JPH0229151U - - Google Patents
Info
- Publication number
- JPH0229151U JPH0229151U JP10689088U JP10689088U JPH0229151U JP H0229151 U JPH0229151 U JP H0229151U JP 10689088 U JP10689088 U JP 10689088U JP 10689088 U JP10689088 U JP 10689088U JP H0229151 U JPH0229151 U JP H0229151U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- mass spectrometry
- light source
- parabolic mirror
- ionization device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000004949 mass spectrometry Methods 0.000 claims description 3
- 238000010884 ion-beam technique Methods 0.000 claims description 2
- 230000007935 neutral effect Effects 0.000 claims 2
- 239000002245 particle Substances 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 3
- 238000000605 extraction Methods 0.000 description 1
Landscapes
- Electron Sources, Ion Sources (AREA)
- Electron Tubes For Measurement (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10689088U JPH0229151U (ko) | 1988-08-12 | 1988-08-12 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP10689088U JPH0229151U (ko) | 1988-08-12 | 1988-08-12 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0229151U true JPH0229151U (ko) | 1990-02-26 |
Family
ID=31340806
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP10689088U Pending JPH0229151U (ko) | 1988-08-12 | 1988-08-12 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0229151U (ko) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015179572A (ja) * | 2014-03-18 | 2015-10-08 | 株式会社東芝 | スパッタ中性粒子質量分析装置 |
| WO2018173935A1 (ja) * | 2017-03-21 | 2018-09-27 | 学校法人工学院大学 | 質量分析装置および質量分析方法 |
-
1988
- 1988-08-12 JP JP10689088U patent/JPH0229151U/ja active Pending
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015179572A (ja) * | 2014-03-18 | 2015-10-08 | 株式会社東芝 | スパッタ中性粒子質量分析装置 |
| WO2018173935A1 (ja) * | 2017-03-21 | 2018-09-27 | 学校法人工学院大学 | 質量分析装置および質量分析方法 |
| JP2018156904A (ja) * | 2017-03-21 | 2018-10-04 | 学校法人 工学院大学 | 質量分析装置および質量分析方法 |
| EP3605584A4 (en) * | 2017-03-21 | 2020-12-16 | Kogakuin University | MASS SPECTROSCOPE AND MASS SPECTROMETRY |