JPH0219171B2 - - Google Patents

Info

Publication number
JPH0219171B2
JPH0219171B2 JP17570383A JP17570383A JPH0219171B2 JP H0219171 B2 JPH0219171 B2 JP H0219171B2 JP 17570383 A JP17570383 A JP 17570383A JP 17570383 A JP17570383 A JP 17570383A JP H0219171 B2 JPH0219171 B2 JP H0219171B2
Authority
JP
Japan
Prior art keywords
probe
support rod
seal cover
sampling
valve body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP17570383A
Other languages
Japanese (ja)
Other versions
JPS6067616A (en
Inventor
Shigeyuki Uchama
Kyoharu Ito
Haruo Ozaki
Hideji Yamato
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Nippon Steel Corp
Original Assignee
Nippon Steel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Nippon Steel Corp filed Critical Nippon Steel Corp
Priority to JP17570383A priority Critical patent/JPS6067616A/en
Publication of JPS6067616A publication Critical patent/JPS6067616A/en
Publication of JPH0219171B2 publication Critical patent/JPH0219171B2/ja
Granted legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C21METALLURGY OF IRON
    • C21CPROCESSING OF PIG-IRON, e.g. REFINING, MANUFACTURE OF WROUGHT-IRON OR STEEL; TREATMENT IN MOLTEN STATE OF FERROUS ALLOYS
    • C21C7/00Treating molten ferrous alloys, e.g. steel, not covered by groups C21C1/00 - C21C5/00
    • C21C7/10Handling in a vacuum

