JPH0232576A - Detection of faint signal - Google Patents

Detection of faint signal

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Publication number
JPH0232576A
JPH0232576A JP18324788A JP18324788A JPH0232576A JP H0232576 A JPH0232576 A JP H0232576A JP 18324788 A JP18324788 A JP 18324788A JP 18324788 A JP18324788 A JP 18324788A JP H0232576 A JPH0232576 A JP H0232576A
Authority
JP
Japan
Prior art keywords
signal
measurement
cpu
magnetic field
graph
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP18324788A
Other languages
Japanese (ja)
Other versions
JP2664067B2 (en
Inventor
Koji Mori
孝二 森
Masumi Shimada
島田 真澄
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ricoh Co Ltd
Original Assignee
Ricoh Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ricoh Co Ltd filed Critical Ricoh Co Ltd
Priority to JP18324788A priority Critical patent/JP2664067B2/en
Publication of JPH0232576A publication Critical patent/JPH0232576A/en
Application granted granted Critical
Publication of JP2664067B2 publication Critical patent/JP2664067B2/en
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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  • Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)

Abstract

PURPOSE:To accurately read a faint signal by displacing the faint signal changing from time to time on a display, observing the change in the signal, and processing and detecting the faint signal by instructions from an input unit. CONSTITUTION:Parameters required for measurement of hole mobility are inputted through an input unit of a drive device 11, and a CPU incorporates therein those parameters and successively plots measured data on a CRT of the device 11 for preparation of a graph. In the measurement of the hole mobility, a magnetic field is applied to a semiconductor thin film sample 13 with a current supplied from a current source 14 in response to the hole mobility. Hereby, a signal voltage responsible to the mobility is generated. The signal voltage is measured by a digital voltmeter 17 through buffer amplifiers 15, 16. The CPU 12 plots the measured voltage on the graph on the CPU, successively. An operator watches the graph and effects the measurement at a position where the signal is stabilized. The CPU 12 records the measurement data on a printer 18.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明はホールモビリティ測定等に用いられる微小信号
検出方法に関する。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a small signal detection method used for Hall mobility measurement and the like.

〔従来の技術〕[Conventional technology]

半導体薄膜の電気特性を評価する上でホール移動度の評
価は欠かすことのできないものであり、半導体薄膜のホ
ール移動度を測定してその結果により半導体薄膜のホー
ル移動度を評価している。
Evaluation of hole mobility is essential in evaluating the electrical properties of semiconductor thin films, and the hole mobility of semiconductor thin films is measured and evaluated based on the results.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

半導体薄膜のホール移動度を測定する場合には半導体薄
膜が高抵抗(106Ω・cm以上)であるので、その測
定信号が微小(mV〜μV)となり、信号を正確に読み
取ることが困難であった。
When measuring the hole mobility of a semiconductor thin film, since the semiconductor thin film has a high resistance (more than 106 Ω cm), the measurement signal is very small (mV to μV), making it difficult to read the signal accurately. .

本発明はこのような点に鑑み、信号を正確に読み取るこ
とができる微小信号検出方法を提供することを目的とす
る。
In view of these points, it is an object of the present invention to provide a minute signal detection method that can accurately read signals.

