JPH0236064B2 - - Google Patents

Info

Publication number
JPH0236064B2
JPH0236064B2 JP58020094A JP2009483A JPH0236064B2 JP H0236064 B2 JPH0236064 B2 JP H0236064B2 JP 58020094 A JP58020094 A JP 58020094A JP 2009483 A JP2009483 A JP 2009483A JP H0236064 B2 JPH0236064 B2 JP H0236064B2
Authority
JP
Japan
Prior art keywords
wire
connection point
capillary
bonding tool
bonding
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
JP58020094A
Other languages
Japanese (ja)
Other versions
JPS59150436A (en
Inventor
Tomio Kashihara
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Toshiba Corp
Original Assignee
Tokyo Shibaura Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Shibaura Electric Co Ltd filed Critical Tokyo Shibaura Electric Co Ltd
Priority to JP58020094A priority Critical patent/JPS59150436A/en
Publication of JPS59150436A publication Critical patent/JPS59150436A/en
Publication of JPH0236064B2 publication Critical patent/JPH0236064B2/ja
Granted legal-status Critical Current

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies
    • H01L24/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/484Connecting portions
    • H01L2224/48463Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond
    • H01L2224/48465Connecting portions the connecting portion on the bonding area of the semiconductor or solid-state body being a ball bond the other connecting portion not on the bonding area being a wedge bond, i.e. ball-to-wedge, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/74Apparatus for manufacturing arrangements for connecting or disconnecting semiconductor or solid-state bodies and for methods related thereto
    • H01L2224/78Apparatus for connecting with wire connectors
    • H01L2224/7825Means for applying energy, e.g. heating means
    • H01L2224/783Means for applying energy, e.g. heating means by means of pressure
    • H01L2224/78301Capillary
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/85009Pre-treatment of the connector or the bonding area
    • H01L2224/8503Reshaping, e.g. forming the ball or the wedge of the wire connector
    • H01L2224/85035Reshaping, e.g. forming the ball or the wedge of the wire connector by heating means, e.g. "free-air-ball"
    • H01L2224/85045Reshaping, e.g. forming the ball or the wedge of the wire connector by heating means, e.g. "free-air-ball" using a corona discharge, e.g. electronic flame off [EFO]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/851Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector the connector being supplied to the parts to be connected in the bonding apparatus
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/80Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected
    • H01L2224/85Methods for connecting semiconductor or other solid state bodies using means for bonding being attached to, or being formed on, the surface to be connected using a wire connector
    • H01L2224/8512Aligning
    • H01L2224/85148Aligning involving movement of a part of the bonding apparatus
    • H01L2224/85169Aligning involving movement of a part of the bonding apparatus being the upper part of the bonding apparatus, i.e. bonding head, e.g. capillary or wedge
    • H01L2224/8518Translational movements
    • H01L2224/85181Translational movements connecting first on the semiconductor or solid-state body, i.e. on-chip, regular stitch
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/01Chemical elements
    • H01L2924/01082Lead [Pb]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/1015Shape
    • H01L2924/1016Shape being a cuboid
    • H01L2924/10161Shape being a cuboid with a rectangular active surface

Description

【発明の詳細な説明】 〔発明の技術分野〕 この発明はたとえば半導体装置の組立工程にお
いて、ペレートとリードフレーム上のリードとを
ワイヤによつて接続するワイヤボンデイング方法
に関する。
DETAILED DESCRIPTION OF THE INVENTION [Technical Field of the Invention] The present invention relates to a wire bonding method for connecting a plate and a lead on a lead frame with a wire, for example, in the assembly process of a semiconductor device.

〔発明の技術的背景とその問題点〕[Technical background of the invention and its problems]

