ
ール、オクチルアルコール、アセチルアルB −ノベ
トリメチレングリコール、ブタンジオール、1.5−ベ
ンタンジオール、ヘキシレングリコール、オクチレング
リコーノベグリセリン等が挙げられる。The water-soluble ethylene oxide adduct compound used in the developer of the present invention is a compound obtained by addition condensation of ethylene oxide to an aliphatic or aromatic alcohol or hydroxy compound or acid, and a compound to which a sulfonic acid or a sulfonic acid group is further bonded. When an aliphatic alcohol is used, the number of carbon atoms in the alcohol is preferably 3 or more, more preferably 5 or more. Examples of alcohols include n-propyl alcohol, isopropyl alcoholonopene n-butanonovaisobutanol,
Secondary butanol, tertiary butanol, n-amyl alcohol, isoamyl alcohol, 3-pentanol, n-hexanol, methyl amyl alcohol, 2-ethylbuquinol, n-heptatool, n-octatool, 2-ethylhexanol, Nonanol, n-decanol, undecanol, n-dodecanonobe 3,5.5-trimethylhexanol, n-dodecanonobe trimethylnonyl alcoholonobetetradecanol, heptadecanol, cyclohexanol, benzyl alcohol, 2,6.
8-) Tsumethyl-4-nonanol, 2-methyl-7-ethyl-4-undecanol, 5-ethyl-2-nonanol, 3-ethyl-6-undecanol, 3.9-diethyl-6-undecanol, 3.9 -diethyl-6-undecanol, 3.9-diethyl-6-tridecanol,
tridecanol, oleylalconovelauryl alcohol, octyl alcohol, acetyl alcohol B-nobe
Examples include trimethylene glycol, butanediol, 1,5-bentanediol, hexylene glycol, octylene glycol, and octylene glycol.
又、芳香族ヒドロキシ化合物の例としては、P−イソブ
チルフェノール、P−イソヘキシルフェノール、P−イ
ンオクチルフェノール、P−インドデシルフェノール、
オクチルフェノール、ヘキサデシルフェノール、アルキ
ル(C6〜CI 4 )βナフトール、ジアルキル(c
e〜C,、)フェノール、β−ナフトーノベP−フェニ
ルフェノール等が挙げられ、更にまた酸の例としては、
吉草酸、カプロン酸、エナント酸、カプリル酸、ペラル
ゴン酸、カプリン酸、ウンデシル酸、ラウリン酸、トリ
デシル酸、ミリスチン酸、ペンタデシル酸、パルミチン
酸、マルガリン酸、ステアリン酸等を挙げることができ
る。Examples of aromatic hydroxy compounds include P-isobutylphenol, P-isohexylphenol, P-inoctylphenol, P-indodecylphenol,
Octylphenol, hexadecylphenol, alkyl (C6-CI4) beta naphthol, dialkyl (c
e~C,,) phenol, β-naphthonobe P-phenylphenol, etc., and further examples of acids include:
Examples include valeric acid, caproic acid, enanthic acid, caprylic acid, pelargonic acid, capric acid, undecylic acid, lauric acid, tridecylic acid, myristic acid, pentadecylic acid, palmitic acid, margaric acid, and stearic acid.
これらの化合物に必要に応じてさらにプロピレンオキシ
ドをブロック共重合させたものも使用できる。また、こ
れらの化合物にスルホン酸塩基を結合する方法は、たと
えば特開昭59−195641号に記載されている。こ
れらの化合物は感光性平版印刷版の感光層に使用されて
いるノボラック樹脂等とともに、現像過程においてゆる
やかに画像部に付着して現像液の画像部への侵入を緩慢
にして現像ラチチュードの安定化に効果を示すものと考
えられる。エチレンオキシドの付加が4モルより少ない
場合は現像ラチチュード安定化の効果が少い。If necessary, these compounds further block copolymerized with propylene oxide can also be used. Further, a method for bonding a sulfonic acid group to these compounds is described, for example, in JP-A-59-195641. These compounds, along with novolac resins used in the photosensitive layer of photosensitive lithographic printing plates, gently adhere to the image area during the development process, slowing down the intrusion of the developer into the image area and stabilizing the development latitude. This is considered to be effective. When the amount of ethylene oxide added is less than 4 moles, the effect of stabilizing the development latitude is small.
好ましいエチレンオキシドの付加量は、6〜50モルで
あり、50モルを越えると現像速度が遅くなり、又は印
刷時に版面のインキ付着性が悪くなる。又エチレンオキ
シドを15モル以上付加すると自動現像機において発泡
し易くなるが、このような場合プロピレンオキシドをブ
ロック共縮合することてこ、の問題を解決することがで
きる。The preferred amount of ethylene oxide to be added is 6 to 50 moles; if it exceeds 50 moles, the development speed will be slow or the ink adhesion to the plate surface will be poor during printing. Further, if 15 moles or more of ethylene oxide is added, foaming tends to occur in an automatic processor, but in such a case, the problem can be solved by block co-condensing propylene oxide.
