JPH02138719A - Capacitor - Google Patents
CapacitorInfo
- Publication number
- JPH02138719A JPH02138719A JP29267588A JP29267588A JPH02138719A JP H02138719 A JPH02138719 A JP H02138719A JP 29267588 A JP29267588 A JP 29267588A JP 29267588 A JP29267588 A JP 29267588A JP H02138719 A JPH02138719 A JP H02138719A
- Authority
- JP
- Japan
- Prior art keywords
- film
- metallized
- capacitor
- zinc
- electrode
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000003990 capacitor Substances 0.000 title claims abstract description 22
- 239000011701 zinc Substances 0.000 claims abstract description 21
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 claims abstract description 20
- 229910052725 zinc Inorganic materials 0.000 claims abstract description 20
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 11
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 11
- 239000002985 plastic film Substances 0.000 claims abstract description 7
- 229920006255 plastic film Polymers 0.000 claims abstract description 7
- 238000004804 winding Methods 0.000 claims abstract description 4
- 229910052751 metal Inorganic materials 0.000 claims description 15
- 239000002184 metal Substances 0.000 claims description 15
- 238000000605 extraction Methods 0.000 claims description 4
- 239000012528 membrane Substances 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 3
- 238000012360 testing method Methods 0.000 abstract description 22
- 238000009413 insulation Methods 0.000 abstract description 9
- 230000006866 deterioration Effects 0.000 abstract description 3
- 238000000034 method Methods 0.000 abstract description 3
- 230000009467 reduction Effects 0.000 abstract description 3
- 239000007921 spray Substances 0.000 abstract 2
- 230000008859 change Effects 0.000 description 10
- 238000010586 diagram Methods 0.000 description 5
- 230000000694 effects Effects 0.000 description 3
- 238000001704 evaporation Methods 0.000 description 3
- 230000008020 evaporation Effects 0.000 description 3
- 239000004743 Polypropylene Substances 0.000 description 2
- 230000003628 erosive effect Effects 0.000 description 2
- 150000002739 metals Chemical class 0.000 description 2
- 240000003473 Grevillea banksii Species 0.000 description 1
- 206010021033 Hypomenorrhoea Diseases 0.000 description 1
- 230000009471 action Effects 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- -1 polypropylene Polymers 0.000 description 1
- 229920001155 polypropylene Polymers 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 238000011076 safety test Methods 0.000 description 1
Abstract
Description
【発明の詳細な説明】
産業上の利用分野
本発明は金属化プラスチックフィルムヲ巻回してなるコ
ンテ゛ンサに関するものである。DETAILED DESCRIPTION OF THE INVENTION Field of the Invention The present invention relates to a container formed by winding a metallized plastic film.
従来の技術
一般的に金属化プラスチックフィルムの蒸着金属(金属
化電極)としてはアルミニウムまたは亜鉛が用いられて
いる。しかも、対向する二極の金属化電極はアルミニウ
ム、亜鉛等の同一金属を用いていた。BACKGROUND OF THE INVENTION Aluminum or zinc is generally used as the vapor-deposited metal (metallized electrode) for metalized plastic films. Furthermore, the two opposing metallized electrodes used the same metal, such as aluminum or zinc.
等により、エロージョンおよびエロージョンによる容量
減少や、自己回復作用の不完全性による端子相互間絶縁
抵抗の低下を招くという問題があった。There have been problems such as erosion and a decrease in capacitance due to erosion, and a decrease in insulation resistance between terminals due to incomplete self-healing action.
課題を解決するための手段
上記課題を解決するために、本発明のコンデンサは、一
方の金属化電極の材質を亜鉛とし、この金属化電極の電
極引出し側端部を他の部分より厚くし、他方の金属化電
極の材質をアルミニウムとしてなるものである。Means for Solving the Problems In order to solve the above problems, in the capacitor of the present invention, one of the metallized electrodes is made of zinc, and the end of the metallized electrode on the electrode extraction side is made thicker than the other part. The material of the other metallized electrode is aluminum.
作 用
上記手段により寿命試験の容量減少や、端子相互間絶縁
抵抗の低下が抑えられ、信頼性が向上する。Effect: The above means suppresses a decrease in capacity during a life test and a decrease in insulation resistance between terminals, thereby improving reliability.
実施例
以下本発明の実施例について添付図面を参照して説明す
る。EXAMPLES Hereinafter, examples of the present invention will be described with reference to the accompanying drawings.