CC11Aを解決するための手段〕 上記目的を達成するため1本発明は刻々と変化する微小
信号を表示装置で表示してその変化を児させながら、入
力装置からの指示に基づいて上記微小信号を処理して信
号を検出する9 〔実施例〕 本発明の実施例では半導体薄膜のホール移動度を測定装
置により測定してその刻々と変化する微小な測定信号を
CRT(陰極線管)を用いた表示装置で表示し、作業者
がその微小な測定信号を実際に見ながら半導体薄膜に与
えられる磁場のオン/オフを行う。そして測定終了後に
はCRT上の預り定信号に第5図に示すように磁場がオ
フからオンになったところに線りを引き、CRT上の測
定信号を磁場がオフからオンになったところを境に拡大
させる範囲、例えば磁場がオフからオンになったところ
より前後30個の測定データからなる範囲を決めて第6
図に示すようにCRT上の測定信号をその範囲だけ拡大
して表示させる。次に作業者がCRT上の測定信号にお
いて安定している範囲であって第7図に示すように磁場
がオフからオンになったところの前後の測定データの示
す直線の傾きを求める範囲A−B、C−Dを決めて入力
装置で指示することによりその範囲A−B、C−Dの測
定データの傾きを最小自乗法により求めて信号を検出す
る。この場合信号はA−B間、C−D間の各測定データ
を最小自乗して磁場オンでの値に外挿することにより得
る。この外挿した値は第8図に示すように測定データが
安定している範囲A−B、C−Dの各平均値を求めてそ
の差をとることにより求めた信号に比べて正しい値とな
る。
Means for Solving CC11A] In order to achieve the above object, the present invention displays minute signals that change moment by moment on a display device to produce changes in the minute signals, and then displays the minute signals based on instructions from an input device. Processing and Detecting Signals 9 [Example] In an example of the present invention, the hole mobility of a semiconductor thin film is measured by a measuring device, and the ever-changing minute measurement signal is displayed using a CRT (cathode ray tube). This is displayed on a device, and the operator turns on and off the magnetic field applied to the semiconductor thin film while actually viewing the minute measurement signals. After the measurement is completed, a line is drawn on the CRT signal at the point where the magnetic field changes from off to on, as shown in Figure 5, and a line is drawn on the measurement signal on the CRT to the point where the magnetic field changes from off to on. Determine the range to be expanded to the boundary, for example, the range consisting of 30 measurement data before and after the point where the magnetic field is turned on from off, and then
As shown in the figure, the measurement signal on the CRT is enlarged and displayed by that range. Next, the operator determines the slope of the straight line shown by the measurement data before and after the point where the magnetic field is turned on from off, as shown in Figure 7, which is the range where the measurement signal on the CRT is stable. By determining B and CD and instructing them with an input device, the slope of the measurement data in the ranges AB and CD is determined by the method of least squares and a signal is detected. In this case, the signal is obtained by taking the least squares of each measurement data between AB and CD and extrapolating it to the value when the magnetic field is on. As shown in Figure 8, this extrapolated value is a correct value compared to the signal obtained by finding the average values of the ranges A-B and C-D where the measurement data is stable and taking the difference. Become.

この値をVとすると、試料13のホール移動度μはμ=
d −R/p −B(R=V/I)となる。ここにdは
試料13の膜厚、Rは試料13の磁場印加時のホール抵
抗、ρは試料13の抵抗率、Bは上記磁場の強さ、Iは
電流源14の電流値である。
If this value is V, then the Hall mobility μ of sample 13 is μ=
d −R/p −B (R=V/I). Here, d is the film thickness of the sample 13, R is the Hall resistance of the sample 13 when a magnetic field is applied, ρ is the resistivity of the sample 13, B is the strength of the magnetic field, and I is the current value of the current source 14.

第1図はこの実施例で用いた装置を示し、第2図はこの
装置におけるコンピュータ(CP U)12のプログラ
ムを示すフローチャートである。
FIG. 1 shows the apparatus used in this embodiment, and FIG. 2 is a flowchart showing the program of the computer (CPU) 12 in this apparatus.

ドライブ装置11はCRTを用いた表示装置とキーボー
ドからなる入力装置を含むものである。CPU12は入
力装置により入力されたホール移動度の測定に必要なパ
ラメータを取り込み、測定データを逐次CRT上にプロ
ットするためにCRT上にグラフを作成する。次にホー
ル移動度の測定を行うが、半導体薄膜の試料13は磁界
発生装置により磁場が与えられ、電流源14により電流
Iが供給されてホール移動度に応じた信号電圧が発生す
る。
The drive device 11 includes an input device consisting of a display device using a CRT and a keyboard. The CPU 12 takes in the parameters necessary for measuring the Hall mobility inputted by the input device, and creates a graph on the CRT in order to sequentially plot the measurement data on the CRT. Next, hole mobility is measured. A magnetic field is applied to the semiconductor thin film sample 13 by a magnetic field generator, and a current I is supplied from a current source 14 to generate a signal voltage according to the hole mobility.

