JPH02253112A - Form measuring instrument - Google Patents

Form measuring instrument

Info

Publication number
JPH02253112A
JPH02253112A JP7545389A JP7545389A JPH02253112A JP H02253112 A JPH02253112 A JP H02253112A JP 7545389 A JP7545389 A JP 7545389A JP 7545389 A JP7545389 A JP 7545389A JP H02253112 A JPH02253112 A JP H02253112A
Authority
JP
Japan
Prior art keywords
sensor
measurement
measured
face
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7545389A
Other languages
Japanese (ja)
Inventor
Makoto Shimura
志村 誠
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
SHIMORETSUKUSU KK
Original Assignee
SHIMORETSUKUSU KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by SHIMORETSUKUSU KK filed Critical SHIMORETSUKUSU KK
Priority to JP7545389A priority Critical patent/JPH02253112A/en
Publication of JPH02253112A publication Critical patent/JPH02253112A/en
Pending legal-status Critical Current

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  • Length Measuring Devices With Unspecified Measuring Means (AREA)
  • Details Of Measuring And Other Instruments (AREA)

Abstract

PURPOSE:To correct the disaccord between a face to be measured and a sensor movement face and to perform accurate measurement by providing a correction sensor, which is moved in the Z direction in accordance with a measuring sensor moved in X and Y directions, and a specular face as its reference. CONSTITUTION:Measuring sensors 4 and 4' are attached to a pair of arms 5 and 5' of an XY stage 3, and the lower arm 5' is provided with a correction sensor 6 which is moved in the Z direction in accordance with sensors 4 and 4'. A specular surface body 7 is set among three pole braces 11 on a sample stage 2 to constitute the reference face of the sensor 6. When measuring sensors 4 and 4' are moved in X and Y directions, fluctuation in the Z direction is caused between the face to be measured and the sensor movement face. This fluctuation in the Z direction is obtained by measuring the distance from the specular surface body 7 by the correction sensor 6 to correct the read value, thus correcting the disaccord between both reference faces to perform accurate measurement.

Description

【発明の詳細な説明】 [産業上の利用分野] この発明は電子部品や機械部品等の、厚さ、表面形状、
あるいはその他の外形寸法を測定する形状測定装置に関
するものである。
[Detailed Description of the Invention] [Industrial Application Field] This invention relates to the thickness, surface shape,
Alternatively, the present invention relates to a shape measuring device for measuring other external dimensions.

〔従来の技術] 従来の電子部品や機械部品等の厚さ等の外形寸法を測定
する形状測定装置は、例えば資料台にセットされた被測
定物をX−Yおよび2方向に移動する測定用のセンサー
で走査することにより、厚さ等の外形寸法のデータを読
み取るようになっている。ところがX−Y方向に移動す
るために直線案内を利用する場合、次の問題があった。
[Prior Art] Conventional shape measuring devices for measuring external dimensions such as the thickness of electronic parts, mechanical parts, etc. are used for measuring, for example, by moving an object set on a document table in X-Y and two directions. By scanning with a sensor, data on external dimensions such as thickness can be read. However, when using linear guidance to move in the X-Y direction, the following problem occurs.

すなわち転がり案内を利用した場合、転動体の転がり面
の凹凸、表面粗さ、異物の進入あるいは摩耗による精度
劣化等により、資料台にセットされた被測定物の基準面
と、測定用のセンサーの走査方向の基準面とが一致しな
いことが多かった。
In other words, when using rolling guides, the difference between the reference surface of the object to be measured set on the data table and the sensor for measurement may occur due to unevenness of the rolling surface of the rolling elements, surface roughness, intrusion of foreign objects, or accuracy deterioration due to wear. The reference plane in the scanning direction often did not match.

またこの問題を改善する一方法として、静圧案内を利用
することが考えられるが、現在では高価で市販品の種類
も少ないため、利用は困難であった。
One possible way to improve this problem is to use static pressure guides, but it has been difficult to use because they are currently expensive and there are only a few types of commercially available products.

そして前記従来の形状測定装置においては、前記補正を
、予め目的とする被測定物の測定前にダミー等を測定す
ることにより所期の数値を得ておき、その経験値と実際
の測定データとを比較しながら行なうのが一般的であっ
た。
In the conventional shape measuring device, the correction is performed by obtaining the desired numerical value in advance by measuring a dummy etc. before measuring the target object to be measured, and then combining the empirical value with the actual measurement data. It was common to do this by comparing the

[発明が解決しようとする問題点] しかしながら前記従来の形状測定装置においては、前記
転がり案内を利用した場合、転動体の転がり具合により
繰り返し動作に異差が生ずる。したがって測定データに
補正を加える場合、この値も含んで測定データとしなけ
ればならず、測定精度の低下を招いている。
[Problems to be Solved by the Invention] However, in the conventional shape measuring device, when the rolling guide is used, there are differences in the repetitive motion depending on the rolling condition of the rolling elements. Therefore, when correction is applied to the measurement data, this value must be included in the measurement data, resulting in a decrease in measurement accuracy.

