JPH02212389A - Pulling-up device for semiconductor single crystal - Google Patents
Pulling-up device for semiconductor single crystalInfo
- Publication number
- JPH02212389A JPH02212389A JP3335189A JP3335189A JPH02212389A JP H02212389 A JPH02212389 A JP H02212389A JP 3335189 A JP3335189 A JP 3335189A JP 3335189 A JP3335189 A JP 3335189A JP H02212389 A JPH02212389 A JP H02212389A
- Authority
- JP
- Japan
- Prior art keywords
- crucible
- heating body
- single crystal
- shaft
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000013078 crystal Substances 0.000 title claims abstract description 35
- 239000004065 semiconductor Substances 0.000 title claims abstract description 28
- 238000010438 heat treatment Methods 0.000 claims abstract description 33
- 239000000463 material Substances 0.000 claims abstract description 6
- 238000002844 melting Methods 0.000 claims abstract description 6
- 230000008018 melting Effects 0.000 claims abstract description 6
- 238000000034 method Methods 0.000 abstract description 11
- 229910052751 metal Inorganic materials 0.000 abstract description 5
- 239000002184 metal Substances 0.000 abstract description 5
- 239000011810 insulating material Substances 0.000 abstract description 3
- 238000000151 deposition Methods 0.000 abstract description 2
- 229910052697 platinum Inorganic materials 0.000 abstract description 2
- 229910052721 tungsten Inorganic materials 0.000 abstract description 2
- 239000011248 coating agent Substances 0.000 abstract 1
- 238000000576 coating method Methods 0.000 abstract 1
- 229910001218 Gallium arsenide Inorganic materials 0.000 description 6
- 239000000155 melt Substances 0.000 description 3
- 230000015572 biosynthetic process Effects 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 238000013021 overheating Methods 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 1
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 239000002775 capsule Substances 0.000 description 1
- 229910052799 carbon Inorganic materials 0.000 description 1
- 239000003575 carbonaceous material Substances 0.000 description 1
- 238000001816 cooling Methods 0.000 description 1
- PMHQVHHXPFUNSP-UHFFFAOYSA-M copper(1+);methylsulfanylmethane;bromide Chemical compound Br[Cu].CSC PMHQVHHXPFUNSP-UHFFFAOYSA-M 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000001704 evaporation Methods 0.000 description 1
- 230000008020 evaporation Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 230000005855 radiation Effects 0.000 description 1
- 239000003870 refractory metal Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000007738 vacuum evaporation Methods 0.000 description 1
Landscapes
- Crystals, And After-Treatments Of Crystals (AREA)
- Liquid Deposition Of Substances Of Which Semiconductor Devices Are Composed (AREA)
Abstract
Description
【発明の詳細な説明】
〔発明の目的〕
(産業上の利用分野)
本発明は半導体単結晶引上げ装置にかかり、特にチョク
ラルスキ法(Czochralski法、以下Cz法と
略称する)、あるいは液体カプセル法(Liquid
Encapusulated Czochralski
法、以下LEC法と略称する)による半導体単結晶引上
げ装置のホットゾーンにおける加熱手段の改良に関する
。Detailed Description of the Invention [Objective of the Invention] (Industrial Field of Application) The present invention relates to a semiconductor single crystal pulling apparatus, and particularly relates to a semiconductor single crystal pulling apparatus, and particularly relates to the Czochralski method (hereinafter abbreviated as the Cz method) or the liquid capsule method ( Liquid
Encapusulated Czochralski
The present invention relates to improvements in heating means in the hot zone of a semiconductor single crystal pulling apparatus using the LEC method (hereinafter abbreviated as the LEC method).
