JPH0228604Y2 - - Google Patents
Info
- Publication number
- JPH0228604Y2 JPH0228604Y2 JP1983172719U JP17271983U JPH0228604Y2 JP H0228604 Y2 JPH0228604 Y2 JP H0228604Y2 JP 1983172719 U JP1983172719 U JP 1983172719U JP 17271983 U JP17271983 U JP 17271983U JP H0228604 Y2 JPH0228604 Y2 JP H0228604Y2
- Authority
- JP
- Japan
- Prior art keywords
- arms
- sample
- sample stage
- cylindrical cap
- rod
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001816 cooling Methods 0.000 claims description 26
- 238000010894 electron beam technology Methods 0.000 claims description 9
- 239000012212 insulator Substances 0.000 claims description 8
- 238000001073 sample cooling Methods 0.000 claims description 7
- 230000003287 optical effect Effects 0.000 claims description 6
- 238000011109 contamination Methods 0.000 description 4
- 108010085603 SFLLRNPND Proteins 0.000 description 3
- 239000000356 contaminant Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 239000007789 gas Substances 0.000 description 2
- 125000006850 spacer group Chemical group 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 229930195733 hydrocarbon Natural products 0.000 description 1
- 150000002430 hydrocarbons Chemical class 0.000 description 1
- 239000011810 insulating material Substances 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 238000001000 micrograph Methods 0.000 description 1
- 229910052757 nitrogen Inorganic materials 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000009423 ventilation Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
Description
【考案の詳細な説明】
本考案は、電子顕微鏡に組込まれる試料冷却装
置の改良に関する。DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an improvement of a sample cooling device incorporated into an electron microscope.
電子顕微鏡においては、電子線経路の周囲空間
を充分に排気しておくことが重要で、排気が不充
分で水やハイドロカーボン等の残留ガス分子が存
在すると、電子線照射に基づく化学反応から電子
線経路周辺の部材表面に導電性の悪い汚染物質を
付着させる。この汚染現象は部材の温度が低い程
著しくなる傾向があるので、試料を冷却した状態
で電子顕微鏡像を観察する場合には、試料の近傍
に充分冷却したフインを配置して試料近傍の多く
のガス分子を付着させ、試料に付着する汚染物を
少くする等の対策が不可欠となる。 In an electron microscope, it is important to sufficiently vent the space surrounding the electron beam path. If the ventilation is insufficient and residual gas molecules such as water or hydrocarbons are present, electrons will be lost from the chemical reaction caused by the electron beam irradiation. Contaminants with poor conductivity are attached to the surface of the member around the wire path. This contamination phenomenon tends to become more pronounced as the temperature of the component decreases, so when observing an electron microscope image with a cooled sample, a sufficiently cooled fin should be placed near the sample. Measures such as reducing the amount of contaminants adhering to the sample by attaching gas molecules to the sample are essential.
第1図は、所謂サイドエントリー型と称される
電子顕微鏡用の試料装置に試料冷却装置を組込ん
だ装置とその周辺を示す略図である。図中、1は
対物レンズのヨークを示し、2及び3は夫々レン
ズ磁場を発生するための上下磁極片を示してい
る。上下磁極片の間隔を正確に設定するためのス
ペーサ4の側面には穴が穿たれており、該穴を通
してレンズ光軸Zと垂直な方向から棒状部材5
と、その受け部材6が貫通している。棒状部材5
がヨーク1を貫通する部分5aには磁極間隙内に
設置される部材の先端部Tを支点として上下、左
右に移動させたり、受け部材6の方向へ伸縮させ
たりするための移動機構が組込まれている。棒状
部材5が光軸Zと交差する部分には観察試料(図
示せず)が設置されており、該試料は棒状部材5
内部に設けられた熱伝導棒(図示せず)や網線7
を介して真空外に設置された冷却槽8に接続され
ている。磁極片近傍には内側冷却トラツプ9と外
側冷却トラツプ10が絶縁物を介して配置されて
おり、各トラツプは網線11及び12によつて前
記冷却槽8に接続されている。このように従来の
試料冷却装置は、狭い空間に種々の部材を取付け
なければならないため、装置を組込んだり取外す
操作が面倒なだけでなく、試料と冷却トラツプの
距離が相当に離れているため冷却トラツプの効果
が充分に発揮されないという欠点があつた。 FIG. 1 is a schematic diagram showing a so-called side-entry type electron microscope sample device in which a sample cooling device is incorporated and its surroundings. In the figure, 1 indicates the yoke of the objective lens, and 2 and 3 indicate upper and lower magnetic pole pieces for generating the lens magnetic field, respectively. A hole is bored in the side surface of the spacer 4 to accurately set the distance between the upper and lower magnetic pole pieces, and a rod-shaped member 5 is inserted through the hole from a direction perpendicular to the lens optical axis Z.
