JPH0232063U - - Google Patents
Info
- Publication number
- JPH0232063U JPH0232063U JP10942488U JP10942488U JPH0232063U JP H0232063 U JPH0232063 U JP H0232063U JP 10942488 U JP10942488 U JP 10942488U JP 10942488 U JP10942488 U JP 10942488U JP H0232063 U JPH0232063 U JP H0232063U
- Authority
- JP
- Japan
- Prior art keywords
- probe
- opening
- ring
- attached
- integrated circuit
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 claims description 14
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988109424U JPH0548133Y2 (de) | 1988-08-19 | 1988-08-19 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1988109424U JPH0548133Y2 (de) | 1988-08-19 | 1988-08-19 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0232063U true JPH0232063U (de) | 1990-02-28 |
| JPH0548133Y2 JPH0548133Y2 (de) | 1993-12-20 |
Family
ID=31345653
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP1988109424U Expired - Lifetime JPH0548133Y2 (de) | 1988-08-19 | 1988-08-19 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0548133Y2 (de) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0666833A (ja) * | 1992-04-28 | 1994-03-11 | Nippon Denshi Zairyo Kk | プローブカード用探針 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5832782A (ja) * | 1981-08-20 | 1983-02-25 | 池田 与作 | 卓球ラケツトの製造方法 |
| JPS5878436A (ja) * | 1981-11-05 | 1983-05-12 | Seiichiro Sogo | テストプロ−ブ組立体 |
| JPS5989430A (ja) * | 1982-09-17 | 1984-05-23 | アングリアテク・リミテツド | 集積回路の試験用探針器およびその製造方法 |
-
1988
- 1988-08-19 JP JP1988109424U patent/JPH0548133Y2/ja not_active Expired - Lifetime
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5832782A (ja) * | 1981-08-20 | 1983-02-25 | 池田 与作 | 卓球ラケツトの製造方法 |
| JPS5878436A (ja) * | 1981-11-05 | 1983-05-12 | Seiichiro Sogo | テストプロ−ブ組立体 |
| JPS5989430A (ja) * | 1982-09-17 | 1984-05-23 | アングリアテク・リミテツド | 集積回路の試験用探針器およびその製造方法 |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0666833A (ja) * | 1992-04-28 | 1994-03-11 | Nippon Denshi Zairyo Kk | プローブカード用探針 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0548133Y2 (de) | 1993-12-20 |