(従来の技術)
Cz法、LEC法等によるGaAs単結晶引上げ装置の
従来の構造の要部を第4図に断面図で示す。この図に示
すホットゾーン部は内側に断熱材を設けた外囲器(図示
省略)に内装され、この外囲器内を所定の雰囲気にし、
以下に述べるように単結晶引上げを行うものである。第
4図に示すGaAs単結晶引上げ装置は、熱処理の施さ
れた窒化けい素で形成され半導体材料を収容し溶融する
有底円筒形のるつぼ101と、カーボンで形成され前記
るつぼ101を同軸に包囲し、かつその側面と一部底面
に対向する加熱体102と、前記加熱体1G2の底部中
心の開口部102aを貫通して配管されたテーブル支持
軸103と、前記テーブル支持軸103の上端に設けら
れたテーブル104上にテーブル支持軸108と同軸に
配置された前記るつぼ101とこれを包囲するように取
付けられた均温壁部105と、前記テーブル支持軸10
3を回転駆動させる回転駆動機構108から構成されて
いる。なお、前記テーブル支持軸103には、−例とし
て5 rpm程度の回転が与えられる。(Prior Art) A main part of a conventional structure of a GaAs single crystal pulling apparatus using the Cz method, LEC method, etc. is shown in a sectional view in FIG. The hot zone shown in this figure is housed in an envelope (not shown) with a heat insulating material inside, and a predetermined atmosphere is created inside the envelope.
Single crystal is pulled as described below. The GaAs single crystal pulling apparatus shown in FIG. 4 includes a bottomed cylindrical crucible 101 made of heat-treated silicon nitride that accommodates and melts a semiconductor material, and a crucible 101 made of carbon that coaxially surrounds the crucible 101. and a heating body 102 facing the side and a part of the bottom, a table support shaft 103 piped through an opening 102a at the center of the bottom of the heating body 1G2, and a table support shaft 103 provided at the upper end of the table support shaft 103. The crucible 101 is placed coaxially with the table support shaft 108 on the table 104 , the isothermal wall 105 is attached to surround the crucible 101 , and the table support shaft 10 is placed on the table 104 .
It is composed of a rotational drive mechanism 108 that rotationally drives 3. Note that the table support shaft 103 is given a rotation of about 5 rpm, for example.
そして、前記るつぼ101の上方には、種結晶体107
を下端に装着してこのるりぼ101と同軸かつ等速回転
する単結晶引上軸108が配置され、この単結晶引上軸
108を所定速度で引上げて単結晶半導体が製造される
。A seed crystal body 107 is placed above the crucible 101.
A single-crystal pulling shaft 108 is installed at the lower end and rotates coaxially and at a constant speed with the ruribo 101, and a single-crystal semiconductor is manufactured by pulling the single-crystal pulling shaft 108 at a predetermined speed.
(発明が解決しようとする課題)
LEC法によるGaAs単結晶引上げ装置における従来
の構造では、加熱体の発熱は主として放射によりまた伝
導と対流によって均温壁部に伝えられ、次いでるつぼへ
伝えられる。このため、加熱体の温度は、るつぼ内で必
要とされる半導体材料の融点の、例えばGaPで約15
00℃よりも遥かに高い温度に加熱することが必要とさ
れ、加熱体の構成に過度の制限が加えられる。斜上によ
り、実質的にカーボンに限定されているのが現状である
。また、間接加熱のために、るつぼ、ひいては融液温度
の制御が困難であるなどの問題がある。(Problems to be Solved by the Invention) In the conventional structure of a device for pulling a GaAs single crystal using the LEC method, the heat generated by the heating body is transmitted to the temperature-uniforming wall mainly by radiation and also by conduction and convection, and then to the crucible. For this purpose, the temperature of the heating element is approximately 15% higher than the melting point of the semiconductor material required in the crucible, for example for GaP.
Heating to temperatures much higher than 00°C is required, placing undue restrictions on the configuration of the heating element. Currently, due to the upward slope, carbon materials are essentially limited. In addition, indirect heating makes it difficult to control the temperature of the crucible and, by extension, the temperature of the melt.
本発明は上記従来の技術における課題を解決するために
なされたもので、LEC法によるGaAs単結晶引上げ
装置における加熱方式を改良する。The present invention has been made to solve the above-mentioned problems in the conventional technology, and improves the heating method in a GaAs single crystal pulling apparatus using the LEC method.
(課題を解決するための手段)
本発明にかかる半導体単結晶引上げ装置は、半導体材料
をるつぼに入れて溶融し半導体単結晶引上げを行う半導
体単結晶引上げ装置において、るつぼの外面に直接加熱
体を設けたことを特徴とする。(Means for Solving the Problems) A semiconductor single crystal pulling device according to the present invention is a semiconductor single crystal pulling device that pulls a semiconductor single crystal by placing a semiconductor material in a crucible and melting it. It is characterized by having been provided.