Description

【発明の詳細な説明】 この発明は、真空精錬炉における測温・サンプ
リング装置の改良に関し、該測温・サンプリング
用のプローブの高温や付着地金によつて該プロー
ブの支持棒を囲む真空シールパツキンを損傷する
ことがない装置を提供すること、及び該損傷しな
い装置であつて、槽内を大気に復圧せずに測温・
サンプリングを行なうことのできる測温・サンプ
リング装置を提供することを目的とする。 なお本発明の測温・サンプリング装置は、測温
のみを行なう場合、あるいはサンプリングのみを
行なう場合、あるいは測温とサンプリングの両方
を行なう場合のいずれの場合にも使用できる。 真空脱ガスや真空精錬などの溶融金属の真空精
錬炉においては溶融金属の分析のために測温・サ
ンプリングをする必要がある。そのためには試料
を真空槽の外へ取出す必要があり、従来の装置で
は第1,2図を参照して、試料採取の際に測温・
サンプリング用のプローブ2及びプローブの支持
棒4がシール部3を通過するために、プローブ2
及びプローブに近い支持棒4部分の高熱やプロー
ブの支持棒4に付着した地金5によつてシール部
3に設けたパツキン9が損傷し、該損傷したパツ
キンをそのままにしておくと真空槽1の真空度の
維持が困難になるので、パツキンを屡々取り替え
なければならないという問題があつた。 本発明装置は、上記の従来装置がもつている問
題点を解決したものであつて、真空槽の一部に設
けた開口部を経てサンプリング用のプローブを挿
入し、真空槽内部に位置する溶融金属の測温・サ
ンプリングを行なう装置に於て、上記真空槽開口
部上に弁本体内に弁体を設け、該弁体をアクチユ
エータで回動せしめるように構成した遮断弁を設
置すると共に、上記遮断弁に気密に配設され脱着
自在のシールカバーに、前記プローブの支持棒を
摺動自在に設け、該支持棒に設けた係止部により
シールカバーと係合する如くなしたことを特徴と
する真空精錬炉に於ける測温・サンプリング装置
である。 以下、本発明装置の実施例を図面により説明す
る。 第3図及び第4図において、溶融金属6を収納
している真空槽1の上部7には測温・サンプリン
グ用の開口部8が設けられている。その開口部よ
り測温・サンプリング用のプローブ2およびプロ
ーブの支持棒4が真空槽1内に挿入される。 プローブの支持棒4を気密に囲んでいて、該支
持棒4の摺動を許容するグランドパツキン9を収
納しているシールカバー10は、上部にグランド
パツキンホルダー11、グランドパツキン押え1
2を有し、下部に接続フランジ13を有する。尚
15は伸縮管で必要に応じシールカバー10の中
間部に設置される。 前記プローブ支持棒4はチエーン16、スプロ
ケツト17を介して駆動用電動機18にて昇降さ
せられる。またプローブ支持棒4には係止部19
が設けられており、該係止部19はプローブ支持
棒4が上昇してくるとシールカバー10の一部と
係止する。 真空槽1の開口部8とシールカバー10との間
にはボール弁等の遮断弁20が設置されている。
遮断弁20はボール弁本体21内にボール弁体2
2を設置したもので該ボール弁本体21に連接し
た軸23をシリンダ24等のアクチユエータで回
転駆動させボール弁体22を90゜回転して弁を開
閉するものである。ボール弁本体21とボール弁
体22との真空シールはシート部25で行なう。 第3図及び第4図の実施例では遮断弁としてボ
ール弁を使用した場合を示しているが、バタフラ
イ弁等の弁であつてもかまわない。 26および27は遮断弁20が閉の状態の時
に、その遮断弁20とシールカバー10とで囲ま
れた空間を真空圧、又は大気圧にするために、ボ
ール弁本体22に開口する排気管および復圧管で
ありそれぞれ26と27は図示しない真空排気装
置と復圧用空気源とに連結されており、その途中
にそれぞれ弁28,29が設置されている。 尚シールカバー10の下部の接続フランジ13
は遮断弁20の開口部フランジ14上に気密に配
設してあり、シールカバー10はボール弁本体2
1に着脱可能である。 この第3,4図に示す装置において真空処理中
に測温・サンプリングを行なう手順は下記に示す
通りである。 第4図の状態すなわち排気管の弁28及び遮断
20が閉であり、かつシールカバー10が真空
槽開口部を覆つて設けてあるボール弁本体21よ
り分離して上方にありプローブ2の装着が容易な
位置までプローブ支持棒4が上昇している状態に
おいて、プローブ2をプローブ支持棒4に装着す
る。尚、この時、シールカバー10はプローブ支
持棒4に設けられた係止部19と係合することで
支持されている。 次にプローブの支持棒4とシールカバー10
を一緒に下降させシールカバー10の接続フラン
ジ13をボール弁本体21のフランジ14上に載
せた状態で、又はフランジ固着装置によりフラン
ジ13をフランジ14に固着した(圧着装置は図
示せず)状態で復圧管の弁29を閉にしたのち排
気管の弁28を開にし、シールカバー10と遮断
20とで囲まれた空間内を真空槽1内と同様真
空状態にした後に遮断弁20を開にする。その後
にプローブ支持棒4をグランドパツキン9に対し
て摺動させながら下降させ、プローブ2を溶融金
属6中に一定時間浸漬させる。その後、プローブ
2を上昇させる。プローブの支持棒4がグランド
パツキン9内部を摺動しつつ上昇し、支持棒の係
止部19がシールカバー10に係止するまでの間
に遮断弁20と排気管の弁28を閉にし、それか
ら復圧管の弁29を開にして前記空間内を大気圧
に戻し、次にフランジ固着装置が設置されている
場合は該固着を解除する。プローブ支持棒4の係
止部19がシールカバー10に係止した後はプロ
ーブ支持棒4とシールカバー10とは一緒に第4
図に示す作業開始位置まで上昇させられる。そこ
でプローブ2を抜き取る。 なお本実施例装置においては、排気管26、復
圧管27を設置したけれども、これらは必須のも
のではない。遮断弁20が閉の状態では真空槽1
内の圧力がボール弁本体21内の圧力より低いた
めに遮断弁20を開ける時に本実施例のようにボ
ール弁本体21内を排気する場合に比べて排気管
26を設けてないものは大きな駆動力を要するけ
れども、遮断弁20のシリンダー24の駆動力を
それだけ大きくすればよいし、又、排気管26が
ないとボール弁本体21内の空気が真空槽1内に
流れ込むけれども特別に高真空度を要求される精
錬の場合以外は大きな影響はない。また復圧管2
7を設置しない場合は第3図の状態でプローブ支
持棒4を引き上げてシールカバー10を一緒に上
昇させる際、シールカバー10の内外の圧力差に
よる力がシールカバー10に加わるので、遮断弁
20とシールカバー10とで囲まれた空間内を大
気圧に戻した場合に比べて大きな引上げ力を要す
るが、これにしても引き上げ用電動機18の駆動
力の大きいものを用いればよい。従つて、排気管
26、復圧管27が存在しないとしても本発明の
特徴は何ら失われることはない。 本発明によると、シールカバー10を真空槽1
又はボール弁本体21に対して着脱自在とし、プ
ローブの支持棒4と一緒にシールカバー10を上
昇させることができる構成を具備するので、従来
の装置のようにプローブ2や高熱になつているプ
ローブ2の支持棒4の先端部がグランドパツキン
9部を通過することがなく、従つてグランドパツ
キンが熱による損傷を受けることがなく真空シー
ルが確実に行なえるという利点がある。 また、真空槽1内の真空度を維持したままで測
温・サンプリングができ、従つて従来の装置に比
べて、復圧時間等の時間を節約することができ、
処理時間が短くて済み、さらに、真空排気や大気
復圧に必要な動力やユーテリテイが不要であると
いう利点と上記の通り真空槽の真空度を維持した
状態で、真空精錬中の初期、中期、末期等の各精
錬段階に応じて数回の測温・サンプリングを行な
うことができるという利点を有する。
DETAILED DESCRIPTION OF THE INVENTION The present invention relates to an improvement of a temperature measurement/sampling device in a vacuum refining furnace, and relates to a vacuum seal surrounding the support rod of the temperature measurement/sampling probe due to its high temperature or adhered metal. To provide a device that does not damage the gasket, and a device that does not damage the gasket and that can measure temperature without returning the pressure inside the tank to the atmosphere.
The purpose of the present invention is to provide a temperature measurement/sampling device that can perform sampling. Note that the temperature measurement/sampling device of the present invention can be used in any case where only temperature measurement is performed, only sampling is performed, or both temperature measurement and sampling are performed. In vacuum refining furnaces for molten metal, such as vacuum degassing and vacuum refining, it is necessary to measure temperature and sample in order to analyze the molten metal. To do this, it is necessary to take the sample out of the vacuum chamber, and with conventional equipment, temperature measurement and
