JPH022683U - - Google Patents

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Publication number
JPH022683U
JPH022683U JP7957388U JP7957388U JPH022683U JP H022683 U JPH022683 U JP H022683U JP 7957388 U JP7957388 U JP 7957388U JP 7957388 U JP7957388 U JP 7957388U JP H022683 U JPH022683 U JP H022683U
Authority
JP
Japan
Prior art keywords
timing
output
pattern
adjusts
comparator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP7957388U
Other languages
English (en)
Japanese (ja)
Other versions
JP2515914Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7957388U priority Critical patent/JP2515914Y2/ja
Publication of JPH022683U publication Critical patent/JPH022683U/ja
Application granted granted Critical
Publication of JP2515914Y2 publication Critical patent/JP2515914Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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  • Tests Of Electronic Circuits (AREA)
JP7957388U 1988-06-15 1988-06-15 Ｉｃ試験装置のタイミング校正装置 Expired - Lifetime JP2515914Y2 (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7957388U JP2515914Y2 (ja) 1988-06-15 1988-06-15 Ｉｃ試験装置のタイミング校正装置

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7957388U JP2515914Y2 (ja) 1988-06-15 1988-06-15 Ｉｃ試験装置のタイミング校正装置

Publications (2)

Publication Number Publication Date
JPH022683U true JPH022683U (ko) 1990-01-09
JP2515914Y2 JP2515914Y2 (ja) 1996-11-06

Family

ID=31304443

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7957388U Expired - Lifetime JP2515914Y2 (ja) 1988-06-15 1988-06-15 Ｉｃ試験装置のタイミング校正装置

Country Status (1)

Country Link
JP (1) JP2515914Y2 (ko)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002156414A (ja) * 2000-11-16 2002-05-31 Advantest Corp タイミング校正機能を具備した半導体デバイス試験装置
JP2003512630A (ja) * 1999-10-19 2003-04-02 テラダイン・インコーポレーテッド 自動試験装置における改良試験及び較正回路及び方法
JP4617401B1 (ja) * 2009-09-10 2011-01-26 株式会社アドバンテスト 試験装置および試験方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012149955A (ja) * 2011-01-18 2012-08-09 Yokogawa Electric Corp 半導体試験装置

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003512630A (ja) * 1999-10-19 2003-04-02 テラダイン・インコーポレーテッド 自動試験装置における改良試験及び較正回路及び方法
JP4689125B2 (ja) * 1999-10-19 2011-05-25 テラダイン・インコーポレーテッド 自動試験装置における改良試験及び較正回路及び方法
JP2002156414A (ja) * 2000-11-16 2002-05-31 Advantest Corp タイミング校正機能を具備した半導体デバイス試験装置
JP4617401B1 (ja) * 2009-09-10 2011-01-26 株式会社アドバンテスト 試験装置および試験方法
JP2011059110A (ja) * 2009-09-10 2011-03-24 Advantest Corp 試験装置および試験方法

Also Published As

Publication number Publication date
JP2515914Y2 (ja) 1996-11-06

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