そこでこの発明は、上記誤差をまったく解消することを
かでき、正確な測定値を得ることのできる形状測定装置
を提供することを目的として開発したものである。
Therefore, the present invention was developed for the purpose of providing a shape measuring device that can completely eliminate the above-mentioned errors and obtain accurate measurement values.

[問題を解決するための手段] すなわちこの発明の形状測定装置は、ベースに固定され
た資料台と、被測定物の上下に保持されてX−Y方向に
移動する、被接触形レーザー変位計からなる一対の測定
用のセンサー、およびこの測定用センサーと連動する2
方向の変動補正用のセンサーと、その基準となる基準平
面より構成された測定部を有し、被測定物を少なくとも
3点支持により資料台にセットし、その上下に設けた測
定用センサーをx−Y方向に移動することにより、被測
定物の上面および下面の変位データの測定および基準平
面の測定を同時に行なうようにしたことを特徴とするも
のである。
[Means for Solving the Problem] That is, the shape measuring device of the present invention includes a data stand fixed to a base, and a contact type laser displacement meter that is held above and below the object to be measured and moves in the X-Y direction. A pair of measurement sensors consisting of a
It has a measurement unit consisting of a sensor for correcting directional fluctuations and a reference plane that serves as its reference.The object to be measured is set on a document stand with at least three points of support, and the measurement sensors installed above and below the x -By moving in the Y direction, the displacement data of the upper and lower surfaces of the object to be measured and the reference plane can be measured simultaneously.

[実施例] 次に、この発明に係る形状測定装置の一実施例を図面に
基いて説明する。
[Example] Next, an example of the shape measuring device according to the present invention will be described based on the drawings.

第1図において、1はベースで、このベース1上には資
料台2とXYステージ3とが並設されている。上記資料
台2は3本の支柱11と、支柱]1の上端に形成された
把持用の爪12とを備えており、爪12の間に被測定物
13が保持されている。3本の支柱11は上下方向に移
動が可能で、それぞれ移動量測定用のセンサ(図示せず
)か付いている。
In FIG. 1, reference numeral 1 denotes a base, on which a document stand 2 and an XY stage 3 are arranged side by side. The document table 2 includes three columns 11 and gripping claws 12 formed at the upper ends of the columns 1, and an object to be measured 13 is held between the claws 12. The three pillars 11 are movable in the vertical direction, and are each equipped with a sensor (not shown) for measuring the amount of movement.

またXYステージ3上には、被測定物13の上下に伸び
る一対のアーム5.5°か設置され、各アーム5.5“
には、測定用の被接触形レーザ変位計からなる測定用セ
ンサー4,4′がそれぞれ取り付けられていて、X−Y
方向に移動可能である。なお、下部アーム5°側にはさ
らに」1記測定用センサー4.4゛ と連動するよう2
方向の変動補正用センサー6が取り付けられ、やはりX
Yステージ3の駆動に応じて移動するようになっている
。上記測定用センサー4.4”および変動補正用センサ
ー6も上下方向への移動が可能で、かつ移動量測定用セ
ンサが付設されている。これによって厚さ指定された標
準資料を測定して標準とすることにより、厚さデータ計
測を可能としている。
Furthermore, a pair of arms extending above and below the object to be measured 13 are installed on the XY stage 3, each arm 5.5"
Measurement sensors 4 and 4' each consisting of a contact type laser displacement meter are attached to the X-Y
It is possible to move in the direction. In addition, on the 5° side of the lower arm, there is also a sensor 2 for interlocking with the sensor 4.4 for measurement described in 1.
A sensor 6 for correcting the direction fluctuation is attached, and the X
It is configured to move according to the drive of the Y stage 3. The measurement sensor 4.4'' and the variation correction sensor 6 can also be moved in the vertical direction, and are equipped with a sensor for measuring the amount of movement. This makes it possible to measure thickness data.