これらの水溶性エチレンオキシド付加化合物の添加量は
現像液に対して0.003〜10重量%が適しており、
より好ましい添加量範囲は0.05〜5重量%である。The appropriate amount of these water-soluble ethylene oxide addition compounds to be added is 0.003 to 10% by weight based on the developer.
A more preferable addition amount range is 0.05 to 5% by weight.
感光層が現像ラチチュードの狭いものである場合には、
エチレンオキシドの付加モル数の多い化合物を使用する
ことにより、また反対に感光層の現像ラチチュードが比
較的広いがまだ十分でないものの場合にはエチレンオキ
シドの付加モル数の少ない化合物を使用することにより
、所望の現像ラチチュードを有する現像液が得られる。If the photosensitive layer has a narrow development latitude,
By using a compound with a large number of moles of ethylene oxide added, or conversely, if the development latitude of the photosensitive layer is relatively wide but still insufficient, by using a compound with a small number of moles of ethylene oxide added, the desired result can be obtained. A developer having a development latitude is obtained.
本発明の現像液は、自動現像機に於いて現像液の温度を
28〜40℃に上昇させ現像性を高める現像方法におい
ても、現像安定性を維持することができる。The developing solution of the present invention can maintain development stability even in a developing method in which the temperature of the developing solution is raised to 28 to 40° C. in an automatic developing machine to improve developability.
本発明に用いられる現像液には更に下記記載の公知の化
合物を添加することが′できる。The developer used in the present invention may further contain the following known compounds.
例えば、特開昭58−75152号記載のNaCR1K
1.KBr等の中性塩、特開昭58−190952号記
載のEDTA、NTA等のキレート剤、特開昭59−1
21336号記載のCCo (NH3)6) C13等
の錯体、特開昭5525100号公報記載の周期率表第
■a族、第■a族又はmb族の元素のイオン化可能な化
合物、特開昭50−51324号記載のアルキルナフタ
レンスルホン酸ソーダ、N−テトラデシル−N。For example, NaCR1K described in JP-A-58-75152
1. Neutral salts such as KBr, chelating agents such as EDTA and NTA described in JP-A-58-190952, JP-A-59-1
Complexes such as CCo (NH3)6) C13 described in JP-A No. 5525100, ionizable compounds of elements of group ■a, group ■a, or mb of the periodic table described in JP-A-5525100; Sodium alkylnaphthalene sulfonate, N-tetradecyl-N, described in No.-51324.
N−ジヒドロキシエチルベタイン等のアニオンまたは両
性界面活性剤、米国特許4,374,92O号記載のテ
トラメチルデシンジオール等あるいは特開昭60−21
3943号記載の非イオン性界面活性剤、特開昭55−
95946号記載のp−ジメチルアミノメチルポリスチ
レンのメチルクロライド4級化物等のカチオニックポリ
マー、特開昭56−142528号記載のビニルベンジ
ルトリメチルアンモニウムクロライドとアクリル酸ソー
ダの共重合体等の両性高分子、電解質1、特開昭57−
192952号記載の亜硫酸ソーダ等の還元性無機塩、
チオサリチル酸、システィン、チオジグリコール酸等の
アルカリ可溶メルカプト化合物又はチオエーテル化合物
、特開昭58−59444号記載の塩化リチウム等の無
機リチウム化合物、特公昭50−34442号記載の安
息香酸リチウム等の有機リチウム化合物、特開昭59−
75255号記載の81、T1等を含む有機金属界面活
性剤、特開昭59−84241号記載の有機硼素化合物
、ヨーロッパ特許101010号記載のテトラアルキル
アンモニウムオキサイド等の4級アンモニウム塩、特願
昭61−298534号記載のデヒドロ酢酸ナトリウム
等の殺菌剤等があげられる。Anionic or amphoteric surfactants such as N-dihydroxyethylbetaine, tetramethyldecynediol described in U.S. Pat. No. 4,374,92O, or JP-A-60-21
Nonionic surfactant described in No. 3943, JP-A-55-
Cationic polymers such as the quaternized methyl chloride of p-dimethylaminomethylpolystyrene described in No. 95946, amphoteric polymers such as the copolymer of vinylbenzyltrimethylammonium chloride and sodium acrylate described in JP-A-56-142528, Electrolyte 1, JP-A-57-
Reducing inorganic salts such as sodium sulfite described in No. 192952,
Alkali-soluble mercapto compounds or thioether compounds such as thiosalicylic acid, cysteine, and thiodiglycolic acid, inorganic lithium compounds such as lithium chloride described in JP-A No. 58-59444, lithium benzoate described in JP-A No. 50-34442, etc. Organolithium compounds, JP-A-59-
Organometallic surfactants containing 81, T1, etc. described in No. 75255, organoboron compounds described in JP-A-59-84241, quaternary ammonium salts such as tetraalkylammonium oxides described in European Patent No. 101010, Japanese Patent Application No. 1983 Examples include disinfectants such as sodium dehydroacetate described in No.-298534.