and the receiving member 6 passes through it. Rod-shaped member 5
A moving mechanism is incorporated in the portion 5a that penetrates the yoke 1 to move the member installed in the magnetic pole gap vertically, horizontally and horizontally using the tip T of the member installed in the magnetic pole gap as a fulcrum, and to expand and contract it in the direction of the receiving member 6. ing. An observation sample (not shown) is installed at a portion where the rod-shaped member 5 intersects with the optical axis Z.
Heat conduction rods (not shown) and mesh wires 7 provided inside
It is connected to a cooling tank 8 installed outside the vacuum via. An inner cooling trap 9 and an outer cooling trap 10 are placed in the vicinity of the magnetic pole piece with an insulator interposed therebetween, and each trap is connected to the cooling bath 8 by mesh wires 11 and 12. In this way, with conventional sample cooling devices, various parts must be installed in a narrow space, which not only makes it troublesome to install and remove the device, but also because the distance between the sample and the cooling trap is quite large. The drawback was that the cooling trap was not fully effective.
本考案は、このような問題を解決して簡単な構
造で試料近傍に冷却部材を配置できるようにする
ことを目的とするもので、対物レンズを構成する
磁極片の間隙内における所定位置へレンズ光軸と
垂直な方向から挿入される棒状部材5を備え、該
棒状部材は該棒状部材に沿つて伸びた外筒又は一
対の平行なアームa1,a2を有し、前記棒状部
材の先端において前記両アーム間に両アームと非
接触で配置されるように試料台13を熱絶縁物1
5を介して両アームに取り付け、前記棒状部材に
沿つて両アームの間隙に両アームと非接触に熱伝
導部材14を取り付け、該熱伝導部材の一端を前
記試料台に接続すると共に他端を冷却源に接続
し、両アームの略内側に入る大きさを有し試料台
及び熱伝導部材の両者を覆う筒状キヤツプをこれ
ら両者に非接触で且つ前記両アームとも非接触に
なるように熱絶縁物を介して両アームに取り付
け、該筒状キヤツプが前記試料台の温度と両アー
ムの温度との間の温度に冷却されるように筒状キ
ヤツプを熱伝導部材を介して前記冷却源に接続
し、該筒状キヤツプに電子線通過孔を設けたこと
を特徴とする。 The purpose of the present invention is to solve these problems and enable a cooling member to be placed near the sample with a simple structure. A rod-shaped member 5 is inserted from a direction perpendicular to the optical axis, and the rod-shaped member has an outer cylinder extending along the rod-shaped member or a pair of parallel arms a1, a2, and the The sample stage 13 is placed between the two arms without contacting the two arms with the heat insulator 1.
5, and a heat conductive member 14 is attached to the gap between both arms along the rod-shaped member without contacting the arms, one end of the heat conductive member is connected to the sample stage, and the other end is connected to the sample stage. A cylindrical cap, which is connected to a cooling source and has a size that fits approximately inside both arms and covers both the sample stage and the heat conduction member, is heated so that it does not come in contact with both of them and neither of the arms. The cylindrical cap is attached to both arms via an insulator, and the cylindrical cap is connected to the cooling source via a heat conductive member so that the cylindrical cap is cooled to a temperature between the temperature of the sample stage and the temperature of both arms. The cylindrical cap is characterized in that an electron beam passage hole is provided in the cylindrical cap.
