JPH0217470A - Tester of high-frequency breakdown strength - Google Patents

Tester of high-frequency breakdown strength

Info

Publication number
JPH0217470A
JPH0217470A JP16799888A JP16799888A JPH0217470A JP H0217470 A JPH0217470 A JP H0217470A JP 16799888 A JP16799888 A JP 16799888A JP 16799888 A JP16799888 A JP 16799888A JP H0217470 A JPH0217470 A JP H0217470A
Authority
JP
Japan
Prior art keywords
tester
voltage
circuit
resonance
coil
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP16799888A
Other languages
Japanese (ja)
Other versions
JPH0619417B2 (en
Inventor
Chisato Ikeda
千里 池田
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Totoku Electric Co Ltd
Original Assignee
Totoku Electric Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Totoku Electric Co Ltd filed Critical Totoku Electric Co Ltd
Priority to JP16799888A priority Critical patent/JPH0619417B2/en
Publication of JPH0217470A publication Critical patent/JPH0217470A/en
Publication of JPH0619417B2 publication Critical patent/JPH0619417B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Abstract

PURPOSE:To make it possible to attain, through automatic tuning, a state of resonance of a resonant circuit formed of the inductance of a specimen coil connected to a tester and of a resonance capacity incorporated in the tester, by using a phase control loop (PLL circuit). CONSTITUTION:When a specimen coil (an inductance L) for a breakdown strength test is connected to a tester, a voltage on a point B on the output resonance element to which a resonance capacity C incorporated in the tester and the coil L are connected is separated by a pressure separating circuit and detected, and it is subjected to wave- shaping by a comparator and inputted to a phase comparator P1 constituting a PLL circuit D. A voltage at a point A on the output amplifying element side is subjected to wave-shaping and also inverted by an NOT circuit and is inputted to the comparator P1. An output of the comparator P1 corresponding to a phase difference between the points A and B is inputted to a voltage control oscillator P3 through a low-pass filter P2. Since a phase difference of a voltage generated on the primary and secondary sides of a resonant transformer T is added at the time of resonance, the oscillation frequency of the oscillator P3 is controlled so that the phase difference between the points A and B be 180 deg., and thus the uatomatic tuning of a resonant circuit is attained.

Description

【発明の詳細な説明】 〈産業上の利用分野〉 本発明は例えばテレビジョン受像機や陰極線管表示装置
等に使用される偏向コイルなどの高周波コイルの層間耐
圧試験に使用するに有効な自動同調機能を備えた高周波
耐圧試験器に関するものである。
[Detailed Description of the Invention] <Industrial Application Field> The present invention is an automatic tuning method which is effective for use in interlayer voltage withstanding tests of high frequency coils such as deflection coils used in television receivers, cathode ray tube display devices, etc. The present invention relates to a high-frequency withstand voltage tester with functions.

〈従来の技術〉 第5図は、偏向コイルなどの高周波コイルの層間耐圧試
験に用いられている共振式の耐圧試験器の一般的な構成
を示すブロック図で、第2図は共振式の耐圧試験器で利
用される直列共振回路を説明するための回路図である。
<Prior art> Figure 5 is a block diagram showing the general configuration of a resonant type withstand voltage tester used for interlayer withstand voltage tests of high frequency coils such as deflection coils. FIG. 2 is a circuit diagram for explaining a series resonant circuit used in a tester.

この種の耐圧試験器は第2図に示されるように偏向コイ
ルのインダクタンス(、L)と耐圧試験器に内蔵された
共振容量(C)とよりなる直列共振回路の共振により得
られる正弦波電圧(周波数的 100に&、AC2〜3
 kV )が供試コイルに印加されるよう構成されてい
る。そして、コイルの眉間耐圧試験は供試コイルを耐圧
試験器に接続し1発振周波数を手動により変化させなが
ら供試コイルのインダクタンスと共振容量とにより構成
される直列共振回路を同調させ共握状態にし、続いて出
力電圧調整用の可変抵抗器を手動により調整し、供試コ
イルのインダクタンスに応じた電圧をコイルに印加する
ことによって行なわれている。
As shown in Figure 2, this type of voltage tester generates a sine wave voltage obtained by resonance of a series resonant circuit consisting of the inductance (L) of the deflection coil and the resonant capacitance (C) built into the voltage tester. (Frequency: 100 & AC2~3
kV) is applied to the coil under test. Then, for the eyebrow voltage test of the coil, connect the test coil to a voltage tester, and while manually changing the oscillation frequency, tune the series resonant circuit made up of the inductance and resonance capacitance of the test coil to a synchronized state. Then, a variable resistor for adjusting the output voltage is manually adjusted, and a voltage corresponding to the inductance of the coil under test is applied to the coil.