更に必要に応じて水に対する溶解度が10重量%以下の
有機溶剤を併用することができる。Furthermore, an organic solvent having a solubility in water of 10% by weight or less can be used in combination, if necessary.
例えば酢酸エチノペ酢酸プロピル、酢酸ブチル、酢酸ア
ミル、酢酸ベンジル、エチレングリコールモノブチルア
セテート、乳酸ブチル、レブリン酸ブチルのようなカル
ボン酸エステル;エチルブチルケトン、メチルイソブチ
ルケトン、シクロヘキサノンのようなケトン類;エチレ
ングリコールモノブチルエーテノベエチレングリコール
ベンジルエーテル、エチレングリコールモノフェニルエ
ーテル、ベンジルアルコール、メチルフェニルカルビノ
ール、n−アミルアルコール、メチルアミルアルコール
のようなアルコール類;キシレンのようなアルキル置換
芳香族炭化水素:メチレンジクロライド、エチレンジク
ロライド、モノクロルベンゼンのようなハロゲン化炭化
水素などがある。Carboxylic acid esters such as propyl acetate, butyl acetate, amyl acetate, benzyl acetate, ethylene glycol monobutyl acetate, butyl lactate, butyl levulinate; ketones such as ethyl butyl ketone, methyl isobutyl ketone, cyclohexanone; ethylene Alcohols such as glycol monobutyl ether, ethylene glycol benzyl ether, ethylene glycol monophenyl ether, benzyl alcohol, methylphenyl carbinol, n-amyl alcohol, methyl amyl alcohol; alkyl-substituted aromatic hydrocarbons such as xylene: methylene These include halogenated hydrocarbons such as dichloride, ethylene dichloride, and monochlorobenzene.
これら有機溶剤は一種以上用いてもよい。これら有機溶
剤の中では、ベンジルアルコールが特に好ましい。More than one kind of these organic solvents may be used. Among these organic solvents, benzyl alcohol is particularly preferred.
現像液中の含有量は5重量%以下、好ましくは1〜4重
量%である。The content in the developer is 5% by weight or less, preferably 1 to 4% by weight.
本発明の現像液を用いる現像処理方法においては自動現
像機を用いて現像することが有利であり、現像液の劣化
を現像補充液を補充する、いわゆる補充方式で補償しな
がら行うことが好ましく、補充方式としては公知の技術
が用いられる。例えば′vf開Pa 55 11503
9 号公報記載ノ、23版処理量と経時により連続的又
は間欠的に補充する方法、特開昭58−95349号公
報記載の現像ゾーンの途中に感光層の溶出度を測定する
センサーを設け、検出された溶出度に応じて補充する方
法、特願昭62−178457号、特願昭63=456
0号記載の現像液のインピーダンスを測定し、検出され
たインピーダンス値をコンピューター処理し、補充する
方法等が好適に用いられる。In the development processing method using the developer of the present invention, it is advantageous to perform the development using an automatic developing machine, and it is preferable to perform the development while compensating for deterioration of the developer by replenishing the developer with a replenisher, using a so-called replenishment method. A known technique is used as the replenishment method. For example, 'vf open Pa 55 11503
9, a method of replenishing continuously or intermittently depending on the throughput of the 23rd plate and time; a sensor for measuring the degree of elution of the photosensitive layer is provided in the middle of the development zone, as described in JP-A-58-95349; Method of replenishing according to the detected degree of elution, Japanese Patent Application No. 178457/1983, Japanese Patent Application No. 1983=456
The method of measuring the impedance of the developer described in No. 0, processing the detected impedance value by computer, and replenishing the developer is preferably used.
本発明の現像液が適用される0−キノンジアジド感光層
とは活性光照射によりアルカリ可溶性を増す、0−キノ
ンジアジド化合物を感光性成分として含有する感光性複
写層である。The 0-quinonediazide photosensitive layer to which the developer of the present invention is applied is a photosensitive copying layer containing an 0-quinonediazide compound as a photosensitive component, which increases its alkali solubility upon irradiation with actinic light.
かかる感光材料についてはJ、コーサー著[ライトーセ
ンシティブシステムズJ (John 1llile
y &5ons、 Inc、)あるいは「感光性樹脂デ
ータ集」(綜合化学研究新編)などに詳細に記されてい
る。Such light-sensitive materials are described in John Koser [Light-Sensitive Systems J (John 1llile)].
y & 5ons, Inc.) or ``Photosensitive Resin Data Collection'' (Sogo Kagaku Kenkyu Shin-Edition).
