JPH0225594Y2 - - Google Patents
Info
- Publication number
- JPH0225594Y2 JPH0225594Y2 JP1984137227U JP13722784U JPH0225594Y2 JP H0225594 Y2 JPH0225594 Y2 JP H0225594Y2 JP 1984137227 U JP1984137227 U JP 1984137227U JP 13722784 U JP13722784 U JP 13722784U JP H0225594 Y2 JPH0225594 Y2 JP H0225594Y2
- Authority
- JP
- Japan
- Prior art keywords
- processing
- workpiece
- laser
- laser beam
- rotation
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 238000001514 detection method Methods 0.000 claims description 20
- 238000003466 welding Methods 0.000 claims description 2
- 238000005259 measurement Methods 0.000 description 6
- 238000000034 method Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 3
- 238000003754 machining Methods 0.000 description 2
- 238000010586 diagram Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Description
【考案の詳細な説明】 [考案の目的] (産業上の利用分野) 本考案はレーザ加工装置に関する。[Detailed explanation of the idea] [Purpose of invention] (Industrial application field) The present invention relates to a laser processing device.
(従来の技術)
いわゆる倣い方式におけるレーザ加工では、加
工物の形状や加工部の位置の検出をする各種のセ
ンサは加工中に加工部から発するプラズマの光ノ
イズの影響を免れるために、レーザ光照射位置よ
り若干離れた点を先行して検出するようにされて
いる。(Prior technology) In laser machining using the so-called copying method, various sensors that detect the shape of the workpiece and the position of the machined part are not affected by the optical noise of the plasma emitted from the machined part during processing. A point slightly distant from the irradiation position is detected in advance.
(考案が解決しようとする課題)
しかし、このように離れてしまうと、レーザ光
照射と検出とがずれ、離れた距離における変化分
は無視されてしまうことになり、倣い精度が低下
していた。また、予め全体の形状や加工位置を検
出して記憶させ、その記憶した信号の制御によつ
て加工するテイーチング方式では大容量のメモリ
が必要となるほか、時間的なロスが問題となる。(Problem that the invention aims to solve) However, when the laser beam is separated like this, there is a lag between the laser beam irradiation and the detection, and the changes at the distant distance are ignored, resulting in a decrease in tracing accuracy. . Furthermore, the teaching method, in which the overall shape and processing position are detected and stored in advance, and processing is performed by controlling the stored signals, requires a large capacity memory and poses a problem of time loss.
本考案は加工中の外因に影響されず、高速な倣
い加工を高精度に行うことのできるレーザ加工装
置の提供を目的とする。 The object of the present invention is to provide a laser processing device that is not affected by external factors during processing and can perform high-speed copy processing with high precision.
[考案の構成]
(課題を解決するための手段と作用)
円筒状の一方の被加工物の一端部に円盤状の他
方の被加工物を相対的に保持し、これら両者をレ
ーザ溶接するレーザ加工装置において、加工用レ
ーザ光を放出するレーザ発振器と、上記一方の被
加工物を保持して回転させる回転駆動装置と、上
記一方の被加工物もしくは他方の被加工物の少な
くとも一方の基準直径に対する偏心量を上記回転
中に検出する検出装置と、上記偏心量に基づいて
加工用レーザ光の照射を相対的に走査する手段
と、上記加工用レーザ光の照射開始前に先行して
上記検出を指令し上記回転が半回転経過後に上記
検出開始点を上記加工用レーザ光の加工開始点と
して加工指令を出すとともにこの加工指令から1
回転後に加工停止指令を出す制御装置とを備えた
もので、レーザ加工中に生じる外因の影響が及ば
ない箇所でレーザ加工開始前に先行して制御量で
ある偏心量を検出する。[Structure of the invention] (Means and effects for solving the problem) A laser that holds one end of a cylindrical workpiece relatively to another disc-shaped workpiece and laser-welds the two. In the processing device, a laser oscillator that emits a laser beam for processing, a rotation drive device that holds and rotates one of the workpieces, and a reference diameter of at least one of the one workpiece or the other workpiece. a detection device for detecting an amount of eccentricity during the rotation; a means for relatively scanning the irradiation of the processing laser beam based on the amount of eccentricity; After the above-mentioned rotation has passed half a rotation, a processing command is issued with the detection start point as the processing start point of the processing laser beam, and from this processing command, 1
It is equipped with a control device that issues a processing stop command after rotation, and detects the amount of eccentricity, which is a control amount, in advance before starting laser processing at a location that is not affected by external factors that occur during laser processing.
(実施例)
以下、本考案を実施例を示す図面に基いて説明
する。(Example) Hereinafter, the present invention will be explained based on drawings showing examples.
