JPH02183323A - Touch panel device - Google Patents

Abstract

PURPOSE:To prevent a touch panel device from turning to malfunction or non- operation state by forming an alternative beam when an element is damaged in the touch panel device, in which an optical beam lattice is formed by a light receiving element and light emitting element. CONSTITUTION:For an optical beam constituting a sense surface, an R beam BR37 is formed by a photo-transistor TR37 and light emitting diode DR37, for example. When the light emitting diode DR37 is damaged by any cause (samely as the photo-transistor TR37), a light emitting diode DR35 and photo-transistor TR39 are selectively driven by an R beam drive selector and a defective beam alternative beam BR37' is formed. Thus, even when the element is damaged and a defective beam is generated, the device can be prevented from turning to the malfunction or non-operation state.

Description

[Detailed description of the invention] The invention will be explained in the following order.

A. Field of industrial application B. Overview of the invention C. Prior art D. Problem to be solved by the invention ■ = Means for solving the problem (Fig. 1) F. Effect G. Example G3. Explanation of circuit configuration and operation (Fig. 1, 2) General explanation of the main part of G2 (Fig. 3, 4) Detailed explanation of the main part of G3 (Fig. 5, 6) H Effect of the invention A Industrial application field This invention is The present invention relates to a touch panel device suitable for use in, for example, FA systems such as bank online systems, education systems, medical management systems, OA systems, and production process management systems, HA systems such as security systems, or communication systems.

B. Summary of the Invention This invention provides a touch panel device in which a light beam grating is formed by a light receiving element and a light emitting element, and when an element is damaged, a substitute beam is formed in a direction that crosses the beam related to the damaged element. This prevents the device from malfunctioning or becoming inoperable even if an element is damaged.

C. Conventional Technology Various types of touch panel devices have been proposed in the past that allow input by simply touching the screen with a finger instead of a keyboard, and an optical type is one example.

In other words, in the optical method (infrared sensor method), multiple light emitting diodes arranged on the lower printed circuit board around the periphery of the display screen emit infrared beams, and the upper printed circuit board on the opposite side emits an infrared beam. A plurality of phototransistors arranged on the circuit board receive light, and a plurality of light emitting diodes arranged on the printed circuit board on the right side emit infrared beams, and on the opposite side, on the left side. Multiple photo arrays arranged on a printed circuit board
A transistor receives the light and creates a grid of infrared beams. Each photoelectric element along the optical axis is assigned a separate address. By specifying an address and switching each light-emitting diode and its paired foot transistor in sequence, you can determine which light-emitting diode is supposed to emit light and which phototransistor on the opposite side is supposed to detect that light. Recognize. When you touch the display screen with your finger or pen, this blocks the infrared beam. The X-Y coordinates of the interrupted light beam are sent to the host computer for position determination.

However, in the case of the conventional optical touch panel device described above, the sensing surfaces (at least the vertical position sensing surface) are parallel, so when combined with a CRT having a curved surface, C
There is a drawback that variation occurs at the periphery of the RT.

Therefore, in a touch panel device used in a cathode ray tube having a rectangular image display surface curved into a cylindrical shape, a plurality of optical coupling means each consisting of a light emitting element and a light receiving element are provided so that the light beam crosses the image display surface obliquely. In addition, the present applicant has previously proposed a touch panel device in which the envelope surface created by the light beam forms a plane parallel to the display surface of the cathode ray tube, thereby reducing variation at the edges of the screen (particularly (Gan Sho 63-19383).

In addition, a light-receiving element is arranged on the upper side with respect to the rectangular image plane, and a light-emitting element corresponding to the light-receiving element is arranged on the lower side. In a touch panel device equipped with a beam group (Y beam) and a second beam group (χ beam) in which beams are arranged from the lower right to the upper left by a light receiving element and a light emitting element, the first beam group is arranged from the left to the left. Scan to the right (or from the right to the left) and obtain the coordinate values determined based on the position where the beam is first (last) interrupted, and in the second beam group, from the right to the left (from the left to the right). The present applicant first developed a touch panel device that scans the area, obtains coordinate values determined based on the position where the beam is interrupted at the beginning (or last), and obtains determined plane coordinate values from these two determined coordinate values. (Japanese Patent Application No. 63-53186).