特に芳香族ポリヒドロキシ化合物の0−キノンジアジド
スルホン酸エステルとアルカリ可溶性樹脂、例えばフェ
ノール樹脂、クレゾール樹脂、スチレン/無水マレイン
酸共重合体など、とを混合したものが一般に良く使われ
、平版印刷用感光板(プレセンシタイズド版)、フォト
エツチング用レジストなどに用いられている。これらの
内でも本発明の現像液は0−キノンジアジド感光層を有
するポジ型感光性印刷版(以下、ポジ型PS版と称す。In particular, mixtures of 0-quinonediazide sulfonic acid esters of aromatic polyhydroxy compounds and alkali-soluble resins such as phenol resins, cresol resins, styrene/maleic anhydride copolymers, etc. are commonly used, and are photosensitive for lithographic printing. It is used for plates (presensitized plates), photoetching resists, etc. Among these, the developer of the present invention is used to develop a positive-working photosensitive printing plate (hereinafter referred to as a positive-working PS plate) having an 0-quinonediazide photosensitive layer.
の現像液として特にすぐれている。かかるポジ型PS版
は、基本的には支持体としてのアルミニウム板上に、0
−キノンジアジド化合物からなる感光層を有するもので
ある。好適なアルミニウム板には、純アルミニウム板お
よびアルミニウム合金板が含まれ、更にアルミニウムが
ラミネートもしくは蒸着されたプラスチックフィルムも
含まれる。It is particularly excellent as a developer. Such a positive PS plate is basically made of aluminum plate as a support.
- It has a photosensitive layer made of a quinonediazide compound. Suitable aluminum plates include pure aluminum plates and aluminum alloy plates, as well as plastic films laminated or vapor-deposited with aluminum.
アルミニウム板の表面は砂目立て処理、珪酸ソーダ、弗
化ジルコニウム酸カリウム、燐酸塩等の水溶液への浸漬
処理、あるいは陽極酸化処理などの表面処理がなされて
いることが好ましい。また、砂目立てしたのちに米国特
許第2,714,066号明細書に記載されている如く
、珪酸す) IJウム水溶液に浸漬処理されたアルミニ
ウム板、特公昭47−5125号公報に記載されている
ようにアルミニウム板を陽極酸化処理したのちに、アル
カリ金属珪酸塩の水溶液に浸漬処理したものも好適に使
用される。上記陽極酸化処理は、例えば、燐酸、クロム
酸、硫酸、硼酸等の無機酸、若しくは、蓚酸、スルファ
ミン酸等の有機酸またはこれらの塩の水溶液又は非水溶
液の単独又は二種以上を組み合わせた電解液中でアルミ
ニウム板を陽極として電流を流すことにより実施される
。The surface of the aluminum plate is preferably subjected to a surface treatment such as graining treatment, immersion treatment in an aqueous solution of sodium silicate, potassium fluorozirconate, phosphate, or the like, or anodization treatment. In addition, after graining, an aluminum plate is immersed in an aqueous solution of silicic acid as described in U.S. Pat. An aluminum plate which is anodized and then immersed in an aqueous solution of an alkali metal silicate is also preferably used. The above-mentioned anodizing treatment may be carried out by electrolysis using an aqueous or non-aqueous solution of an inorganic acid such as phosphoric acid, chromic acid, sulfuric acid, or boric acid, or an organic acid such as oxalic acid or sulfamic acid, or a salt thereof alone or in combination of two or more. This is carried out by passing an electric current through a liquid using an aluminum plate as an anode.
また、米国特許第3,658,662号明細書に記載さ
れているようなシリケート電着も有効である。Also effective is silicate electrodeposition as described in US Pat. No. 3,658,662.
更には米国特許第4,087,341号明細書、特公昭
46−27481号公報、特開昭52−30503号公
報に開示されているような電解グレインを施した支持体
を上記のように陽極酸化処理したものも有用である。更
に、米国特許第3.834,998号明細書に記されて
いるような砂目立てしたのちに化学的にエツチングし、
しかるのちに陽極酸化処理したアルミニウム板も好まし
い。これらの親水化処理は、支持体の表面を親水性とす
るために施される以外に、その上に設けられる感光性組
成物との有害な反応を防ぐため、更には感光層との密着
性を向上させる為などの種々の目的をもって施されるも
のである。Further, a support coated with electrolytic grains as disclosed in U.S. Pat. Oxidized products are also useful. Further, chemical etching after graining as described in U.S. Pat. No. 3,834,998,
An aluminum plate which is subsequently anodized is also preferred. These hydrophilic treatments are performed not only to make the surface of the support hydrophilic, but also to prevent harmful reactions with the photosensitive composition provided thereon, and to improve the adhesion with the photosensitive layer. It is applied for various purposes such as improving the quality of life.
