JPH02307091A - Stage mechanism - Google Patents
Stage mechanismInfo
- Publication number
- JPH02307091A JPH02307091A JP1128381A JP12838189A JPH02307091A JP H02307091 A JPH02307091 A JP H02307091A JP 1128381 A JP1128381 A JP 1128381A JP 12838189 A JP12838189 A JP 12838189A JP H02307091 A JPH02307091 A JP H02307091A
- Authority
- JP
- Japan
- Prior art keywords
- stage
- drive shaft
- balance
- section
- gravity
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000005484 gravity Effects 0.000 claims abstract description 19
- 230000001133 acceleration Effects 0.000 claims description 7
- 239000004065 semiconductor Substances 0.000 description 12
- 230000003287 optical effect Effects 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 4
- 238000009434 installation Methods 0.000 description 3
- 230000007423 decrease Effects 0.000 description 2
- 238000005286 illumination Methods 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000004804 winding Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70766—Reaction force control means, e.g. countermass
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70716—Stages
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70691—Handling of masks or workpieces
- G03F7/70758—Drive means, e.g. actuators, motors for long- or short-stroke modules or fine or coarse driving
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
- G03F7/70858—Environment aspects, e.g. pressure of beam-path gas, temperature
- G03F7/709—Vibration, e.g. vibration detection, compensation, suppression or isolation
Abstract
Description
【発明の詳細な説明】
〈産業上の利用分野〉
本発明は、半導体製造装置の露光装置等においてステッ
プ駆動の可動ステージに利用されるステージ機構に関す
る。DETAILED DESCRIPTION OF THE INVENTION <Industrial Application Field> The present invention relates to a stage mechanism used as a step-driven movable stage in an exposure apparatus of a semiconductor manufacturing apparatus or the like.
〈従来の技術〉
半導体装置の露光装置等に用いられている従来のステー
ジ機構を第3図に示す。<Prior Art> FIG. 3 shows a conventional stage mechanism used in exposure equipment for semiconductor devices.
ステージ機構21は、ベース2J:に駆動部3か固定さ
れている。該駆動部3には駆動軸22か駆動自在に設け
られている。該駆動軸22にはステージ23が取り付け
られている。該ステージ23はベース2上に摺動自在に
設けられている。The stage mechanism 21 has a drive unit 3 fixed to the base 2J. The drive section 3 is provided with a drive shaft 22 so as to be freely drivable. A stage 23 is attached to the drive shaft 22. The stage 23 is slidably provided on the base 2.
又通常、設置面からの振動の影響を緩和する為に、ベー
ス2は防振器ll上に設置されている。Further, the base 2 is usually installed on a vibration isolator 11 in order to reduce the influence of vibration from the installation surface.
次に、ステージ機構21の動作を説明する。Next, the operation of the stage mechanism 21 will be explained.
先ず、駆動部3か駆動軸22をその軸心方向に駆動する
。それに伴い、ステージ23がベース2上を摺動する。First, the drive section 3 or the drive shaft 22 is driven in the axial direction. Accordingly, the stage 23 slides on the base 2.
上記したステージ機構21を半導体装置のステッパに用
いた場合を第4図により説明する。A case where the stage mechanism 21 described above is used in a stepper of a semiconductor device will be explained with reference to FIG.
通常、ステッパ20には、露光照明部、コンデンサレン
ズ部、レチクル設置部及び縮小レンズ部で構成された露
光光学系15が設けられている。該露光光学系15はア
ーム16に固定されている。Typically, the stepper 20 is provided with an exposure optical system 15 that includes an exposure illumination section, a condenser lens section, a reticle installation section, and a reduction lens section. The exposure optical system 15 is fixed to an arm 16.
該アームJ6は、ステージ機構21のベース2上に固設
されている。The arm J6 is fixed on the base 2 of the stage mechanism 21.
又ステージ機構21のステージ23上には半導体ウェハ
30が@、置されている。Further, a semiconductor wafer 30 is placed on the stage 23 of the stage mechanism 21.
該半導体ウェハ30には、ステージ23かステップ駆動
される毎に、レチクルパターンが露光される。A reticle pattern is exposed onto the semiconductor wafer 30 each time the stage 23 is driven step by step.
