JPH01215008A - Metallized film capacitor - Google Patents
Metallized film capacitorInfo
- Publication number
- JPH01215008A JPH01215008A JP4122388A JP4122388A JPH01215008A JP H01215008 A JPH01215008 A JP H01215008A JP 4122388 A JP4122388 A JP 4122388A JP 4122388 A JP4122388 A JP 4122388A JP H01215008 A JPH01215008 A JP H01215008A
- Authority
- JP
- Japan
- Prior art keywords
- deposited film
- film
- zinc
- aluminum
- onto
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000003990 capacitor Substances 0.000 title claims abstract description 16
- 239000011104 metalized film Substances 0.000 title claims description 10
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims abstract description 19
- 229910052782 aluminium Inorganic materials 0.000 claims abstract description 16
- 239000010408 film Substances 0.000 claims description 20
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 abstract description 8
- 229910052725 zinc Inorganic materials 0.000 abstract description 8
- 239000011701 zinc Substances 0.000 abstract description 8
- 229910052751 metal Inorganic materials 0.000 abstract description 4
- 239000002184 metal Substances 0.000 abstract description 4
- 229920006254 polymer film Polymers 0.000 abstract description 3
- -1 polypropylene Polymers 0.000 abstract description 3
- 239000004743 Polypropylene Substances 0.000 abstract description 2
- 230000006378 damage Effects 0.000 abstract description 2
- 229920001155 polypropylene Polymers 0.000 abstract description 2
- 239000011347 resin Substances 0.000 abstract description 2
- 229920005989 resin Polymers 0.000 abstract description 2
- 238000000151 deposition Methods 0.000 abstract 1
- 230000000052 comparative effect Effects 0.000 description 2
- 238000011038 discontinuous diafiltration by volume reduction Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 description 1
- 238000005259 measurement Methods 0.000 description 1
- 229920000139 polyethylene terephthalate Polymers 0.000 description 1
- 239000005020 polyethylene terephthalate Substances 0.000 description 1
- 238000011076 safety test Methods 0.000 description 1
- 229910052710 silicon Inorganic materials 0.000 description 1
- 239000010703 silicon Substances 0.000 description 1
- 239000000779 smoke Substances 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/14—Organic dielectrics
- H01G4/18—Organic dielectrics of synthetic material, e.g. derivatives of cellulose
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/32—Wound capacitors
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Abstract
Description
【発明の詳細な説明】 （産業上の利用分野） 本発明は金属化フィルムコ１ンデンサに関する。[Detailed description of the invention] (Industrial application field) The present invention relates to metallized film capacitors.
（Ｕ来の技術）
金属化フイルムコンデンリ゛は、保安性を向上するため
に、長手方向に所定の間隔でスリットを形成して金属を
Ｍ＠Ｌ、た金属化フィルムを用いることがある。このコ
ンテン１ノは、スリットによって蒸着された金属層が各
°々、電気的に独立となるため、一箇所でセルフヒーリ
ングが生じ破損しても長手方向には波及せず、保安性が
向上する。特に、蒸着する金属がアルミの方が！Ｉｌｉ
鉛よりもより優れた保安性を示す。(Urban Technology) In order to improve safety, metallized film condensers sometimes use a metallized film in which slits are formed at predetermined intervals in the longitudinal direction and metal is added to the film. In this Content 1, each metal layer deposited by the slit becomes electrically independent, so even if self-healing occurs in one location and breaks, it does not spread in the longitudinal direction, improving safety. . Especially when the metal to be vapor-deposited is aluminum! Ili
Shows better safety than lead.
（発明が解決しようとす委課題）
しかし、アルミ蒸着フィルムを用いたコンデンサは亜鉛
蒸着フィルムを用いたそれに比べて容量減少が大きい欠
点があった。(Problem to be Solved by the Invention) However, a capacitor using an aluminum vapor-deposited film has a drawback that the capacitance is greatly reduced compared to a capacitor using a zinc-evaporated film.
本発明の目的は、以上の欠点を改良し、保安性の優れた
かつ容Φ減少の少ない金属化フィルムコンデンサを提供
するものである。An object of the present invention is to improve the above-mentioned drawbacks and provide a metallized film capacitor with excellent safety and less decrease in capacity Φ.