半導体装置の組立工程において、ペレツトとリ
ードフレームをワイヤによつて接続する手段とし
て一般に第1図に示すボンデイング装置が用いら
れている。第1図中1はボンデイングヘツド本体
で、この本体1の上部にはワイヤスプール2が設
けられている。上記本体1のワイヤ繰出し側には
ワイヤ3を案内するワイヤガイド4が設けられて
いる。また、ワイヤガイド4の自由端部には上記
ワイヤ3を下方へ案内するための湾曲部8が形成
されている。このワイヤガイド4の湾曲部8の下
部には導入されたワイヤ3をクランプしたり解放
したりする上クランプ9が設けられている。この
上クランプ9は本体1の側方に突設されたアーム
9aに支持され、図示しないソレノイドにより開
閉し、ワイヤ3をクランプしたり解放したりする
ようになつている。また上クランプ9の他の役目
はボンデイングツールがその先端にボールを保持
し第1接続点に下降する時にワイヤにバツクテン
シヨンを与えることである。下クランプ11は揺
動ブラケツト12の先端部に設けられていて、図
示しないソレノイドによつて開閉し、ワイヤ3を
クランプしたり解放するようになつている。上記
揺動ブラケツト12の下側にはこれとほぼ平行な
ボンデイングアーム13が設けられている。この
ボンデイングアーム13の先端部にはワイヤ3が
挿通されるボンデイングツールとしてのキヤピラ
リ14が設けられている。上記ボンデイングアー
ム13は揺動ブラケツトに板ばね13aと引張バ
ネ13bを介して保持されており、揺動ブラケツ
ト12の基端部を軸支する回動軸15を中心とし
て上下方向に回動するようになつている。すなわ
ち、下クランプ11およびキヤピラリ14は一体
となつて上下方向に移動するようになつている。
なお、キヤピラリ14の下方にはトーチ16また
はスパーク電極が設けられていて、キヤピラリ1
4の下方に突出するワイヤ3の先端を加熱しボー
ル17を形成するようになつている。しかして、
キヤピラリ14の下方にペレツト18およびリー
ドフレーム19を配置し、上記ボール17をペレ
ツト18の第1の接続点P1にボンデイングした
のち、ワイヤ3をリードフレーム19の第2の接
続点P2にボンデイングしてペレツト18とリー
ドフレーム19とを接続することによりボンデイ
ングが行なわれる。
In the assembly process of semiconductor devices, a bonding apparatus shown in FIG. 1 is generally used as a means for connecting pellets and lead frames with wires. Reference numeral 1 in FIG. 1 is a bonding head main body, and a wire spool 2 is provided on the upper part of this main body 1. A wire guide 4 for guiding the wire 3 is provided on the wire feeding side of the main body 1. Further, a curved portion 8 for guiding the wire 3 downward is formed at the free end of the wire guide 4. An upper clamp 9 for clamping and releasing the introduced wire 3 is provided at the lower part of the curved portion 8 of the wire guide 4. The upper clamp 9 is supported by an arm 9a projecting from the side of the main body 1, and is opened and closed by a solenoid (not shown) to clamp and release the wire 3. Another role of the upper clamp 9 is to hold the ball at the tip of the bonding tool and provide back tension to the wire as it descends to the first connection point. The lower clamp 11 is provided at the tip of the swing bracket 12, and is opened and closed by a solenoid (not shown) to clamp and release the wire 3. A bonding arm 13 is provided below the swing bracket 12 and is substantially parallel to the swing bracket 12. A capillary 14 serving as a bonding tool through which the wire 3 is inserted is provided at the tip of the bonding arm 13. The bonding arm 13 is held by the swing bracket via a plate spring 13a and a tension spring 13b, and is configured to rotate vertically about a rotation shaft 15 that supports the base end of the swing bracket 12. It's getting old. That is, the lower clamp 11 and the capillary 14 are configured to move together in the vertical direction.
Note that a torch 16 or a spark electrode is provided below the capillary 14.
The tip of the wire 3 protruding downward from the wire 4 is heated to form a ball 17. However,
A pellet 18 and a lead frame 19 are arranged below the capillary 14, and the ball 17 is bonded to the first connection point P1 of the pellet 18, and then the wire 3 is bonded to the second connection point P2 of the lead frame 19. Bonding is then performed by connecting pellet 18 and lead frame 19.

この従来のボンデイング方法をさらに詳細に第
2図を参照して説明する。aはボンデイング動作
開始前の状態を示し、ワイヤ3の先端にはボール
17が形成されている。この状態からキヤピラリ
14が降下しbの状態でボンデイングを行う。キ
ヤピラリ14が降下するときにワイヤ3はワイヤ
スプール2から繰り出される。また、上クランプ
9は閉じてワイヤ3を微弱なクランプ力でクラン
プしバツクテンシヨンを付与している。bはペレ
ツト18の電極にボンデイングした状態を示して
いる。この時点で上クランプ9は開く。cはキヤ
ピラリ14が上昇し、その途中においてキヤピラ
リ14がリードフレーム19側に移動した状態を
示している。この時にもキヤピラリ14の水平移
動によりワイヤ3が繰り出される。dは再度キヤ
ピラリ14が降下を開始した状態を示す。この時
キヤピラリ14はXY方向に移動を続けているた
めワイヤ3の繰り出しは引続き行なわれている。
e,fはキヤピラリ14のXY方向への移動が終
了し、下降が続いている状態を示す。この状態で
はキヤピラリ14の内部をワイヤ3が逆方向すな
わち下から上に向つて移動する現象が生じる。そ
して、このワイヤ3が下から上へスムーズに移動
することがワイヤ3にループを形成する上で重要
な条件となる。fはキヤピラリ14よりもワイヤ
が先にリードフレームに接触する状態を示してい
る。gはリードフレーム19の第2の接続点P2
にボンデイングした状態を示す。hはキヤピラリ
14が上昇停止し下クランプ11が閉じワイヤ3
を引きちぎる直前の状態を示す。iは引きちぎら
れたワイヤ3の先端を加熱しボール17を形成さ
せ、初期位置に戻つた状態を示し、以上の順序で
ワイヤボンデイングが行なわれた。
This conventional bonding method will be explained in more detail with reference to FIG. A shows the state before the start of the bonding operation, and a ball 17 is formed at the tip of the wire 3. From this state, the capillary 14 descends and bonding is performed in state b. When the capillary 14 descends, the wire 3 is let out from the wire spool 2. Further, the upper clamp 9 is closed to clamp the wire 3 with a weak clamping force to provide back tension. b shows the state in which the pellet 18 is bonded to the electrode. At this point, the upper clamp 9 is opened. 3c shows a state in which the capillary 14 is raised and moved toward the lead frame 19 in the middle. At this time as well, the wire 3 is fed out by the horizontal movement of the capillary 14. d shows a state in which the capillary 14 has started descending again. At this time, the capillary 14 continues to move in the XY directions, so the wire 3 continues to be fed out.
e and f indicate the state in which the capillary 14 has finished moving in the XY directions and continues to descend. In this state, a phenomenon occurs in which the wire 3 moves inside the capillary 14 in the opposite direction, that is, from the bottom to the top. The smooth movement of this wire 3 from the bottom to the top is an important condition for forming a loop in the wire 3. f indicates a state in which the wire contacts the lead frame before the capillary 14 does. g is the second connection point P 2 of the lead frame 19
This shows the bonded state. At h, the capillary 14 stops rising and the lower clamp 11 closes and the wire 3
Shows the state immediately before being torn off. i shows a state in which the tip of the torn wire 3 is heated to form a ball 17 and returned to the initial position, and wire bonding was performed in the above order.