更に米国特許第3511661号、特公昭57−163
49号、特公昭46−35685号、特開昭60−14
9491号、特開昭60−232998号等に記載され
ているような下塗剤を塗布する方法も好ましい。Furthermore, U.S. Patent No. 3511661, Japanese Patent Publication No. 57-163
No. 49, Japanese Patent Publication No. 46-35685, Japanese Patent Publication No. 1987-14
Also preferred is the method of applying an undercoat as described in No. 9491, JP-A No. 60-232998, and the like.
支持体の親水性表面の上に設けられる感光層は0−キノ
ンジアジド化合物からなる。特に好ましいO−キノンジ
アジド化合物は0−ナフトキノンジアジド化合物であり
、例えば米国特許第3,046,110号、同第3,0
46,111号、同第3,046,112号、同第3.
046.115号、同第3,046,118号、同第3
,046,119号、同第3,046,12O号、同第
3,046,121号、同第3,046,122号、同
第3,046,123号、同第3,061,430号、
同第3,102,809号、同第3,106,465号
、同第3,635,709号、同第3,647.443
号の各明細書をはじめ、多数の刊行物に記されており、
これらは好適に使用することができる。これらの内でも
、特に芳香族ヒドロキシ化合物の0−ナフトキノンジア
ジドスルホン酸エステルまたはO−ナフトキノンジアジ
ドカルボン酸エステル、および芳香族アミン化合物の0
−ナフトキノンジアジドスルホン酸アミドまたはO−ナ
フトキノンジアジドカルボン酸アミドが好ましく、特に
米国特許第3.635.709号明細書に記されている
ピロガロールとアセトンとの縮合物に0−ナフトキノン
ジアジドスルホン酸をエステル反応させたもの、米国特
許第4.028.111号明細書に記されている末端に
ヒドロキシ基を有するポリエステルに0−ナフトキノン
ジアジドスルホン酸、または0−ナフトキノンジアジド
カルボン酸をエステル反応させたもの、英国特許第1.
494,043号明細書に記されているようなp−ヒド
ロキシスチレンのホモポリマーまたはこれらと他の共重
合し得るモノマーとの共重合体に0−ナフトキノンジア
ジドスルホン酸または0−ナフトキノンジアジドカルボ
ン酸をエステル反応させたもの、米国特許第3,759
,711号明細書に記されているような0−アミノスチ
レンと他の共重合しろるモノマーとの共重合体に○−キ
ノンジアジドスルホン酸又は、0−キノンジアジドカル
ボン酸をアミド反応させたものは非常にすぐれている。The photosensitive layer provided on the hydrophilic surface of the support consists of an 0-quinonediazide compound. Particularly preferred O-quinonediazide compounds are O-naphthoquinonediazide compounds, such as U.S. Pat.
No. 46,111, No. 3,046,112, No. 3.
No. 046.115, No. 3,046,118, No. 3
, No. 3,046,119, No. 3,046,12O, No. 3,046,121, No. 3,046,122, No. 3,046,123, No. 3,061,430 ,
No. 3,102,809, No. 3,106,465, No. 3,635,709, No. 3,647.443
It is written in numerous publications, including the specifications of each issue.
These can be suitably used. Among these, in particular, O-naphthoquinonediazide sulfonic acid ester or O-naphthoquinonediazidecarboxylic acid ester of aromatic hydroxy compounds, and O-naphthoquinonediazide carboxylic acid ester of aromatic amine compounds.
- Naphthoquinonediazide sulfonic acid amide or O-naphthoquinonediazidecarboxylic acid amide is preferred, especially esterifying O-naphthoquinonediazide sulfonic acid to the condensate of pyrogallol and acetone as described in U.S. Pat. No. 3,635,709. A polyester having a hydroxyl group at the end described in U.S. Patent No. 4.028.111 is subjected to an ester reaction with 0-naphthoquinonediazide sulfonic acid or 0-naphthoquinonediazidecarboxylic acid, British Patent No. 1.
0-naphthoquinonediazide sulfonic acid or 0-naphthoquinonediazidecarboxylic acid is added to a homopolymer of p-hydroxystyrene or a copolymer of these with other copolymerizable monomers as described in No. 494,043. Ester-reacted product, U.S. Patent No. 3,759
, 711, in which a copolymer of 0-aminostyrene and other copolymerizable monomers is subjected to an amide reaction with ○-quinonediazide sulfonic acid or 0-quinonediazidecarboxylic acid is extremely Excellent.