〈発明が解決しようとする課題〉
しかしながら、上記した従来の技術では、イ)ステージ
が移動するにつれてステージ機構の重心か移動するので
、防振器に支持されているベースのバランスが崩れ、ス
テージ機構か振動を起こす。<Problems to be Solved by the Invention> However, in the above-mentioned conventional technology, (a) as the stage moves, the center of gravity of the stage mechanism moves, which causes the base supported by the vibration isolator to lose its balance, causing the stage mechanism to or cause vibration.
口)ステージが移動する場合には、ステージに加速度が
生じるので、駆動軸を介して駆動部にステージの移動方
向又はその反対方向に慣性モーメントが生じ、ステージ
機構を回転させようとする。その為、ステージ機構か振
動を起こす。When the stage moves, acceleration is generated on the stage, so a moment of inertia is generated in the drive unit via the drive shaft in the direction of movement of the stage or in the opposite direction, which tends to rotate the stage mechanism. This causes the stage mechanism to vibrate.
この様な従来のステージ機構を半導体製造装置の露光装
置、特にステッパに用いた場合には、位置決め精度か低
下してピッチずれやチップ回転等を起こすとともにフォ
ーカス精度か低下して解像不良を起こす為に、露光され
る半導体装置の歩留りが低下するという課題を有してい
た。When such a conventional stage mechanism is used in an exposure device of semiconductor manufacturing equipment, especially a stepper, the positioning accuracy decreases, causing pitch deviation and chip rotation, and the focusing accuracy decreases, resulting in poor resolution. Therefore, there has been a problem in that the yield of exposed semiconductor devices is reduced.
く課題を解決するための手段〉
本発明は、上記課題を解決する為に成されたもので、ス
テージの移動時に生じる振動が防止されるステージ機構
を提供することを目的とする。Means for Solving the Problems> The present invention has been made to solve the above problems, and an object of the present invention is to provide a stage mechanism that prevents vibrations that occur when the stage moves.
即ち、ステージとバランス部とがステージの重心の移動
方向に対して反対方向に移動して、ステージとバランス
部とバランス部駆動軸とが成す重心を常に一定位置に保
つとともに、ステージの移動によってステージ機構に生
じる慣性モーメントが打ち消される所定の加速度で移動
するバランス部を設けたことを特徴とするものである。In other words, the stage and the balance section move in the opposite direction to the direction in which the center of gravity of the stage moves, and the center of gravity formed by the stage, the balance section, and the balance section drive shaft is always kept at a constant position, and the movement of the stage moves the center of gravity of the stage. This mechanism is characterized by the provision of a balance section that moves at a predetermined acceleration that cancels out the moment of inertia generated in the mechanism.
(作用〉
上記したステージ機構は、ステージの移動に対応して移
動するバランス部を設けたことにより、ステージとバラ
ンス部駆動軸とバランス部とが成す重心は、ステージの
重心の移動に対応してバランス部駆動軸とバランス部と
か成す重心が移動し、常に一定位置に保たれる。(Function) The stage mechanism described above is provided with a balance section that moves in response to the movement of the stage, so that the center of gravity formed by the stage, the balance section drive shaft, and the balance section changes in response to the movement of the center of gravity of the stage. The center of gravity, which is formed by the balance part drive shaft and the balance part, moves and is always kept at a constant position.
よって、ステージ機構の重心を常に一定位置に保つ。Therefore, the center of gravity of the stage mechanism is always kept at a constant position.
又ステージの質量と、バランス部駆動軸とバランス部を
和した質量と、を同質量にして設定するとともに、バラ
ンス部駆動軸とバランス部とが成ず加速度の絶対値をス
テージの加速度の絶対値に等しく設定し、かつバランス
部駆動軸とともにバランス部をステージの移動方向に対
して反対方向に移動させて、ステージ機構に生じる慣性
モーメントを打ち消す。In addition, the mass of the stage and the sum of the mass of the balance part drive shaft and balance part are set to be the same mass, and the absolute value of the acceleration of the stage is set so that the balance part drive shaft and the balance part do not meet. The balance section is set equal to , and the balance section is moved in the opposite direction to the moving direction of the stage together with the balance section drive shaft to cancel out the moment of inertia generated in the stage mechanism.
よって、ステージの移動で生じる振動を防止する。Therefore, vibrations caused by the movement of the stage are prevented.
〈実施例〉 本発明の実施例を図に基づいて説明する。<Example> Embodiments of the present invention will be described based on the drawings.