D Problems to be Solved by the Invention As described above, an optical touch panel device consists of a pair of light emitting elements (infrared light emitting diodes) and light receiving elements (infrared light emitting diodes).
The position is detected by blocking the light beam formed on the line connecting the transistor (transistor), but when applying this to a large display device, it is necessary to set the detection coordinate points at a small pitch (high resolution). , the number of pairs of light emitting elements and light receiving elements (including transistors that drive the light emitting elements) is extremely large.

By the way, sudden failure of one element (damage; disconnection, short circuit)
It is easily understood that even if the probability of failure is small, the probability of failure increases when a large number of elements are involved.

Therefore, if the light emitting element is disconnected (including the transistor that drives it; if the transistor is disconnected or shorted due to the circuit configuration, the same phenomenon will occur as if the light emitting element was disconnected), no infrared rays will be emitted, and the light beam will not reach the light receiving element. It will be the same as being blocked. When a light-receiving element is disconnected or blocked, the light emitted from the corresponding light-emitting element cannot be detected, which is equivalent to the fact that the light beam constituting the touch panel is blocked. Therefore, damage to this element causes malfunction or non-operation of the touch panel device, and seriously impedes the operation of the system.

Here, it is also possible to prevent serious defects in the operation of the touch panel device by preventing the generation of a signal indicating that the light beam related to the damaged element is interrupted, but in this case, It has the following drawbacks.

Now, with reference to FIG. 6, consider the case where one beam is missing due to damage to the element. In order to reduce the number of elements and improve resolution, optical touch panel devices usually process data indicating the interruption of the beams when adjacent beams are interrupted, and calculate the virtual beam position at the intermediate position as coordinate values. (−dimensional data) and sent from the touch panel.

Normally, the pitch between the beams (W) is set so that the width of the finger (W) is such that w<W so that the finger does not fall between the beams, and the number of elements that form the beam is increased unnecessarily. The relationship W<2w is set so that the virtual beam position can be detected in order to obtain high resolution even if the beam is not used.

In a touch panel device that has a missing beam as shown in Figure 6A, it is possible to use some processing (data processing) method to ignore the address corresponding to the missing beam and block the normally formed beam with a finger. In the case of detection, the beam shown in FIG. 6B is blocked (including the virtual beam; B 21 B
i B +o is a virtual beam detected when adjacent beams are interrupted), and the coordinate value is detected.

If the finger width (W) is more than twice the inter-beam pitch (W), in the case of FIG. (averaging processing), but the above-mentioned conditions for setting the inter-beam pitch are not based on this. Therefore,
If a touch panel with a missing beam is operated with a normal finger, three consecutive coordinate values (along the beam direction) that should have been detected will be missing. In this case,
If the area of the image to be touched, such as an icon displayed on a display device equipped with a touch panel, is small (normally, the displayed image is particularly narrow in the vertical direction, and the displayed image is relatively long in the horizontal direction) However, the width of a finger that can be extended directly facing the image is narrow.・) There may be cases where the coordinate values corresponding to the area of the image cannot be detected.

This invention was made in view of this point, and focuses on the fact that damage to a large number of light emitting elements and light receiving elements does not occur at the same time, but usually at one point in time. It distinguishes between light beam interruption due to element damage and light beam interruption due to element damage, and in the case of element damage, it warns that element damage has occurred and forms a light beam to replace the light beam related to the damaged element, which is critical to the operation of the device. An object of the present invention is to provide a touch panel device that can prevent the occurrence of serious defects.

As described above, if only the missing beams are ignored, there will be three consecutive coordinate points that are not detected.

Therefore, in this invention, when an element is damaged, a beam is formed to replace the beam related to the damaged element, so that the number of undetected coordinate points is 2 or less in a row, and the detection of coordinate values corresponding to images such as icons is more reliable. It is something to do.

G. Example Hereinafter, an example of the present invention will be described in detail based on FIGS. 1 to 6.

E. Means for Solving the Problems This invention provides a touch panel device in which a light beam lattice is formed by a light receiving element and a light emitting element. It is formed to form a substitute beam.

F Effect G3 Circuit configuration and operation description Figure 1 shows the circuit configuration of this embodiment. In the figure, (21) is a microprocessor unit (MPU
) , (22) is an n-beam forming light-emitting diode drive for switching the light-emitting diodes D, ~DL, , associated with forming the L-beam in response to control signals specifying addresses from the M P IJ (21). The fixed terminals 5dLI-3dL, , are connected to the anodes of the light-emitting diodes DL+''-Dt, respectively, and the movable terminal SdLC is connected to the positive power supply via a resistor (23). It is connected to the terminal B. The selector (22) also has an open fixed terminal S dLo.The light emitting diode DL
I~DL? The cathodes of l are commonly connected and the drive line (
24) and the MPU via the drive circuit (25)
(21) is connected to port PDD. These light emitting diodes DLI to DL,, are M P U (2
The control is switched by the address (DADD) formed by the port I-PD of 1).