これらの0−キノンジアジド化合物は、単独で使用する
ことができるが、アルカリ可溶性樹脂と混合し、この混
合物を感光層として設けた方が好ましい。好適なアルカ
リ可溶性樹脂には、ノボラック型フェノール樹脂が含ま
れ、具体的には、フェノールホルムアルデヒド樹脂、O
−クレゾールホルムアルデヒド樹脂、m−クレゾールホ
ルムアルデヒド樹脂などが含まれる。更に特開昭501
25806号公報に記されている様に上記のようなフェ
ノール樹脂と共に、t−ブチルフェノールホルムアルデ
ヒド樹脂のような炭素数3〜8のアルキル基で置換され
たフェノールまたはクレゾールとホルムアルデヒドとの
縮合物とを併用すると、より一層好ましい。アルカリ可
溶性樹脂は、感光層中に約50〜約85重量、より好ま
しくは60〜80重量%、含有させられる。Although these 0-quinonediazide compounds can be used alone, it is preferable to mix them with an alkali-soluble resin and provide this mixture as a photosensitive layer. Suitable alkali-soluble resins include novolak-type phenolic resins, specifically phenol formaldehyde resins, O
-cresol formaldehyde resin, m-cresol formaldehyde resin, etc. Furthermore, JP-A-501
As described in Publication No. 25806, a phenol resin such as the above is used together with a phenol substituted with an alkyl group having 3 to 8 carbon atoms, such as t-butylphenol formaldehyde resin, or a condensate of cresol and formaldehyde. Then, it is even more preferable. The alkali-soluble resin is contained in the photosensitive layer in an amount of about 50 to about 85% by weight, more preferably 60 to 80% by weight.
更に本発明の組成物には、上記のアルカリ可溶性ノボラ
ック樹脂以外の、アルカリ可溶性樹脂を必要に応じて配
合することができる。例えば、スチレン−アクリル酸共
重合体、メチルメタアクリレートーメククリシレ酸共重
合体、アルカリ可溶性ポリウレタン樹脂、特公昭52−
28401号公報記載のアルカリ可溶性ビニル系樹脂、
−アルカリ可溶I生ポリブチラール(封脂等も含有させ
ることができる。Furthermore, the composition of the present invention may contain an alkali-soluble resin other than the above-mentioned alkali-soluble novolak resin, if necessary. For example, styrene-acrylic acid copolymer, methyl methacrylate to methacrylic acid copolymer, alkali-soluble polyurethane resin,
Alkali-soluble vinyl resin described in Publication No. 28401,
- Alkali-soluble I raw polybutyral (sealing resin etc. can also be contained).
0−キノンジアジド化合物からなる感光層には、必要に
応じて更に特開昭58−2O3433号に記載されてい
るような染料、可塑剤、プリントアウト性能を与える成
分などの添加剤を加えることができる。Additives such as dyes, plasticizers, and components imparting printout performance as described in JP-A No. 58-2O3433 can be added to the photosensitive layer made of the 0-quinonediazide compound, if necessary. .
支持体上に設けられる0−キノンジアジド化合物からな
る感光層の塗布量は約05〜約7 g / m’であり
、より好ましくは1.5〜3 g / m’である。The coating weight of the photosensitive layer made of an O-quinonediazide compound provided on the support is about 0.5 to about 7 g/m', more preferably 1.5 to 3 g/m'.
かくして得られるポジ型PS版は透明原図を通してカー
ボンアーク灯、水銀灯、メタルハライドランプ、キセノ
ンランプ、タングステンランプなどの活性光線の豊富な
光線により露光されると、その部分はアルカリ可溶性に
変る。従って、本発明の現像液で処理すると、感光層の
露光部分は溶出され、支持体の親水性表面が露出される
。When the positive PS plate thus obtained is exposed through a transparent original to a light source rich in actinic rays such as a carbon arc lamp, mercury lamp, metal halide lamp, xenon lamp, or tungsten lamp, that portion becomes alkali-soluble. Therefore, when treated with the developer of the present invention, the exposed portions of the photosensitive layer are eluted and the hydrophilic surface of the support is exposed.
本発明の現像液は、現像安定性が高く、現像条件の管理
が極めて容易であり、処理能力が高いため少量で多くの
感光材料を現像でき、しかも、使用済廃液の排出が少な
く、廃液処理も容易である。The developer of the present invention has high development stability, it is extremely easy to manage the development conditions, and its high processing capacity allows it to develop a large number of photosensitive materials with a small amount.Moreover, there is little discharge of used waste solution, and waste solution treatment is possible. is also easy.
さらに高温現像も安定に行うことができる。Furthermore, high-temperature development can also be carried out stably.
以下実施例をもって本発明の詳細な説明する。 The present invention will be described in detail below with reference to Examples.
実施例1〜6
特公昭43−28403号公報実施例1に記載されてい
るアセトンとピロガロールの縮合により得られるポリヒ
ドロキシフェニルのナフトキノン−1,2−ジアジド−
5−スルホン酸エステル0.8重量部と7ボラツク型メ
タパラ混合クレゾールホルムアルデヒド樹脂2.2重量
部、ノボラック型オクチルフェノールホルムアルデヒド
樹脂0.02重量部、無水フタル酸0.08重量部、2
−トリクロルメチル−5−(p−メトキシスチリル)−
1,3,4−オキサジアゾール0.04重量部およびク
リスタルバイオレットのパラトルエンスルホン酸塩0.