第1図に示すステージ機構1は、防振器11を設けたベ
ース2上に駆動部3か固定されている。In the stage mechanism 1 shown in FIG. 1, a drive section 3 is fixed on a base 2 provided with a vibration isolator 11.
該駆動部3には、雄ねじ部4aと雌ねじ部4bとを形成
した主駆動軸4か回動可能に設けられている。この雄ね
じ部4a及び雌ねじ部4bは、夫々同一のピッチを有し
ていて、ねじ山の巻き方向が互いに逆方向に形成され、
夫々の軸心を一致させである。The drive portion 3 is rotatably provided with a main drive shaft 4 having a male threaded portion 4a and a female threaded portion 4b. The male threaded portion 4a and the female threaded portion 4b have the same pitch, and the winding directions of the threads are opposite to each other.
The axes of each should be aligned.
又、前記ベース2上には、ステージ5が摺動自在に設け
られている。Furthermore, a stage 5 is slidably provided on the base 2.
該ステージ5には、主駆動軸4の雄ねじ部4aに螺合す
る雌ねし部5bが形成されている。そして、ステージ5
は、主駆動軸4の回転によって、主駆動軸4の軸線X方
向に摺動される。又ステージ5の重心Gsは主駆動軸4
の軸線Xに一致させである。The stage 5 is formed with a female threaded portion 5b that is screwed into the male threaded portion 4a of the main drive shaft 4. And stage 5
is slid in the direction of the axis X of the main drive shaft 4 as the main drive shaft 4 rotates. Also, the center of gravity Gs of the stage 5 is the main drive shaft 4.
It is aligned with the axis X of .
一方、前記主駆動軸4には、雌ねじ部4bに螺合する雄
ねじ部6aを形成したバランス部駆動軸6が設けられて
いる。On the other hand, the main drive shaft 4 is provided with a balance drive shaft 6 having a male threaded portion 6a that is screwed into a female threaded portion 4b.
該バランス部駆動軸6の軸線X°は前記主駆動軸4の軸
線Xに一致させである。The axis X° of the balance drive shaft 6 is aligned with the axis X of the main drive shaft 4.
そして、バランス部駆動軸6は、主駆動軸4の回転に連
動して軸線x方向に移動する。The balance part drive shaft 6 moves in the axis x direction in conjunction with the rotation of the main drive shaft 4.
前記バランス部駆動軸6の先端でかつステージ5の内部
側には、前記ベース2上にかつ摺動自在に設けたバラン
ス部7が取り付けられている。又バランス部7とバラン
ス部駆動軸6とが成す重心G[lは、主駆動軸の軸線X
に一致させである。A balance part 7 is attached to the tip of the balance part drive shaft 6 and inside the stage 5, and is slidably provided on the base 2. In addition, the center of gravity G [l is the axis X of the main drive shaft formed by the balance part 7 and the balance part drive shaft 6
It should match.
次に、上記構成のステージ機構lの動作を説明する。Next, the operation of the stage mechanism I having the above configuration will be explained.
駆動部3によって主駆動軸4が回転させられると、ステ
ージ5が所定の方向に移動する。When the main drive shaft 4 is rotated by the drive unit 3, the stage 5 moves in a predetermined direction.
この時、バランス部駆動軸6は、ステージ5の移動方向
とは反対方向に移動する。又バランス部駆動軸6の加速
度の絶対値は、ステージ5の加速度の絶対値に等しくな
っている。At this time, the balance part drive shaft 6 moves in the opposite direction to the moving direction of the stage 5. Further, the absolute value of the acceleration of the balance portion drive shaft 6 is equal to the absolute value of the acceleration of the stage 5.
それに伴い、バランス部7もバランス部駆動軸6ととも
に移動する。Accordingly, the balance section 7 also moves together with the balance section drive shaft 6.
この様にして、ステージ5とバランス部駆動軸6とバラ
ンス部7とが成す重心Gを常に一定に保つとともに、ス
テージ5の移動によって生しる慣性モーメントを打ち消
す。In this way, the center of gravity G formed by the stage 5, the balance part drive shaft 6, and the balance part 7 is always kept constant, and the moment of inertia generated by the movement of the stage 5 is canceled out.