第1図において、11はフィルム12に蒸着された亜鉛
蒸着膜であり、電極引出し側端部11aの膜厚を厚く(
膜抵抗値2〜1oQ/口)し残りの部分11bの膜厚を
薄く(膜抵抗値10〜60Ω/口)しである。13はフ
ィルム14に蒸着されたアルミニウム蒸着膜であり、膜
抵抗値を3010とした。In FIG. 1, reference numeral 11 denotes a zinc vapor-deposited film deposited on the film 12, and the film thickness at the electrode lead-out side end 11a is increased (
The remaining portion 11b has a thinner film thickness (membrane resistance value 10 to 60 Ω/hole). Reference numeral 13 denotes an aluminum vapor-deposited film deposited on the film 14, and the film resistance value was set to 3010.
試料としてポリプロピレン(以下PPと称す)フィルム
厚さ6μmr B OIjlの片面蒸着フィルムを用
い60μFのコンデンサを作成した。比較のたhb 7
/レミニウム、亜鉛のそれぞれの蒸着金属によるサン
プルを作成した。各蒸着金属の膜抵抗値はsQ1口とし
た。寿命試験として連続耐用試験を行った。試験条件は
oCの雰囲気を有する恒温槽内にてAC300Vを印加
し試験前(初期値)に対する容量変化率及び端子相互間
絶縁抵抗の変化を調べた。その結果を第2図、第3図に
示す。この試験結果より、初期値に対する容量変化率(
第2図参照)にて、二極の蒸着金属が7ルミニウムを用
いた試料は大きな減少を示した。また端子相互間絶縁抵
抗の変化(第3図後照)にて二極の蒸着金属が亜鉛を用
いた試料は劣化が著しいことがわかる。A 60 μF capacitor was prepared using a single-sided vapor deposited polypropylene (hereinafter referred to as PP) film having a thickness of 6 μm as a sample. comparison hb 7
/ Samples were prepared using evaporated metals of reminium and zinc. The film resistance value of each vapor-deposited metal was set to sQ1. A continuous durability test was conducted as a life test. The test conditions were to apply AC 300 V in a thermostatic chamber with an oC atmosphere, and to examine the rate of change in capacitance and the change in insulation resistance between terminals compared to before the test (initial value). The results are shown in FIGS. 2 and 3. From this test result, the rate of change in capacity relative to the initial value (
(see Figure 2), the sample in which 7-luminium was used as the vapor-deposited metal of the two electrodes showed a large decrease. In addition, it can be seen from the change in insulation resistance between terminals (refer to Figure 3) that the sample in which zinc was used as the vapor-deposited metal of the two electrodes was significantly deteriorated.
なお、亜鉛の蒸着膜のうち電極引出し側端部以外の膜抵
抗値を変化させて、前述と同一仕様のコンデンサで同じ
試験を行い、1000時間時間給縁抵抗値とtanδの
関係を第7図に示す。In addition, the same test was conducted with a capacitor having the same specifications as described above by changing the film resistance value of the zinc evaporated film other than the electrode lead-out side end, and the relationship between the supply edge resistance value and tan δ for 1000 hours is shown in Figure 7. Shown below.
第7図からもわかる様に亜鉛の蒸着膜抵抗値が低いと絶
縁抵抗値の変化に影響し、膜抵抗値がある値以上になる
とコンデンサのtanδに影響してくる。As can be seen from FIG. 7, when the resistance value of the deposited zinc film is low, it affects the change in the insulation resistance value, and when the film resistance value exceeds a certain value, it affects the tan δ of the capacitor.
次に二極の蒸着金属が共に亜鉛であるものを除く試料に
て、アルミニウム蒸着金属側の蒸M電極を複数個に分割
し安全機能を備えた保安機能付きコンデンサを作成し信
頼性試験を試みだ。第4図においてアルミニウム蒸着膜
16を分割し、分割幅mに対する電極部と金属溶射層と
の接合部幅nの比率を10%とし、誘電体構成は第1図
と同じとした。寿命試験として断続耐用試験を行った。Next, we created a capacitor with a safety function by dividing the evaporated M electrode on the aluminum evaporated metal side into multiple pieces and attempted a reliability test using samples other than those in which the evaporated metal of both electrodes was zinc. is. In FIG. 4, the aluminum vapor deposited film 16 was divided, the ratio of the width n of the joint between the electrode part and the metal sprayed layer to the division width m was set to 10%, and the dielectric structure was the same as in FIG. An intermittent durability test was conducted as a life test.