03重量部を2O重量部のメチルセロソルブアセテート
と8重量部のメチルエチルケトンに溶解して感光液を調
製した。ナイロンブラシで砂目立された厚さ0.3mm
のアルミニウム版をアルカリでエツチングした後、硝酸
水溶液中で更に電解エツチングし、続いて硫酸水溶液中
で陽極酸化しく陽極酸化皮膜量2.7 g/m’) 、
その後70℃の酢酸亜鉛水溶液で処理し良く洗滌した後
に乾燥し、その上に上記感光液を回転塗布機によって塗
布乾燥して約2.0g/m’の感光層を有する感光板を
得た。この感光板に濃度差0.15のステップウェッジ
と網点ウェッジを通して富士写真フィルム0.1製PS
ライト (2kwメタルハライドランプ)を用いて露光
した。一方現像液としてSiO□/Na2Oモル比約0
.9の珪酸ソーダ2重量%水溶液1βに表1の化合物を
添加した現像液を作製した。Examples 1 to 6 Polyhydroxyphenyl naphthoquinone-1,2-diazide obtained by condensation of acetone and pyrogallol as described in Example 1 of Japanese Patent Publication No. 43-28403
0.8 parts by weight of 5-sulfonic acid ester, 2.2 parts by weight of 7-volac type metapara mixed cresol formaldehyde resin, 0.02 parts by weight of novolac type octylphenol formaldehyde resin, 0.08 parts by weight of phthalic anhydride, 2
-Trichloromethyl-5-(p-methoxystyryl)-
0.04 parts by weight of 1,3,4-oxadiazole and 0.04 parts by weight of crystal violet paratoluenesulfonate.
A photosensitive solution was prepared by dissolving 3 parts by weight of 03 parts by weight in 2 parts by weight of methyl cellosolve acetate and 8 parts by weight of methyl ethyl ketone. 0.3mm thick grained with nylon brush
After etching the aluminum plate with alkali, it was further electrolytically etched in a nitric acid aqueous solution, and then anodized in a sulfuric acid aqueous solution to obtain an anodized film amount of 2.7 g/m').
Thereafter, it was treated with an aqueous zinc acetate solution at 70° C., thoroughly washed, and then dried. The photosensitive solution was coated thereon using a spin coater and dried to obtain a photosensitive plate having a photosensitive layer of about 2.0 g/m'. A step wedge with a density difference of 0.15 and a halftone dot wedge are passed through this photosensitive plate to make the PS manufactured by Fuji Photo Film 0.1.
Exposure was performed using a light (2 kW metal halide lamp). On the other hand, as a developer, the molar ratio of SiO□/Na2O is approximately 0.
.. A developing solution was prepared by adding the compounds shown in Table 1 to a 2% by weight aqueous sodium silicate solution 1β of No. 9.
露光焼付された感光板を現像液温度25℃と35℃に保
たれたそれぞれの現像液に浸漬し、1枚は1分後、他は
3分後に取り出し水洗した。表2には滲出したステップ
ウェッジの段数と網点ウェッジのハイライト部の網点の
再現性の結果を示す。The exposed and baked photosensitive plates were immersed in respective developers whose temperatures were kept at 25° C. and 35° C., and one plate was taken out after 1 minute and the others after 3 minutes and washed with water. Table 2 shows the results of the number of bleed-out step wedges and the reproducibility of halftone dots in highlighted areas of the halftone dot wedge.
表2より比較例1の珪酸ナトリウム水溶液単独に比べて
実施例1〜6の現像液は温度、時間等に於いても極めて
安定性の高いことが判る。更に実施例1.2の現像液に
ついて現像処理能力を調べたがいずれも11当り3 m
’の感光板を現像した後も充分現像能力を維持していた
。又実施例1〜6において珪酸ナトリウムの代りに珪酸
カリウムを用いても珪酸ナトリウムと同等の性能を維持
していた。It can be seen from Table 2 that the developing solutions of Examples 1 to 6 have extremely high stability over temperature, time, etc., compared to the sodium silicate aqueous solution of Comparative Example 1 alone. Furthermore, the development processing ability of the developer of Example 1.2 was investigated, and in all cases, the development processing capacity was 3 m/11.
Even after developing the photosensitive plate ', the developing ability was maintained sufficiently. Further, even when potassium silicate was used in place of sodium silicate in Examples 1 to 6, performance equivalent to that of sodium silicate was maintained.