上記したステージ機構1を半導体製造装置のステッパに
用いた場合を第2図により説明する。A case in which the stage mechanism 1 described above is used in a stepper of a semiconductor manufacturing apparatus will be explained with reference to FIG.
通常、ステッパ10には、露光照明部、コンデンサレン
ズ部、レチクル設置部及び縮小レンズ部で構成された露
光光学系15か設けられている。該露光光学系15はア
ーム16に固定されている。Usually, the stepper 10 is provided with an exposure optical system 15 that includes an exposure illumination section, a condenser lens section, a reticle installation section, and a reduction lens section. The exposure optical system 15 is fixed to an arm 16.
該アーム16はステージ機構1のベース2上に固設され
ている。The arm 16 is fixedly mounted on the base 2 of the stage mechanism 1.
又ステージ5上には半導体ウェハ30か載置されている
。Further, a semiconductor wafer 30 is placed on the stage 5.
該半導体ウェハ30には、ステージ5がステップ駆動さ
れる毎に、レチクルパターンか露光される。A reticle pattern is exposed onto the semiconductor wafer 30 each time the stage 5 is driven step by step.
この時、該ステージ機構lを回転させようとする慣性モ
ーメントが生じないので、ステージ機構1は慣性モーメ
ントの影響による振動を解消する。At this time, since no moment of inertia is generated to rotate the stage mechanism 1, the stage mechanism 1 eliminates vibrations caused by the moment of inertia.
よって、アーム16は振動しなくなり、露光光学系15
か安定に固定される。Therefore, the arm 16 no longer vibrates, and the exposure optical system 15
or stably fixed.
従って、ステージ機構lは、ステッパ10によって露光
されるレチクルパターンのピッチずれ。Therefore, the stage mechanism 1 prevents the pitch deviation of the reticle pattern exposed by the stepper 10.
チップ回転等を解消するとともに、焦点ずれによる解像
不良も解消する。This eliminates chip rotation, etc., and also eliminates poor resolution due to defocus.
〈発明の効果〉
以上、説明した様に本発明によれば、
ステージの移動に対応して移動するバランス部か設けら
れているので、ステージ機構の重心の位置を常に一定位
置に保つことができるとともに、ステージ機構を回転さ
せようとする慣性モーメントを打ち消すことかてきる。<Effects of the Invention> As explained above, according to the present invention, since a balance section that moves in response to the movement of the stage is provided, the center of gravity of the stage mechanism can always be kept at a constant position. At the same time, the moment of inertia that tries to rotate the stage mechanism can be canceled out.
その為、ステージの移動時に生じるステージ機構の振動
か防止でき、半導体製造装置の露光装置等の可動ステー
ジに用いた場合に、ピッチずれやチップ回転等が生じな
い、又焦点ずれのない優れた露光パターンを形成するこ
とかてき、露光される半導体装置の歩留りを向上させる
ことかてきるという効果か得られる。Therefore, vibration of the stage mechanism that occurs when the stage moves can be prevented, and when used as a movable stage in exposure equipment of semiconductor manufacturing equipment, excellent exposure is achieved without pitch deviation, chip rotation, etc., and without defocusing. It is possible to form a pattern, and the yield of exposed semiconductor devices can be improved.
第1図は、本発明の詳細な説明する概略部分破断正面図
、
第2図は、第1図中のステージ機構か設けられたステッ
パを説明する正面図、
第3図は、従来のステージ機構を示す概略説明図、
第4図は、第3図中のステージ機構が設けられたステッ
パを説明する正面図である。
■・・・ステージ機構、 2・・・ベース。
3・・・駆動部、 4・・・主駆動軸。
5・・・ステージ、 6・・・バランス部駆動軸。
7・・・バランス部、 4a、6a・・・雄ねじ部。
4b、 5b・・・雌ねじ部。
G5・・・主ステージの重心。
X・・・主駆動軸の軸線。
X′・・・バランス部駆動軸の軸線。FIG. 1 is a schematic partially cutaway front view explaining the present invention in detail. FIG. 2 is a front view explaining a stepper provided with the stage mechanism in FIG. 1. FIG. 3 is a conventional stage mechanism. FIG. 4 is a front view illustrating a stepper provided with the stage mechanism shown in FIG. 3. ■...Stage mechanism, 2...Base. 3... Drive unit, 4... Main drive shaft. 5... Stage, 6... Balance part drive shaft. 7... Balance part, 4a, 6a... Male screw part. 4b, 5b...Female screw part. G5: Center of gravity of the main stage. X: Axis of main drive shaft. X'...Axis of balance unit drive shaft.