〈解決しようとする問題点〉 前記、従来の耐圧試験器においては、直列共振回路の同
調をとるために発振周波数を変化させる操作、或は供試
コイルへの印加電圧を調整する操作を手動により行なわ
ねばならぬため、その操作は微妙で非常な熟練を要し、
同調が不完全な状態では異常発振を生じ、耐圧試験器の
各素子部品が破損する事故を招いてしまう、このためこ
れら同調操作には時間を要し、熟練した操作者でないと
操作が難かしいといった問題点がある。更に、インダク
タンスの異る複数のコイルを同一の試験ラインに流すよ
うな場合、各コイルのインダクタンスに対応した複数の
耐圧試験器を用意する必要があって、コイル検査ライン
の自動化が困難である0本発明はこれら諸欠点を解消す
るためになされたものである。
<Problem to be solved> In the conventional voltage tester mentioned above, the operation of changing the oscillation frequency in order to tune the series resonant circuit, or the operation of adjusting the voltage applied to the test coil, cannot be performed manually. The operation is delicate and requires great skill.
If the tuning is incomplete, abnormal oscillation will occur, leading to damage to the various elements of the voltage tester. Therefore, these tuning operations take time and are difficult to operate unless you are an experienced operator. There are some problems. Furthermore, when multiple coils with different inductances are passed through the same test line, it is necessary to prepare multiple voltage testers corresponding to the inductance of each coil, making it difficult to automate the coil inspection line. The present invention has been made to eliminate these drawbacks.

〈解決するための手段〉 位相制御ループ(PLL回路)を用いて共振式の耐圧試
験器を構成し、前記耐圧試験器に接続される供試コイル
のインダクタンスと前記耐圧試験器内蔵の共振容量とよ
りなる共振回路の共振状層を自動同調で得られるように
したことを第1の構成とし、更に加えて第2の構成とし
て出力電圧がコイルのインダクタンスに応じて予め設定
された電圧値に自動311!Iされる構成としたもので
ある。
<Means for solving the problem> A resonant voltage tester is configured using a phase control loop (PLL circuit), and the inductance of a test coil connected to the voltage tester and the resonant capacitance built into the voltage tester are The first configuration is that the resonant layer of the resonant circuit made of 311! The configuration is such that it can be

〈作用及び実施例〉 この種の共振式の耐圧試験器においては、直列共振回路
における共振時には下記のような関係が存在している。
<Operations and Examples> In this type of resonant type withstand voltage tester, the following relationship exists during resonance in the series resonant circuit.

・    E ・共振電流      I0=/ ・コイルの端子間電圧 ・  、 ω14  ・E a
 =J    E    (31・コイルのQ    
  Q=  。
・E ・Resonant current I0=/ ・Voltage between coil terminals ・ , ω14 ・E a
=J E (31・Q of coil
Q=.

従って、供試コイルの層間にレアショート等の絶縁不良
が存在する場合には、コイルのQが小さくなるため、(
3)及び(4)式から明らかなように供試コイルの端子
間に印加されるべき電圧 E+  が上昇しなくなるこ
とによりコイルの絶縁不良が確認されるものである。こ
こで(3)式かられかるように。
Therefore, if there is an insulation defect such as a layer short between the layers of the test coil, the Q of the coil becomes small, so (
As is clear from equations 3) and (4), poor insulation of the coil is confirmed when the voltage E+ to be applied between the terminals of the test coil no longer increases. Here, as can be seen from equation (3).

共振時においては出力増幅部側と出力共振部側の電圧の
間には一定の位相差が存在している。(第2図の場合 
90′)第1図は本発明の一実施例である耐圧試験器の
構成を示すブロック図であり、第3図はPLL回路の一
例を示す回路図、第4図はA(EC回路の一例を示す回
路図である。
During resonance, a certain phase difference exists between the voltages on the output amplification section side and the output resonance section side. (In the case of Figure 2
90') Fig. 1 is a block diagram showing the configuration of a withstand voltage tester which is an embodiment of the present invention, Fig. 3 is a circuit diagram showing an example of a PLL circuit, and Fig. 4 is a circuit diagram showing an example of A (EC circuit). FIG.