(26) is a selector for the n-beam forming phototransistor drive for switching the phototransistors TLr-Ttn associated with forming the n-beam in response to a control signal specifying an address from MPU (21); Its fixed terminals StLI-StL, , are connected to the emitters of phototransistors TLI-T, respectively, and its movable terminal Stt. is grounded.

The selector (26) also has a fixed release terminal S tLO.

Phototransistors S tLI to St1. The collectors of A are commonly connected to the signal line (27) and the buffer circuit (
28) via port PSIN of MPU (21)
connected to. These phototransistors StL to S□□ are controlled and switched by an address (TADD) formed by port PT of MPU (21).

(29) is an R beam forming light emitting diode drive selector for switching the light emitting diodes DRI to DR, related to forming the R beam in accordance with a control signal specifying an address from MPU (21). The fixed terminals SRLI-3RLn are connected to the anodes of the light emitting diodes DRI''Dl, , respectively, and the movable terminals SRLC are connected to the positive power terminal B through a resistor (30).
connected to. In addition, the selector (29) is connected to the release fixed terminal 5.
Has RLO. The cathodes of the light emitting diodes DRI to DRn are commonly connected and connected to the port PDD of the M P IJ (21) via a drive line (24) and a drive circuit (25). And these light emitting diodes D
, ~DRFI are controlled and switched by the address (DADD) formed by the port PD of MPU (21).

(31) is a selector for the R beam forming phototransistor drive for switching the phototransistor TRI%TRfi associated with forming the R beam in response to a control signal specifying an address from MPU (21). The fixed terminals S tRI to S tR, , are connected to the emitters of the phototransistors TRI to TR, , respectively, and the movable terminal S LRC is grounded.

The selector (31) also has a release fixed terminal S tRo.

The collectors of the phototransistors SLRl''-StRn are commonly connected, and the 7MPU (21) (7) baud 1-PS is connected via the signal line (27) and the buffer circuit (28).
Connected to rN. These phototransistors St□ to SLI+, . . . are controlled and switched by an address (TADD) formed by port PT of MPU (21).

Note that (32) is an infrared filter that selectively transmits an infrared beam to the periphery of the image plane of a CRT or the like.

Now, the movable terminal S dRC of the selector (29) is controlled by control signals from ports PD and PT of MPU (21).
While the movable terminal S tRC of the selector (31) is connected to the release fixed terminals S dRO and S tRO, the light emitting diodes DLI to D1° are sequentially driven by the selector (22), and correspondingly the light emitting diodes DLI to D1° are driven. In the device (26), phototransistors T, -TL are sequentially driven to sequentially form an n-beam. In other words, DLI + TLI is the beam, [)tz, TL2 is the L2 beam,...D
L, , TL, form an L beam.

Corresponding to the received light beam, a current flows through the phototransistors T, ~TLfi whose emitters are grounded, and a current flows through the load resistor RL in the common buffer circuit (28) of the phototransistors TLI~TL, , as shown in FIG. A light reception signal as shown in A is generated. This light reception signal is sent to the buffer circuit (28)
The beam detection signal is amplified within the beam and becomes a beam detection signal as shown in FIG. 2B. This beam detection signal is input to port PSIN of MPU (21), where it is determined whether or not there is a signal corresponding to the beam (if the beam is interrupted by a finger, etc.)
The phototransistor switching address TADD (same as the normal light emitting diode switching address DADD) at which the beam is blocked is stored in the memory.

In addition, the movable terminal S dLc of the selector (22) is controlled by control signals from the ports PD and PT of the MPU (21).
and the movable terminal S tLC of the selector (26) are respectively released and fixed terminals S dl, o and S, 1 . . The selector (29) selects the light emitting diode 1"DIll~DR,, while connected to the selector (29).
are sequentially driven, and correspondingly, phototransistors TRI to TR are sequentially driven by a selector (31) to form R beams sequentially. In other words, D B 1. T
Rl is the R beam, DR□, Twa is the R2 beam,
...DR,,,TR,,is R,.

form a beam.