ところで、第3図は第1の接続点P1に接続さ
れたのちのワイヤ3のワイヤループの形状の良い
例aと代表的な悪例b,cを示したものである
が、b,cではワイヤ3がリードフレーム19に
接触しており、不良と判定される。また、b,c
のようにワイヤ3がリードフレーム19に接触し
なくてもワイヤループの高さHが低いと次工程で
樹脂封止のためモールド成形した場合に短絡して
不良品となるので製品歩留りが低下する。このよ
うにb,cの不良が発生するのは、第2図c,d
の状態でワイヤ3を繰り出す時にたとえば上クラ
ンプ9とワイヤ3との摩擦が異常に大きくなり、
ボール17の接続部に大きな引張り力が水平方向
に作用する結果ワイヤループLの高さが低くな
る。
By the way, Fig. 3 shows a good example a and typical bad examples b and c of the shape of the wire loop of the wire 3 after being connected to the first connection point P1 . The wire 3 is in contact with the lead frame 19 and is determined to be defective. Also, b, c
Even if the wire 3 does not contact the lead frame 19, if the height H of the wire loop is low, it will short circuit when molded for resin sealing in the next process, resulting in a defective product, resulting in a decrease in product yield. . In this way, defects b and c occur as shown in Fig. 2 c and d.
For example, when the wire 3 is fed out in this state, the friction between the upper clamp 9 and the wire 3 becomes abnormally large.
As a result of the large tensile force acting horizontally on the connecting portion of the ball 17, the height of the wire loop L is reduced.

また、cの不良は、第2図e,fにおいて余分
に繰り出されたワイヤ3がキヤピラリ14の中を
下から上向き移動する時、キヤピラリ14とワイ
ヤ3との摩擦が増大し、移動が正常に行なわれな
かつた時に発生するもので、ワイヤにたるみが生
ずる。そして、これらワイヤループの形状不良に
よる製品不良はワイヤ3の通路やクランパにおけ
る塵埃、油付着による摩擦の増大、またはキヤピ
ラリ14のつまりによる摩擦の増大によるもので
その防止が困難であつた。このため、製品歩留り
が低下するだけでなく、頻繁にキヤピラリ14を
交換するため装置の稼動率を低下させるという欠
点があつた。
In addition, the defect c is caused by the fact that when the wire 3 that has been unwound in excess moves upward inside the capillary 14 from below in FIGS. This occurs when this is not done, resulting in slack in the wire. Product defects due to defects in the shape of these wire loops are caused by increased friction due to dust and oil adhesion in the wire path and the clamper, or increased friction due to clogging of the capillary 14, and are difficult to prevent. This not only reduces the product yield, but also reduces the operating rate of the device due to frequent replacement of the capillary 14.

〔発明の目的〕[Purpose of the invention]

この発明は上記事情に着目してなされたもの
で、その目的とするところは、第1接続点と第2
接続点とを結ぶワイヤの長さを一定にしてワイヤ
ループの形状を常に正常(理想的)な状態に制御
でき、信頼性を向上することができるワイヤボン
デイング方法を提供しようとするものである。
This invention was made by paying attention to the above circumstances, and its purpose is to connect the first connection point and the second connection point.
It is an object of the present invention to provide a wire bonding method in which the length of the wire connecting the connection point is kept constant, the shape of the wire loop can always be controlled to a normal (ideal) state, and reliability can be improved.

