JPH02146U - - Google Patents

Info

Publication number
JPH02146U
JPH02146U JP7765488U JP7765488U JPH02146U JP H02146 U JPH02146 U JP H02146U JP 7765488 U JP7765488 U JP 7765488U JP 7765488 U JP7765488 U JP 7765488U JP H02146 U JPH02146 U JP H02146U
Authority
JP
Japan
Prior art keywords
sample
point
tilt correction
fixed
moving
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP7765488U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP7765488U priority Critical patent/JPH02146U/ja
Publication of JPH02146U publication Critical patent/JPH02146U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Analysing Materials By The Use Of Radiation (AREA)

Description

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本考案の一実施例の側断面図、第2図
は従来例の側断面図である。 ア…光学顕微鏡、イ…X線分光器、S…試料、
A…試料面、B…移動面、1…対物レンズ、2…
補正ピン、3…試料ホルダー、4…傾斜補正台、
5…試料ホルダー、6…移動台、7…移動ガイド
FIG. 1 is a side sectional view of an embodiment of the present invention, and FIG. 2 is a side sectional view of a conventional example. A... Optical microscope, B... X-ray spectrometer, S... Sample,
A...Sample surface, B...Movement surface, 1...Objective lens, 2...
Correction pin, 3...sample holder, 4...tilt correction table,
5...Sample holder, 6...Movement table, 7...Movement guide.

Claims (1)

【実用新案登録請求の範囲】[Scope of utility model registration request] 一定点に焦点を有し、その焦点に試料面上の一
点を位置させて、試料面のその点の分析を行う分
析装置において、試料を直交3軸方向に移動させ
る移動手段と、上記装置に固定され上記移動手段
の直交2軸方向移動面と平行な基準面を形成する
当り部材と、上記移動手段に保持され上記直交2
軸を軸として回動可能に試料を保持する傾斜補正
手段とよりなることを特徴とする試料傾斜補正装
置。
In an analyzer that has a focal point at a fixed point, places a point on the sample surface at the focal point, and analyzes that point on the sample surface, a moving means for moving the sample in three orthogonal axes directions; a contact member that is fixed and forms a reference plane that is parallel to the orthogonal two-axis movement plane of the moving means;
A sample tilt correction device comprising a tilt correction means for holding a sample rotatably about a shaft.
JP7765488U 1988-06-10 1988-06-10 Pending JPH02146U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP7765488U JPH02146U (en) 1988-06-10 1988-06-10

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP7765488U JPH02146U (en) 1988-06-10 1988-06-10

Publications (1)

Publication Number Publication Date
JPH02146U true JPH02146U (en) 1990-01-05

Family

ID=31302627

Family Applications (1)

Application Number Title Priority Date Filing Date
JP7765488U Pending JPH02146U (en) 1988-06-10 1988-06-10

Country Status (1)

Country Link
JP (1) JPH02146U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009250758A (en) * 2008-04-04 2009-10-29 Nippon Steel Corp Leveling tool of hardness measuring surface, and leveling method of hardness measuring surface

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009250758A (en) * 2008-04-04 2009-10-29 Nippon Steel Corp Leveling tool of hardness measuring surface, and leveling method of hardness measuring surface

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