JPH02170733A - Testing device - Google Patents

Abstract

PURPOSE:To automatically supervise the presence/absence of the abnormality of an output signal generated from a power source panel by setting testing conditions for the power source panel, always supervising the state indicating signal generated from the power source panel, and deciding the presence/absence of the abnormality of the signal. CONSTITUTION:A testing control means 12 sets the testing conditions for the power source panel corresponding to the designation of a condition designating part 6 through a condition setting means 10 to a condition output part 2 in an initial time or whenever the output of a state output part 4 is generated after initial setting. After the setting of the testing condition to the power source panel, the signal indicating the state of the power source panel, which has responded to the testing condition, is always supervised, when the signal is received and the testing condition designation at the time of setting the testing condition is not updated, the testing condition corresponding to the designation is sent, and the state of the power source panel, etc., for the testing condition are supervised. Thus, the presence/absence of the abnormality of the output signal generated from the power source panel can be automatically supervised.

Description

[Detailed Description of the Invention] [Summary] Regarding a test device suitable for monitoring the presence or absence of abnormality in the output signal generated from the power supply panel, etc., the present invention automatically monitors the presence or absence of abnormality in the output signal generated from the power supply panel, etc. A condition output unit that sends test conditions to the device under test, a status output unit that outputs information representing the state of the device under test in response to the sent test conditions, and a condition output unit that outputs information representing the state of the device under test, a condition specifying unit for updating the test condition specification, an updating unit for updating the test condition specification, a condition setting unit for setting the test condition in the condition output unit, and a test control unit, the test control unit including the condition specifying unit. The test conditions according to the specification are set in the condition output section initially through the condition setting means or each time the initial setting diameter is output from the condition output section, and the test conditions are set in the condition indicator section. The update means is configured to update immediately when the period for the condition has elapsed.

[Industrial application field]

The present invention relates to a testing device such as a power supply panel, and more particularly to a test device suitable for monitoring the presence or absence of an abnormality in an output signal generated from a power supply panel or the like.

[Prior Art] A power supply board used in an information processing device or the like is configured to generate various output signals in response to signals from a main unit. When generating various output signals from the power panel, if a momentary abnormal signal is generated, this output signal will have an extremely large effect on the entire main unit, so monitor the presence or absence of various output signals generated from the power panel. is needed.

Therefore, in conventional monitoring equipment that tests power panels, test conditions for the power panel are set, the output signal from the power panel in response to the test conditions is captured, and the output signal is checked to see if it matches the set value. It was configured to make a determination as to whether or not. That is, a method is adopted in which the output signal from the power supply panel and a preset signal are compared according to an empirically allowed number of times, and if the signals do not match within the allowed number of times, an error is displayed.

[Problem to be solved by the invention]

However, the conventional monitoring system only monitors the output signal from the power panel in response to commands from the main unit, so even if there is an abnormality in the output signal instantaneously generated from the power panel, the It was not possible to automatically monitor whether there were any abnormalities. The only way to carry out this surveillance was to do it manually.

An object of the present invention is to provide a test device that can automatically monitor the presence or absence of an abnormality in an output signal generated from a power supply panel or the like.

[Means to solve the problem]

FIG. 1 shows a block diagram of the principle of the present invention. As shown in this figure, the present invention includes a condition output unit 2 that sends test conditions to the device under test 1, and a state that outputs information representing the state of the device under test 1 in response to the sent test conditions. An output section 4, a condition specifying section 6 for specifying test conditions, an updating means 8 for updating the specification of test conditions, a condition setting means 10 for setting test conditions in the condition output section 2, and a test control means 12. The test control means 12 initially sets the test conditions according to the specification of the condition specifying section 6 via the condition setting section 10, or controls the output generation of the status output section 4 after initial setting. The test condition is set in the condition output section 2 each time, and the updating means 8 is updated immediately when the period for the test condition set in the condition specifying section 6 has elapsed.

(Function) After setting test conditions for the power panel, etc., constantly monitor signals indicating the status from the power panel, etc. that responded to the test conditions.
When the signal is received, and the test condition designation at the time the test condition was set has not been updated, the test condition corresponding to the designation is sent and the status of the power supply panel, etc. is monitored for the test condition. Therefore, when an abnormality occurs in the state, it is possible to automatically confirm the abnormality.