本考案装置は、第1図に示される従来装置と比
較して内側トラツプ9や外側トラツプ10を設け
る代わりに、或いはこれらの冷却手段に付加して
棒状部材5の内部に冷却トラツプとして機能する
部材を組込んだことを特徴とするもので、その棒
状部材の軸心Aに沿つた断面図を第2図に、第2
図中のBB断面図を第3図に示す。 Compared to the conventional device shown in FIG. 1, the device of the present invention has a member functioning as a cooling trap inside the rod-shaped member 5, instead of providing an inner trap 9 and an outer trap 10, or in addition to these cooling means. A cross-sectional view along the axis A of the rod-shaped member is shown in FIG.
Fig. 3 shows a BB cross-sectional view in the figure.
第2図及び第3図において、5bは棒状部材5
の電子線光軸Z側の端部を示している。棒状部材
5は棒状部材5に沿つて伸びた一対の平行なアー
ムa1,a2を有している。棒状部材5の先端に
おいて前記両アームa1,a2間に両アームと非
接触で配置されるように試料台13が止めネジ1
5によつて両アームa1,a2に取り付けられて
いる。止めネジ15は両アームa1,a2から試
料への熱流入を防ぐため、熱絶縁性の高い物質か
らなつている。試料台13には、その電子線通過
孔13aの周囲に試料(図示せず)を載置する機
構が形成されている。前記棒状部材5に沿つて両
アームa1,a2の間隙に、しかも両アームと非
接触に、熱伝導部材14が止めネジ15により両
アームa1,a2に取り付けられている。試料台
13と熱伝導棒14の一端とは銅製の薄板16を
介して接続されている。この薄板16は熱伸縮を
吸収するためのものである。熱伝導棒14の他端
は真空外に設けられた冷却槽と接続されており、
冷却槽によつて試料ホルダー13に保持された試
料が所定の低温に冷却される。17は試料台13
及び熱伝導棒14の両者を覆うための筒状キヤツ
プであり、筒状キヤツプは両アームの略内側に入
る大きさを有している。即ち、両アームの内側の
幅Wより狭い幅を有し、且つ光軸方向の幅は両ア
ームの厚みTを越えないか越えても僅かに越える
程度になつている。この筒状キヤツプは17は試
料台13及び熱伝導棒14の両者に非接触で且つ
前記両アームa1,a2とも非接触になるように
止めネジ15により両アームa1,a2に取り付
けられている。第4図は筒状キヤツプの立体図で
あり、側面に穿たれた6つの穴18は止めネジ1
5を貫通させるためのものであり、上下に穿たれ
た2個の穴19は電子線を通過させるためのもの
である。筒状キヤツプ17の開口側端部17bは
可撓性の熱伝導部材によつて熱伝導棒14と接続
されている。 In FIGS. 2 and 3, 5b is a rod-shaped member 5
The end portion on the electron beam optical axis Z side is shown. The rod-shaped member 5 has a pair of parallel arms a1 and a2 extending along the rod-shaped member 5. The sample stage 13 is attached to the setscrew 1 so that it is disposed between the arms a1 and a2 at the tip of the rod-shaped member 5 without contacting the arms.
5 to both arms a1 and a2. The set screw 15 is made of a highly thermally insulating material in order to prevent heat from flowing into the sample from both arms a1 and a2. The sample stage 13 is provided with a mechanism for placing a sample (not shown) around the electron beam passage hole 13a. A heat conducting member 14 is attached to both arms a1, a2 along rod-shaped member 5 in a gap between both arms a1, a2 without contacting both arms with set screws 15. The sample stage 13 and one end of the heat conduction rod 14 are connected via a thin copper plate 16. This thin plate 16 is for absorbing thermal expansion and contraction. The other end of the heat conduction rod 14 is connected to a cooling tank provided outside the vacuum.