図においてTは共振トランス、Lは供試コイルのインダ
クタンス、Cは耐圧試験器に内蔵される共振容量である
。Dは位相比重11、ローパスフィルタP2.電圧制御
発撮器P3などで構成されるPLL回路(第3図参照)
、Eは整流回路P4、誤差項@器P5、可変抵抗素子P
6などで構成されるAGC回路(第4図参照)である、
以下、図に沿って具体的に説明する。いま、耐圧試験用
の供試コイルを耐圧試験器に接続すると、共振容量Cと
供試コイルの接続される出力共振部側B点の電圧は分圧
抵抗等からなる分圧回路で分圧検出されるとともにコン
パレータ等により波形整形されてI’LL回路を構成す
る位相比較器PIの端子1に入力される。一方、出力増
幅部側A点の電圧はコンパレータ等により波形整形され
るとともにNOT回路等により反転されて、同じく前記
位相比較器PIの端子3に入力されるよう構成されてい
る。従って、前記A点とB点の電圧の位相差に応じた位
相比較器からの出力がローパスフィルタP2を介して電
圧制御発振器P3の端子8に入力されるが、共振時には
共振トランスTのそれぞれ1次側と2次側に生ずる電圧
の位相差が加わるので、A点とB点の位相差が180°
となるよう電圧制御発振器P3の発振周波数が制御され
て共振回路の自動同調が得られる。
In the figure, T is a resonant transformer, L is the inductance of the coil under test, and C is the resonant capacitance built into the withstand voltage tester. D has a phase ratio of 11 and a low-pass filter P2. PLL circuit consisting of voltage controlled oscillator P3 etc. (see Figure 3)
, E is the rectifier circuit P4, error term @ device P5, variable resistance element P
The AGC circuit (see Fig. 4) is composed of 6, etc.
A detailed explanation will be given below with reference to the drawings. Now, when the test coil for a withstand voltage test is connected to a withstand voltage tester, the voltage at point B on the output resonance part side, where the resonant capacitor C and the test coil are connected, is detected by a voltage divider circuit consisting of a voltage divider resistor, etc. At the same time, the signal is waveform-shaped by a comparator or the like and input to terminal 1 of the phase comparator PI constituting the I'LL circuit. On the other hand, the voltage at point A on the output amplifier side is waveform-shaped by a comparator or the like, inverted by a NOT circuit or the like, and is similarly input to the terminal 3 of the phase comparator PI. Therefore, the output from the phase comparator corresponding to the phase difference between the voltages at points A and B is input to the terminal 8 of the voltage controlled oscillator P3 via the low-pass filter P2. Since the phase difference between the voltages generated on the next side and the secondary side is added, the phase difference between points A and B is 180°.
The oscillation frequency of the voltage controlled oscillator P3 is controlled so that the resonant circuit can be automatically tuned.

前記自動同調された電圧制御発振@P3からの出力が、
増幅W!F及びドライブ段Gを介して増幅され共振回路
が共振状態となるものである。更に、実施例においては
出力共振部側B点の電圧が市況分圧回路により検出され
て、整流回路P4、誤差増幅器P5、可変抵抗素子P6
で構成されるAGC回路口の!I流回路P4の51に入
力される。そしてこの整流口路からの出力と出力電圧設
定デジタルスイッチにより予め設定され、D−A変換回
路を介した出力がそれぞれ前記AGC回路の誤差増幅器
P5のGl、G2端子に入力され、その誤差信号出力が
可変抵抗素子P6を介して増幅器M5に入力されるよう
構成されている。このような構成により出力電圧はコイ
ルのインダクタンスに応じて決まる電圧値に自動調整さ
れる。従って、本試験器に供試コイルを接続し、出力電
圧値を設定するのみで耐圧試験が全て自動的に行なわれ
る。
The output from the automatically tuned voltage controlled oscillation @P3 is
Amplify W! It is amplified via F and drive stage G, and the resonant circuit enters a resonant state. Furthermore, in the embodiment, the voltage at point B on the output resonance part side is detected by the market voltage divider circuit, and the voltage at point B on the output resonance part side is detected by the rectifier circuit P4, the error amplifier P5, and the variable resistance element P6.
The AGC circuit port consists of! It is input to 51 of the I-flow circuit P4. The output from this rectifier path and the output voltage set in advance by the output voltage setting digital switch are inputted to the Gl and G2 terminals of the error amplifier P5 of the AGC circuit, respectively, and output the error signal. is input to the amplifier M5 via the variable resistance element P6. With this configuration, the output voltage is automatically adjusted to a voltage value determined according to the inductance of the coil. Therefore, by simply connecting the test coil to this tester and setting the output voltage value, the withstand voltage test is automatically performed.