(作 用)
本発明の半導体単結晶引上げ装置は、るつぼの外面に加
熱体を装着形成した構造であるため、るつぼおよび半導
体融液の温度制御を直接に行なうことができる。これに
より、装置内の加熱体を過熱することなく、所定の温度
にて半導体単結晶引上げを達成する。(Function) Since the semiconductor single crystal pulling apparatus of the present invention has a structure in which a heating body is attached to the outer surface of the crucible, the temperature of the crucible and the semiconductor melt can be directly controlled. Thereby, the semiconductor single crystal can be pulled at a predetermined temperature without overheating the heating element in the apparatus.
(実施例)
以下、本発明にかかる半導体単結晶引上げ装置の一実施
例につき図面を参照して説明する。(Example) Hereinafter, an example of the semiconductor single crystal pulling apparatus according to the present invention will be described with reference to the drawings.
第1図は本実施例のホットゾーン部を示すもので、内面
に断熱材を備えた外囲器15は破線にて省略して示す。FIG. 1 shows the hot zone portion of this embodiment, and the envelope 15 provided with a heat insulating material on the inner surface is omitted by broken lines.
るつぼ10は第1図に示されるように、非回転のテーブ
ル支持軸12の上端に設けられたテーブル13上に配置
される。また、るつはlOの上方には、下端に種結晶体
107を装着し非回転で垂直に上下動する単結晶引上軸
14が配置されている。As shown in FIG. 1, the crucible 10 is placed on a table 13 provided at the upper end of a non-rotating table support shaft 12. Further, above the melt lO, a single crystal pulling shaft 14 is arranged which has a seed crystal body 107 attached to its lower end and moves up and down vertically without rotating.
第2図に一実施例に用いられるるつぼを側面図で示す。FIG. 2 shows a side view of a crucible used in one embodiment.
このるつぼlOには、その外面に高融点金属を装着しパ
ターン化された加熱体11が設けられている。この加熱
体11は一例として、外周側面の周側面加熱体21と、
底面の底面加熱体部31からなっており、その高融点金
属として白金、タングステン等が適し、その形成には、
パターン形状のマスクをるつぼの周側面に装着し、真空
蒸着法により一例として数十μm厚の高融点金属層を被
着したのち、マスクを取除くことで達成される。また、
底面加熱体部31は、るつぼの底面からの放冷を防止な
いし補償するもので、そのパターン形状例を第3図(a
)、または(b)にるつぼの下面図で示す。This crucible lO is provided with a patterned heating element 11 having a refractory metal attached to its outer surface. As an example, this heating body 11 includes a circumferential side heating body 21 on the outer circumferential side;
It consists of a bottom heating body part 31 on the bottom surface, and platinum, tungsten, etc. are suitable as the high melting point metal for the bottom heating body part 31, and for its formation,
This is achieved by attaching a patterned mask to the peripheral side of the crucible, depositing a high melting point metal layer with a thickness of several tens of micrometers, for example, by vacuum evaporation, and then removing the mask. Also,
The bottom heating body 31 prevents or compensates for cooling from the bottom of the crucible, and an example of its pattern shape is shown in FIG. 3(a).
) or (b) shows a bottom view of the crucible.
前記各加熱体部21.31への通電のための電極21a
、31aは、パターン端末の電極形成予定域を電極導出
部材の形状に形成するとともに、鎖部の電極導出部材に
よる圧接に耐え得る厚さに形成する。Electrode 21a for energizing each of the heating body parts 21.31
, 31a are formed so that the electrode formation area at the end of the pattern is formed in the shape of the electrode lead-out member and has a thickness that can withstand pressure contact by the electrode lead-out member of the chain portion.
なお、るつぼの材質が高温で導電性の場合には、加熱体
11の形成前に絶縁層、例えば窒化アルミニウムAIN
層を形成し、この上に加熱体蒸着を施して達成する。Note that if the material of the crucible is conductive at high temperature, an insulating layer, for example aluminum nitride AIN, is applied before forming the heating element 11.
This is achieved by forming a layer and performing heating element evaporation on the layer.
斜上の構造のるつぼを用いて半導体単結晶引上げ装置を
構成することにより、従来の同装置に必須であった均温
壁は用いず、また、るつぼと単結晶引上げ軸の回転も不
要であるから装置構成が簡潔にできる。By configuring a semiconductor single crystal pulling device using a crucible with an inclined structure, there is no need for a constant temperature wall, which was essential in conventional similar devices, and there is no need to rotate the crucible and single crystal pulling shaft. The device configuration can be simplified.