第1図において1は移動テーブル装置、2はこ
の移動テーブル装置1上に設置された保持装置で
ある。保持装置2は移動テーブル装置1上に直接
固定される角度設定治具3と、この治具に固定さ
れる回転駆動装置4と、この装置によつて回転さ
れる把持体5よりなつている。把持体5には円筒
状の一方の被加工物6が開口側を上方にして把持
されている。一方、移動テーブル装置1上には保
持装置2とは別に、検出装置7が支持体8によつ
て設けられている。検出装置7は第2図に示すよ
うに、半導体レーザ発振器9とその検出用レーザ
光Laを検出部に対して集光するレンズ10aと
上記検出部よりの反射光Lbの光路上に設けられ
る集光レンズ10bおよびこのレンズ10bの集
光した光を受光するポジシヨンセンサ11を主要
素として構成されている。ポジシヨンセンサ11
で光電変換された信号は増幅されて制御装置12
に入力するようになつている。この制御装置12
はレーザ発振器13における加工用レーザ光14
の放出開始と上記検出装置7による被加工物6の
加工部に加工用レーザ光14が入射するように移
動テーブル装置1の矢印Aで示す方向への駆動と
を制御する機能を有している。ところで、上記装
置において、検出装置7は加工用レーザ光14の
被加工物6の入光点と正反対すなわち180度の位
置を検出用レーザ光Laが照射する位置に配設さ
れている。なお、加工用レーザ光14は反射鏡1
5で偏向され、集光レンズ16を介し、被加工物
の上記入光点に集光されるようになつている。 In FIG. 1, 1 is a moving table device, and 2 is a holding device installed on this moving table device 1. In FIG. The holding device 2 consists of an angle setting jig 3 directly fixed on the movable table device 1, a rotation drive device 4 fixed to this jig, and a grip body 5 rotated by this device. One cylindrical workpiece 6 is gripped by the gripper 5 with the opening side facing upward. On the other hand, apart from the holding device 2, a detection device 7 is provided on the movable table device 1 by a support 8. As shown in FIG. 2, the detection device 7 includes a semiconductor laser oscillator 9, a lens 10a that focuses the detection laser beam La onto the detection section, and a condenser provided on the optical path of the reflected light Lb from the detection section. The main components include an optical lens 10b and a position sensor 11 that receives the light collected by the lens 10b. Position sensor 11
The photoelectrically converted signal is amplified and sent to the control device 12.
It is now possible to input . This control device 12
is the processing laser beam 14 in the laser oscillator 13
It has a function of controlling the start of emission of the moving table device 1 and the driving of the movable table device 1 in the direction shown by the arrow A so that the processing laser beam 14 is incident on the processing portion of the workpiece 6 by the detection device 7. . By the way, in the above-mentioned apparatus, the detection device 7 is disposed at a position where the detection laser beam La irradiates a position exactly opposite, that is, 180 degrees, from the incident point of the processing laser beam 14 on the workpiece 6. Note that the processing laser beam 14 is transmitted through the reflecting mirror 1.
The beam is deflected by the beam 5 and condensed through a condensing lens 16 onto the light incident point on the workpiece.
以上の構成において、被加工物6の開口部に他
方の被加工物である蓋体20を溶接する加工につ
いて第1図乃至第3図に基づいて説明する。角度
設定治具3により加工用レーザ光14との入射角
度を設定した後回転駆動装置4を作動し、検出装
置7による測定を開始する。すなわち、被加工物
6の外周の寸法精度が一般的に悪いために、被加
工物8の開口部に挿入された比較的寸法精度のよ
い蓋体20の外周の基準直径に対する偏心量を検
出装置7で検出する。制御装置12においては、
この検出の開始点からエンコーダによつて被加工
物6の回転角度をたとえば1度毎に算出し、その
回転角度毎の偏心量を360度分記憶する。この記
憶した偏心量のデータを基に移動テーブル装置1
を上記偏心量分走査する。ただし、加工用レーザ
光14の照射は測定点と対称の位置、すなわち、
180度ずれた箇所にきたとき、照射するように設
定される。したがつて、制御シーケンスでは180
度分のデータ測定が加工用レーザ光14の照射開
始に先行するので、測定開始からレーザ照射が終
了するまでに被加工物6は蓋体20と共に1回転
半(540度)回転される。 In the above configuration, the process of welding the lid 20, which is the other workpiece, to the opening of the workpiece 6 will be explained based on FIGS. 1 to 3. After setting the angle of incidence with the processing laser beam 14 using the angle setting jig 3, the rotation drive device 4 is activated and measurement by the detection device 7 is started. That is, since the dimensional accuracy of the outer periphery of the workpiece 6 is generally poor, the device detects the amount of eccentricity of the outer periphery of the lid body 20 inserted into the opening of the workpiece 8, which has relatively good dimensional accuracy, with respect to the reference diameter. 7 to detect. In the control device 12,
From the starting point of this detection, the rotation angle of the workpiece 6 is calculated, for example, every degree by an encoder, and the amount of eccentricity for each rotation angle is stored for 360 degrees. Based on this stored eccentricity data, the moving table device 1
is scanned by the amount of eccentricity mentioned above. However, the processing laser beam 14 is irradiated at a position symmetrical to the measurement point, that is,
It is set to irradiate when it comes to a location that is 180 degrees off. Therefore, in the control sequence 180
Since the degree data measurement precedes the start of irradiation with the processing laser beam 14, the workpiece 6 is rotated one and a half rotations (540 degrees) together with the lid body 20 from the start of measurement until the end of laser irradiation.
