JPH02150505U - - Google Patents

Info

Publication number
JPH02150505U
JPH02150505U JP1989060402U JP6040289U JPH02150505U JP H02150505 U JPH02150505 U JP H02150505U JP 1989060402 U JP1989060402 U JP 1989060402U JP 6040289 U JP6040289 U JP 6040289U JP H02150505 U JPH02150505 U JP H02150505U
Authority
JP
Japan
Prior art keywords
voltage value
measured
area ratio
light
plate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP1989060402U
Other languages
English (en)
Other versions
JP2524971Y2 (ja
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1989060402U priority Critical patent/JP2524971Y2/ja
Priority to US07/528,766 priority patent/US5096299A/en
Priority to DE90110015T priority patent/DE69003869T2/de
Priority to AT90110015T priority patent/ATE95918T1/de
Priority to EP90110015A priority patent/EP0399562B1/en
Publication of JPH02150505U publication Critical patent/JPH02150505U/ja
Application granted granted Critical
Publication of JP2524971Y2 publication Critical patent/JP2524971Y2/ja
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/28—Measuring arrangements characterised by the use of optical techniques for measuring areas
    • G01B11/285—Measuring arrangements characterised by the use of optical techniques for measuring areas using photoelectric detection means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Inking, Control Or Cleaning Of Printing Machines (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
  • Photometry And Measurement Of Optical Pulse Characteristics (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Description

【図面の簡単な説明】
第１図ａおよびｂは本考案に係る絵柄面積率測
定装置の一実施例を示す側面図および正面図、第
２図はこの絵柄面積率測定装置におけるＣＣＤカ
メラからの出力電圧を入力とする処理回路を示す
ブロツク構成図、第３図はこの絵柄面積率測定装
置において被測定平版を水なし平版とした際に得
られるＣＣＤカメラからの出力電圧値を示す図、
第４図は水なし平版の縁面に付した黒レベルを示
す平面図、第５図はこの絵柄面積率測定装置の動
作を説明するフローチヤート、第６図は絵柄面積
率測定に際してのＡ／Ｄコンバータへの供与電圧
値を第９図ｂに対応して例示した図、第７図ａお
よびｂは従来の絵柄面積率測定装置の構造を示す
側面図および正面図、第８図はこの絵柄面積率測
定装置において被測定平版を水なし平版とした際
に得られるＣＣＤカメラからの出力電圧値を示す
図、第９図ａおよびｂはＰＳ版および水なし平版
の絵柄面積率測定に際してのＣＣＤカメラの出力
電圧値を例示する図である。 １……被測定平版、２−１〜２−ｎ……ハロゲ
ンランプ（光源）、３……ＣＣＤカメラ、４……
拡散板、５……ＣＰＵ、８……Ａ／Ｄコンバータ
、９……黒レベル用Ｄ／Ａコンバータ、１０……
白レベル用Ｄ／Ａコンバータ、１１……減算器、
１−１……黒レベル、１−３……白レベル。

Claims (1)

    【実用新案登録請求の範囲】
  1. 並設配置された複数の光源を備え、これら光源
    からの光を被測定平版へ照射しそこからの反射光
    に応じた電圧値に基づいて前記被測定平版に描か
    れた絵柄の面積率を測定する絵柄面積率測定装置
    において、前記光源の前面に配置され前記被測定
    平版への照射光を乱反射させて通過せしめる拡散
    手段と、前記被測定平版の黒レベルからの前記反
    射光に応じた電圧値を所定値Ｖａに合わせ込む第
    １の電圧値調整手段と、前記被測定平版の白レベ
    ルからの前記反射光に応じた電圧値を所定値Ｖｂ
    に合わせ込む第２の電圧値調整手段とを備えてな
    る絵柄面積率測定装置。
JP1989060402U 1989-05-26 1989-05-26 絵柄面積率測定装置 Expired - Lifetime JP2524971Y2 (ja)

Priority Applications (5)

