JPH02140466U - - Google Patents
Info
- Publication number
- JPH02140466U JPH02140466U JP4770089U JP4770089U JPH02140466U JP H02140466 U JPH02140466 U JP H02140466U JP 4770089 U JP4770089 U JP 4770089U JP 4770089 U JP4770089 U JP 4770089U JP H02140466 U JPH02140466 U JP H02140466U
- Authority
- JP
- Japan
- Prior art keywords
- sample
- ultrasonic
- probe
- coincides
- emits
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000523 sample Substances 0.000 claims description 10
- 238000010897 surface acoustic wave method Methods 0.000 claims 1
- 238000010586 diagram Methods 0.000 description 2
- 238000002604 ultrasonography Methods 0.000 description 2
Landscapes
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Description
第１図は本考案の実施例に係る超音波顕微鏡の
一部の斜視図、第２図は第１図に示す探触子の斜
視図、第３図は第１図に示す探触子の側面図、第
４図は従来の超音波顕微鏡の系統図、第５図はＶ
（Ｚ）曲線を示す波形図である。
２……試料、１３……センサ、１４……支持体
、１５……回転操作部、１７……目盛板、１８…
…固定板。
Fig. 1 is a perspective view of a part of an ultrasound microscope according to an embodiment of the present invention, Fig. 2 is a perspective view of the probe shown in Fig. 1, and Fig. 3 is a perspective view of the probe shown in Fig. 1. Side view, Figure 4 is a system diagram of a conventional ultrasound microscope, Figure 5 is a V
(Z) It is a waveform diagram showing a curve. 2...Sample, 13...Sensor, 14...Support, 15...Rotary operation section, 17...Scale plate, 18...
...Fixed plate.
Claims (1)
波ビームを放射し、前記試料からの反射波を受信
する探触子を備えた超音波顕微鏡において、前記
探触子を、前記超音波ビームが前記試料に入射し
たとき当該試料に生じる表面弾性波が方向性をも
つ構造とし、かつ、当該超音波ビームの中心と一
致する軸まわりに回転可能に支持したことを特徴
とする超音波顕微鏡。 In an ultrasonic microscope equipped with a probe that emits a focused ultrasonic beam to a sample placed on a sample stage and receives reflected waves from the sample, the probe is An ultrasonic microscope characterized in that the surface acoustic wave generated in the sample when a beam is incident on the sample has a directional structure, and is supported rotatably around an axis that coincides with the center of the ultrasonic beam. .
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4770089U JPH02140466U (en) | 1989-04-25 | 1989-04-25 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4770089U JPH02140466U (en) | 1989-04-25 | 1989-04-25 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH02140466U true JPH02140466U (en) | 1990-11-26 |
Family
ID=31563862
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4770089U Pending JPH02140466U (en) | 1989-04-25 | 1989-04-25 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH02140466U (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011242332A (en) * | 2010-05-20 | 2011-12-01 | Nippon Telegr & Teleph Corp <Ntt> | Ultrasonic nondestructive measurement method, ultrasonic nondestructive measurement instrument, and program |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS589063B2 (en) * | 1974-12-13 | 1983-02-18 | 松下電工株式会社 | Mukikei Koukataino Seihou |
| JPS59206758A (en) * | 1983-05-11 | 1984-11-22 | Noritoshi Nakabachi | Ultrasonic microscope device |
| JPS62249052A (en) * | 1986-04-22 | 1987-10-30 | Olympus Optical Co Ltd | Ultrasonic microscope |
-
1989
- 1989-04-25 JP JP4770089U patent/JPH02140466U/ja active Pending
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS589063B2 (en) * | 1974-12-13 | 1983-02-18 | 松下電工株式会社 | Mukikei Koukataino Seihou |
| JPS59206758A (en) * | 1983-05-11 | 1984-11-22 | Noritoshi Nakabachi | Ultrasonic microscope device |
| JPS62249052A (en) * | 1986-04-22 | 1987-10-30 | Olympus Optical Co Ltd | Ultrasonic microscope |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2011242332A (en) * | 2010-05-20 | 2011-12-01 | Nippon Telegr & Teleph Corp <Ntt> | Ultrasonic nondestructive measurement method, ultrasonic nondestructive measurement instrument, and program |
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