〔発明の概要〕[Summary of the invention]

この発明はワイヤをペレツト上の第1接続点に
ボンデイングしたのち、ボンデイングツールとし
てのキヤピラリを上昇させることによりキヤピラ
リの先端からワイヤをその長さが第1接続点から
次にボンデイングするリードフレーム上の第2接
続点までの正常なワイヤループ長さに等しくなる
まで繰り出し、ついでキヤピラリと一体となり上
下動する下クランプで固定することにより以後の
ワイヤの繰り出しを防止して、キヤピラリの先端
から繰り出されるワイヤの長さを一定にしたの
ち、キヤピラリを第2接続点まで移動してワイヤ
をリードフレームにボンデイングするように構成
したもので、第1接続点の上部のワイヤループの
形状を一定にし、信頼性、製品歩留りを向上する
ことができる。
This invention involves bonding a wire to a first connection point on a pellet, and then raising a capillary as a bonding tool to connect the wire from the tip of the capillary to the lead frame whose length extends from the first connection point to the next bonding point. The wire is let out until it is equal to the normal length of the wire loop up to the second connection point, and then fixed with a lower clamp that moves up and down as one with the capillary to prevent the wire from being let out again.The wire is then let out from the tip of the capillary. After making the length constant, the capillary is moved to the second connection point and the wire is bonded to the lead frame.The shape of the wire loop above the first connection point is kept constant, and reliability is improved. , product yield can be improved.

〔発明の実施例〕[Embodiments of the invention]

以下この発明の一実施例を第1図の同一構成部
分に同一符号を付けた第4図〜第7図を参照して
説明する。第4図中20はボンデイングヘツドフ
レームである。このボンデイングヘツドフレーム
20はXYテーブル21に設けられていて、エン
コーダ22aを同軸に有するX軸モータ22およ
びエンコーダ23aを同軸に有するY軸モータ2
3に駆動されてXY方向に移動するようになつて
いる。また、上記ボンデイングヘツドフレーム2
0には先端にボンデイングツールとしてのキヤピ
ラリ14を有するキヤピラリアーム13が上記ボ
ンデイングヘツドフレーム20の側壁に設けられ
たエンコーダ24aを有するZ軸モータ24によ
り駆動され、第1図に示した回動軸15と同様に
回転軸に揺動自在に支持されている。また、上記
X軸モータ22はX軸サーボドライバ25および
X軸サーボコントローラ26を介してCPU、
RAM、POMおよびPIOから構成された制御回路
としてのキヤピラリ位置演算制御装置27に接続
されている。そして上記Y軸モータ23はY軸サ
ーボドライバー28、Y軸サーボコントローラ2
9を介して、上記キヤピラリ位置演算制御装置2
7に接続されている。また、上記Z軸モータ24
はZ軸サーボドライバ30、Z軸サーボコントロ
ーラ31を介して上記キヤピラリ位置演算制御装
置27に接続されている。また、上記各エンコー
ダ22a,23a,24aは各サーボコントロー
ラ26,29,31を介してキヤピラリ位置演算
制御装置27に接続されている。このキヤピラリ
位置演算制御装置27はボンダ制御装置32に接
続されていて、キヤピラリ14のX、Y、Z方向
への移動を制御するほか、クランプ装置の開閉を
制御するようになつている。33はペレツト18
……を搭載しているリードフレームである。
An embodiment of the present invention will be described below with reference to FIGS. 4 to 7, in which the same components as in FIG. 1 are given the same reference numerals. 20 in FIG. 4 is a bonding head frame. This bonding head frame 20 is installed on an XY table 21, and includes an X-axis motor 22 having an encoder 22a on the same axis and a Y-axis motor 2 having an encoder 23a on the same axis.
3 to move in the XY directions. In addition, the bonding head frame 2
0, a capillary arm 13 having a capillary 14 as a bonding tool at its tip is driven by a Z-axis motor 24 having an encoder 24a provided on the side wall of the bonding head frame 20, and rotates with the rotation axis 15 shown in FIG. Similarly, it is swingably supported on a rotating shaft. In addition, the X-axis motor 22 is connected to the CPU via an X-axis servo driver 25 and an X-axis servo controller 26.
It is connected to a capillary position calculation control device 27 as a control circuit composed of RAM, POM, and PIO. The Y-axis motor 23 includes a Y-axis servo driver 28 and a Y-axis servo controller 2.
9, the capillary position calculation control device 2
7 is connected. In addition, the Z-axis motor 24
is connected to the capillary position calculation and control device 27 via a Z-axis servo driver 30 and a Z-axis servo controller 31. Further, each of the encoders 22a, 23a, 24a is connected to a capillary position calculation control device 27 via each servo controller 26, 29, 31. The capillary position calculation control device 27 is connected to the bonder control device 32, and controls the movement of the capillary 14 in the X, Y, and Z directions, as well as the opening and closing of the clamp device. 33 is pellet 18
This is a lead frame equipped with...

