JPH0230062U - - Google Patents
Info
- Publication number
- JPH0230062U JPH0230062U JP10827088U JP10827088U JPH0230062U JP H0230062 U JPH0230062 U JP H0230062U JP 10827088 U JP10827088 U JP 10827088U JP 10827088 U JP10827088 U JP 10827088U JP H0230062 U JPH0230062 U JP H0230062U
- Authority
- JP
- Japan
- Prior art keywords
- rods
- concentric circles
- distributed capacitance
- cylinders
- frequency measurement
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000005259 measurement Methods 0.000 claims description 6
- 239000000523 sample Substances 0.000 claims description 6
- 239000011162 core material Substances 0.000 claims description 2
- 238000010586 diagram Methods 0.000 description 2
Description
第１図は、本考案の一実施例に係る高周波測定
用プローブの断面図、第２図は、前記高周波測定
用プローブ周辺の等価回路図、第３図ａ，ｂは、
前記高周波測定用プローブの要部断面図、第４図
は、本考案の別の実施例に係る高周波測定用プロ
ーブの断面図、第５図は、前記別の実施例に係る
高周波測定用プローブ周辺の等価回路図、第６図
は、本考案を使用して入力した妨害波の周波数特
性を表す図である。
１……高周波測定用プローブ、２……アウター
シエル（筒体）、３……インナーシエル（筒体）
、５……棒体、６，７……インダクタンスコア材
。
FIG. 1 is a sectional view of a high-frequency measurement probe according to an embodiment of the present invention, FIG. 2 is an equivalent circuit diagram around the high-frequency measurement probe, and FIGS. 3a and 3b are
FIG. 4 is a cross-sectional view of a main part of the high-frequency measurement probe according to another embodiment of the present invention, and FIG. 5 is a sectional view of the high-frequency measurement probe according to another embodiment of the present invention. FIG. 6 is a diagram showing the frequency characteristics of interference waves input using the present invention. 1... Probe for high frequency measurement, 2... Outer shell (cylindrical body), 3... Inner shell (cylindrical body)
, 5... Rod body, 6, 7... Inductance core material.
Claims (1)
に配置することで分布容量を形成し、前記筒体及
び／又は前記棒体の同心円上に、インダクタンス
コア材を配置することでインダクタンス成分を形
成してなり、前記分布容量と前記インダクタンス
成分とを回路定数として使用することを特徴とす
る高周波測定用プローブ。 Distributed capacitance is formed by arranging conductive cylinders and/or rods on concentric circles, and an inductance core material is placed on the concentric circles of the cylinders and/or the rods to reduce the inductance component. A probe for high frequency measurement, characterized in that the distributed capacitance and the inductance component are used as circuit constants.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10827088U JPH0619097Y2 (en) | 1988-08-19 | 1988-08-19 | High frequency measurement probe |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10827088U JPH0619097Y2 (en) | 1988-08-19 | 1988-08-19 | High frequency measurement probe |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0230062U true JPH0230062U (en) | 1990-02-26 |
| JPH0619097Y2 JPH0619097Y2 (en) | 1994-05-18 |
Family
ID=31343444
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10827088U Expired - Lifetime JPH0619097Y2 (en) | 1988-08-19 | 1988-08-19 | High frequency measurement probe |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0619097Y2 (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009257858A (en) * | 2008-04-15 | 2009-11-05 | Fujitsu Ltd | Electric field detection probe and manufacturing method therefor |
| JP2012208019A (en) * | 2011-03-30 | 2012-10-25 | Furukawa Electric Co Ltd:The | Probe, measuring apparatus and circuit board |
| CN117310292A (en) * | 2023-11-28 | 2023-12-29 | 深圳市鼎阳科技股份有限公司 | System, method and medium for measuring input impedance of high-frequency power supply probe |
-
1988
- 1988-08-19 JP JP10827088U patent/JPH0619097Y2/en not_active Expired - Lifetime
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2009257858A (en) * | 2008-04-15 | 2009-11-05 | Fujitsu Ltd | Electric field detection probe and manufacturing method therefor |
| JP2012208019A (en) * | 2011-03-30 | 2012-10-25 | Furukawa Electric Co Ltd:The | Probe, measuring apparatus and circuit board |
| CN117310292A (en) * | 2023-11-28 | 2023-12-29 | 深圳市鼎阳科技股份有限公司 | System, method and medium for measuring input impedance of high-frequency power supply probe |
| CN117310292B (en) * | 2023-11-28 | 2024-01-30 | 深圳市鼎阳科技股份有限公司 | System, method and medium for measuring input impedance of high-frequency power supply probe |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0619097Y2 (en) | 1994-05-18 |