In order for the sampling probe 2 and the probe support rod 4 to pass through the sealing part 3, the probe 2
Also, the gasket 9 provided in the seal portion 3 is damaged due to the high heat in the portion of the support rod 4 near the probe and the metal 5 attached to the support rod 4 of the probe, and if the damaged gasket is left as it is, the vacuum chamber 1 There was a problem in that the gasket had to be replaced frequently because it became difficult to maintain the degree of vacuum. The device of the present invention solves the above-mentioned problems of the conventional device, and the sampling probe is inserted through an opening provided in a part of the vacuum chamber, and the molten metal located inside the vacuum chamber is In an apparatus for measuring and sampling the temperature of metal, a shutoff valve is installed above the opening of the vacuum chamber and has a valve body inside the valve body, and the valve body is rotated by an actuator. The support rod of the probe is slidably provided on a detachable seal cover that is airtightly disposed on the shutoff valve, and is engaged with the seal cover by a locking portion provided on the support rod. This is a temperature measurement/sampling device for vacuum refining furnaces. Embodiments of the apparatus of the present invention will be described below with reference to the drawings. In FIGS. 3 and 4, an opening 8 for temperature measurement and sampling is provided in the upper part 7 of the vacuum chamber 1 housing the molten metal 6. A temperature measurement/sampling probe 2 and a probe support rod 4 are inserted into the vacuum chamber 1 through the opening. A seal cover 10 that airtightly surrounds the support rod 4 of the probe and houses a gland gasket 9 that allows the support rod 4 to slide has a gland gasket holder 11 and a gland gasket presser 1 on the top.
2 and a connecting flange 13 at the bottom. Reference numeral 15 denotes a telescopic tube, which is installed in the middle of the seal cover 10 as required. The probe support rod 4 is raised and lowered by a drive motor 18 via a chain 16 and a sprocket 17. Also, the probe support rod 4 has a locking portion 19.
is provided, and the locking portion 19 locks with a part of the seal cover 10 when the probe support rod 4 rises. A shutoff valve 20 such as a ball valve is installed between the opening 8 of the vacuum chamber 1 and the seal cover 10 .
The shutoff valve 20 has a ball valve body 2 inside the ball valve body 21.
2 is installed, and a shaft 23 connected to the ball valve main body 21 is rotationally driven by an actuator such as a cylinder 24, and the ball valve body 22 is rotated 90 degrees to open and close the valve. Vacuum sealing between the ball valve body 21 and the ball valve body 22 is performed by the seat portion 25. Although the embodiments shown in FIGS. 3 and 4 use a ball valve as the shutoff valve, a valve such as a butterfly valve may also be used. 26 and 27 are exhaust pipes that open into the ball valve body 22 in order to bring the space surrounded by the shutoff valve 20 and the seal cover 10 to vacuum pressure or atmospheric pressure when the shutoff valve 20 is in the closed state; Repressure pipes 26 and 27 are connected to a vacuum evacuation device (not shown) and a return pressure air source, respectively, and valves 28 and 29 are installed in the middle thereof, respectively. Furthermore, the connection flange 13 at the bottom of the seal cover 10
is airtightly disposed on the opening flange 14 of the shutoff valve 20 , and the seal cover 10 is attached to the ball valve body 2.