Current flows through the phototransistors T and ~TRn whose emitters are grounded corresponding to the received light beam, and a common buffer circuit (
A light reception signal as shown in FIG. 2A is generated at the load resistor RL in 28). This light reception signal is amplified within the buffer circuit (28) and becomes a beam detection signal as shown in FIG. 2B. This beam detection signal is the baud of MPU (21)
PSIN is input to PSIN, and here it is determined whether there is a signal corresponding to the beam (if the beam is blocked by a finger, etc.), and the photo transistor switching address TADD (usually the light emitting diode switching address) where the beam is blocked is determined. DADD) is stored in memory.

The data in the memory storing the addresses of the L beams and R beams that have been cut off in this way is processed according to a predetermined procedure. Since this process is not directly related to the gist of the present invention, it will be omitted, but if necessary, please refer to Japanese Patent Application No. 63146210, which is an earlier application of the present application. Naturally, the diagonal coordinates obtained from the beam arrangement are converted to normal orthogonal coordinates. Additionally, coordinates outside the effective area are excluded. Then, the detected and processed coordinate values are sent from the serial baud 1 to MPU (21) to a computer (not shown) in a format such as 2320, for example.

G2 Outline of Main Parts Next, the main parts of the present invention will be outlined with reference to FIGS. 3 and 4.

As described above, if only the missing beams are ignored, there will be three consecutive coordinate points that are not detected.

Here, when an element is damaged, a beam is formed to replace the beam related to the damaged element, so that the number of undetected coordinate points is 2 or less in a row, and the detection of coordinate values corresponding to images such as icons is made more reliable. It is something to do.

In order to explain the present invention in detail, its operation will be explained in comparison with the conventional problems. FIG. 3 shows a beam forming section of a touch panel device as shown in FIG. 1 to which this invention is applied. The light beam constituting the sense surface is composed of a phototransistor TR311 and a light emitting diode DR3.
1, the R beam BR3+ is transmitted to the phototransistor TR
R beam B R33 from 311 light emitting diode DR33
However, photo shout/runrasta TR45, light emitting diode D
An R beam B R4S is formed from R45.

Note that explanations regarding the front and rear elements, beams, and L beams will be omitted.

When a finger touches the sense surface (image surface) formed by this beam grating, a coordinate point as representatively drawn in the lower left part A of the figure is detected.

When two consecutive beams are interrupted, there is a virtual beam at an intermediate position, and data processing is performed to determine coordinate values (detection points) as if this beam had been interrupted. In the figure, the virtual beams are those with even beam numbers (for example,
BR3□ (not shown).

Photo transistor TR1□9 Light emitting diode DR3
Assume that the R beam B R3ff is formed from 7, but the light emitting diode DRz7 (the same applies to the photo-l-randisk TR0T) is damaged for some reason.

As a result, beam B 117 is missing from the touch panel (-
If you touch this with your finger, the intersection of the blocked beams (including the virtual beam) will not be fixed at one point, and it will not function as a touch panel.

Here, in place of the beam BR3□ associated with the damaged light emitting diode DR37, the light emitting diode D1135 (or light emitting diode DR39) and the phototransistor TR39 (or phototransistor TR3S) are connected to the R beam forming light emitting diode drive selector (29). and R beamforming phototransistor drive selector (
31) to form a missing beam substitute (replacement) beam BR37'.

In this case, driving the element and forming the beam are performed as follows.

Photo transistor 731311 light emitting diode DR
From 3+, the R beam BR31 is connected to the phototransistor T.
R33 + light emitting diode DR: l: R beam BR from l
33 is a phototransistor TR3S, an R beam BR'3S is sent from a light emitting diode DR3S, a substitute beam BR37' is sent from a phototransistor TR39+a light emitting diode DR3S, a phototransistor TR39,
Y beam B++311 from light emitting diode DR19,
Photo transistor T R41 + light emitting diode DR
, , a Y beam B++41 is formed. Note that explanations regarding the front and rear elements, beams, and L beams will be omitted.

When you touch the sense surface (image surface) formed by the beam grating formed in this way with your finger, the upper right part 8 of the figure (beam B1
139 and the substitute beam B R37' are very close to each other, and the beam B R3S and the substitute beam B R3'r are far apart; the same relationship exists at the target position with respect to the intermediate position of the beam. , which is easily understood).

The detected coordinate points will be described in detail below with reference to FIG. 4 showing an enlarged view of part B.