つぎに上記のように構成されたワイヤボンデイ
ング装置の作用を第5図および第6図を参照して
説明する。第5図においてaおよびbは従来例と
全く同じである。すなわち、上クランプ9は閉
じ、下クランプ11は開放している。閉じた上ク
ランプ9はワイヤ3の繰り出しにおいてバツクテ
ンシヨンを与える作用をする。第5図cにおいて
lは第6図に示すように座標がそれぞれ(x1
y1、z1)、(x2、y2、z2)の第1、第2接続点P1
P2を正常なワイヤループでボンデイングするの
に必要なワイヤ長さを示し、このワイヤ3の長さ
はキヤピラリ位置演算制御装置27およびボンダ
制御装置32により計算し、キヤピラリ14を第
6図におけるQ1点までその下端が高さlになる
ように上昇させる。キヤピラリ14が高さlの
Q1点まで上昇すると下クランプ11を閉じ、キ
ヤピラリ14の下端に保持されたワイヤ3の長さ
を固定する。下クランプ11は閉じたままの状態
でキヤピラリ14と一体となつて上下動する。そ
して、第5図dのようキヤピラリ14は第2接続
点P2と反対方向へ移動するとともに、ワイヤ3
が切断されるのを防止するためキヤピラリ14を
同時に降下させる。これにより、ボール17の接
続部には第2接続点P2と反対方向の変形が行な
われる。つぎに、キヤピラリ14の下端のワイヤ
3が適当なたるみを保持するように第6図のQ2
点まで移動する。このとき、キヤピラリ14の下
端は第1接続点P1からl′の距離にある。そして、
このl′は実験においては第1接続点P1と第2接続
点P2の直線距離dの70%程度が最適であつた。
そして、上記Q2点からQ3点に向つてほぼ直線的
に移動する。途中Q2′点では第1接続点の真上と
なる。これを第5図eに示す。このeに示す位置
においてキヤピラリ14の下端近傍のワイヤ3は
第2接続点P2の逆方向に変形加工を受け、くの
字状に折曲される。第5図fはキヤピラリ14が
引続き第2接続点P2に向つて移動する状態を示
し、キヤピラリ14がリードフレーム19近傍の
Q3点に近付くと、キヤピラリ14より先きにワ
イヤ3がリードフレーム19に接触する。第5図
gはこの状態を示している。しかしながら従来の
方法に比較するとキヤピラリ14の先端のワイヤ
3は90度程度に折曲されているので第2接続点
P2で異常なたるみが発生しない。そしてキヤピ
ラリ14が、リードフレーム19に近付くとXY
方向にわずかに移動し、第2接続点P2の真上に
くる。第5図hは第2接続点P2の真上において
キヤピラリ14が下降し、所定の圧力でボンデイ
ングを行なつている状態を示す。ボンデイングが
終了すると下クランプ11が開き、キヤピラリ1
4が第5図iに示すように所定の高さまで上昇
し、下クランプ11が閉じ、ワイヤ3を引きちぎ
る。ついで、ワイヤ3の先端にボール17を形成
し、キヤピラリ14は初めの位置に復帰し1サイ
クルを完了する。
Next, the operation of the wire bonding apparatus constructed as described above will be explained with reference to FIGS. 5 and 6. In FIG. 5, a and b are exactly the same as in the conventional example. That is, the upper clamp 9 is closed and the lower clamp 11 is open. The closed upper clamp 9 acts to provide back tension when the wire 3 is fed out. In Fig. 5c, l has coordinates (x 1 ,
y 1 , z 1 ), the first and second connection points P 1 of (x 2 , y 2 , z 2 ),
The wire length required to bond P 2 with a normal wire loop is shown. The length of this wire 3 is calculated by the capillary position calculation control device 27 and the bonder control device 32, and the capillary 14 is Raise it to point 1 so that its lower end is at height l. The capillary 14 has a height l.
When it rises to point Q1 , the lower clamp 11 is closed and the length of the wire 3 held at the lower end of the capillary 14 is fixed. The lower clamp 11 moves up and down together with the capillary 14 while remaining closed. Then, as shown in FIG. 5d, the capillary 14 moves in the opposite direction to the second connection point P2 , and the wire 3
The capillary 14 is lowered at the same time to prevent it from being cut. As a result, the connecting portion of the ball 17 is deformed in the opposite direction to the second connecting point P2 . Next, make sure that the wire 3 at the lower end of the capillary 14 has an appropriate amount of slack by adjusting
Move to the point. At this time, the lower end of the capillary 14 is at a distance l' from the first connection point P1 . and,
In experiments, this l' was optimally about 70% of the straight-line distance d between the first connection point P1 and the second connection point P2 .
Then, it moves almost linearly from the Q2 point to the Q3 point. On the way, point Q 2 ' is directly above the first connection point. This is shown in Figure 5e. At the position shown in e, the wire 3 near the lower end of the capillary 14 is deformed in the direction opposite to the second connection point P2 and bent into a dogleg shape. FIG. 5f shows the state in which the capillary 14 continues to move toward the second connection point P2 , and the capillary 14 is located near the lead frame 19.
When approaching point Q 3 , the wire 3 contacts the lead frame 19 before the capillary 14. FIG. 5g shows this state. However, compared to the conventional method, the wire 3 at the tip of the capillary 14 is bent at about 90 degrees, so the second connection point is
No abnormal sagging occurs in P2 . When the capillary 14 approaches the lead frame 19,
direction, and come directly above the second connection point P2 . FIG. 5h shows a state in which the capillary 14 is lowered directly above the second connection point P2 and bonding is performed at a predetermined pressure. When bonding is completed, the lower clamp 11 opens and the capillary 1
4 is raised to a predetermined height as shown in FIG. 5i, the lower clamp 11 is closed and the wire 3 is torn off. Then, a ball 17 is formed at the tip of the wire 3, and the capillary 14 returns to its initial position, completing one cycle.