The sample held in the sample holder 13 is cooled to a predetermined low temperature by the cooling tank. 17 is the sample stage 13
This is a cylindrical cap for covering both the heat conducting rod 14 and the heat conducting rod 14, and the cylindrical cap has a size that can fit approximately inside both arms. That is, it has a width narrower than the inner width W of both arms, and the width in the optical axis direction does not exceed the thickness T of both arms, or even if it does, it only slightly exceeds. This cylindrical cap 17 is attached to both arms a1 and a2 by set screws 15 so that it does not come into contact with both the sample stage 13 and the heat conduction rod 14, and also with the arms a1 and a2. Figure 4 is a three-dimensional view of the cylindrical cap, and the six holes 18 drilled on the side are the set screws 1.
5, and the two holes 19 bored above and below are for passing the electron beam. The open end 17b of the cylindrical cap 17 is connected to the heat conduction rod 14 by a flexible heat conduction member.
上述した構造の装置において、試料台13が両
アームa1,a2と非接触になるように、試料台
13が熱絶縁物製の止めネジ15を介して両アー
ムa1,a2に取り付けられており、且つ筒状キ
ヤツプ17は試料台13及び熱伝導棒14の両者
に非接触で且つ前記両アームとも非接触になるよ
うに止めネジ15を介して両アームa1,a2に
取り付けられているため、両アームa1,a2及
び試料台13及びキヤツプ17の三者間は相互に
熱的に充分絶縁されることになる。更に、試料台
13は熱伝導棒14を介して冷却槽に接続されて
いるため、試料台13に載置された試料は、液体
窒素温度に比較的近い温度まで冷却される。一
方、筒状キヤツプ17の開口側端部17bは可撓
性の熱伝導部材によつて熱伝導棒14に接続され
ており、又、筒状キヤツプ17からの放射熱は試
料台及び熱伝導棒14によつて吸収されるため、
筒状キヤツプ17は、試料ほど冷却されないが、
室温に近い両アームa1,a2よりはるかに低い
温度に冷却される。そのため、試料を極めて低い
温度に冷却する試料冷却装置の機能を維持しつ
つ、筒状キヤツプ17は冷却トラツプとして役割
を果たし、試料近傍の空空間に飛来した汚染粒子
は筒状キヤツプにより効果的にトラツプされる。
この場合、冷却トラツプとして機能する筒状トラ
ツプは両アームa1,a2の内側に配置されるた
わ、構造が簡単でコンパクトとなる。又、従来の
内側劣却トラツプ9や外側冷却トラツプ10に比
較して、筒状トラツプは大幅に試料に接近して配
置されると共に、試料をあらゆる方向から(電子
線の通過方向のみ除いて)覆つているため、その
試料汚染防止の効果は極めて大きなものとなる。
又、試料台13をあらゆる方向から覆う筒状キヤ
ツプ17が熱シールド部材としての役割をも果た
すため、試料に対する冷却効率が向上する。 In the apparatus having the above-described structure, the sample stage 13 is attached to both arms a1, a2 via setscrews 15 made of heat insulators so that the sample stage 13 is not in contact with both arms a1, a2, In addition, the cylindrical cap 17 is attached to both arms a1 and a2 via setscrews 15 so that it does not contact both the sample stage 13 and the heat conduction rod 14, and also does not contact both arms. The arms a1, a2, the sample stage 13, and the cap 17 are sufficiently thermally insulated from each other. Furthermore, since the sample stage 13 is connected to the cooling tank via the heat conduction rod 14, the sample placed on the sample stage 13 is cooled to a temperature relatively close to the liquid nitrogen temperature. On the other hand, the open end 17b of the cylindrical cap 17 is connected to the heat conduction rod 14 by a flexible heat conduction member, and the radiant heat from the cylindrical cap 17 is transferred to the sample stage and the heat conduction rod. Because it is absorbed by 14,
Although the cylindrical cap 17 is not cooled as much as the sample,
It is cooled to a much lower temperature than both arms a1 and a2, which are close to room temperature. Therefore, while maintaining the function of the sample cooling device that cools the sample to an extremely low temperature, the cylindrical cap 17 plays the role of a cooling trap, and the cylindrical cap effectively removes contaminant particles that have flown into the empty space near the sample. Trapped.