」1記した資料台2の3本の支柱11間には、精密に平
面度を設定した鏡面体7が設置され、この鏡面体7より
構成された基準平面上を上記X方向の変動補正用センサ
ー6が走査するようになっている。14はXステージ駆
動用のX軸モータ、15はX軸側エンコーダである。同
様にYステージ駆動用のX軸モータ、Y軸用エンコーダ
も取り付けられているが、図示ばされていない。
A mirror surface body 7 whose flatness is precisely set is installed between the three supports 11 of the data table 2 described in 1 above, and the reference plane formed by this mirror surface body 7 is used to correct the fluctuation in the X direction. The sensor 6 is configured to scan. 14 is an X-axis motor for driving the X stage, and 15 is an X-axis side encoder. Similarly, an X-axis motor for driving the Y stage and a Y-axis encoder are also attached, but they are not shown.

以上の構成からなる測定部Cは、第2図に示すようにC
PU等からなる処理部りによって制御される。この処理
部りにはCRTやプリンタ、■/F出力部、フロッピー
ディスクドライブ等の周辺機器Eが付設されている。こ
の発明の形状測定装置は以上の各部から構成されている
The measuring section C having the above configuration is as shown in FIG.
It is controlled by a processing unit consisting of a PU and the like. Peripheral equipment E such as a CRT, a printer, a /F output unit, and a floppy disk drive are attached to this processing unit. The shape measuring device of the present invention is comprised of the above-mentioned parts.

上記形状測定装置を使用して被測定物が測定される。す
なわち上記処理部りにおいては、先ず周辺機器Eを用い
て測定に際して必要となる条件を設定する。そして処理
部りによって制御しながら測定部Cを駆動する。測定は
、X方向に測定用センサー4.4°を連続移動し、予め
設定された測定間隔で被測定物の上面と下面のデータを
読み取る。そして以上の動作を繰り返し、設定されたラ
イン数の収集を行なう。
An object to be measured is measured using the shape measuring device. That is, in the processing section, first, the peripheral equipment E is used to set the conditions necessary for measurement. Then, the measuring section C is driven while being controlled by the processing section. The measurement is performed by continuously moving the measurement sensor 4.4 degrees in the X direction and reading data on the top and bottom surfaces of the object at preset measurement intervals. The above operations are then repeated to collect the set number of lines.

以上の測定を行なう場合、次のような操作をして測定用
センサー4.4”の2方向の変動についての補正を行な
う。すなわち測定用センサー44゛か測定時にx−Y方
向に移動する際には、被測定物の基準面との間で2方向
の変動が生しる。
When performing the above measurements, the following operations are performed to correct for fluctuations in the measurement sensor 4.4" in two directions. In other words, when the measurement sensor 44" moves in the x-y direction during measurement, In this case, fluctuations occur in two directions with respect to the reference plane of the object to be measured.

この2方向の変動は、上記測定用センサー4,4と連動
するZ方向の変動補正用センサー6によって、その基準
となる基準平面(鏡面体7)と測定用センサー4,4°
との間の距離を測定し、演算により上記読み取り値の補
正を行なう。この際使用する基準平面としては、オプチ
カルフラット等の鏡面体7からなる平面を用いる。また
当初の資料台2および基準平面の傾きについては、平面
度の確認された基準資料を資料台2にセットし、予め測
定しておくことで、これとの比較により補正値を得るも
のである。
The fluctuations in these two directions are corrected by the Z-direction fluctuation correction sensor 6 that works with the measurement sensors 4, 4, and the reference plane (mirror surface 7) that serves as the reference and the measurement sensors 4, 4°.
The distance between the two is measured and the above read value is corrected by calculation. As the reference plane used at this time, a plane made of a mirror surface 7 such as an optical flat is used. In addition, regarding the inclination of the original document table 2 and the reference plane, a reference document whose flatness has been confirmed is set on the document table 2 and measured in advance, and a correction value is obtained by comparison with this. .

この補正に際する処理を第3図に基いて説明すると、図
におけるセンサー16は測定用センサーと変動補正用セ
ンサーとを簡略化して一体として示したもので、基準平
面からの距離B、B’ を読み取り、その差が変動量と
なる。そこで、この変動量を読み取り値Aから加減して
上記読み取り値A°を補正する。なお、測定中の読み取
りデータまたはファイルされたデータはCRT上にグラ
フまたは数値として表示され、I/F出力部においてR
3−232C回線等の通信回線により、指定されたデー
タの出力を行なう。また同時にプリンターへ数値データ
の出力を行なう。
The process for this correction will be explained based on FIG. 3. The sensor 16 in the figure is a simplified integral unit of a measurement sensor and a fluctuation correction sensor, and is located at distances B and B' from the reference plane. is read, and the difference is the amount of variation. Therefore, this amount of variation is added or subtracted from the read value A to correct the read value A°. Note that the read data or filed data during measurement is displayed as a graph or numerical value on the CRT, and R is displayed at the I/F output section.
Specified data is output via a communication line such as a 3-232C line. At the same time, numerical data is output to the printer.