In FIG. 4, coordinate points (detection points) PL P2. P
3゜P4. P5. P6 is the coordinate point that should be detected when the adjacent L beam (in the case of the figure, the beams BLII and B L9 i can be considered as a virtual beam BLI+1 formed by these two beams) and the R beam are blocked. be. Coordinate point P12. P22. P32. Pd2.
P52. P62 is a coordinate point to be detected when one beam and one R beam are blocked.

By the way, the above setting conditions, that is, the normal beam B ll
! When substitute beam BR37' is formed instead of 7,
The coordinate points to be detected behave as follows. (In addition, when assuming a virtual beam B LIO obtained when the finger is placed in the middle position of the beam B L91 B Ll l and both beams are interrupted, the relationship between the coordinate points P12 to P62 and the coordinate points P1 to P6 is the same. Therefore, the coordinate points P1 to P
Only 6 will be explained. ) Beam BLI. , BI+35, the coordinate point P1 is obtained.

When placing a finger at the intersection of the beams BL+o+B, 136, the finger would normally block the beam B 1lls+ B R:l and the coordinate point P2 would be obtained, but since there is no beam Bl+37 (beam B117' is on the B., side A coordinate point P1 (biased to ) is detected.

When you put your finger on the intersection of the beams B Ll o, B R:+7, you would normally get the coordinate point P3, but the beam B 11
17, the coordinate point P3 is not detected. However, depending on the size of the fingers of the person actually operating the beam,
35BR: Since the distance between +7' and < 2w does not mean that only one beam is completely missing, depending on the position of the finger touch (if the finger is large even if there is no deviation),
Beam B R3? is shielded from light and coordinate point P3 is detected.

Or beam B*zs+ By+3. ' is blocked and coordinate point P2 is detected.

Beam +3t+. , when placing a finger on the intersection of BR38, beams BR37' 1BR39 are blocked (BR37 and B
beam B 13 due to data processing (although R3,' is different)
8 is shielded from light, coordinate point P4 is detected.

Beam B. When you put your finger on the intersection of +B and +39, you would normally get coordinate point P5, but beam B111? ZB R
ff9 is shielded from light, and coordinate point P4 is detected as in the case above.

BeamBLI. , B74°, coordinate point P6 is obtained. Beam BR3 when your fingers are big? 'BR
When 391BR41 is shielded from light and data processing is performed by determining coordinate values from the shielded beam at the fingertip, beam BR3
Coordinate point P5 is detected assuming that 7'+B*sq is shielded from light.

As is clear from the above description, by forming a substitute beam to replace the missing beam, the number of undetected coordinate points is two or less in a row, thereby making the detection of coordinate values more reliable.

Detailed explanation of the main parts of G3Next, in order to obtain the above-mentioned effect, that is, to detect a damaged element and form a substitute beam to replace the missing beam related to this damaged element, the damaged element must first be detected. Must be. Here, element damage (disconnection, short circuit)
Since is - time point and - element, the interruption of the light beam due to the breakage of - element is a single tree, and the detection of plane coordinates is not performed, and this continues for more than a finite time (when the finger is inserted) When inserting/unplugging, the interruption of the beam only occurs, but this occurs transiently.) Using this as a judgment condition, detect the damaged element (light emitting diode or phototransistor). If the corresponding beam-forming light-emitting diode and phototransistor are damaged, the corresponding beam-forming light-emitting diode and phototransistor are detected as damaged). The above effect is achieved by forming a substitute beam with an adjacent left or right element (not limited to a phototransistor) to replace the missing beam associated with the damaged element.

Based on the above summary description, a method for obtaining the above effect will be explained with reference to the flowcharts of FIGS. 5 and 6.

First, initial settings are performed in steps (41) to (47) in FIG. That is, the beam intercept/scan count (BI/SC) is cleared in step (41), and the L beam ink intercept buffer memory (BI/SC) is cleared in step (42).
Clear LBIBM). This buffer memory records the addresses of beams missing due to element damage. In step (43), the R beam ink buffer memory (RBIBM) is cleared.

This buffer memory records the addresses of R beams that are missing due to element damage. In step (44), the L beam ink set counter (LB IC) is cleared. This counter counts the number of L beams that are blocked. In step (45), the R beam ink set counter (RB IC) is cleared. This counter counts the number of R beams that are blocked. In step (46), the L address memory (LAM) is cleared.