Claims (1)
が0.6〜2.0の珪酸アルカリ金属塩と、酸又はアル
コールに4モル以上のエチレンオキシドを付加して得ら
れる水溶性エチレンオキシド付加化合物を含有すること
を特徴とする、o−キノンジアジド化合物含有感光層を
有する感光性平版印刷版の現像液。Contains an alkali metal silicate salt with a SiO_2/M_2O (M represents an alkali metal) ratio of 0.6 to 2.0 and a water-soluble ethylene oxide addition compound obtained by adding 4 moles or more of ethylene oxide to an acid or alcohol. A developer for a photosensitive lithographic printing plate having a photosensitive layer containing an o-quinonediazide compound.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63190300A JP2538793B2 (en) | 1988-07-29 | 1988-07-29 | Photosensitive lithographic printing plate developer |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63190300A JP2538793B2 (en) | 1988-07-29 | 1988-07-29 | Photosensitive lithographic printing plate developer |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH0239157A true JPH0239157A (en) | 1990-02-08 |
JP2538793B2 JP2538793B2 (en) | 1996-10-02 |
Family
ID=16255868
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63190300A Expired - Fee Related JP2538793B2 (en) | 1988-07-29 | 1988-07-29 | Photosensitive lithographic printing plate developer |
Country Status (1)
Country | Link |
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JP (1) | JP2538793B2 (en) |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0561205A (en) * | 1991-09-02 | 1993-03-12 | Fuji Photo Film Co Ltd | Image forming method |
JPH05204164A (en) * | 1992-01-24 | 1993-08-13 | Fuji Photo Film Co Ltd | Image forming method |
EP1314552A2 (en) | 1998-04-06 | 2003-05-28 | Fuji Photo Film Co., Ltd. | Photosensitive resin composition |
DE4411176B4 (en) * | 1993-03-30 | 2007-08-30 | Fuji Photo Film Co., Ltd., Minami-Ashigara | Developer of PS plates and supplementary fluids for developers |
Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5522759A (en) * | 1978-08-08 | 1980-02-18 | Fuji Photo Film Co Ltd | Developing method of positive type photosensitive lithographic printing plate |
JPS59195641A (en) * | 1983-04-21 | 1984-11-06 | Fuji Photo Film Co Ltd | Developer composition |
JPS60194095A (en) * | 1984-02-21 | 1985-10-02 | ヘキスト・アクチエンゲゼルシヤフト | Manufacture of sheet, foil or web-form material |
JPS60263147A (en) * | 1984-06-12 | 1985-12-26 | Dainippon Ink & Chem Inc | Developing solution composition |
JPS6271958A (en) * | 1985-09-25 | 1987-04-02 | Konishiroku Photo Ind Co Ltd | Developing solution composition and developing method for photosensitive lithographic printing plate |
JPH027055A (en) * | 1988-06-27 | 1990-01-11 | Konica Corp | Processing method for photosensitive planographic printing plate |
JPH03502256A (en) * | 1988-01-06 | 1991-05-23 | オリン・ハント・スペシヤルテイ・プロダクツ・インコーポレイテツド | Aqueous developers and their use in developing positive photoresist compositions |
-
1988
- 1988-07-29 JP JP63190300A patent/JP2538793B2/en not_active Expired - Fee Related
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5522759A (en) * | 1978-08-08 | 1980-02-18 | Fuji Photo Film Co Ltd | Developing method of positive type photosensitive lithographic printing plate |
JPS59195641A (en) * | 1983-04-21 | 1984-11-06 | Fuji Photo Film Co Ltd | Developer composition |
JPS60194095A (en) * | 1984-02-21 | 1985-10-02 | ヘキスト・アクチエンゲゼルシヤフト | Manufacture of sheet, foil or web-form material |
JPS60263147A (en) * | 1984-06-12 | 1985-12-26 | Dainippon Ink & Chem Inc | Developing solution composition |
JPS6271958A (en) * | 1985-09-25 | 1987-04-02 | Konishiroku Photo Ind Co Ltd | Developing solution composition and developing method for photosensitive lithographic printing plate |
JPH03502256A (en) * | 1988-01-06 | 1991-05-23 | オリン・ハント・スペシヤルテイ・プロダクツ・インコーポレイテツド | Aqueous developers and their use in developing positive photoresist compositions |
JPH027055A (en) * | 1988-06-27 | 1990-01-11 | Konica Corp | Processing method for photosensitive planographic printing plate |
Cited By (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH0561205A (en) * | 1991-09-02 | 1993-03-12 | Fuji Photo Film Co Ltd | Image forming method |
JPH05204164A (en) * | 1992-01-24 | 1993-08-13 | Fuji Photo Film Co Ltd | Image forming method |
DE4411176B4 (en) * | 1993-03-30 | 2007-08-30 | Fuji Photo Film Co., Ltd., Minami-Ashigara | Developer of PS plates and supplementary fluids for developers |
EP1314552A2 (en) | 1998-04-06 | 2003-05-28 | Fuji Photo Film Co., Ltd. | Photosensitive resin composition |
Also Published As
Publication number | Publication date |
---|---|
JP2538793B2 (en) | 1996-10-02 |
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