1 can be attached and detached. The procedure for temperature measurement and sampling during vacuum processing in the apparatus shown in FIGS. 3 and 4 is as shown below. In the state shown in FIG. 4, the exhaust pipe valve 28 and the shutoff valve 20 are closed, and the seal cover 10 is located above and separated from the ball valve body 21 provided to cover the vacuum chamber opening, and the probe 2 is attached. The probe 2 is attached to the probe support rod 4 while the probe support rod 4 is raised to a position where it is easy to move. At this time, the seal cover 10 is supported by engaging with a locking portion 19 provided on the probe support rod 4. Next, the support rod 4 of the probe and the seal cover 10 are lowered together, and the connecting flange 13 of the seal cover 10 is placed on the flange 14 of the ball valve body 21, or the flange 13 is attached to the flange 14 using a flange fixing device. After closing the valve 29 of the return pressure pipe in the fixed state (the crimping device is not shown), the valve 28 of the exhaust pipe is opened, and the space surrounded by the seal cover 10 and the shutoff valve 20 is inside the vacuum chamber 1. Similarly, after creating a vacuum state, the shutoff valve 20 is opened. Thereafter, the probe support rod 4 is lowered while sliding against the gland packing 9, and the probe 2 is immersed in the molten metal 6 for a certain period of time. After that, probe 2 is raised. The support rod 4 of the probe rises while sliding inside the gland packing 9, and the shutoff valve 20 and the valve 28 of the exhaust pipe are closed until the locking part 19 of the support rod locks with the seal cover 10 . Then, the valve 29 of the pressure recovery pipe is opened to return the space to atmospheric pressure, and then, if a flange fixing device is installed, the fixation is released. After the locking portion 19 of the probe support rod 4 locks on the seal cover 10 , the probe support rod 4 and the seal cover 10 are moved together into the fourth position.
It is raised to the work starting position shown in the figure. Then, remove probe 2. Although the exhaust pipe 26 and the recovery pipe 27 are installed in the device of this embodiment, these are not essential. When the shutoff valve 20 is closed, the vacuum chamber 1
Since the pressure inside the ball valve body 21 is lower than the pressure inside the ball valve body 21, when the shutoff valve 20 is opened, the pressure in the ball valve body 21 without the exhaust pipe 26 is large compared to the case where the inside of the ball valve body 21 is exhausted as in this embodiment. Although it requires a lot of force, it is sufficient to increase the driving force of the cylinder 24 of the shutoff valve 20 , and also, although the air inside the ball valve body 21 would flow into the vacuum chamber 1 without the exhaust pipe 26, it is necessary to increase the driving force of the cylinder 24 of the shutoff valve 20. There is no major effect except in the case of smelting that requires . Also, the pressure recovery pipe 2
7 is not installed, when the probe support rod 4 is pulled up and the seal cover 10 is raised together with the probe support rod 4 in the state shown in FIG . A larger pulling force is required than when the space surrounded by the seal cover 10 and the seal cover 10 is returned to atmospheric pressure, but even in this case, a pulling motor 18 with a large driving force may be used. Therefore, even if the exhaust pipe 26 and the recovery pipe 27 are not present, the features of the present invention are not lost in any way. According to the present invention, the seal cover 10 is attached to the vacuum chamber 1.
Alternatively, it is detachable from the ball valve main body 21 and has a structure that allows the seal cover 10 to be raised together with the probe support rod 4, so that the probe 2 or the probe that is heated to high temperature can be easily attached to the ball valve body 21, unlike conventional devices. There is an advantage that the tip of the second support rod 4 does not pass through the gland packing 9, so that the gland packing is not damaged by heat and vacuum sealing can be performed reliably. In addition, temperature measurement and sampling can be performed while maintaining the degree of vacuum in the vacuum chamber 1, and therefore, compared to conventional equipment, time such as pressure recovery time can be saved.
The processing time is short, and the power and utilities required for vacuum evacuation and atmospheric pressure restoration are not required. It has the advantage that temperature measurement and sampling can be carried out several times depending on each refining stage, such as the final stage.