（課題が解決しようとする問題点）
本発明は、上記の目的を達成するために、長手方向に所
定間隔でスリットを設けたアルミ蒸着フィルムと、亜鉛
蒸着フィルムとを積層し巻回して端面にメタリコンを形
成したコンデンサ素子を有する金属化フィルムコンデン
サを提供するものである。(Problems to be Solved) In order to achieve the above object, the present invention has an aluminum vapor deposited film provided with slits at predetermined intervals in the longitudinal direction, and a zinc vapor deposited film, which are laminated and wound to form an end face. A metallized film capacitor having a capacitor element formed with metallized silicon is provided.
（作用）
本発明によれば、一方のアルミＭ着フィルｌえにスリッ
トを形成して保安性をもたせているために、セルフヒー
リング等による破壊を減少でき、かつ他方の亜鉛蒸着フ
ｆルムにより容量減少を軽減できる。(Function) According to the present invention, since slits are formed in one aluminum M-coated film to provide security, destruction due to self-healing etc. can be reduced, and the other zinc-deposited film Capacity reduction can be reduced.
（実施例） 以下、本発明を実施例に基づいて説明する。(Example) Hereinafter, the present invention will be explained based on examples.
第１図及び第２図において、１は、アルミ蒸着フィルム
であり、ポリプロピレンフィルム等の高分”ｆフィルム
２にアルミをＭ［してアルミ金属層３を形成したもので
、長手方向の所定間隔にスリット４が設ｃ）られている
。５は、１ＩＩｉ鉛蒸着フィルムであり、高分子フィル
ム６にＩｌｉ ｔ！ＸｉがＷ＆着され亜鉛金属層７が形
メ火されている。そしてアルミ蒸着フィルｌ−，１と！
Ｉｌｉ ｇｋ Ｍ着フィルム５とは各々に設けられたマ
ージン８及び９とをｎいに反対側にして積層されて巻回
されコンデンサ素子が形成されている。コンデンサ素子
１０は、第３図に示ず通り、端面にメタリコン１１が形
成されリード端子１２が接続されケース１３中に゛収納
され、樹脂１４封正されている。1 and 2, reference numeral 1 is an aluminum vapor-deposited film, in which an aluminum metal layer 3 is formed by applying aluminum to a high-density film 2 such as a polypropylene film at predetermined intervals in the longitudinal direction. A slit 4 is provided in c). 5 is a 1IIi lead vapor-deposited film, and a polymer film 6 is coated with Ilit! l-,1!
The Ili gk M-bound film 5 is laminated and wound with margins 8 and 9 provided on each side facing away from each other to form a capacitor element. As shown in FIG. 3, the capacitor element 10 has a metallic contact 11 formed on its end face, a lead terminal 12 connected thereto, and is housed in a case 13 and sealed with a resin 14.
アルミ蒸着フィルム１のスリット４は、アルミ金属層３
の所定間隔で電極を接触し電流を流して蒸発して形成す
る。The slit 4 of the aluminum vapor-deposited film 1 is formed by the aluminum metal layer 3.
It is formed by contacting electrodes at predetermined intervals and applying a current to evaporate.
次に、厚さ５μｍ、幅５０市のポリエチレンテレフタレ
ートを用い、＋ｈ １ ｒｕｎのスリットを８Ｍ間隔で
形成したアルミ蒸着フィルムを用いた定格２００Ｖ、３
０μＦの金属化フィルムコンデンサにつき、保安性合格
率及び容量減少率を従来例及び比較例とともに測定した
ところ表の通りの結果が御られた。測定は温ＩＩＩ ６
０℃の雰囲気中に電圧２５０ｖ印加して１０００１１ｒ
放置後に行なう。保安性合格率はさらにＪ ｌ５−Ｃ４
９（Ｌ８の８−１５−２により保安性試験を行なった後
に外観に亀裂や発煙・発火のないものを合格として判定
した。Next, using polyethylene terephthalate with a thickness of 5 μm and a width of 50 mm, an aluminum vapor-deposited film with +h 1 run slits formed at 8M intervals was used.