〈効 果〉 以上説明したように、本発明の共振式の耐圧試験器によ
れば1位相制御ループ(PLL回路)によって共振状態
が自動同調により得られる。又、コイルのインダクタン
スにより予め決まる出力電圧をデジタルスイッチにより
設定しておけば、以後出力電圧は設定された電圧値にな
るよう自動調整されるので、従来手動により行なってい
た共振回路の同調をとる作業及び出力電圧調整のための
作業が不要となる。更に、インダクタンスの異るコイル
を同一ラインで試験出来るので、作業性が向上するばか
りか耐圧試験における個人差がなくなり、試験の信頼性
が向上するといった大きな効果が得られる。
<Effects> As explained above, according to the resonant voltage tester of the present invention, a resonant state can be obtained by automatic tuning using a one-phase control loop (PLL circuit). In addition, if the output voltage, which is determined in advance by the inductance of the coil, is set using a digital switch, the output voltage will be automatically adjusted to the set voltage value, making it possible to tune the resonant circuit, which was previously done manually. This eliminates the need for work and work for adjusting the output voltage. Furthermore, since coils with different inductances can be tested on the same line, not only is work efficiency improved, but individual differences in withstand voltage tests are eliminated, and test reliability is improved.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明による耐圧試験器の構成を示すブロック
図、第2図は共振式の耐圧試験器で利用される直列共振
回路を説明するための回路図、第3図は本発明で用いる
PLL回路の一例、第4図は同じ<AGC回路の一例、
第5図は従来例の耐圧試験器の構成を示すブロック図で
ある。 T:共振トランス、L:インダクタンス、C:共振容量
、D:PLL回路、Ej A G CID回路、1?:
増幅器、Gニド541段、PI:位相比較器、P2:ロ
ーパスフィルタ、P3:電圧制御発振器、P4:整流回
路、P5:誤差増幅器、P6:可変抵抗素子、M1〜H
5:増幅器
Fig. 1 is a block diagram showing the configuration of the withstand voltage tester according to the present invention, Fig. 2 is a circuit diagram for explaining a series resonant circuit used in a resonant type withstand voltage tester, and Fig. 3 is a circuit diagram used in the present invention. An example of a PLL circuit, FIG. 4 is an example of the same <AGC circuit,
FIG. 5 is a block diagram showing the configuration of a conventional voltage resistance tester. T: Resonant transformer, L: Inductance, C: Resonant capacitance, D: PLL circuit, Ej A G CID circuit, 1? :
Amplifier, G Nido 541 stage, PI: Phase comparator, P2: Low pass filter, P3: Voltage controlled oscillator, P4: Rectifier circuit, P5: Error amplifier, P6: Variable resistance element, M1 to H
5: Amplifier

Claims (1)

【特許請求の範囲】 1、高周波コイルの層間耐圧試験に用いられる共振式の
高周波耐圧試験器において、前記耐圧試験器に接続され
る供試コイルのインダクタンスと前記耐圧試験器内蔵の
共振容量よりなる共振回路の共振時の発振周波数を位相
制御ループを用いて自動同調する構成としたことを特徴
とする高周波耐圧試験器。 2、前記共振時の高周波耐圧試験器からの出力電圧が予
め設定された電圧値に自動調整される構成としたことを
特徴とする請求項1記載の高周波耐圧試験器。
[Scope of Claims] 1. A resonant high-frequency withstand voltage tester used for an interlayer withstand voltage test of a high-frequency coil, consisting of an inductance of a test coil connected to the withstand voltage tester and a resonant capacitance built into the withstand voltage tester. A high frequency withstand voltage tester characterized in that it is configured to automatically tune the oscillation frequency during resonance of a resonant circuit using a phase control loop. 2. The high frequency withstand voltage tester according to claim 1, wherein the output voltage from the high frequency withstand voltage tester at the time of resonance is automatically adjusted to a preset voltage value.
JP16799888A 1988-07-06 1988-07-06 High frequency withstand tester Expired - Lifetime JPH0619417B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP16799888A JPH0619417B2 (en) 1988-07-06 1988-07-06 High frequency withstand tester