つぎに、上記キヤピラリ14、上クランプ9お
よび下クランプ11の作動を制御するキヤピラリ
位置演算制御装置27およびボンダ制御装置の作
用について説明する。
Next, the functions of the capillary position calculation control device 27 and the bonder control device that control the operations of the capillary 14, upper clamp 9, and lower clamp 11 will be explained.

ボンダ制御装置32からキヤピラリ位置演算制
御装置27に対して第1接続点P1の座標(x1
y1、z1)と第2接続点P2の座標(x2、y2、z2)と
を送る。これによりキヤピラリ位置演算制御装置
27は第1接続点P1と第2接続点P2との直線距
離、正常なワイヤ3の長さl、キヤピラリ14を
第1接続点P1からQ1,Q2,Q3を経て第2接続点
P2へと連続してスムーズに移動させるための径
路を計算する。そして、この計算結果はその都度
メモリされたのち、逐時1msごとにX,Y,Z軸
サーボコントローラ26,29および31に対し
て位置指令パルスとなつて与えられる。各サーボ
コントローラ26,29,31は位置指令パルス
をカウントし、現在位置と指令位置が等しくなる
ようにそれぞれのドライバ25,28および30
にモータ駆動指令を与える。各モータ22,23
および24が回転するとエンコーダ22a,23
aおよび24aから回転量に比例したパルスが発
生し、そのパルスをサーボコントローラ26,2
9,31がカウントしキヤピラリ14の現在位置
を知る。キヤピラリ位置演算制御装置27はキヤ
ピラリ14の位置に対応して上クランプ9、下ク
ランプ11と同期させて駆動するための信号を送
る。
The coordinates (x 1 ,
y 1 , z 1 ) and the coordinates (x 2 , y 2 , z 2 ) of the second connection point P 2 . As a result, the capillary position calculation control device 27 calculates the linear distance between the first connection point P 1 and the second connection point P 2 , the normal length l of the wire 3, and the distance between the capillary 14 from the first connection point P 1 to Q 1 , Q 2 , second connection point via Q 3
Calculate the route to move continuously and smoothly to P 2 . The calculation results are stored in memory each time and then given as position command pulses to the X, Y, and Z axis servo controllers 26, 29, and 31 every 1 ms. Each servo controller 26, 29, 31 counts the position command pulse, and each driver 25, 28, 30 counts the position command pulse so that the current position and the command position are equal.
Give a motor drive command to. Each motor 22, 23
and 24 rotates, the encoders 22a, 23
Pulses proportional to the amount of rotation are generated from a and 24a, and the pulses are sent to the servo controllers 26 and 2.
9 and 31 are counted and the current position of the capillary 14 is known. The capillary position calculation control device 27 sends a signal to drive the upper clamp 9 and lower clamp 11 in synchronization with the position of the capillary 14.

上記実施例のように第1接続点においてボンデ
イングしたのち、ボンデイングツールを上昇させ
て必要な長さのワイヤを繰り出し、第1接続点の
接続部を第2接続点と逆方向に変形加工するので
ワイヤ3を下クランプ11でクランプしたまま第
2接続点にボンデイングしても高いループでしか
も安定してワイヤを張ることができる。ワイヤ3
のループの高さは第5図におけるキヤピラリ14
下端までの長さlを制御することにより自由に設
定することができる。また、第1接続点と第2接
続点との距離から正常なワイヤ3の長さを自動的
に計算し、その長さのワイヤを正確に繰り出すよ
うにしたので非常に正確な理想的なループを形成
することができる。また、従来のように第2接続
点近傍でキヤピラリ14の中のワイヤ3が逆戻り
するという現象が起こらないのでキヤピラリ14
に付着したワイヤ屑などによりループの形状が影
響を受けることがないという効果もある。
After bonding at the first connection point as in the above embodiment, the bonding tool is raised to feed out the necessary length of wire, and the connection part at the first connection point is deformed in the opposite direction to the second connection point. Even if the wire 3 is bonded to the second connection point while being clamped by the lower clamp 11, the wire can be stretched stably with a high loop. wire 3
The height of the loop is the height of the capillary 14 in Figure 5.
It can be freely set by controlling the length l to the lower end. In addition, the normal length of the wire 3 is automatically calculated from the distance between the first connection point and the second connection point, and the wire of that length is accurately fed out, making it possible to create a very accurate ideal loop. can be formed. In addition, since the wire 3 inside the capillary 14 does not return in the vicinity of the second connection point as in the conventional case, the wire 3 inside the capillary 14
Another advantage is that the shape of the loop is not affected by wire scraps or the like attached to the loop.

次に他の実施例について説明する。 Next, other embodiments will be described.

第7図は第1図を部分的に改造し下クランプを
回転支点40を中心に回転できるようにしたもの
である。動力源は図中に示すアクチユエータ41
でありこのアクチユエータはボンダ制御装置32
により駆動される。本機構により下クランプ11
は約1mm上下可能とすることができる。
FIG. 7 shows a partially modified version of FIG. 1 so that the lower clamp can be rotated about a rotational fulcrum 40. The power source is the actuator 41 shown in the figure.
and this actuator is the bonder control device 32.
Driven by. With this mechanism, the lower clamp 11
can be moved up and down by about 1 mm.