[考案の効果]
上記実施例で、被加工物6の変位量(フレ量)
が最大で0.22μmのものについて行つた。検出装
置7による測定精度は約10μmであるが、移動テ
ーブル装置1等の全体の精度から約50μmの位置
修正精度で加工が行えた。[Effect of the invention] In the above embodiment, the amount of displacement (amount of deflection) of the workpiece 6
The maximum diameter was 0.22μm. Although the measurement accuracy by the detection device 7 is approximately 10 μm, processing could be performed with a position correction accuracy of approximately 50 μm based on the overall accuracy of the movable table device 1 and the like.
また、検出装置による加工位置等の検出を半回
転分先行して行い、その先行分を修正したレーザ
加工を開始するようにしたので、検出装置に対す
る外乱の影響がなく高精度の測定が行え、また加
工時間も検出開始とレーザ照射開始との間のずれ
分のみの付加であり、テイーチング方式に比べて
時間のロスが少なくてすむ効果を得た。 In addition, the detection device detects the machining position, etc. by half a rotation in advance, and then starts laser processing by correcting the preceding portion, so that high-precision measurement can be performed without the influence of disturbance on the detection device. In addition, the processing time is added only by the difference between the start of detection and the start of laser irradiation, which has the effect of reducing time loss compared to the teaching method.
第1図は本考案の一実施例を示す構成図、第2
図は第1図における検出装置の構成を示す平面
図、3図は上記実施例におけるプログラムの一例
である。
1……移動テーブル装置、2……保持装置、7
……検出装置、12……制御装置、13……レー
ザ発振器。
Fig. 1 is a configuration diagram showing one embodiment of the present invention;
This figure is a plan view showing the configuration of the detection device in FIG. 1, and FIG. 3 is an example of a program in the above embodiment. 1...Moving table device, 2...Holding device, 7
...Detection device, 12...Control device, 13...Laser oscillator.
Claims (1)
方の被加工物を相対的に保持し、これら両者をレ
ーザ溶接するレーザ加工装置において、加工用レ
ーザ光を放出するレーザ発振器と、上記一方の被
加工物を保持して回転させる回転駆動装置と、上
記一方の被加工物もしくは他方の被加工物の少な
くとも一方の基準直径に対する偏心量を上記回転
中に検出する検出装置と、上記偏心量に基づいて
加工用レーザ光の照射を相対的に走査する手段
と、上記加工用レーザ光の照射開始前に先行して
上記検出を指令し上記回転が半回転経過後に上記
検出開始点を上記加工用レーザ光の加工開始点と
して加工指令を出すとともにこの加工指令から1
回転後に加工停止指令を出す制御装置とを備えた
ことを特徴とするレーザ加工装置。 A laser processing device for relatively holding one end of a cylindrical workpiece and another disc-shaped workpiece and laser welding the two, a laser oscillator that emits a laser beam for processing; a rotation drive device that holds and rotates one workpiece; a detection device that detects an amount of eccentricity with respect to a reference diameter of at least one of the one workpiece or the other workpiece during the rotation; means for relatively scanning the irradiation of the processing laser light based on the amount; A processing command is issued as the processing start point of the processing laser beam, and 1
A laser processing device characterized by comprising a control device that issues a processing stop command after rotation.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984137227U JPH0225594Y2 (en) | 1984-09-12 | 1984-09-12 |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP1984137227U JPH0225594Y2 (en) | 1984-09-12 | 1984-09-12 |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS6153083U JPS6153083U (en) | 1986-04-10 |
JPH0225594Y2 true JPH0225594Y2 (en) | 1990-07-13 |
Family
ID=30695641
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP1984137227U Expired JPH0225594Y2 (en) | 1984-09-12 | 1984-09-12 |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0225594Y2 (en) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5177643B2 (en) * | 2008-02-21 | 2013-04-03 | 独立行政法人産業技術総合研究所 | High precision laser processing and combined laser / electrolytic processing equipment |
JP5331417B2 (en) * | 2008-09-10 | 2013-10-30 | 株式会社ディスコ | Laser processing equipment |
-
1984
- 1984-09-12 JP JP1984137227U patent/JPH0225594Y2/ja not_active Expired
Also Published As
Publication number | Publication date |
---|---|
JPS6153083U (en) | 1986-04-10 |
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