JPH02140466U - - Google Patents

Info

Publication number
JPH02140466U
JPH02140466U JP4770089U JP4770089U JPH02140466U JP H02140466 U JPH02140466 U JP H02140466U JP 4770089 U JP4770089 U JP 4770089U JP 4770089 U JP4770089 U JP 4770089U JP H02140466 U JPH02140466 U JP H02140466U
Authority
JP
Japan
Prior art keywords
sample
ultrasonic
probe
coincides
emits
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP4770089U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP4770089U priority Critical patent/JPH02140466U/ja
Publication of JPH02140466U publication Critical patent/JPH02140466U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
JP4770089U 1989-04-25 1989-04-25 Pending JPH02140466U (OSRAM)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP4770089U JPH02140466U (OSRAM) 1989-04-25 1989-04-25

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP4770089U JPH02140466U (OSRAM) 1989-04-25 1989-04-25

Publications (1)

Publication Number Publication Date
JPH02140466U true JPH02140466U (OSRAM) 1990-11-26

Family

ID=31563862

Family Applications (1)

Application Number Title Priority Date Filing Date
JP4770089U Pending JPH02140466U (OSRAM) 1989-04-25 1989-04-25

Country Status (1)

Country Link
JP (1) JPH02140466U (OSRAM)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011242332A (ja) * 2010-05-20 2011-12-01 Nippon Telegr & Teleph Corp <Ntt> 超音波非破壊計測方法、超音波非破壊計測装置、及びプログラム

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS589063B2 (ja) * 1974-12-13 1983-02-18 松下電工株式会社 ムキケイコウカタイノ セイホウ
JPS59206758A (ja) * 1983-05-11 1984-11-22 Noritoshi Nakabachi 超音波顕微鏡装置
JPS62249052A (ja) * 1986-04-22 1987-10-30 Olympus Optical Co Ltd 超音波顕微鏡

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS589063B2 (ja) * 1974-12-13 1983-02-18 松下電工株式会社 ムキケイコウカタイノ セイホウ
JPS59206758A (ja) * 1983-05-11 1984-11-22 Noritoshi Nakabachi 超音波顕微鏡装置
JPS62249052A (ja) * 1986-04-22 1987-10-30 Olympus Optical Co Ltd 超音波顕微鏡

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2011242332A (ja) * 2010-05-20 2011-12-01 Nippon Telegr & Teleph Corp <Ntt> 超音波非破壊計測方法、超音波非破壊計測装置、及びプログラム

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