本発明の半導体単結晶引上げ装置は、るつぼの外面に加
熱体を装着形成した構造であるため、るつぼおよび半導
体融液の温度制御を直接に行なうことができる。これに
より、装置内の加熱体を過熱することなく、所定の温度
、かつ自由な発熱分布にて半導体単結晶引上げが達成で
きる。したがって、均温化のための回転機構も不要にな
る。また、従来の独立した加熱体、均温壁等の部材も不
要となり、構造が簡略化され、コストダウンが図られる
などの利点もある。Since the semiconductor single crystal pulling apparatus of the present invention has a structure in which a heating body is attached to the outer surface of the crucible, the temperature of the crucible and the semiconductor melt can be directly controlled. Thereby, the semiconductor single crystal can be pulled at a predetermined temperature and with a free heat distribution without overheating the heating element in the apparatus. Therefore, a rotation mechanism for temperature equalization is also not required. Furthermore, conventional members such as an independent heating element and a temperature-uniforming wall are no longer necessary, and the structure is simplified and costs can be reduced.
なお、前記実施例で例示したGaAs単結晶引上げ装置
は、GaAsの単結晶引上げに限定されるものでなく、
Stをはじめ一般の半導体単結晶引上げ装置に広く適用
できる。Note that the GaAs single crystal pulling apparatus exemplified in the above embodiment is not limited to pulling a GaAs single crystal;
It can be widely applied to general semiconductor single crystal pulling equipment including St.
第1図は本発明の一実施例にかかる半導体単結晶引上げ
装置のホットゾーン部の断面図、第2図は本発明の一実
施例の半導体単結晶引上げ装置におけるるつぼの側面図
、第3図(a)、(b)はいずれも本発明の一実施例の
るつぼの下面図、第4図は従来例にかかる半導体単結晶
引上げ装置のホットゾーン部の断面図である。
10・・・るつぼ
11・・・加熱体
21・・・周側面加熱体部
31・・・底面加熱体部
21a、31a −・・電極
12・・・テーブル支持軸
13・・・テーブル
15・・・外囲器FIG. 1 is a sectional view of a hot zone part of a semiconductor single crystal pulling apparatus according to an embodiment of the present invention, FIG. 2 is a side view of a crucible in a semiconductor single crystal pulling apparatus according to an embodiment of the present invention, and FIG. (a) and (b) are both bottom views of a crucible according to an embodiment of the present invention, and FIG. 4 is a sectional view of a hot zone portion of a conventional semiconductor single crystal pulling apparatus. DESCRIPTION OF SYMBOLS 10... Crucible 11... Heating body 21... Surrounding side heating body part 31... Bottom heating body part 21a, 31a... Electrode 12... Table support shaft 13... Table 15...・Envelope
Claims (1)
を行う半導体単結晶引上げ装置において、前記るつぼの
外面に直接加熱体を設けたことを特徴とする半導体単結
晶引上げ装置。A semiconductor single crystal pulling apparatus for pulling a semiconductor single crystal by placing a semiconductor material in a crucible and melting it, characterized in that a heating element is provided directly on the outer surface of the crucible.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3335189A JPH02212389A (en) | 1989-02-13 | 1989-02-13 | Pulling-up device for semiconductor single crystal |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP3335189A JPH02212389A (en) | 1989-02-13 | 1989-02-13 | Pulling-up device for semiconductor single crystal |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02212389A true JPH02212389A (en) | 1990-08-23 |
Family
ID=12384157
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP3335189A Pending JPH02212389A (en) | 1989-02-13 | 1989-02-13 | Pulling-up device for semiconductor single crystal |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02212389A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003522086A (en) * | 1998-06-26 | 2003-07-22 | エムイーエムシー・エレクトロニック・マテリアルズ・インコーポレイテッド | Electric resistance heater for crystal growth apparatus and method of using the same |
-
1989
- 1989-02-13 JP JP3335189A patent/JPH02212389A/en active Pending
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2003522086A (en) * | 1998-06-26 | 2003-07-22 | エムイーエムシー・エレクトロニック・マテリアルズ・インコーポレイテッド | Electric resistance heater for crystal growth apparatus and method of using the same |
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