In this case, the cylindrical trap functioning as a cooling trap is arranged inside both arms a1 and a2, so that the structure is simple and compact. Furthermore, compared to the conventional inner degradation trap 9 and outer cooling trap 10, the cylindrical trap is placed much closer to the sample, and the sample can be viewed from all directions (except for the direction in which the electron beam passes). Since it is covered, the effect of preventing sample contamination is extremely large.
Further, since the cylindrical cap 17 that covers the sample stage 13 from all directions also serves as a heat shield member, the cooling efficiency for the sample is improved.
尚、上述した実施例は本考案の一実施例に過ぎ
ず、変形して実施することができる。 It should be noted that the above-described embodiment is only one embodiment of the present invention, and may be modified and implemented.
例えば上述した実施例においては、筒状キヤツ
プ17の開口側端部17bを可撓性の熱伝導部材
によつて熱伝導棒14と接続するようにしたが、
筒状キヤツプが前記試料台の温度と両アームの温
度との間の温度に冷却されるようにするため、可
撓性のある銅線などにより直接劣却槽に接続する
ようにしても良い。 For example, in the embodiment described above, the open end 17b of the cylindrical cap 17 is connected to the heat conductive rod 14 by a flexible heat conductive member.
In order to cool the cylindrical cap to a temperature between the temperature of the sample stage and the temperature of both arms, it may be directly connected to the deterioration tank by a flexible copper wire or the like.
以上述べたように、本考案の装置においては、
前記棒状部材の先端において前記両アーム間に両
アームと非接触で配置できるように試料台13を
熱絶縁物15を介して両アームに取り付け、前記
棒状部材に沿つて両アームの間隙に両アームと非
接触に熱伝導部材14を取り付け、該熱伝導部材
の一端を前記試料台に接続すると共に他端を冷却
源に接続し、両アームの略内側に入る大きさを有
し試料台及び熱伝導部材の両者を覆う筒状キヤツ
プをこれら両者に非接触で且つ前記両アームとも
非接触になるように熱絶縁物を介して両アームに
取り付けたため、構造が簡単でコンパクトな汚染
防止機構を備えた電子顕微鏡用試料冷却装置が提
供される。又、筒状トラツプは大幅に試料に接近
して配置されると共に、試料をあらゆる方向から
(電子線の通過方向のみ除いて)覆つているため、
その試料汚染防止の効果は極めて大きなものとな
る。又、試料台をあらゆる方向から覆う筒状キヤ
ツプが熱シールド部材としての役割をも果たすた
め、試料に対する冷却効率を向上しえる電子顕微
鏡用試料冷却装置が提供される。 As mentioned above, in the device of the present invention,
A sample stage 13 is attached to both arms via a thermal insulator 15 so that it can be placed between the two arms at the tip of the rod-shaped member without contacting the two arms, and the two arms are placed in the gap between the two arms along the rod-shaped member. A heat conductive member 14 is attached without contact with the sample stage, one end of the heat conductive member is connected to the sample stage, and the other end is connected to a cooling source, and the heat conductive member 14 is large enough to fit approximately inside both arms, and is connected to the sample stage and the heat conductive member. A cylindrical cap that covers both of the conductive members is attached to both arms via a thermal insulator so that it does not come in contact with both of them and with both of the arms, thereby providing a simple and compact contamination prevention mechanism. A specimen cooling device for an electron microscope is provided. In addition, the cylindrical trap is placed very close to the sample and covers the sample from all directions (except for the direction in which the electron beam passes).
The effect of preventing sample contamination is extremely large. Further, since the cylindrical cap that covers the sample stage from all directions also serves as a heat shield member, a sample cooling device for an electron microscope is provided that can improve the cooling efficiency for the sample.