次に本装置によりボンデイングを行う方法を説
明する。この目的は図5fからgの区間において
キヤピラリ先端のワイヤが約90度に折角されるこ
とを助けるものである。すなわち図5gにおいて
キヤピラリ14より先にリードフレーム19に接
するワイヤ長さをできるだけ少くし、安定なワイ
ヤループを作るものである。
Next, a method for performing bonding using this apparatus will be explained. The purpose of this is to help the wire at the tip of the capillary to be bent to about 90 degrees in the section of FIGS. 5f to g. That is, in FIG. 5g, the length of the wire that contacts the lead frame 19 before the capillary 14 is made as short as possible to create a stable wire loop.

そのためには図5で示す動作に若干の修正を加
える必要がある。すなわち、図5cにおいてワイ
ヤ長さlを0.5mm程度大きくしl1とする(l1=l+
α)そしてこのプラスされたαは図5gにおいて
下クランプ11を+αだけ上昇させる。この操作
によりワイヤループの長さはlとなり前記実施例
と同じループになる。この実施例では図5gでワ
イヤがαだけ引き上げられるため、ワイヤがリー
ドフレーム19に接する時期がおくれ、その分だ
けワイヤループにたるみを発生させることが少く
なりよりループが得られる。
For this purpose, it is necessary to make some modifications to the operation shown in FIG. That is, in Fig. 5c, the wire length l is increased by about 0.5 mm to l 1 (l 1 = l +
α) This added α then raises the lower clamp 11 by +α in FIG. 5g. By this operation, the length of the wire loop becomes l, which is the same as in the previous embodiment. In this embodiment, since the wire is pulled up by α in FIG. 5g, the time when the wire comes into contact with the lead frame 19 is delayed, and the occurrence of slack in the wire loop is reduced by that much, resulting in a better loop.

なお前記各実施例においては、ボンデイングツ
ールとして中心にワイヤ13が挿通されたキヤピ
ラリ14を用いたボールボンデイングについて説
明したが一般に超音波ボンデイングとして知れて
いるウエツジを用いたボンデイングにも適用でき
ることは明らかである。
In each of the above embodiments, ball bonding using a capillary 14 with a wire 13 inserted through the center as a bonding tool was explained, but it is clear that the present invention can also be applied to bonding using a wedge, which is generally known as ultrasonic bonding. be.

なおワイヤとして金線、アルミ線、銅線なども
使用できる。
Note that gold wire, aluminum wire, copper wire, etc. can also be used as the wire.

〔発明の効果〕〔Effect of the invention〕

以上説明したように、この発明においてはボン
デイングツールの先端と第1接続点との間のワイ
ヤの長さを第1接続点と第2接続点とを結ぶワイ
ヤの長さとほぼ等しくなるまで繰出したのちはワ
イヤをクランプしてキヤピラリを第2接続点まで
移動させるのでワイヤループの形状を確実にコン
トロールすることができるという効果を奏する。
As explained above, in this invention, the length of the wire between the tip of the bonding tool and the first connection point is fed out until it becomes approximately equal to the length of the wire connecting the first connection point and the second connection point. Since the wire is then clamped and the capillary is moved to the second connection point, the shape of the wire loop can be reliably controlled.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は一般のワイヤボンデイング装置を示す
側面図、第2図は従来のワイヤボンデイング方法
における動作説明図、第3図はワイヤループの形
状の良い例と悪い例とを比較して示す側面図、第
4図はこの発明の一実施例に用いられるボンデイ
ング装置の要部を示す斜視図、第5図はこの発明
の方法における動作説明図、第6図は同じくこの
発明の方法における動作説明図、第7図は他の実
施例に用いられるボンデイング装置の側面図であ
る。 2……ワイヤスプール、3……ワイヤ、4……
ワイヤガイド、9……上クランプ、11……下ク
ランプ、14……キヤピラリ、P1……第1接続
点、P2……第2接続点、27……キヤピラリ位
置演算制御装置(制御回路)、26,29,31
……X、Y、Zサーボコントローラ。
Fig. 1 is a side view showing a general wire bonding device, Fig. 2 is an explanatory diagram of the operation in a conventional wire bonding method, and Fig. 3 is a side view showing a comparison of good and bad wire loop shapes. , FIG. 4 is a perspective view showing the main parts of a bonding apparatus used in an embodiment of the present invention, FIG. 5 is an explanatory diagram of the operation in the method of the present invention, and FIG. 6 is an explanatory diagram of the operation in the method of the present invention. , FIG. 7 is a side view of a bonding apparatus used in another embodiment. 2... wire spool, 3... wire, 4...
Wire guide, 9... Upper clamp, 11... Lower clamp, 14... Capillary, P 1 ... First connection point, P 2 ... Second connection point, 27... Capillary position calculation control device (control circuit) , 26, 29, 31
...X, Y, Z servo controller.