This memory records the address of the interrupted beam. In step (47), the R address memory (R
Clear AM). This memory records the address of the interrupted R beam.

Next, in steps (48) to (60), the L beam is scanned, the number of blocked beams is counted, and a substitute beam is formed. That is, step (48
) to set the L beam address to O, and step (49
) to increment the L beam address by 1. In step (50), it is determined whether the address of the L beam is equal to the contents recorded in the LBIBM (address of the missing L beam), and if not, the address of the L beam is changed to the address of the L beam in step (51). Drive Photo Transistor Selector (LBDTS) or selector (2
6), and in step (52), the beam address is also sent to the L beam drive light emitting diode selector (LB
DDS), that is, the selector (22).

In step (53), it is determined whether or not there is a beam interruption;
If there is a blockage, the LBIC is counted up by 1 in step (54), and the L beam address is set to L in step (55).
Record in AM. Then, the process proceeds to step (56), and it is determined whether the L beam address is the last address.

Also, if the beam is not blocked in step (53), the process proceeds to step (56). If the address of the L beam is not the last in step (56), the process returns to step (44) and the above-described operation is repeated.

On the other hand, in step (50), the address of the L beam is set to LBI.
If it is equal to the content recorded in the BM (address of the missing L beam), that is, if the missing beam continues N scans, the address of the L beam is set to 1 in step (57).
In step (58), the address of the L beam added by 1 is sent to the LBDTS, in step (59), the address of the L beam is subtracted by 1, and in step (60), the address of the L beam with this 1 subtracted is sent to the LBDTS. Send the address to LBDDS and proceed to step (53). That is, this step (
57) to (60) are alternate beam type routines.

If the address of the L beam is the last in step (56), the process advances to step (61).

Next, in steps (61) to (73), the R beams are scanned, the number of blocked R beams is counted, and a substitute beam is formed. That is, the chip (61
) to set the R beam address to O, and step (62
) to amplify the R beam address by one count. In step (63), it is determined whether the address of the R beam is equal to the content recorded in the RBIBM (address of the missing R beam), and if not, in step 64, the address of the R beam is recorded in the R beam drive photo.・Transistor selector (RBDTS) or selector (31)
Similarly, in step (65), the address of the R beam is sent to the R beam driver 41 light emitting diode selector (RBD).
DS), that is, sent to the selector (29).

In step (66), it is determined whether or not there is a beam interruption;
If there is a blockage, step (67) asks whether l? Blc is counted up by 1, and the address of the R beam is recorded in the RAM in step (68). Then, proceed to step (69),
It is determined whether the R beam address is the last one.

Also, if the beam is not blocked in step (66), the process proceeds to step (69). If the address of the R beam is not the last in step (69), the process returns to step (62) and the above-described operation is repeated.

On the other hand, in step (63) the R beam address is set to RBI.
If it is equal to the content recorded in the BM (the address of the missing R beam), that is, if the missing beam continues N scans, the address of the R beam is set to 1 in step (70).
In step (71), the address of the R beam added by 1 is sent to l1BDTs, and in step (72)
The address of the R beam is subtracted by 1 in step (73), and the address of the R beam calculated by 1fJIi is set to RBDD.
S, and the process proceeds to step (66). In other words, steps (70) to (73) are a substitute beam type routine.

Next, in step (69), if the address of the R beam is the last, the process advances to step (74) in FIG.

In steps (74) to (79), the blocking status of the L beam and the R beam is determined. That is, in step (74) LB
It is determined whether the IC count value is O or not, and if it is 0, the process proceeds to step (75) of routine 1. In step (75), it is determined whether the count value of RBIC is 0 or not. If it is 0, the process returns to step (41) in FIG. 5 with the state of non-measurement 1.

If the count value of RBIC is not 0 in step (75), it is determined in step (76) whether the count value of RBTC is 1 or not, and if it is 1, it is determined that there is a beam dropout, and the process proceeds to step (80), which will be described later. If it is not 1, the process returns to the fifth step (41) in a state of non-measurement 2.

If the count value of LBIG is not O in step (74), the process proceeds to step (77), and the count value of LBIC is 1.
If it is 1, the process proceeds to step (78) of routine 2. In step (78), it is determined whether the RBTC count value is O or not. If it is 0, it is assumed that there is a beam dropout and the process proceeds to step (80), and if it is 0, it is assumed that the measurement is completed and the process proceeds to step (86), which will be described later.

