JPH0237658B2 - - Google Patents

Info

Publication number
JPH0237658B2
JPH0237658B2 JP58138517A JP13851783A JPH0237658B2 JP H0237658 B2 JPH0237658 B2 JP H0237658B2 JP 58138517 A JP58138517 A JP 58138517A JP 13851783 A JP13851783 A JP 13851783A JP H0237658 B2 JPH0237658 B2 JP H0237658B2
Authority
JP
Japan
Prior art keywords
sample
ion
ion beam
generates
signal
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58138517A
Other languages
English (en)
Japanese (ja)
Other versions
JPS6028151A (ja
Inventor
Hideaki Arima
Takayuki Matsukawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Mitsubishi Electric Corp
Original Assignee
Mitsubishi Electric Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp filed Critical Mitsubishi Electric Corp
Priority to JP58138517A priority Critical patent/JPS6028151A/ja
Publication of JPS6028151A publication Critical patent/JPS6028151A/ja
Publication of JPH0237658B2 publication Critical patent/JPH0237658B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H01J37/266—Measurement of magnetic or electric fields in the object; Lorentzmicroscopy
    • H01J37/268—Measurement of magnetic or electric fields in the object; Lorentzmicroscopy with scanning beams

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Tests Of Electronic Circuits (AREA)
JP58138517A 1983-07-27 1983-07-27 走査形ストロボイオン顕微鏡 Granted JPS6028151A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58138517A JPS6028151A (ja) 1983-07-27 1983-07-27 走査形ストロボイオン顕微鏡

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58138517A JPS6028151A (ja) 1983-07-27 1983-07-27 走査形ストロボイオン顕微鏡

Publications (2)

Publication Number Publication Date
JPS6028151A JPS6028151A (ja) 1985-02-13
JPH0237658B2 true JPH0237658B2 (enrdf_load_stackoverflow) 1990-08-27

Family

ID=15223994

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58138517A Granted JPS6028151A (ja) 1983-07-27 1983-07-27 走査形ストロボイオン顕微鏡

Country Status (1)

Country Link
JP (1) JPS6028151A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6272123A (ja) * 1985-09-25 1987-04-02 Mitsubishi Electric Corp パタ−ン欠陥検査修正方法
JPS63116443A (ja) * 1986-11-05 1988-05-20 Seiko Instr & Electronics Ltd Ｆｉｂテスタ

Also Published As

Publication number Publication date
JPS6028151A (ja) 1985-02-13

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