この信号電圧は入力インピーダンス101sΩのバッフ
ァ増幅器15.16を介してディジタル電圧計17によ
り測定され、CPU12は測定・データプロットルーチ
ンMeasurement−1にてディジタル電圧計1
7の測定電圧を取り込んで逐次CRT上のグラフにプロ
ットする。この実施例では作業者が測定信号の安定して
いて信号検出に用いる範囲を選択することにより、CP
U12がこの範囲を選択しやすいようにCRT上の測定
信号の磁場がオンになったところの付近を拡大するが、
CP U12はその拡大範囲を設定してCRT上の測定
信号をその範囲だけ拡大してプロットする。そしてCP
U12は信号出力算出ルーチンAveにてCRT上の測
定信号により信号を算出する。
This signal voltage is measured by a digital voltmeter 17 via a buffer amplifier 15.16 having an input impedance of 101 sΩ, and the CPU 12 uses the digital voltmeter 17 in a measurement/data plotting routine Measurement-1.
7 measurement voltages are taken in and sequentially plotted on a graph on the CRT. In this embodiment, the operator can select a stable range of the measurement signal and use it for signal detection.
To make it easier for U12 to select this range, we will expand the area around where the magnetic field of the measurement signal on the CRT is turned on.
The CPU 12 sets the enlargement range, enlarges the measurement signal on the CRT by the range, and plots it. And C.P.
U12 calculates a signal based on the measurement signal on the CRT in a signal output calculation routine Ave.

第3図は上記測定・データプロットルーチンMeasu
rement−1を示す・ CPU12はグラフを作成したCRT上の範囲をデータ
プロット範囲として設定し、ディジタル電圧計(デジポ
ル)17をクリアする。次にCPU12はディジタル電
圧計17を測定状態に設定し、ある秒数(ここでは任意
の秒数5tep time)待ってから、ディジタル電
圧計17からのデータを読み取ってCRT上のグラフに
プロットする。以下CPU12はこの動作を繰り返して
行うが、作業者がCRTを児ながら任意の時点で上記磁
界発生装置により磁場をかける。磁場をかけた場合CP
U12は同様にディジタル電圧計17からのデータを読
み取ってCRT上のグラフにプロットするが、磁場がオ
フからオンになった時にはタイマの計時している時間と
ディジタル電圧計17の出力電圧を読み込むと共に番号
を付ける。そして測定が終了したら、CPU12はCR
T上の測定信号における磁場がオフからオンになった箇
所に線りを引いて表示させる。
Figure 3 shows the above measurement and data plotting routine.
Indicates rement-1. The CPU 12 sets the range on the CRT where the graph was created as the data plot range, and clears the digital voltmeter (Digipol) 17. Next, the CPU 12 sets the digital voltmeter 17 to a measurement state, waits for a certain number of seconds (here, an arbitrary number of seconds, 5 tep time), and then reads the data from the digital voltmeter 17 and plots it on a graph on the CRT. Thereafter, the CPU 12 repeats this operation, and the operator applies a magnetic field using the magnetic field generator at any time while holding the CRT. CP when a magnetic field is applied
U12 similarly reads data from the digital voltmeter 17 and plots it on a graph on the CRT, but when the magnetic field is turned on from off, it reads the time measured by the timer and the output voltage of the digital voltmeter 17, and Add a number. Then, when the measurement is completed, the CPU 12
A line is drawn and displayed at the point where the magnetic field in the measurement signal on T turns from off to on.

第4図は上記信号出力算出ルーチンAveを示す。FIG. 4 shows the signal output calculation routine Ave.

CPU12は上記磁場がオンした時にはその番号をプリ
ンタ18にプリントアウトさせる。作業者はこの番号を
参照し、磁場がオンした前後の平均をとるべき安定した
データの番号を入力装置で入力する。CPU12はその
データの番号を表示装置に表示させ、作業者がデータの
番号を再入力した場合にはその再入力したデータの番号
を表示装置に表示させる。次にCPU12はその番号の
データの平均値を磁場がオンする前と後で算出し、最小
自乗法により磁場がオンする前と後におけるデータの示
す直線の傾きを求める。次にCPU12は磁場がオンす
る前と後におけるデータの各平均値とその差を求めてプ
リンタ18にプリントアウトさせる。
When the magnetic field is turned on, the CPU 12 causes the printer 18 to print out the number. The operator refers to this number and uses the input device to input the number of stable data to be averaged before and after the magnetic field is turned on. The CPU 12 displays the data number on the display device, and when the operator re-inputs the data number, displays the re-input data number on the display device. Next, the CPU 12 calculates the average value of the data of that number before and after the magnetic field is turned on, and uses the method of least squares to find the slope of the straight line represented by the data before and after the magnetic field is turned on. Next, the CPU 12 calculates each average value and the difference between the data before and after the magnetic field is turned on, and causes the printer 18 to print them out.