第1図は従来の試料冷却装置を示す略図、第2
図乃至第4図は夫々本考案の一実施例装置におけ
る要部を説明するための略図である。
1:対物レンズヨーク、2,3:磁極片、4:
スペーサー、5:棒状部材、a1,a2:アー
ム、6:受け部材、7,11,12:網線、8:
冷却槽、9:内側冷却トラツプ、10:外側冷却
トラツプ、13:試料台、14:熱伝導棒、1
5:止めネジ、17:筒状キヤツプ。
Figure 1 is a schematic diagram showing a conventional sample cooling device;
4 through 4 are schematic diagrams for explaining essential parts of an apparatus according to an embodiment of the present invention. 1: Objective lens yoke, 2, 3: Magnetic pole piece, 4:
spacer, 5: rod-shaped member, a1, a2: arm, 6: receiving member, 7, 11, 12: mesh wire, 8:
Cooling tank, 9: Inner cooling trap, 10: Outer cooling trap, 13: Sample stage, 14: Heat conduction rod, 1
5: Set screw, 17: Cylindrical cap.
Claims (1)
所定位置へレンズ光軸と垂直な方向から挿入され
る棒状部材5を備え、該棒状部材は該棒状部材に
沿つて伸びた外筒又は一対の平行なアームa1,
a2を有し、前記棒状部材の先端において前記両
アーム間に両アームと非接触で配置されるように
試料台13を熱絶縁物15を介して両アームに取
り付け、前記棒状部材に沿つて両アームの間隙に
両アームと非接触に熱伝導部材14を取り付け、
該熱伝導部材の一端を前記試料台に接続すると共
に他端を冷却源に接続し、両アームの略内側に入
る大きさを有し試料台及び熱伝導部材の両者を覆
う筒状キヤツプをこれら両者に非接触で且つ前記
両アームとも非接触になるように熱絶縁物を介し
て両アームに取り付け、該筒状キヤツプが前記試
料台の温度と両アームの温度との間の温度に冷却
されるように筒状キヤツプを熱伝導部材を介して
前記冷却源に接続し、該筒状キヤツプに電子線通
過孔を設けたことを特徴とする電子顕微鏡用試料
冷却装置。 A rod-shaped member 5 is inserted into a predetermined position in the gap between the magnetic pole pieces constituting the objective lens from a direction perpendicular to the optical axis of the lens. arm a1,
a2, and a sample stage 13 is attached to both arms via a thermal insulator 15 so as to be disposed between both arms at the tip of the rod-shaped member without contacting both arms, and A heat conductive member 14 is installed in the gap between the arms without contacting both arms,
A cylindrical cap having one end connected to the sample stage and the other end connected to a cooling source, and having a size that fits approximately inside both arms and covering both the sample stage and the heat conductive member, is connected to the sample stage and the heat conductive member. The cylindrical cap is attached to both arms via a thermal insulator so as to be in non-contact with both of them and with both arms, and the cylindrical cap is cooled to a temperature between the temperature of the sample stage and the temperature of both arms. 1. A sample cooling device for an electron microscope, characterized in that a cylindrical cap is connected to the cooling source via a heat conductive member, and an electron beam passage hole is provided in the cylindrical cap.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17271983U JPS6080657U (en) | 1983-11-08 | 1983-11-08 | Sample cooling device for electron microscope |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP17271983U JPS6080657U (en) | 1983-11-08 | 1983-11-08 | Sample cooling device for electron microscope |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6080657U JPS6080657U (en) | 1985-06-04 |
JPH0228604Y2 true JPH0228604Y2 (en) | 1990-07-31 |
Family
ID=30376426
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP17271983U Granted JPS6080657U (en) | 1983-11-08 | 1983-11-08 | Sample cooling device for electron microscope |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS6080657U (en) |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4727480U (en) * | 1971-04-16 | 1972-11-28 | ||
JPS5537062A (en) * | 1978-09-08 | 1980-03-14 | Ricoh Co Ltd | Picture process system |
-
1983
- 1983-11-08 JP JP17271983U patent/JPS6080657U/en active Granted
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS4727480U (en) * | 1971-04-16 | 1972-11-28 | ||
JPS5537062A (en) * | 1978-09-08 | 1980-03-14 | Ricoh Co Ltd | Picture process system |
Also Published As
Publication number | Publication date |
---|---|
JPS6080657U (en) | 1985-06-04 |
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