JPH0239149U - - Google Patents

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Publication number
JPH0239149U
JPH0239149U JP11691688U JP11691688U JPH0239149U JP H0239149 U JPH0239149 U JP H0239149U JP 11691688 U JP11691688 U JP 11691688U JP 11691688 U JP11691688 U JP 11691688U JP H0239149 U JPH0239149 U JP H0239149U
Authority
JP
Japan
Prior art keywords
rays
target
ray
slit
emitted
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP11691688U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP11691688U priority Critical patent/JPH0239149U/ja
Publication of JPH0239149U publication Critical patent/JPH0239149U/ja
Pending legal-status Critical Current

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  • Analysing Materials By The Use Of Radiation (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は従来の装置の構成図、第2図は本考案
実施例の構成図である。図において1はX線管、
2はフイラメント、3は電子流、4はターゲツト
、5は一次X線、6はスリツト、7は試料、8は
蛍光X線、9はX線検出器、10は第2のターゲ
ツト、11はターゲツト10の特性X線である。
FIG. 1 is a block diagram of a conventional device, and FIG. 2 is a block diagram of an embodiment of the present invention. In the figure, 1 is an X-ray tube,
2 is a filament, 3 is an electron current, 4 is a target, 5 is a primary X-ray, 6 is a slit, 7 is a sample, 8 is a fluorescent X-ray, 9 is an X-ray detector, 10 is a second target, 11 is a target 10 characteristic X-rays.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] X線管のターゲツトから放射される一次X線で
励起されて二次X線を放射する第2のX線発生タ
ーゲツトと、上記第2のターゲツトからその表面
に対して微小の角度で放射されるX線が通過する
スリツトと、上記スリツトを通過したX線が微小
の入射角をもつて入射するように設置される平板
状の試料と、上記試料と対向するように設置され
てその試料の表面で発生した蛍光X線を検出する
X線検出器とよりなる全反射蛍光X線分析装置。
a second X-ray generating target that is excited by the primary X-rays emitted from the target of the X-ray tube and emits secondary X-rays, and the second X-rays are emitted from the second target at a minute angle with respect to the surface thereof. A slit through which the X-rays pass, a flat sample placed so that the X-rays passing through the slit are incident at a small angle of incidence, and a surface of the sample placed opposite the sample. A total internal reflection fluorescent X-ray analyzer consisting of an X-ray detector that detects fluorescent X-rays generated by
JP11691688U 1988-09-07 1988-09-07 Pending JPH0239149U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP11691688U JPH0239149U (en) 1988-09-07 1988-09-07

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP11691688U JPH0239149U (en) 1988-09-07 1988-09-07

Publications (1)

Publication Number Publication Date
JPH0239149U true JPH0239149U (en) 1990-03-15

Family

ID=31359893

Family Applications (1)

Application Number Title Priority Date Filing Date
JP11691688U Pending JPH0239149U (en) 1988-09-07 1988-09-07

Country Status (1)

Country Link
JP (1) JPH0239149U (en)

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