次にCPU12はCRT上に磁場がオフからオンになっ
た時の時間、電圧と、磁場がオンする前と後における各
データの平均値及びその差、上記傾きをプロットし、ま
た磁場がオフからオンになったところに縦線を引くと共
に、最小自乗法によって求めた磁場がオンする前と後に
おける直線をプロットする。
Next, the CPU 12 plots on the CRT the time and voltage when the magnetic field was turned on from off, the average value and difference of each data before and after the magnetic field was turned on, and the above slope, and Draw a vertical line where the magnetic field turns on, and plot the straight lines before and after the magnetic field turns on, which were determined by the least squares method.

〔発明の効果〕〔Effect of the invention〕

以上のように本発明によれば刻々と変化する微小信号を
表示装置で表示してその変化を見させながら、入力装置
からの指示に基づいて上記微小信号を処理して信号を検
出するので、信号を正確に読み取ることが可能となる。
As described above, according to the present invention, a minute signal that changes every moment is displayed on a display device so that the change can be seen, and the minute signal is processed based on an instruction from an input device to detect the signal. It becomes possible to read the signal accurately.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例で用いた装置を示すブロック
図、第2図は同実施例におけるCPUのプログラムを示
すフローチャート、第3図は同プログラムにおける測定
・データプロットルーチンを示すフローチャート、第4
図は同プログラムにおける信号出力算出ルーチンを示す
フローチャート、第5図は上記装置のホール電圧検出例
を示す図、第6図は同ホール電圧検出例の一部を拡大し
て示す図、第7図及び第8図は上記実施例を説明するた
めの図である。 11・・・ドライブ装置、12・・・CPU。 亮 因 亮 ■ 時間(3a)
FIG. 1 is a block diagram showing an apparatus used in an embodiment of the present invention, FIG. 2 is a flowchart showing a CPU program in the same embodiment, and FIG. 3 is a flowchart showing a measurement/data plotting routine in the same program. Fourth
The figure is a flowchart showing the signal output calculation routine in the same program, Figure 5 is a diagram showing an example of Hall voltage detection by the above device, Figure 6 is an enlarged view of a part of the same Hall voltage detection example, and Figure 7 is and FIG. 8 are diagrams for explaining the above embodiment. 11... Drive device, 12... CPU. Ryoin Ryo ■ Time (3a)

Claims (1)

【特許請求の範囲】[Claims] 刻々と変化する微小信号を表示装置で表示してその変化
を見させながら、入力装置からの指示に基づいて上記微
小信号を処理して信号を検出することを特徴とする微小
信号検出方法。
A method for detecting a minute signal, characterized in that the minute signal that changes moment by moment is displayed on a display device so that the change can be seen, and the minute signal is processed and detected based on an instruction from an input device.
JP18324788A 1988-07-22 1988-07-22 Small signal detection method Expired - Fee Related JP2664067B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP18324788A JP2664067B2 (en) 1988-07-22 1988-07-22 Small signal detection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP18324788A JP2664067B2 (en) 1988-07-22 1988-07-22 Small signal detection method

Publications (2)

Publication Number Publication Date
JPH0232576A true JPH0232576A (en) 1990-02-02
JP2664067B2 JP2664067B2 (en) 1997-10-15

Family

ID=16132350

Family Applications (1)

Application Number Title Priority Date Filing Date
JP18324788A Expired - Fee Related JP2664067B2 (en) 1988-07-22 1988-07-22 Small signal detection method

Country Status (1)

Country Link
JP (1) JP2664067B2 (en)

Also Published As

Publication number Publication date
JP2664067B2 (en) 1997-10-15

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