[Example] In FIG. 2, a control unit 10 constituting a power monitoring device includes a CPU 12, a CRT 14, and a keyboard 1.
6, floppy disk 18, ink face (GP-
IB) 20, digital input/output interface CDl0)
It has 22. The floppy disk 18 stores a program for executing the processing in FIG. 4 and steps 110 to 124 (this corresponds to the test control means 12 in FIG. 1). In addition, a flag (FLG) (condition specifying section 6 in FIG. 1) is stored, and a program for its update process is also stored in the floppy disk 18 (this is the update means 8 in FIG. 1). ). The ink face 20 is connected to a digital multimeter (DMM) 24, and the digital input/output interface 22 is connected to an alarm I10.
It is connected to a power supply board 28 via a circuit (ALMIlo) 26. The CPU 2, floppy disk 18, and digital input/output interface 22 correspond to the condition setting means 10 shown in FIG. Furthermore, the digital input/output ink face 22 includes a control latch (C0NT latch) 30, a scan circuit (SCAN) 32, and a slider (AC) 3.
4. Power supply panel 28 via load (LOAD) 36
It is connected to the. The scan circuit 32 is connected to a digital multimeter 3. In addition, the control latch 30 is a manual controller (MANUAL C0
NT) 40 to the panel 42.

The alarm I10 circuit 26, as shown in FIG.
It is composed of a control section 44, a gate circuit 46, a data latch 48, a comparator 50, and an input latch 52. The input latch 52 is connected to the power supply panel 28, and the output of the gate circuit 46 and the input of the data latch 48 are connected to a pass line. is connected to the latch control input of the data latch 48 and the control section 4.
It is connected to the input address line of 4. Control unit 4
4 is 100-108 in Figure 4 and 200-22 in Figure 5
Process 0. The input latch 52, the comparator 50, the processes 200 to 220 of the process flow in FIG. 5 in the control unit 44, and the digital input/output ink face 22 correspond to the status output unit 4 in FIG.

The present embodiment has the above-mentioned configuration, and its operation will next be explained based on the processing flow of FIGS. 4 and 5.

First, when various test conditions are input from the keyboard 16, each test condition is stored on the floppy disk 18. Then, a command to execute a test for one ALM signal condition is output to the power board 28, and the ALM signal is sent to the floppy disk 18 of the control latch l-10.
When the flag (FLG) corresponding to the signal condition is set, the control unit 44 performs processing to disable hardware interrupts (100 in FIG. 4), and generates an alarm signal based on the test conditions stored in the floppy disk 18. Condition setting processing is performed (102 in FIG. 4). Set flag (F
LG) is set until the flag corresponding to the next ALM signal condition is set. After that, monitoring for monitoring the output signal from the power supply panel 28 is started (10 in FIG. 4).
4). Furthermore, the prohibition of hardware interrupts is canceled, and the hardware interrupts are enabled (106) in Figure 4).
! Input alarm data to 128 (1 in Figure 4).
08).

After the alarm data is sent to the power supply board (device under test), the control section 44 enters the process shown in FIG. 5.

Determines whether there is an interrupt from the power supply panel (2 in Figure 5).
00), if there is no interrupt, the process proceeds to step 220 in FIG. It when there is an interrupt.

rt (interrupt control flag) is set to O (202 in FIG. 5), and hardware interrupt disabling processing is executed for comparison processing (204 in FIG. 5). After this, start processing for monitoring the output signal of the power supply panel 28 (206 in Fig. 5).
, reads out the alarm signal from the power supply panel 28 (208 in FIG. 5). Then, it is determined whether the count value for the number of monitoring times is, for example, 1000 (2IO in FIG. 5).
, until the count value reaches 1000, it is determined whether the signal condition matches the readout signal (see 2 in Fig. 5).
12). If this judgment condition does not match, the process returns to step 206 in FIG. 5 again.

At this time, the number of times of monitoring is counted and amplified by l.

On the other hand, when they match, processing is performed in which the signal condition matches the read signal (214 in FIG. 5). 1trj after this
is set to 1 (216 in FIG. 5), and control is passed to the control unit IO (220 in FIG. 5).

Also, when the count value reaches 1000, the error flag (ERR) is set to 1 (indicating a mismatch) (step 218), and control is passed to the control unit 10 (step 218).
220 in Figure 5).

As described above, even if no alarm state occurs (No. 200 in Figure 5), or whether an interrupt from the power supply board occurs and an error state occurs (No. 4
214 and 218) in the figure, the control section 44 sends a notification to the control unit 10 to start the information collection process regarding the test status of the power panel (220 in Figure 4).