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP16799888A JPH0619417B2 (en) 1988-07-06 1988-07-06 High frequency withstand tester

Publications (2)

Publication Number Publication Date
JPH0217470A true JPH0217470A (en) 1990-01-22
JPH0619417B2 JPH0619417B2 (en) 1994-03-16

Family

ID=15859905

Family Applications (1)

Application Number Title Priority Date Filing Date
JP16799888A Expired - Lifetime JPH0619417B2 (en) 1988-07-06 1988-07-06 High frequency withstand tester

Country Status (1)

Country Link
JP (1) JPH0619417B2 (en)

Cited By (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002296313A (en) * 2001-03-30 2002-10-09 Takamisawa Cybernetics Co Ltd Capacitor-testing device
JP2002323525A (en) * 2001-04-25 2002-11-08 Takamisawa Cybernetics Co Ltd Capacitor tester
JP2006098170A (en) * 2004-09-29 2006-04-13 Soken Denki Kk Partial discharge measuring system
JP2015513081A (en) * 2012-02-27 2015-04-30 マシイネンフアブリーク・ラインハウゼン・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング Test system and method for testing high voltage technology equipment
CN110703059A (en) * 2019-11-13 2020-01-17 上海恒能泰企业管理有限公司璞能电力科技工程分公司 Device for improving tuning stability of series resonance test under small load

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002296313A (en) * 2001-03-30 2002-10-09 Takamisawa Cybernetics Co Ltd Capacitor-testing device
JP4728498B2 (en) * 2001-03-30 2011-07-20 株式会社高見沢サイバネティックス Capacitor testing equipment
JP2002323525A (en) * 2001-04-25 2002-11-08 Takamisawa Cybernetics Co Ltd Capacitor tester
JP2006098170A (en) * 2004-09-29 2006-04-13 Soken Denki Kk Partial discharge measuring system
JP2015513081A (en) * 2012-02-27 2015-04-30 マシイネンフアブリーク・ラインハウゼン・ゲゼルシヤフト・ミツト・ベシユレンクテル・ハフツング Test system and method for testing high voltage technology equipment
CN110703059A (en) * 2019-11-13 2020-01-17 上海恒能泰企业管理有限公司璞能电力科技工程分公司 Device for improving tuning stability of series resonance test under small load
WO2021093352A1 (en) * 2019-11-13 2021-05-20 上海恒能泰企业管理有限公司璞能电力科技工程分公司 Apparatus for improving tuning stability of series resonance test under small load
CN110703059B (en) * 2019-11-13 2021-08-17 上海恒能泰企业管理有限公司璞能电力科技工程分公司 Device for improving tuning stability of series resonance test under small load

Also Published As

Publication number Publication date
JPH0619417B2 (en) 1994-03-16

Similar Documents

Publication Publication Date Title
US2173426A (en) Electric system
JPH1172515A (en) Broad-band analog insulation circuit
JP2716137B2 (en) Tuning tracking method, tracking tuning filter, tracking tuning filter / mixer, and tracking tuning device
EP0041566A1 (en) Bandpass amplifier circuits
US3963982A (en) Apparatus for measuring the resonant frequency and coefficient of coupling of a plurality of coupled piezoelectric resonators
JPH0217470A (en) Tester of high-frequency breakdown strength
US5991609A (en) Low cost digital automatic alignment method and apparatus
JPH0738457A (en) Circuit device for generating tuned voltage
US2173231A (en) Measuring instrument
US3525944A (en) Frequency discriminator circuit
US2256067A (en) Receiver selectivity control
US3361986A (en) Low-distortion sweep signal generator with superimposed frequency modulation
US5587663A (en) Method for measuring the inductance of each resonator of a coupled-dual resonator crystal
CA1263152A (en) Quadrupole mass filter with unbalanced r.f. voltage
US4136313A (en) Apparatus for measuring q-quality of oscillatory circuit components
US4618829A (en) Bridge circuit demodulator
JPS6319569A (en) Method for detecting leaked current
Weir Automatic measurement system for a multichannel digitally tuned bandpass filter
US3402345A (en) Field modulated gyromagnetic resonance spectrometer having an internal test signal generator
JPH0457406A (en) Phase shift circuit for rf generator
JPH0587944A (en) Metal detector
JP2928248B2 (en) TV tuner input filter
JPS6174412A (en) Television tuner
JP2665912B2 (en) Insulation resistance measurement method that compensates for the effect of ground resistance
JPH03261876A (en) Method of measuring electronic circuit