Claims (1)

【特許請求の範囲】 1 ワイヤを巻着しているスプールからワイヤガ
イド、クランプをへてボンデイングツールに挿通
されたワイヤを、上記ボンデイングツールの下降
により第1接続点にボンデイングし、つぎに上記
ボンデイングツールを上昇かつXY方向に移動さ
せて、ワイヤを繰出し、第2接続点にボンデイン
グしついで、ワイヤを引きちぎるワイヤボンデイ
ング方法において、第1接続点にボンデイングし
たのち、ボンデイングツールの先端から第1接続
点の間にあるワイヤの長さが、第1、第2接続点
間を結ぶ正常なループの長さ(=l)とほぼ等し
くなるまでボンデイングツールを上昇させてワイ
ヤを操り出したあとボンデイングツールと一体と
なつて移動する構造をもつクランパを閉じて、以
後のワイヤの繰り出しを止め、 次いて、ボンデイングツールを下降させなが
ら、第2接続点の方向とは逆方向に移動させ、ワ
イヤのたるみを作り、このたるみを保持した状態
で再度第1接続点の真上に移動し、ワイヤの座屈
を第2接続点の反対方向に作るとともに塑性変形
を起こさせ、ワイヤを成形しながら第2接続点に
移動、下降し、ボンデイングするワイヤボンデイ
ング方法。 2 第1および第2接続点の座標および要求され
るワイヤループの高さをもとに演算し、必要なワ
イヤ長さ(=l)を自動的に算出し、前記第1接
続点より上昇させ、ワイヤをクランプする時のツ
ールの高さを上記lにすることを特徴とする特許
請求の範囲第1項記載のワイヤボンデイング方
法。 3 特許請求の範囲第1項の方法において、クラ
ンパをボンデイングツールに対して相対的に上下
動させる機能をもたせ、ボンデイングツールが、
第1接続点より上昇し、次いてクランパでワイヤ
をクランプする時のボンデイングツールの高さを
必要なワイヤの長さ(=l)よりわずかに大きい
長さ(=l+α)に等しくし、このわずかな長さ
(=α)は、ボンデイングツールが第2接続点に
ボンデイングする手前でクランパによりボンデイ
ングツールの上方にわずかな長さ(=α)引き上
げることを特徴とするワイヤボンデイング方法。
[Claims] 1. A wire that is passed through a wire guide, a clamp, and a bonding tool from a spool around which the wire is wound is bonded to a first connection point by lowering the bonding tool; In a wire bonding method in which the tool is moved upward and in the XY direction, the wire is fed out, bonded to a second connection point, and then the wire is torn off, the wire is bonded to the first connection point, and then from the tip of the bonding tool to the first connection point. Raise the bonding tool until the length of the wire between them is approximately equal to the length of the normal loop (=l) connecting the first and second connection points, and then lower the bonding tool. The clamper, which has a structure that moves together, is closed to stop the wire from being fed out from now on. Next, while lowering the bonding tool, move it in the opposite direction to the direction of the second connection point to remove the slack in the wire. Then move the wire directly above the first connection point again while holding this slack, make the wire buckle in the opposite direction of the second connection point, cause plastic deformation, and make the second connection while forming the wire. A wire bonding method that moves, lowers, and bonds to a point. 2 Calculate based on the coordinates of the first and second connection points and the required height of the wire loop, automatically calculate the required wire length (=l), and raise it above the first connection point. 2. The wire bonding method according to claim 1, wherein the height of the tool when clamping the wire is set to the above l. 3. In the method according to claim 1, the clamper is provided with a function of moving up and down relative to the bonding tool, and the bonding tool
The height of the bonding tool when it rises above the first connection point and then clamps the wire with the clamper is set equal to a length (=l+α) that is slightly larger than the required wire length (=l), and this slightly The wire bonding method is characterized in that the wire bonding tool is pulled up by a slight length (=α) above the bonding tool using a clamper before the bonding tool bonds to the second connection point.
JP58020094A 1983-02-09 1983-02-09 Wire bonding method Granted JPS59150436A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP58020094A JPS59150436A (en) 1983-02-09 1983-02-09 Wire bonding method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP58020094A JPS59150436A (en) 1983-02-09 1983-02-09 Wire bonding method

Publications (2)

Publication Number Publication Date
JPS59150436A JPS59150436A (en) 1984-08-28
JPH0236064B2 true JPH0236064B2 (en) 1990-08-15

Family

ID=12017522

Family Applications (1)

Application Number Title Priority Date Filing Date
JP58020094A Granted JPS59150436A (en) 1983-02-09 1983-02-09 Wire bonding method

Country Status (1)

Country Link
JP (1) JPS59150436A (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2823454B2 (en) * 1992-12-03 1998-11-11 株式会社東芝 Wire bonding equipment
EP1187190A1 (en) 2000-09-11 2002-03-13 Marconi Communications GmbH Method for monitoring the length of constant-wire-length bonds & apparatus therefor
JP5065585B2 (en) 2005-10-11 2012-11-07 ユニ・チャーム株式会社 Breastfeeding pad
WO2009117170A1 (en) * 2008-03-17 2009-09-24 Kulicke And Soffa Industries, Inc. Wire payout measurement and calibration techniques for a wire bonding machine

Also Published As

Publication number Publication date
JPS59150436A (en) 1984-08-28

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