Application Number Priority Date Filing Date Title
JP1989060402U JP2524971Y2 (ja) 1989-05-26 1989-05-26 絵柄面積率測定装置
US07/528,766 US5096299A (en) 1989-05-26 1990-05-24 Pattern area ratio measuring apparatus
DE90110015T DE69003869T2 (de) 1989-05-26 1990-05-26 Gerät zur Messung des Flächenverhältnisses eines Musters auf einer zu bedruckenden Oberfläche.
AT90110015T ATE95918T1 (de) 1989-05-26 1990-05-26 Geraet zur messung des flaechenverhaeltnisses eines musters auf einer zu bedruckenden oberflaeche.
EP90110015A EP0399562B1 (en) 1989-05-26 1990-05-26 Pattern area ratio measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1989060402U JP2524971Y2 (ja) 1989-05-26 1989-05-26 絵柄面積率測定装置

Publications (2)

Publication Number Publication Date
JPH02150505U true JPH02150505U (ja) 1990-12-26
JP2524971Y2 JP2524971Y2 (ja) 1997-02-05

Family

ID=13141140

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1989060402U Expired - Lifetime JP2524971Y2 (ja) 1989-05-26 1989-05-26 絵柄面積率測定装置

Country Status (5)

Country Link
US (1) US5096299A (ja)
EP (1) EP0399562B1 (ja)
JP (1) JP2524971Y2 (ja)
AT (1) ATE95918T1 (ja)
DE (1) DE69003869T2 (ja)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5357335A (en) * 1993-03-31 1994-10-18 Minnesota Mining And Manufacturing Company Optical detection device for screening magnetic tape
ES2323206B1 (es) * 2006-10-16 2010-04-21 Universidad De Cordoba Procedimiento de calibracion absoluta en intensidad de un dispositivo optico.
TWI393854B (zh) * 2008-09-01 2013-04-21 Univ Ishou The method of the optical system to measure the actual contact area of ​​the

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59160709A (ja) * 1983-03-03 1984-09-11 Komori Printing Mach Co Ltd 印刷版の絵柄面積測定方法
JPS60238834A (ja) * 1984-05-11 1985-11-27 Asahi Shinbunsha:Kk 画線比率測定装置
JPS63221207A (ja) * 1987-03-10 1988-09-14 Ricoh Co Ltd 干渉測定装置における光電変換方法

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2720812A (en) * 1952-09-30 1955-10-18 Middleton William Edga Knowles Instrument for measuring distinctness of image gloss
US3609044A (en) * 1969-07-01 1971-09-28 Eastman Kodak Co Apparatus for selectively inspecting a web surface and a coating on the surface
US3792268A (en) * 1972-01-06 1974-02-12 Ibm Document scanner having optical diffusion means
US3891797A (en) * 1973-12-26 1975-06-24 Mc Donnell Douglas Corp Plating area measuring system
US4406545A (en) * 1981-05-07 1983-09-27 Western Electric Company, Inc. Methods of and apparatus for measuring surface areas
US4512662A (en) * 1981-07-06 1985-04-23 Tobias Philip E Plate scanner for printing plates
DE3309443A1 (de) * 1982-05-29 1983-12-08 Heidelberger Druckmaschinen Ag, 6900 Heidelberg Verfahren zur ermittlung der flaechendeckung einer druckvorlage oder druckplatte fuer druckmaschinen

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS59160709A (ja) * 1983-03-03 1984-09-11 Komori Printing Mach Co Ltd 印刷版の絵柄面積測定方法
JPS60238834A (ja) * 1984-05-11 1985-11-27 Asahi Shinbunsha:Kk 画線比率測定装置
JPS63221207A (ja) * 1987-03-10 1988-09-14 Ricoh Co Ltd 干渉測定装置における光電変換方法

Also Published As

Publication number Publication date
DE69003869T2 (de) 1994-05-05
EP0399562A3 (en) 1991-05-29
JP2524971Y2 (ja) 1997-02-05
US5096299A (en) 1992-03-17
ATE95918T1 (de) 1993-10-15
EP0399562B1 (en) 1993-10-13
DE69003869D1 (de) 1993-11-18
EP0399562A2 (en) 1990-11-28

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Legal Events

Date Code Title Description
EXPY Cancellation because of completion of term