If the count value of LBSC is not 1 in step (77), the process proceeds to step (79), where it is determined whether the count value of RBSC is 0 or not. Return to step (old) in the figure, and if it is not 0, proceed to step (86).

In other words, when scanning the touch panel surface (full beam),
- If there is a missing beam of only a tree, in this flow, together with the measurement result of non-measurement 1, it is determined whether it is due to real element damage or not. If so, it is determined whether or not it is due to true element damage using the above-described flow. If the non-measurement states 1 and 2 are determined after the value of Bl/SC is 1 or more, this means that a missing beam has temporarily occurred due to some reason, so BT/SC
The values of Bl/SC, LBTBM, RBIBM must be reset, so go back to step (41) and set Bl/SC, LBTBM, RBIBM.
Clear etc.

The following table summarizes the determination operations in steps (74) to (79) described above.

If it is determined in steps (76) and (78) that there is a missing beam, then in step (80) the Bl/SC
1 count up, and in step (81) BI/SC
Determine whether the value of is N or not, and if it is N, step (82)
``Element damage'' is displayed.

In step (83), it is determined whether the count value of LBIC is 1 or not. If it is 1, that is, if the L beam is main cut-off, the data of LAM is taken into LBIBM in step (84), and as shown in FIG. Return to step (44). Further, if the count value of LBIC is not 1 in step (83), that is, if the R beam is main cut off, then in step (85)
The AM data is taken into the RBIBM and the process returns to step (44) in FIG. That is, the address whose beam is interrupted due to element damage is taken into LBIBM and RBIBM, and steps (4B) to (60) and step (61
) to (73) are used to form substitute beams. Here, if the sample rate is 30/sec, N=
150, the address of the missing beam is taken into the LBIBM or RBTBM after 5 seconds, and a substitute beam is formed.

Next, when the measurement is completed in steps (78) and (79), the detected data (measured data) is processed in steps (86) to (88) of routine 3. That is, in step (86), data in LAM and data in RAM are processed, in step (87), oblique coordinates are converted to orthogonal coordinates, and in step (88), coordinates are sent from the serial port of MPU (21). and step (44) in Figure 5.
Return to

Here, if there is no data in the LAM or RAM (if there is no beam interruption), the plane coordinates are not determined and the coordinates are not sent. Furthermore, if the data in LAM and/or RAM is not continuous, the coordinates will not be sent as an error. In the above two cases, if the beam is interrupted due to element damage,
The count-up of Bl/SC is interrupted, but when the finger is removed, Bl/SC continues to count up.

In the case of this example, the first beam and the Nth beam (the last beam formed in the LR1 scan) actually have short beam lengths, so the current cannot be reduced by increasing the current limiter resistance of the light emitting diode. The probability of damage is extremely small.

Furthermore, in this embodiment, the L beam and the R beam are sequentially formed in the direction of the adjacent beam, but what should be noted is that the element next to the element corresponding to the missing beam is energized and crossed. A substitute beam may be formed. Therefore, R
A commonly used element is placed at the intersection of the beam and the L beam (obviously outside the display surface) (L B D T S / L B D D for L beam formation).
This also applies to the case where - elements (S and RBDTS/RBDDS are not common) are used for forming the L beam and for forming the R beam. In this case, two beams are missing due to the damage of - number of elements, so the coordinates (plane coordinate values) obtained from the detected data indicate the position of the element. Damage to the element can be determined based on whether the obtained plane coordinate value corresponds to the element position.

Since a substitute beam is formed, even if a missing beam due to a damaged element occurs, it is possible to prevent the device from malfunctioning or being in an inoperable state. Additionally, since it warns of element damage, prompt maintenance can be performed.

[Brief explanation of the drawing]

Fig. 1 is a circuit configuration diagram showing an embodiment of the present invention, Fig. 2 is a diagram for explaining the operation of Fig. 1, and Figs. 7 are diagrams for explaining missing beams. (21) is a microprocessor unit (MPU), (
22), (26), (29), (31) are selectors, I)t+-I)Lfi and DRl-DL, , are light emitting diodes, TLI~TL, and TRI'''
-T Rゎ is a phototransistor. Effect of H invention

Claims (1)

[Claims] In a touch panel device that forms a light beam grating using a light receiving element and a light emitting element, when the element is damaged, a substitute beam is formed in a direction that crosses the beam related to the damaged element. A touch panel device characterized by: