JPH02179487A - Inspecting head for double-surface circuit board - Google Patents

Inspecting head for double-surface circuit board

Info

Publication number
JPH02179487A
JPH02179487A JP63331214A JP33121488A JPH02179487A JP H02179487 A JPH02179487 A JP H02179487A JP 63331214 A JP63331214 A JP 63331214A JP 33121488 A JP33121488 A JP 33121488A JP H02179487 A JPH02179487 A JP H02179487A
Authority
JP
Japan
Prior art keywords
plate
circuit board
probe
double
spring
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP63331214A
Other languages
Japanese (ja)
Inventor
Sueo Sakakura
坂倉 季尾
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Seikosha KK
Original Assignee
Seikosha KK
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Seikosha KK filed Critical Seikosha KK
Priority to JP63331214A priority Critical patent/JPH02179487A/en
Publication of JPH02179487A publication Critical patent/JPH02179487A/en
Pending legal-status Critical Current

Links

Abstract

PURPOSE:To make it possible to inspect the circuit patterns on both surfaces of a circuit board accurately at the same time by accurately positioning the double-surface circuit board to be inspected with a receiving plate at first, bringing probes into contact with the surfaces elastically from the upper and lower sides, and performing the inspection. CONSTITUTION:A plurality of double-surface circuit boards P are transferred on a receiving plate 4 from a carrier. The board is set with a sucking device 10 so that the board is not moved. When an upper head 2 is lowered, at first the lower end part of a guide shaft 16 which is made to extend from the lower surface of a pushing plate 14 intrudes into the recess part of the upper end of a guide shaft 6 of the plate 4. Thus, the relative positions of the plate 4 and the plate 14 are set. Both surfaces of the shafts 6 and 16 are in contact. When the head 2 is further lowered, a first spring 7 is compressed, and a positioning pin 9 is lifted and set at an accurate position. When the head 2 is further lowered, a second spring 17 is compressed, and an upper plate 13 and the plate 14 become contact state. The board P is held between the plate 4 and the plate 14. Under this state, the upper end of a lower probe 8 is elastically brought into contact with the circuit pattern of the lower surface of the board P. The lower end of an upper probe 18 is elastically brought into contact with the circuit pattern on the upper surface. Thus, both upper and lower surfaces are inspected at the same time.

Description

【発明の詳細な説明】 〔産業上の利用分野] 本発明は、両面回路基板用検査ヘッドに関するものであ
る。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to an inspection head for double-sided circuit boards.

[従来の技術] 従来、回路基板の検査装置を構成する検査ヘッドは、検
査する回路基板の搬送路上に設けてあり、キャリア上に
載置してある回路基板が搬送手段によって検査ヘッドの
下を通過する際に、ヘッドが降下して検査ヘッドに設け
であるプローブが回路基板の上面の回路パターンに接触
し、回路基板の検査を行っている。
[Prior Art] Conventionally, an inspection head constituting a circuit board inspection device is installed on a conveyance path for the circuit board to be inspected, and the circuit board placed on a carrier is moved under the inspection head by the conveyance means. When passing, the head descends and the probe provided on the inspection head comes into contact with the circuit pattern on the top surface of the circuit board, thereby inspecting the circuit board.

[解決しようとする課題] 上記の検査ヘッドは、回路基板をキャリア上に載置した
まま、プローブを接触させるものであり、片面回路基板
で、しかも簡単な回路構成の基板の検査を行うことはで
きるが、この場合でも、キャリアには基板のガイドのた
めにある程度の余裕を持たせであるので正確な位置決め
は困難で、精度の高い検査は望めない。さらに両面回路
基板の検査を行うためには、上面のパターンの検査の後
で、回路基板を反転させるなどしてから別の検査工程に
導き、下面のパターンの検査を行わなければならず、検
査工程が増加してしまうなどの問題がある。このように
しても高精度な検査は無理であるので、例えばカメラの
回路基板のように、小型でありしかも両面に高精度な回
路が設けである両面回路基板を検査するには適さないも
のである。
[Problem to be solved] The above inspection head contacts the probe with the circuit board placed on the carrier, and it is difficult to inspect a single-sided circuit board with a simple circuit configuration. However, even in this case, since the carrier is provided with a certain amount of margin for guiding the substrate, accurate positioning is difficult and highly accurate inspection cannot be expected. Furthermore, in order to inspect a double-sided circuit board, after inspecting the pattern on the top side, the circuit board must be turned over, etc., and then taken to another inspection process, and the pattern on the bottom side must be inspected. There are problems such as an increase in the number of steps. Even with this method, high-precision inspection is impossible, so it is not suitable for inspecting small double-sided circuit boards that have high-precision circuits on both sides, such as camera circuit boards. be.

本発明の目的は、両面回路基板を両面同時に、かつ高精
度に検査ができる両面回路基板用検査ヘッドを提供する
ことにある。
An object of the present invention is to provide a double-sided circuit board inspection head that can inspect both sides of a double-sided circuit board simultaneously and with high precision.

[課題を解決するための手段] 上記の目的を達成するために、本発明における両面回路
基板用検査ヘッドは、上下に対向的に設けてあり、かつ
相対的に前進後退させられる上板および下板と、これら
の上板と下板の各対向面にばね力に抗して縮退可能に設
けてあり、両面回路基板の上下パターン面に弾接可能な
複数の上プローブおよび下プローブと、上面に回路基板
を載置可能であり、下プローブが貫通可能な透孔を有す
る一方、平時は上面が下プローブの上端よりも上位に位
置するように下板の上方で第1のばねによって弾発され
ている受け板と、下仮に植設してあり、受け板に形成し
てある貫通孔から上方に突出するとともに先端が先細に
形成され、回路基板に形成してある位置決め穴に嵌合可
能である位置決めピンと、−上プローブが貫通可能な透
孔を有する一方、平時は下面が上プローブの下端よりも
下位に位置するように上板の下方で第2のばねによって
弾発され、回路基板の上面と当接した状態で、回路基板
より突出した位置決めピンが嵌合可能な逃し穴を形成し
てある当て板とを備えている。
[Means for Solving the Problems] In order to achieve the above object, the double-sided circuit board inspection head of the present invention is provided with an upper plate and a lower plate that are vertically opposed to each other and that are relatively moved forward and backward. A plurality of upper probes and lower probes are provided on opposing surfaces of the upper and lower plates to be retractable against spring force, and are capable of elastic contact with the upper and lower pattern surfaces of the double-sided circuit board. The circuit board can be mounted on the board, and has a through hole through which the lower probe can pass, while the upper surface of the lower probe is resiliently pressed by a first spring above the lower board so that the upper surface is located above the upper end of the lower probe during normal operation. It is temporarily implanted at the bottom of the receiving plate and protrudes upward from the through hole formed in the receiving plate, and has a tapered tip so that it can fit into the positioning hole formed on the circuit board. The positioning pin has a through hole through which the upper probe can penetrate, and is pushed by a second spring under the upper plate so that the lower surface is located below the lower end of the upper probe during normal operation, and the circuit board and a backing plate formed with a relief hole into which a positioning pin protruding from the circuit board can fit while in contact with the upper surface of the circuit board.

また、受け板の後退を先行させるために、第2のばねの
ばね力は、第1のばねのそれよりも大きくしてある。
Further, in order to advance the retreat of the receiving plate, the spring force of the second spring is made larger than that of the first spring.

[作用] 上プローブおよび下プローブは、受け板上の所定位置に
両面回路基板が載置され、受け板に回路基板を介して当
て板が対接したときに、基板の両面の回路パターンに当
接して同時に検査する。先端が先細な位置決めピンは、
回路基板を介して当て板が受け板に対接するのに先立っ
て、受け板上の回路基板の位置決め穴に嵌合し、回路基
板を正確な位置に位置決めする。第2のばねのばね力を
第1のばねのそれよりも大きくしてあると、回路基板が
当て板と受け板とに挟持されて固定されるのに先立って
、回路基板の位置合せをするのが容易となる。
[Function] When a double-sided circuit board is placed on a predetermined position on a receiving plate and a contact plate is brought into contact with the receiving plate via the circuit board, the upper probe and the lower probe touch the circuit patterns on both sides of the board. be inspected at the same time. The positioning pin with a tapered tip is
Before the backing plate comes into contact with the receiving plate via the circuit board, it is fitted into the positioning hole of the circuit board on the receiving plate to accurately position the circuit board. If the spring force of the second spring is greater than that of the first spring, the position of the circuit board can be adjusted before the circuit board is clamped and fixed between the backing plate and the receiving plate. This makes it easier.

[実施例] 以下本発明の一実施例について図面を参照して説明する
[Example] An example of the present invention will be described below with reference to the drawings.

第1図に示すように、本発明に係る両面回路基板用検査
ヘッドは、所定間隔をおいて対向し、相対的に前進後退
が可能な下ヘツド1と」下ヘツド2とからなるもので、
同時に成敗の回路基板の検査が可能なものである。回路
基板は図示しない搬送路をキャリアに載置されて搬送さ
れる途中で、キャリアからこの検査部の下ヘツド1の上
面へ適宜の手段で複数個ずつ移されるものである。
As shown in FIG. 1, the double-sided circuit board inspection head according to the present invention consists of a lower head 1 and a lower head 2, which face each other at a predetermined interval and can move forward and backward relative to each other.
At the same time, it is possible to inspect circuit boards for success or failure. While the circuit boards are placed on a carrier and transported along a transport path (not shown), a plurality of circuit boards are transferred one by one from the carrier to the upper surface of the lower head 1 of the inspection section by appropriate means.

そこで先ず下ヘツド1の構成について第1.2図によっ
て説明する。下ヘツド1の下板3は、図示しない下取付
は板の上面に固定してあり、この下板3の後述する上板
13との対向面3aには、複数の下プローブ8・・・が
所定位置に設けである。
First, the structure of the lower head 1 will be explained with reference to FIG. 1.2. The lower plate 3 of the lower head 1 has a lower mounting (not shown) fixed to the upper surface of the plate, and a plurality of lower probes 8 are mounted on a surface 3a facing the upper plate 13 (described later). It is provided in a predetermined position.

各下プローブ8は、図示しないばねのばね力に抗して縮
退可能である。
Each lower probe 8 is retractable against the force of a spring (not shown).

下板3の上方には、受け板4が下板3から離脱不能に:
隻数の支持軸5・・・により連結してあり、この支持軸
5・・・には段数の第1のばね(圧縮ばね)7・・・が
嵌合し、受け板4を下板3に対して弾発させている。
Above the lower plate 3, a receiving plate 4 cannot be separated from the lower plate 3:
They are connected by support shafts 5 of the number of ships, and the first springs (compression springs) 7 of the number of stages are fitted to the support shafts 5, and the receiving plate 4 is connected to the lower plate 3. It is firing against the enemy.

第5図示のように下プローブ8・・・は、受け板4の対
応位置に設けである透孔4a・・・内に挿入してある。
As shown in FIG. 5, the lower probes 8 are inserted into through holes 4a provided at corresponding positions in the receiving plate 4.

受け板4の上面は、平時は下プローブ8の先端よりも上
位に位置しており、受け板4が第1のばね7を圧縮して
後退(下降)するとき、下プローブ8・・・の先端が受
け阪4の上面にセットされている両面回路基板Pの下面
の回路パターンに弾接可能である。
The upper surface of the receiving plate 4 is located above the tip of the lower probe 8 during normal times, and when the receiving plate 4 compresses the first spring 7 and retreats (descends), the upper surface of the lower probe 8... The tip can come into elastic contact with the circuit pattern on the lower surface of the double-sided circuit board P set on the upper surface of the receiver 4.

さらに下板3の上面には、第5図示のように先端が先細
部9aに形成した!!数の位置決めピン9・・・が植設
してある。この位置決めピン9は受け板4の対応する位
置に設けである貫通孔4b・・・を挿通して、平時には
受け板の上面から僅かに先細部9aのみが突出した状態
に設けである。
Further, on the upper surface of the lower plate 3, the tip is formed into a tapered part 9a as shown in FIG. ! Several positioning pins 9... are implanted. The positioning pins 9 are inserted through through holes 4b provided at corresponding positions on the receiving plate 4, and are provided in such a state that only the tapered portion 9a slightly protrudes from the upper surface of the receiving plate during normal operation.

受け板4には、両面回路基板Pが載置される位置の中心
部に、回路基板Pを受け板4に吸着保持するための吸着
装置10が設けである。
The receiving plate 4 is provided with a suction device 10 for suctioning and holding the circuit board P on the receiving plate 4 at the center of the position where the double-sided circuit board P is placed.

上ヘツド2の構成は、第1図示のように下ヘツド1のそ
れに準じ、対称に配設されているものである。すなわち
上ヘツド2の上板13は、図示しない上取付は板の下面
に固定してあり、この上板13の下板3との対向面13
aには、複数の上プローブ18・・・が所定位置に設け
である。各上プローブ18の構成は下プローブ8と同じ
である。
The structure of the upper head 2 is similar to that of the lower head 1 as shown in the first figure, and is arranged symmetrically. That is, the upper plate 13 of the upper head 2 has an upper mounting (not shown) fixed to the lower surface of the plate, and a surface 13 of the upper plate 13 facing the lower plate 3 is fixed to the lower surface of the plate.
A is provided with a plurality of upper probes 18 at predetermined positions. The configuration of each upper probe 18 is the same as that of the lower probe 8.

」二板13の下方に、当て板14が上板13から離脱不
能にl(数の支持軸15・・・により連結してあり、こ
の支持軸15・・・には複数の第2のばね(圧縮ばね)
17・・・が嵌合し、当て板14を上板13に対して弾
発させている。
'' Below the second plate 13, a backing plate 14 is irremovably connected to the upper plate 13 by a number of support shafts 15, and a plurality of second springs are attached to the support shafts 15. (compression spring)
17... are fitted, causing the backing plate 14 to spring against the upper plate 13.

第5図示のように上プローブ18・・・は、当て板14
の対応位置に設けである透孔14a・・・内に挿入して
ある。当てt!1214の下面は、平時は上プローブ1
8の先端よりも下位に位置しており、当て板14が第2
のばね17を圧縮して後退(上昇)するとき、上プロー
ブ18・・・の先端が受け板4の上面にセットされてい
る両面回路基板Pの上面の回路パターンに弾接可能であ
る。
As shown in FIG. 5, the upper probe 18...
It is inserted into a through hole 14a provided at a corresponding position. Guess it! The lower surface of 1214 is the upper probe 1 during normal times.
8, and the backing plate 14 is located below the tip of the second
When the springs 17 are compressed and the upper probes 18 are moved back (raised), the tips of the upper probes 18 can come into elastic contact with the circuit pattern on the upper surface of the double-sided circuit board P set on the upper surface of the receiving plate 4.

当て板14には、下板3に植設した位置決めピン9の進
入路に当る位置に、位置決めピン9の逃し穴14bが設
けである。
The backing plate 14 is provided with an escape hole 14b for the positioning pin 9 at a position corresponding to the entry path of the positioning pin 9 implanted in the lower plate 3.

受け板4と当て板14とには、それぞれガイド軸6.1
6が固着してあり、いずれも下板3と上板13とに固着
してあるスリーブ6a、16a内を摺動自在に貫通して
いる。ガイド軸6.16は組立て時に下ベツド1と上ヘ
ツド2との相対的位置を決めるのに使われ、また稼動時
には、ガイド軸16からガイド軸6を介して受け板4を
最初に押し下げるのに使われる。
The receiving plate 4 and the backing plate 14 each have a guide shaft 6.1.
6 is fixed to the sleeves 6a and 16a, which are both fixed to the lower plate 3 and the upper plate 13, and are slidably passed through the sleeves 6a and 16a. The guide shaft 6.16 is used to determine the relative position of the lower bed 1 and the upper head 2 during assembly, and is also used to initially push down the receiving plate 4 from the guide shaft 16 via the guide shaft 6 during operation. used.

第2のばね17のばね力は第1のばね7のばね力よりも
大きく設定してあり、後述のように回路基板Pの位置の
微調整を容易にしている。
The spring force of the second spring 17 is set larger than the spring force of the first spring 7 to facilitate fine adjustment of the position of the circuit board P as described later.

次に本発明の動作について説明する。Next, the operation of the present invention will be explained.

上記したように、検査すべき両面回路基板Pは図示しな
い搬送路をキャリアに載置されて搬送される途中で、キ
ャリアから受け板4上に適宜の手段で複数個ずつ移され
、吸着装置10によって容易に移動しないようにセット
される。このときは位置決めピン9の先端の先細部9a
のみが、第5図示のように回路基板Pの位置決め穴りに
嵌合している。次に上ヘツド2が図示しない駆動シリン
ダによって下降すると、まず当て板14の下面から突出
しているガイド軸16・・・の下端部が、受け板4のガ
イド軸6の上端の凹部内に侵入して受け板4と当て板1
4との相対位置を確定し、両ガイド軸6.16の端面が
当接する。さらに上ヘツド2が下降すると、ガイド軸1
6からガイド軸6を介して受け板4に押下げ力が作用し
、最初に弱いばね力の第1のばね7が圧縮して受け板4
がこのばね力に抗して押し下げられる。この下降によっ
て位置決めピン9は第5図示の位置から相対的に上昇し
、その軸部が回路基板Pの位置決め穴りから上方に突出
する。回路基板Pはこのときは吸着装置10により位置
保持されているのみであるので、位置決めピン9の軸部
が穴りに嵌合するときにその位置が微:A整され、正確
な位置にセットされることになる。さらに引続き上ヘツ
ド2が下降し、第1のばね7が圧縮し終る(第3図示)
と、今度は第2のばね17が圧縮し、上板13と当て板
14とが対接状態(第4図示)となる。また両面回路基
板Pは受け板4と当て板14との間に挟着状態となる。
As described above, while the double-sided circuit boards P to be inspected are placed on a carrier and transported along a transport path (not shown), a plurality of double-sided circuit boards P are transferred from the carrier onto the receiving plate 4 by an appropriate means, and the suction device 10 It is set so that it does not move easily. At this time, the tapered part 9a at the tip of the positioning pin 9
The only part is fitted into the positioning hole of the circuit board P as shown in the fifth figure. Next, when the upper head 2 is lowered by a drive cylinder (not shown), the lower end of the guide shaft 16 protruding from the lower surface of the backing plate 14 enters the recess at the upper end of the guide shaft 6 of the receiving plate 4. Receive plate 4 and back plate 1
4, and the end surfaces of both guide shafts 6.16 come into contact. When the upper head 2 further descends, the guide shaft 1
6 acts on the receiving plate 4 via the guide shaft 6, and first the first spring 7 with a weak spring force is compressed and the receiving plate 4 is compressed.
is pushed down against this spring force. This lowering causes the positioning pin 9 to rise relatively from the position shown in FIG. 5, and its shaft portion protrudes upward from the positioning hole of the circuit board P. At this time, the circuit board P is only held in position by the suction device 10, so when the shaft portion of the positioning pin 9 fits into the hole, its position is finely adjusted and set at an accurate position. will be done. Further, the upper head 2 continues to descend, and the first spring 7 finishes being compressed (as shown in the third figure).
Then, the second spring 17 is compressed, and the upper plate 13 and the backing plate 14 come into contact with each other (as shown in the fourth figure). Further, the double-sided circuit board P is sandwiched between the receiving plate 4 and the backing plate 14.

この状態において下プローブ8の上端が両面回路基板P
の下面の回路パターンに弾接するとともに、上プローブ
18の下端が上面の回路パターンに弾接して、両面回路
基板Pの上下両面の回路パターンの検査を同時に行うこ
とになる。
In this state, the upper end of the lower probe 8 is connected to the double-sided circuit board P.
At the same time, the lower end of the upper probe 18 comes into elastic contact with the circuit pattern on the upper surface, and the circuit patterns on both the upper and lower surfaces of the double-sided circuit board P are simultaneously inspected.

両面の回路パターンの検査が終了すると、上ヘツド2が
上昇して、上記とは逆に先に当て板14が第2のばね1
7のばね力により原位置に復帰し、ついで受け板4が原
位置に復帰し、両面回路基板Pは位置決めピン9の16
ノ束から解放される。そこで吸着装置lOの吸着を停止
し、検査が終了した回路基板Pを元の搬送ラインに戻す
When the inspection of the circuit patterns on both sides is completed, the upper head 2 is raised and, contrary to the above, the backing plate 14 is first moved to the second spring 1.
7 returns to its original position, then the receiving plate 4 returns to its original position, and the double-sided circuit board P is attached to the positioning pin 9 at 16.
Freed from bondage. Then, the suction of the suction device IO is stopped, and the circuit board P that has been inspected is returned to the original transport line.

[効果] 以上説明したように本発明は、検査すべき両面回路基板
を、受け板上にてまず正確に位置決めした上で、上下か
らプローブを弾接して検査するものであるから、正確な
検査が可能で、回路基板の両面の回路パターンの同時検
査が可能であり、回路基板の検査の高精度化ならびに高
能率化に甚だ有効である。
[Effects] As explained above, in the present invention, the double-sided circuit board to be inspected is first accurately positioned on the receiving plate and then inspected by elastically contacting the probe from above and below, so that accurate inspection is possible. It is possible to simultaneously inspect circuit patterns on both sides of a circuit board, and is extremely effective in increasing the accuracy and efficiency of circuit board inspection.

【図面の簡単な説明】 第1図は要部の断面図、第2図は回路基板が載置される
受け板の串面図、第3図および第4図は回路基板を検査
するまでの段階を説明するそれぞれ断面図、第5図は要
部の拡大断面図である。 3・ ・下板、    3a・ ・対向面、4・ ・受
け板、 4a・ ・透孔、   4b−―貰通孔、7・・・第1
のばね、  8・ ・下プローブ、9・ ・位置決めピ
ン、 13・ ・上板、   13a・ ・対向面、14・・
・当て板、 14a・・・透孔、  14b・ ・逃し穴、17・ 
・第2のばね、 18・・ψ下プローブ、 P・・・両面回路基板、h・ ・位置決め穴。 以  上
[Brief explanation of the drawings] Figure 1 is a cross-sectional view of the main parts, Figure 2 is a cross-sectional view of the receiving plate on which the circuit board is placed, and Figures 3 and 4 are the steps taken before inspecting the circuit board. Each stage is a sectional view, and FIG. 5 is an enlarged sectional view of the main part. 3. ・Lower plate, 3a. .Opposing surface, 4. .Receiving plate, 4a. .Through hole, 4b--receiving hole, 7.. 1st
Spring, 8. Lower probe, 9. Locating pin, 13. Upper plate, 13a. Opposing surface, 14.
・Backing plate, 14a...Through hole, 14b・・Escape hole, 17・
・Second spring, 18... ψ bottom probe, P... Double-sided circuit board, h... Positioning hole. that's all

Claims (2)

【特許請求の範囲】[Claims] (1)上下に対向的に設けてあり、かつ相対的に前進後
退させられる上板および下板と、 上記上板と上記下板の各対向面にばね力に抗して縮退可
能に設けてあり、両面回路基板の上下パターン面に弾接
可能な複数の上プローブおよび下プローブと、 上面に上記回路基板を載置可能であり、上記下プローブ
が貫通可能な透孔を有する一方、平時は上記上面が上記
下プローブの上端よりも上位に位置するように上記下板
の上方で第1のばねによって弾発されている受け板と、 上記下板に植設してあり、上記受け板に形成してある貫
通孔から上方に突出するとともに先端が先細に形成され
、上記回路基板に形成してある位置決め穴に嵌合可能で
ある位置決めピンと、上記上プローブが貫通可能な透孔
を有する一方、平時は下面が上記上プローブの下端より
も下位に位置するように上記上板の下方で第2のばねに
よって弾発され、上記回路基板の上面と当接した状態で
上記回路基板より突出した上記位置決めピンが嵌合可能
な逃し穴を形成してある当て板と、からなる両面回路基
板用検査ヘッド。
(1) An upper plate and a lower plate that are provided vertically facing each other and that can be moved forward and backward relative to each other; and an upper plate and a lower plate that are provided on opposing surfaces of the upper plate and the lower plate so that they can retract against spring force. It has a plurality of upper probes and lower probes that can come into elastic contact with the upper and lower pattern surfaces of the double-sided circuit board, the circuit board can be placed on the upper surface, and a through hole through which the lower probe can penetrate. a receiving plate that is resiliently pressed by a first spring above the lower plate so that the upper surface is located higher than the upper end of the lower probe; a positioning pin that protrudes upward from the formed through hole and has a tapered tip and that can be fitted into a positioning hole formed in the circuit board; and a one side having a through hole through which the upper probe can pass. , the lower surface of the upper probe is pressed by a second spring below the upper plate so that it is located below the lower end of the upper probe during normal times, and the probe protrudes from the circuit board while being in contact with the upper surface of the circuit board. A double-sided circuit board inspection head comprising: a backing plate having a relief hole into which the positioning pin can fit;
(2)請求項1において、上記第2のばねのばね力を上
記第1のばねのそれよりも大きくしたことを特徴とする
両面回路基板用検査ヘッド。
(2) The double-sided circuit board inspection head according to claim 1, wherein the spring force of the second spring is greater than that of the first spring.
JP63331214A 1988-12-29 1988-12-29 Inspecting head for double-surface circuit board Pending JPH02179487A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63331214A JPH02179487A (en) 1988-12-29 1988-12-29 Inspecting head for double-surface circuit board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63331214A JPH02179487A (en) 1988-12-29 1988-12-29 Inspecting head for double-surface circuit board

Publications (1)

Publication Number Publication Date
JPH02179487A true JPH02179487A (en) 1990-07-12

Family

ID=18241172

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63331214A Pending JPH02179487A (en) 1988-12-29 1988-12-29 Inspecting head for double-surface circuit board

Country Status (1)

Country Link
JP (1) JPH02179487A (en)

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6275358A (en) * 1985-09-30 1987-04-07 Yokowo Mfg Co Ltd Circuit board inspecting device
JPS6360972B2 (en) * 1981-12-30 1988-11-28

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6360972B2 (en) * 1981-12-30 1988-11-28
JPS6275358A (en) * 1985-09-30 1987-04-07 Yokowo Mfg Co Ltd Circuit board inspecting device

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