【図面の簡単な説明】[Brief explanation of drawings]

第1図及び第2図は従来装置を示してあり、第
1図は測温・サンプリング中の説明図、第2図は
測温・サンプリングの前あるいは後の状態の説明
図である。第3図及び第4図は本発明装置の一実
施例を示し、第3図は測温・サンプリング中の説
明図、第4図は測温・サンプリングの前あるいは
後の状態の説明図である。 1…真空槽、2…プローブ、4…支持棒、6…
溶融金属、8…開口部、9…シールパツキン、1
0…シールカバー、19…係止部、20…遮断
弁、21…ボール弁本体、22…ボール弁体、2
3…軸、24…シリンダー、25…シート部、2
6…排気管、27…復圧管、28…排気用弁、2
9…復圧用弁。
1 and 2 show a conventional device, with FIG. 1 being an explanatory diagram during temperature measurement and sampling, and FIG. 2 being an explanatory diagram of the state before or after temperature measurement and sampling. Figures 3 and 4 show an embodiment of the device of the present invention, Figure 3 is an explanatory diagram during temperature measurement/sampling, and Figure 4 is an explanatory diagram of the state before or after temperature measurement/sampling. . 1...Vacuum chamber, 2...Probe, 4...Support rod, 6...
Molten metal, 8... Opening, 9... Seal packing, 1
0... Seal cover, 19... Locking part, 20... Shutoff valve, 21... Ball valve body, 22... Ball valve body, 2
3...Shaft, 24...Cylinder, 25...Seat part, 2
6...Exhaust pipe, 27...Recovery pipe, 28...Exhaust valve, 2
9...Repressure valve.

Claims (1)

【特許請求の範囲】 1 真空槽の一部に設けた開口部を経てサンプリ
ング用のプローブを挿入し、真空槽内部に位置す
る溶融金属の測温・サンプリングを行なう装置に
於て、 上記真空槽開口部上に弁本体内に弁体を設け、
該弁体をアクチユエータで回動せしめるように構
成した遮断弁を設置すると共に、上記遮断弁に気
密に配設された脱着自在のシールカバーに、前記
プローブの支持棒を摺動自在に設け、該支持棒に
設けた係止部によりシールカバーと係合する如く
なしたことを特徴とする真空精錬炉に於ける測
温・サンプリング装置。
[Scope of Claims] 1. In an apparatus for measuring and sampling the temperature of molten metal located inside a vacuum chamber by inserting a sampling probe through an opening provided in a part of the vacuum chamber, A valve body is provided within the valve body over the opening,
A cutoff valve configured to rotate the valve body with an actuator is installed, and a support rod of the probe is slidably provided on a removable seal cover airtightly disposed on the cutoff valve. 1. A temperature measurement/sampling device for a vacuum refining furnace, characterized in that a locking portion provided on a support rod engages with a seal cover.
JP17570383A 1983-09-22 1983-09-22 Temperature measuring/sampling apparatus in vacuum refining furnace Granted JPS6067616A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP17570383A JPS6067616A (en) 1983-09-22 1983-09-22 Temperature measuring/sampling apparatus in vacuum refining furnace

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP17570383A JPS6067616A (en) 1983-09-22 1983-09-22 Temperature measuring/sampling apparatus in vacuum refining furnace

Publications (2)

Publication Number Publication Date
JPS6067616A JPS6067616A (en) 1985-04-18
JPH0219171B2 true JPH0219171B2 (en) 1990-04-27

Family

ID=16000764

Family Applications (1)

Application Number Title Priority Date Filing Date
JP17570383A Granted JPS6067616A (en) 1983-09-22 1983-09-22 Temperature measuring/sampling apparatus in vacuum refining furnace

Country Status (1)

Country Link
JP (1) JPS6067616A (en)

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Publication number Priority date Publication date Assignee Title
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JPH0619344B2 (en) * 1986-07-25 1994-03-16 株式会社神戸製鋼所 Vacuum melting furnace sampling device
JPH01227041A (en) * 1988-03-07 1989-09-11 Asahi Eng Co Ltd Method and apparatus for sampling moving tank
DE19505743A1 (en) * 1995-02-20 1996-08-22 Inteco Int Techn Beratung Process and plant for producing blocks from metals
DE102009019568A1 (en) * 2009-05-02 2010-11-11 Sms Mevac Gmbh Measuring lance device for a molten metal for vacuum treatment in a degassing vessel
KR101278870B1 (en) * 2010-09-01 2013-07-01 주식회사 우진 Vacuum preservation for temperature measuring and sampling device
JP5875410B2 (en) * 2012-03-05 2016-03-02 日新製鋼株式会社 Temperature measuring sampling equipment for vacuum refining furnace
CN102796849B (en) * 2012-08-29 2014-03-19 西安前沿重型工业工程技术有限公司 Device for automatically performing temperature measurement and sampling on molten steel under vacuum state
CN107764594A (en) * 2017-11-20 2018-03-06 中国重型机械研究院股份公司 A kind of VOD swing types molten steel automatic temperature measurement sampler

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0418581A (en) * 1990-05-14 1992-01-22 Canon Inc Fixing device

Also Published As

Publication number Publication date
JPS6067616A (en) 1985-04-18

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