In the control unit 10 that received this notification, the fourth
The process starting from 110 in the figure is started.

It is determined whether or not Itrt is 1 (11 in Figure 3).
0). If it is 0 (NO at 110 in FIG. 4), hard interrupt prohibition processing is performed (112 in FIG. 4). Power panel 2
11 in Figure 4 to start the process for monitoring the signal 8.
4) Sequentially capture alarm signals from the power supply panel 28 (
116 in Figure 4). Then, processing is performed to set the error flag (ERR) to 1 (118 in FIG. 4).

On the other hand, when it is determined that I t r t=1 at 110 in FIG. 4, it is determined whether the error flag (ERR) is 0 (120 in FIG. 4). And the error flag is 0
If not, perform error processing (122 in Figure 4)
. In the error processing, the details of the error are displayed on the screen of the CRT 14, as shown in FIG. Before entering error processing, a screen like the one shown in Figure 6 (A) was displayed on the CRT 14 screen, but when error processing started, a screen like the one shown in Figure 6 (B) was displayed on the CRTI 4 screen. displayed on the screen. Each of the screen areas showing the next screen, retest, next test, and end shown at the bottom of the screen shown in FIG. 6(B) corresponds to a function key on the keyboard provided on the CRT 14, and when pressed, Each movement is caused. When the next screen is specified using the keyboard, for example, data corresponding to a sequential count is displayed each time the key is pressed. The first press will sequentially display data corresponding to counts 31 to 60, and the next press will sequentially display data corresponding to counts 61 to 90. For reexamination, please change the screen to Figure 6 (
Return to screen A) and perform the test from the point where the error occurred. For the next test, ignore the part where the error occurred and try the next ALM.
Perform tests on signal conditions. Termination forces the current test to end.

After the process is completed, the process moves to step 124 in FIG. 4, and when the period for the test condition has elapsed, the process moves to the process for setting the next ALM signal condition. When the setting processing is completed, the process returns to 100 in FIG. 4, and processing such as setting to the control unit 44 according to the flag (FLG) is continued. Therefore, if the values of the flags (FLG) are the same, testing of the power supply panel 28 is restarted under the ALM signal condition corresponding to the flag (FLC;).

When the series of processes as described above for all ALM signal conditions are completed (Y at 124 in FIG. 4), the test for that power supply panel is completed.

〔Effect of the invention〕

As explained above, according to the present invention, after setting the test conditions for the power panel etc., the signal indicating the status from the power panel is constantly monitored and it is determined whether or not there is an abnormality in the signal. Even if an instantaneous abnormal signal is generated due to the above, the abnormality can be reliably detected.

[Brief explanation of the drawing]

FIG. 1 is a block diagram of the principle of the present invention, FIG. 2 is a block diagram of an information processing system to which the present invention is applied, FIG. FIG. 5 is a diagram showing a processing flow for explaining other effects of the present invention. FIG. 6 is a diagram showing a display according to the present invention. 1 to 3, 2 is a condition output section (data latch 48), 4 is a state output section (input latch 52, comparator 5o, 200 to 220 of the processing flow in FIG. 5 in the control section 44, digital Input/output ink face 22), 6 is condition specification section (floppy disk 1
8 is the update means (CPU 12), 10 is the condition specifying means (CPU 12, floppy disk 18, digital input/output interface 22), 12 is the test control means (CPL 112, floppy disk 18) 110 to 12 of the processing flow in Figure 4
4). 2 to 1' August 1' - I ¥ 6 Jisumu's whole rice is lipless i Iyo 2nd figure J to β month or J eyebrows... / 2 1st figure ``δ Ming's Ir4p year old Figure 5 (A) A5 (Kami Iraq Figure 6)

Claims (1)

[Claims] (1) A condition output unit (2) that sends test conditions to the device under test (1), and a status output unit that outputs information representing the state of the device under test (1) in response to the sent test conditions. (4), a condition specifying section (6) for specifying test conditions, an updating means (8) for updating the specification of test conditions, and a condition setting means (10) for setting test conditions in the condition output section (2). )
and a test control means (12), the test control means (12) initially setting test conditions according to the specifications of the condition specifying section (6) via the condition setting means (10). , or after initial setting, set it in the condition output section (2) every time the output of the status output section (4) occurs, and immediately when the period for the test condition set in the condition specification section (6) has elapsed. A test device characterized by updating an updating means (8).