JPH02276978A - Test program correcting device - Google Patents

Abstract

PURPOSE:To reduce manual operation for test program correction and to easily shorten the time and facilitate the operation by providing means for test time measurement, wait time setting, simultaneous measurement, order variation, duplication deletion, input and output adjustment, etc. CONSTITUTION:At least one of the means for the execution time measurement of a desired place in a test program, minimum wait time setting required to stabilize the output of a semiconductor device, simultaneous measurement of possible items, order variation of plural test items, duplication deletion of description, and the best input and output adjustment for the semiconductor device is provided. Then necessary means among the respective means is applied to a necessary item of the test program consisting of (n) test items composed of respective statements for condition setting, wait time, measurement, decision making, and condition resetting. Consequently, the program correction is facilitated and the time is shortened.

Description

DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a test program modification device for modifying a test program for testing a semiconductor device.

[Prior Art] A semiconductor measuring device that performs various tests on semiconductor devices usually has a plurality of signal generating means, measuring means, etc., and tests the semiconductor device by operating these means according to a test program. The test program used at this time is created according to the procedure shown in FIG.

First, a program is edited for each semiconductor device based on a test specification that defines its electrical characteristics, etc. (step S1). Next, set the test program in the semiconductor measurement equipment, actually operate the equipment, check whether its operation realizes the various measurement conditions for the test based on the previous test specifications, and Obtain test results and determine the validity of the test. If the necessary test conditions and desired test results cannot be obtained, debugging is performed to correct the test program (step 32). After a test program that operates correctly is completed in this way, time reduction work is performed as necessary (step S3). A test program is completed through this series of tasks.

Next, details of the time reduction work in step S3 will be explained. The following six items are generally listed as work contents that are often performed in practice.

1. Test time measurement 2. Waiting time setting 3. Simultaneous c1 constantization 4. Test order change 5. Duplication deletion 6. Input/output condition adjustment 1. Test time measurement This is to actually measure how long the execution time is required.

2. Setting the waiting time is to find out the minimum time required from when input is given to the semiconductor device under test until the output becomes stable, and to set this as the waiting time.

3. Simultaneous measurement allows for the simultaneous measurement of multiple test items whose measurement contents are independent (does not affect each other) and whose measurement conditions can be set at the same time. be.

4. Changing the test order is done when changing the order of test items, that is, the order of measurement, would save time, taking into consideration the characteristics of the semiconductor device under test or the operating efficiency of the semiconductor measurement equipment. be.

5. Duplication deletion is to eliminate duplication in the test program description.

6. Input/output condition adjustment is intended to optimize the input/output conditions in test items such as changing the input and finding the input value when the output is inverted.

A typical test program creation task is to create a test program with high execution efficiency by appropriately combining these contents.

[Problem to be solved by the invention] At present, most of the above-mentioned tasks are performed manually, and humans think of ways to accomplish the tasks, use a test program editing tool in accordance with the method, and perform tests. The program is being changed sequentially. Therefore, the amount of work involved was large, the level of technology required was also high, and it took a considerable amount of time.

This invention has been made to solve the above-mentioned problems, and in particular, it is an object of the present invention to provide a test program modification device that can easily accomplish the work necessary to shorten the time required for actual operation of a test program. .

[Means to solve the problem]

The test program modification device according to the present invention includes a test time measuring means for determining the execution time of a desired portion of the test program, and a minimum waiting time necessary for stabilizing the output of a semiconductor device on the test program. a waiting time setting means for setting a waiting time, and a simultaneous measurement means for making it possible to simultaneously measure items among a plurality of test items in a test program whose measurement contents are independent and whose measurement conditions can be set at the same time; A test order change means for changing the order of test items in a test program, a duplication deletion means for eliminating duplicate descriptions in a test program, and a test order change means for changing the order of test items in a test program; The test time measuring means includes at least one of input/output adjusting means for optimization, and means for specifying a range in which the execution time is to be measured in the test program, and a means for specifying the range of the test program specified based on the specification. The waiting time setting means includes a means for measuring the execution time and a means for displaying the measured time. It consists of a means for determining the state of the output of the semiconductor device δp1 for the tested test item, and a means for setting the minimum waiting time based on the measurement result, and the simultaneous station 1 determining means can perform simultaneous measurements during the test program. The test order changing means consists of a means for specifying a test item, a means for identifying sentences included in the specified test item, and a means for rearranging sentences of the same type in parallel. The duplicate deletion means includes a means for specifying the test item to be changed and its moving location, and a means for changing the order of the test items based on the specification. The input/output adjustment means includes means for deleting duplicate descriptions in the test program, and the input/output adjusting means includes means for specifying test items to be adjusted for input/output in the test program, and determining optimal values of input/output conditions for the semiconductor device based on the specifications. means and
and means for displaying the optimum value.

[Effect]

The present invention includes a test time measuring means for measuring the execution time of a desired part in a test program, and a waiting time setting means for setting the minimum waiting time necessary for the output of the semiconductor device to stabilize on the test program. Among the test items in the test program, the measurement contents are independent,
Simultaneous measurement means that allows items for which measurement conditions can be set at the same time to be measured at the same time; Test order change means that changes the order of multiple test items in a test program; and Eliminate duplication in descriptions in the test program. and an input/output adjusting means for optimizing input/output conditions to the semiconductor device in a desired test item of the test program. Workers who wish to shorten test program time can easily measure test program test time, set waiting time, and perform simultaneous measurement by using the above-mentioned means.

You can change the test order, delete Type 1, or adjust the input/output conditions.

〔Example〕

Figure 1 shows a screen 1 when a test program creator uses a test program modification device which is an embodiment of the present invention.
It is a figure showing an image displayed on. Also, Figure 2 shows
- As an example, it is a diagram showing an outline of the configuration of a test program. As shown in FIG. 2, the test program consists of n test items, and the content of each test item is -
For boat fishing, it consists of a condition setting statement, a waiting time statement, a measurement statement 1 judgment statement, and a test condition cancellation statement.

A person who modifies a test program (hereinafter referred to as a worker) who wishes to shorten the time selects the number of tests he or she wishes to implement from the menu shown in FIG. When "1. Test time Δ-1 constant" is selected, the test program correction apparatus according to this embodiment starts the process shown in FIG. First, an input request is made to the operator to specify the item or range for which the required time in the test program is to be measured (step 51).
0).

When input, a command to read the time is added to the beginning and end of the designated portion, and time is measured using the built-in timer (step 511). The time measurement results are displayed as an average value if necessary (step 512).

Next, when the operator selects "2. Waiting time setting", the test program modification apparatus according to this embodiment starts the process shown in FIG. 4A. First, an input request is issued to the operator to specify a set of an aPj fixed statement and a waiting time statement for which the optimum waiting time is to be set (step 520). This is the measurement statement,
There are many waiting time statements, and there are cases where the measurement statement is the same but the waiting time statements are different, or vice versa, and it is not possible to determine which part of the test program is intended even if only one is specified. This is because there is. When the above-mentioned manual operation is performed, for example, a group of commands for repeatedly measuring the output with sampling every 1 ms is used to obtain a change in the measured value over time. That is, changes in data are tracked (step 521). next,
For example, the time required to fall within 5% of the standard value minus the width (for example, time t in FIG. 4B) is investigated to obtain data as a specific value of the waiting time.

Next, repeated measurements are performed, and the results of these multiple measurements are graphed and displayed (FIG. 4C) or output as a report (step 522). Based on this 7I-1 constant result, the optimal value V of the waiting time. (the mode in FIG. 4C) is determined (step 823).

The operator checks this and, if he/she wishes to modify the waiting time, modifies the test program (step S24).
.

When the operator selects "3. Simultaneous measurement", the test program modification apparatus according to this embodiment starts the process shown in FIG. First, an input request is made to the operator to specify the test items that can be specified at the same time (step 5).
30). When multiple test items are entered, condition setting statements are included in each item.

The device itself recognizes each sentence, such as a waiting time sentence, and rearranges the same sentence names in parallel (step 531). For example, first, the condition setting sentence, measurement sentence 1 judgment sentence, etc. included in the first test item are recognized. Next, the condition setting statement for the next test item,
After recognizing the measurement sentence 1 judgment sentence, etc., and reaching the designated test item, the identified sentences of the same type are rearranged in parallel. Note that a warning may be issued if the condition settings for each test item 1 change during the process of recognizing each sentence. Then, if there are duplicate sentences, they are deleted (duplicate deletion described later). The program thus created is executed and the measurement results are displayed (step 532).
). Based on this display, the operator confirms the test item data before and after this operation (step 833). Then, after the operator confirms the program, if there is a request for program modification, the program is modified (step 534).

When the operator selects "4. Change test order," the test program modification apparatus according to this embodiment starts the process shown in FIG. 6. First, a request is made to the operator to input which test item he would like to bring after which test item (step 540).

When input, the condition setting before the order change is read from the hardware monitor result so that the test item after the test item to be moved starts from the initial state. This is because duplicative condition setting statements are usually omitted when creating a program, and later test items may be executed based on the condition settings of previous test items. In some cases, if the test order changes, the condition settings etc. may change, and to prevent this, the condition settings are read and kept at the initial state. Also, for the test items to be moved, starting from the initial settings, independent test execution is enabled (step 541). Completely terminate the test item before the test item to be moved (
complete release of test conditions). This is to avoid affecting the next test item. Similarly, the destination test item is changed so that the destination test item is completely completed and the next test item is started from the initial state. After preparation is completed in this way, the test item is moved (step 542). Then, the process after duplication deletion, which will be described later, is performed (step 843). After changing the test order in this way and completing the program, execute the test (step 544), confirm that there is no change in data for all test items (step 545), display the results (step 546), and proceed with the process. The program is modified according to the user's request (step 547).

When the operator selects "51 duplicate deletion", the test program modification apparatus according to this embodiment starts the process shown in FIG. First, a request is made to the operator to input what part of the test program is to be checked (step 550).

Once entered, we check for duplicate parameters for each aP1 constant hardware (terminals of semiconductor devices that are subject to δp1 constant, etc.), and if there are duplicate programs, delete the duplicate programs through dialogue with the operator. are executed sequentially (step 551). The program whose duplicates have been deleted in this manner is executed, and the data of all test items is checked (step 552) to confirm that there is no change in the data from before the duplicate deletion.

When the operator selects "6. Input/output condition adjustment", the test program modification apparatus according to this embodiment starts the process shown in FIG. 8A. Here, as a specific example, in a test item that changes the input and calculates the input value when the output is reversed, we will use a simple loop statement as a two-step loop statement (first change the input in large steps, then change the output as appropriate after reversing the output.) The case where you want to change the description to the one shown in FIG. 8B) will be explained. First, the operator is requested to input items for which input/output condition adjustment is desired to be optimized (step 560). Then, the range W in which the input is changed is determined based on the standard value of the width of the input (read from the judgment statement of the test program) in which the output is inverted in response to the input change. Then, when the test program is actually executed, the human power changes by large steps within the range W, and the output state is measured. 8th
In Figure B, the output is inverted at ■, and at the point ■, it goes back two steps, and the input changes in the next smaller width S. Then, it is detected that the output is inverted in [phase]. At this time, the fewer the number of input change steps required to measure the input whose output is inverted, the shorter the test program execution time can be.

In order to minimize the number of steps, each parameter L
, S is calculated theoretically. For example, in the above example, the value of each parameter that minimizes the number of steps is determined using a formula that uses the relationship between the geometric mean and the arithmetic mean. The optimum values of these parameters are determined and operated to minimize the number of steps (step 561), and the optimum values of each parameter are displayed (step 562). In the above equation, the number of steps is minimized when the left side minus the right side. The operator uses each parameter W based in this way,
Modify the program based on L and S (step 363),
The effect of time reduction is confirmed by "1. Test time lN-1 constant".

Also r7. When EXITJ is selected, the time saving operation ends (see Figure 9).

As described above, according to this embodiment, the test program for testing the semiconductor device is modified by the test program modification device formed using a computer, for example, so that the work performed by the operator is reduced. Correction time can be shortened.

In the above embodiment, it is assumed that a test program measuring device is connected to a semiconductor measuring device, but instead of the semiconductor measuring device, a simulator configured by a computer is used to perform part of the test program modification work. For example, deletion of duplicate parts may be realized.

〔Effect of the invention〕

As described above, according to the present invention, since it is possible to modify a test program using the apparatus, it is possible to easily modify the program and to save time.

[Brief explanation of drawings]

FIG. 1 is a diagram showing a screen image of a test program correction device according to the present invention, FIG. 2 is a configuration diagram showing the configuration of a test program, FIG. 3 is a flowchart showing the order of test time measurement, and FIG. Flowchart showing the order of waiting time setting, Figures 4B and 4C are diagrams for explaining the waiting time setting work, Figure 5 is a flowchart showing the order of simultaneous measurement, and Figure 6 is the order of changing the test order. 7 is a flowchart showing the order of duplicate deletion, FIG. 8A is a flowchart showing the order of input/output condition adjustment, FIG. 8B is a diagram for explaining the adjustment state of input/output condition adjustment, and FIG. FIG. 9 is a flowchart showing the end of the time reduction work, and FIG. 10 is a flowchart showing the order of conventional test program creation. In the figure, 1 is a screen. Note that the same reference numerals in each figure indicate the same or corresponding parts. Figure 1 - Screen 4A Figure 4B Figure 4C Figure 4 Strange flash 4 Figure Figure 88 Figure 8A 3. Person making the amendment (voluntarily) 5. "Detailed Description of the Invention" 6. Contents of Amendment (1) "Program measuring device" in line 12 of page 18 of the specification is corrected to "program modifying device."that's all

Claims (1)

[Claims] (1) A test program modification device for modifying a test program for testing a semiconductor device, comprising: a test time measuring means for measuring execution time of a desired portion of the test program; and an output of the semiconductor device. a waiting time setting means for setting a minimum waiting time necessary for the test program to become stable; simultaneous measurement means for simultaneously measuring possible items; test order changing means for changing the order of test items in the test program; and duplication deletion means for eliminating duplicate descriptions in the test program. and input/output adjusting means for optimizing input/output conditions to the semiconductor device in a desired test item of the test program, and the test time measuring means is configured to adjust input/output conditions to the semiconductor device in a desired test item of the test program. means for specifying a range in which the execution time is to be measured, a means for measuring the execution time in the specified range of the test program based on the specification, and a means for displaying the measured time; The means includes a means for specifying a test item whose waiting time is desired to be corrected in the test program, a means for measuring an output state of the semiconductor device for the specified test item based on the specification, and a means for measuring the output state of the semiconductor device for the specified test item based on the specification. means for setting a minimum waiting time based on the above, and the simultaneous measurement means includes means for specifying test items that can be measured simultaneously in the test program, and means for specifying test items that can be measured simultaneously in the test program; means for identifying sentences and rearranging sentences of the same type in parallel; the test order changing means includes means for specifying the test items whose order is to be changed in the test program and their movement locations; and means for changing the order of test items, and the duplication deletion means comprises means for specifying a request range for duplication deletion in the test program, and means for deleting duplicate entries in the test program based on the specification. , the input/output adjustment means includes means for specifying test items to be adjusted for input/output in the test program, means for determining optimum values of input/output conditions for the semiconductor device based on the specification, and displaying the optimum values. A test program modification device comprising: means for modifying a test program;