試験条件は100℃雰囲気を有する恒温槽内にてACs
soVる2秒間通電、2秒間無通電にて断続通電し、試
験前(初期値)に対する容量変化率を調べた。この結果
を第6図に示す。また第1表に保安性試験結果を示す。The test conditions were ACs in a constant temperature chamber with an atmosphere of 100℃.
Current was applied intermittently for 2 seconds at soV and no current was applied for 2 seconds, and the rate of change in capacity relative to before the test (initial value) was examined. The results are shown in FIG. Table 1 also shows the safety test results.
第 1 表
この試験結果からも、本発明の容量減少は抑えられ、保
安機能を付加しても蒸着膜の電極部と金属溶射層(以下
、メタリコンという)との非合部溶断作用が過度に発生
することがなく、保安機能と実用上のコンデンサ寿命を
両立し、長期使用に耐えうろことがわかる。Table 1 The test results also show that the capacity reduction of the present invention is suppressed, and even with the addition of the safety function, the non-joint fusing effect between the electrode part of the vapor deposited film and the metal sprayed layer (hereinafter referred to as metallicon) is excessive. It can be seen that this does not occur, and that it has both safety functions and practical capacitor life, and can withstand long-term use.
なお本実施例において二衝の蒸着金属のうち、蒸着金属
亜鉛側の電極11の電極引出し側端部の膜厚とメタリコ
ンとの電気的コンタクト性を調べた。試験としては強制
短絡充放電試験を行なった。In this example, of the two vapor-deposited metals, the film thickness of the electrode 11 on the electrode lead-out side of the zinc vapor-deposited metal and the electrical contact with the metallicon were investigated. As a test, a forced short-circuit charge/discharge test was conducted.
第6図にDC300V、50サイクル目の膜抵抗値とt
anδの関係を示す。Figure 6 shows the membrane resistance value and t at 50th cycle at DC300V.
The relationship between andδ is shown.
第6図より明らかな様に亜鉛蒸着フィルムの電極引出し
側端部の膜厚を2〜10Ω/口にすることにより、メタ
リコンの接合部強度が向上することがわかる。前記亜鉛
蒸着の膜抵抗値を20/口より低くするとフィルムが蒸
着時に熱ダメージを受け、熱変形を起こし、蒸着歩留が
低下した。このことより、2Ω/口〜1o/口が適切で
ある。As is clear from FIG. 6, it can be seen that by setting the film thickness of the zinc-deposited film at the electrode lead-out side end to 2 to 10 Ω/hole, the strength of the metallicon joint is improved. When the film resistance value of the zinc evaporation was lower than 20/port, the film was thermally damaged during the evaporation process, thermal deformation occurred, and the evaporation yield decreased. From this, 2Ω/mouth to 1o/mouth is appropriate.
発明の効果
以上のように蒸着金属アルミニウム、亜鉛のそ九ぞれ優
れた点を具備することにより、寿命試験等に於いて容量
減少及び端子相互間絶縁抵抗の劣化を抑えることができ
、長寿命、信頼性の高いコンデンサを実現できる。Effects of the Invention As described above, by having each of the superior points of vapor-deposited metal aluminum and zinc, it is possible to suppress the decrease in capacity and the deterioration of the insulation resistance between terminals in life tests, etc., resulting in a long life. , a highly reliable capacitor can be realized.
【図面の簡単な説明】
第1図Aは本発明の一実施例を示すコンデンサの展開斜
視図、第1図Bは同コンデンサの断面図、第2図は同コ
ンデンサの試験時容量変化を示す特性図、第3図は同コ
ンデンサの試験時端子相互間絶縁抵抗の変化を示す特性
図、第4図Aは本発明の他の実施例を示すコンデンサの
展開斜視図、第4図Bは同コンデンサの展開平面図、第
5図は同コンデンサの寿命試験時容量変化を示す特性図
、第6図は同コンデンサの電極引出し側端部のZn蒸着
膜抵抗値とtanδとの関係を示す特性図、第7図は同
蒸着金属亜鉛側の電極引出し側端部以外の部分の膜抵抗
値と寿命試瞼時端子相互間絶縁抵抗の変化およびtan
δの変化を示す特性図である。
11・・・・・・亜鉛蒸着膜、11a・・・・・・亜鉛
蒸着膜の電極引出し側端部、12,14・・・・・・プ
ラスチックフィルム。
Oフルミニニウム士’j’Jユニhム
ム光期品
り含
図
kn Cf′
一−−Cll?