〔発明の効果1 この発明の形状測定装置は以上のように形成したので、
資料台にセットされた被測定物の基準面と、測定用のセ
ンサーの走査方向の基準面とが不一致の場合でも、それ
に伴う誤差を簡単に補正することができ、非常に精度の
よい形状測定装置を提供することができる。
[Effect of the invention 1 Since the shape measuring device of this invention is formed as described above,
Even if there is a mismatch between the reference plane of the object to be measured set on the document table and the reference plane in the scanning direction of the measurement sensor, the resulting error can be easily corrected, allowing highly accurate shape measurement. equipment can be provided.

【図面の簡単な説明】[Brief explanation of drawings]

第1図はこの発明に係る形状測定装置の一実施例を示し
、測定部の斜視図、第2図は基本構成を示す概略図、第
3図は補正に関する処理を示す概略図である。 1・・・ベース     2・・・資料台3・・・XY
ステージ  4,4°・・・測定用センサ5.5゛・・
・アーム  6・・・変動補正用センサ7・・・鏡面体
     11・・・支柱12・・・把持用の爪  1
3・・・被測定物14・・・X軸モータ C・・・測定部 E・・・周辺機器 15・・・X軸周エンコーダ D・・・処理部
FIG. 1 shows an embodiment of the shape measuring device according to the present invention, and is a perspective view of a measuring section, FIG. 2 is a schematic diagram showing the basic configuration, and FIG. 3 is a schematic diagram showing processing related to correction. 1...Base 2...Data stand 3...XY
Stage 4,4°...Measurement sensor 5.5°...
・Arm 6... Sensor for fluctuation correction 7... Mirror surface body 11... Support 12... Gripping claw 1
3...Object to be measured 14...X-axis motor C...Measuring section E...Peripheral device 15...X-axis circumferential encoder D...Processing section

Claims (1)

【特許請求の範囲】[Claims] 1、ベースに固定された資料台と、被測定物の上下に保
持されてX−Y方向に移動する、被接触形レーザー変位
計からなる一対の測定用のセンサー、およびこの測定用
センサーと連動するZ方向の変動補正用のセンサーと、
その基準となる基準平面より構成された測定部を有し、
被測定物を少なくとも3点支持により資料台にセットし
、その上下に設けた測定用センサーをX−Y方向に移動
することにより、被測定物の上面および下面の変位デー
タの測定および基準平面の測定を同時に行なうようにし
たことを特徴とする形状測定装置。
1. A pair of measurement sensors consisting of a data stand fixed to the base and a contact type laser displacement meter that is held above and below the object to be measured and moves in the X-Y direction, and works in conjunction with this measurement sensor. a sensor for correcting fluctuations in the Z direction;
It has a measurement part configured from a reference plane that serves as its reference,
By setting the object to be measured on a data stand with at least three points of support, and moving the measurement sensors installed above and below it in the X-Y direction, it is possible to measure displacement data on the top and bottom surfaces of the object and to set the reference plane. A shape measuring device characterized in that measurements are performed simultaneously.
JP7545389A 1989-03-28 1989-03-28 Form measuring instrument Pending JPH02253112A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7545389A JPH02253112A (en) 1989-03-28 1989-03-28 Form measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7545389A JPH02253112A (en) 1989-03-28 1989-03-28 Form measuring instrument

Publications (1)

Publication Number Publication Date
JPH02253112A true JPH02253112A (en) 1990-10-11

Family

ID=13576717

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7545389A Pending JPH02253112A (en) 1989-03-28 1989-03-28 Form measuring instrument

Country Status (1)

Country Link
JP (1) JPH02253112A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007286072A (en) * 2007-08-06 2007-11-01 Kobe Steel Ltd Method and apparatus for measuring flatness

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS606803A (en) * 1983-06-24 1985-01-14 Sumitomo Metal Ind Ltd Device for measuring shape of work roll of rolling mill

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS606803A (en) * 1983-06-24 1985-01-14 Sumitomo Metal Ind Ltd Device for measuring shape of work roll of rolling mill

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007286072A (en) * 2007-08-06 2007-11-01 Kobe Steel Ltd Method and apparatus for measuring flatness

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