Claims (1)
摺動自在に設けたステージと、 前記主駆動軸に連動可能に設けたバランス部駆動軸と、 前記バランス部駆動軸に取り付けられたバランス部とか
ら構成され、 前記バランス部駆動軸の軸線を前記主駆動軸の軸線に一
致させるとともに各軸線を前記ステージの移動面に対し
て水平に設け、 前記バランス部駆動軸の駆動方向を前記主駆動軸の駆動
方向に対して反対方向に設定し、 前記ステージの重心及び前記バランス部と前記バランス
部駆動軸とが成す重心を前記主駆動軸の軸線に一致させ
、 該ステージの重心に生じる加速度の絶対値と、該バラン
ス部と該バランス部駆動軸とが成す重心の加速度の絶対
値と、を同一にして設定するとともに、 該ステージの質量と、該バランス部と該バランス部駆動
軸を和した質量とを同質量にして設けたことを特徴とす
るステージ機構。[Claims] A base, a drive section provided on the base, a main drive shaft driven by the drive section, and a main drive shaft attached to the main drive shaft and slidably provided on the base. It is composed of a stage, a balance part drive shaft provided so as to be interlocked with the main drive shaft, and a balance part attached to the balance part drive shaft, and the axis of the balance part drive shaft is aligned with the axis of the main drive shaft. and each axis is set horizontally with respect to the moving surface of the stage, the drive direction of the balance part drive shaft is set in the opposite direction to the drive direction of the main drive shaft, and the center of gravity of the stage and the balance The center of gravity formed by the balance section and the balance section drive shaft is aligned with the axis of the main drive shaft, and the absolute value of the acceleration generated at the center of gravity of the stage and the acceleration of the center of gravity formed between the balance section and the balance section drive shaft are determined. A stage mechanism characterized in that the absolute values are set to be the same, and the mass of the stage and the sum of the mass of the balance section and the balance section drive shaft are set to be the same mass.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1128381A JPH02307091A (en) | 1989-05-22 | 1989-05-22 | Stage mechanism |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1128381A JPH02307091A (en) | 1989-05-22 | 1989-05-22 | Stage mechanism |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02307091A true JPH02307091A (en) | 1990-12-20 |
Family
ID=14983411
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1128381A Pending JPH02307091A (en) | 1989-05-22 | 1989-05-22 | Stage mechanism |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02307091A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008175823A (en) * | 1998-07-16 | 2008-07-31 | Canon Inc | Drive stage, scanning probe microscope, information recording and reproducing device, and machining device |
JP2011091392A (en) * | 1998-09-18 | 2011-05-06 | Gsi Group Corp | High-speed precision positioning apparatus |
WO2011152109A1 (en) * | 2010-06-02 | 2011-12-08 | Nakatomi Yoshiharu | Stage mechanism |
-
1989
- 1989-05-22 JP JP1128381A patent/JPH02307091A/en active Pending
Cited By (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2008175823A (en) * | 1998-07-16 | 2008-07-31 | Canon Inc | Drive stage, scanning probe microscope, information recording and reproducing device, and machining device |
JP4498423B2 (en) * | 1998-07-16 | 2010-07-07 | キヤノン株式会社 | Drive stage, scanning probe microscope, information recording / reproducing device, processing device |
JP2010164577A (en) * | 1998-07-16 | 2010-07-29 | Canon Inc | Scanning probe microscope |
JP4614398B2 (en) * | 1998-07-16 | 2011-01-19 | キヤノン株式会社 | Scanning probe microscope |
JP2011091392A (en) * | 1998-09-18 | 2011-05-06 | Gsi Group Corp | High-speed precision positioning apparatus |
JP2014140049A (en) * | 1998-09-18 | 2014-07-31 | Gsi Group Corp | High-speed precision positioning apparatus |
WO2011152109A1 (en) * | 2010-06-02 | 2011-12-08 | Nakatomi Yoshiharu | Stage mechanism |
JP4838402B1 (en) * | 2010-06-02 | 2011-12-14 | 芳春 中富 | Stage mechanism |
CN102396032A (en) * | 2010-06-02 | 2012-03-28 | 中富芳春 | Stage mechanism |
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