壜辷り賃@)の橿「不i51出し俳、1止瀞1や以クト
D月1(田(口℃ソL(”/’。〕寸く[Brief Description of the Drawings] Figure 1A is an exploded perspective view of a capacitor showing an embodiment of the present invention, Figure 1B is a sectional view of the same capacitor, and Figure 2 shows the capacitance change of the same capacitor during testing. 3 is a characteristic diagram showing the change in insulation resistance between terminals during testing of the same capacitor, FIG. 4A is an exploded perspective view of a capacitor showing another embodiment of the present invention, and FIG. 4B is the same. A developed plan view of the capacitor, Figure 5 is a characteristic diagram showing the capacitance change during a life test of the same capacitor, and Figure 6 is a characteristic diagram showing the relationship between the Zn vapor deposited film resistance value and tan δ at the end of the electrode extraction side of the same capacitor. , Figure 7 shows the film resistance value of the part other than the electrode lead-out side end on the vapor-deposited metal zinc side, the change in insulation resistance between terminals during life test, and tan
FIG. 3 is a characteristic diagram showing changes in δ. 11... Zinc vapor deposited film, 11a... Electrode extraction side end of zinc vapor deposited film, 12, 14... Plastic film. O Fluminium Officer'j'J Unihmumu Light period product included diagram kn Cf' 1--Cll? Bottle rental fee @)'s ``Fi51 out haiku, 1 stop 1 and Ikuto D month 1 (田(mouth℃soL(''/'.) sunk
Claims (3)
に引出金属溶射層を設けてなり、一方の極の金属化電極
の材質を亜鉛とし、この金属化電極の電極引出し側端部
を他の部分より厚く形成し、この一方の極の金属化電極
に対向する他方の極の金属化電極の材質をアルミニウム
としたことを特徴とするコンデンサ。(1) A metallized plastic film is wound, and a lead-out metal sprayed layer is provided on the end surface of the winding. The material of the metallized electrode of one pole is zinc, and the end of the metallized electrode on the lead-out side of the other pole is made of zinc. A capacitor characterized in that the material of the metallized electrode of the other pole, which is formed thicker than the metallized electrode of the one pole and is opposed to the metallized electrode of the one pole, is made of aluminum.
の膜抵抗値を2〜10Ω/□とし、他の部分の膜抵抗値
を10〜50Ω/□としたことを特徴とする請求項1記
載のコンデンサ。(2) A claim characterized in that the metallized electrode made of zinc has a membrane resistance value of 2 to 10 Ω/□ at the electrode extraction side end, and a membrane resistance value of 10 to 50 Ω/□ in other parts. The capacitor according to item 1.
割して保安機構を備えてなる請求項1または2記載のコ
ンデンサ。(3) The capacitor according to claim 1 or 2, wherein the safety mechanism is provided by dividing a metallized electrode made of aluminum into a plurality of parts.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP29267588A JPH02138719A (en) | 1988-11-18 | 1988-11-18 | Capacitor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP29267588A JPH02138719A (en) | 1988-11-18 | 1988-11-18 | Capacitor |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH02138719A true JPH02138719A (en) | 1990-05-28 |
Family
ID=17784844
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP29267588A Pending JPH02138719A (en) | 1988-11-18 | 1988-11-18 | Capacitor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH02138719A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH04359416A (en) * | 1991-06-04 | 1992-12-11 | Shizuki Denki Seisakusho:Kk | Metal vapor deposited film capacitor |
US5424797A (en) * | 1991-06-03 | 1995-06-13 | Nikon Corporation | Flash lighting apparatus |
US5614970A (en) * | 1991-06-03 | 1997-03-25 | Nikon Corporation | Flash lighting apparatus and a camera equipped with the flash lighting apparatus |
-
1988
- 1988-11-18 JP JP29267588A patent/JPH02138719A/en active Pending
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5424797A (en) * | 1991-06-03 | 1995-06-13 | Nikon Corporation | Flash lighting apparatus |
US5614970A (en) * | 1991-06-03 | 1997-03-25 | Nikon Corporation | Flash lighting apparatus and a camera equipped with the flash lighting apparatus |
JPH04359416A (en) * | 1991-06-04 | 1992-12-11 | Shizuki Denki Seisakusho:Kk | Metal vapor deposited film capacitor |
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