The safety pass rate and capacity reduction rate of 0 μF metallized film capacitors were measured along with conventional examples and comparative examples, and the results shown in the table were obtained. Measurement is warm III 6
100011r by applying a voltage of 250v in an atmosphere at 0℃
Do this after leaving it alone. The safety pass rate is J l5-C4
After conducting the safety test according to 8-15-2 of 9 (L8), those with no cracks, smoke, or ignition in their appearance were judged to have passed.
表
表から明らかな通り、本発明によれば、保安性合格率及
び容か減少率の両者が従来例１及び２並びに比較例に比
べて優れている。As is clear from the table, according to the present invention, both the safety pass rate and the volume reduction rate are superior to Conventional Examples 1 and 2 and Comparative Example.
（発明の効果）
以上の通り、本発明によればアルミ蒸着フィルムの方に
スリットを形成し、他方を畦ＩＩｆ１蒸着フィルムとす
ることにより、保安性及び容社減少量の優れた金属化フ
ィルムコンデンサが得られる。(Effects of the Invention) As described above, according to the present invention, by forming slits on one side of the aluminum vapor-deposited film and using the ridge IIf1 vapor-deposited film on the other side, a metallized film capacitor with excellent safety and reduced volume loss can be achieved. is obtained.
第１図及び第２図は本発明実施例の各々長手方向の断面
図及び艮■方自と直角方向の断面図の一部、第３図は本
発明実施例の断面図を示す。
１・・・アルミ蒸着フィルム、 ３・・・アルミ金属層
、４・・・スリット、 ５・・・亜鉛蒸着フィルム、７
・・・ｉｌｌ！鉛金属層、 １０・・・コンデンサ素子
、１１・・・メタリコン。
特許出願人 ｌ］立コンデンサ株式会社第１図
第２図
第３図1 and 2 show a longitudinal cross-sectional view and a part of a cross-sectional view in a direction perpendicular to the device, respectively, of an embodiment of the present invention, and FIG. 3 shows a cross-sectional view of the embodiment of the present invention. DESCRIPTION OF SYMBOLS 1... Aluminum vapor deposited film, 3... Aluminum metal layer, 4... Slit, 5... Zinc vapor deposited film, 7
...ill! Lead metal layer, 10... Capacitor element, 11... Metallicon. Patent applicant l] Tachi Capacitor Co., Ltd. Figure 1
Figure 2 Figure 3
Claims (1)
着フィルムと、亜鉛蒸着フィルムとを積層し巻回して端
面にメタリコンを形成したコンデンサ素子を有する金属
化フィルムコンデンサ。(1) A metallized film capacitor having a capacitor element in which an aluminum vapor-deposited film with slits provided at predetermined intervals in the longitudinal direction and a zinc-vapor-deposited film are laminated and wound to form a metallized film on the end face.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4122388A JPH01215008A (en) | 1988-02-24 | 1988-02-24 | Metallized film capacitor |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4122388A JPH01215008A (en) | 1988-02-24 | 1988-02-24 | Metallized film capacitor |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01215008A true JPH01215008A (en) | 1989-08-29 |
Family
ID=12602401
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP4122388A Pending JPH01215008A (en) | 1988-02-24 | 1988-02-24 | Metallized film capacitor |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01215008A (en) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03104719U (en) * | 1990-02-09 | 1991-10-30 | ||
| US7660099B2 (en) * | 2006-09-19 | 2010-02-09 | Panasonic Corporation | Case molded capacitor |
| US20100091425A1 (en) * | 2006-12-22 | 2010-04-15 | Panasonic Corporation | Electronic component and method for producing the same |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6348815A (en) * | 1986-08-19 | 1988-03-01 | 株式会社 指月電機製作所 | Metallized film capacitor |
-
1988
- 1988-02-24 JP JP4122388A patent/JPH01215008A/en active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6348815A (en) * | 1986-08-19 | 1988-03-01 | 株式会社 指月電機製作所 | Metallized film capacitor |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03104719U (en) * | 1990-02-09 | 1991-10-30 | ||
| US7660099B2 (en) * | 2006-09-19 | 2010-02-09 | Panasonic Corporation | Case molded capacitor |
| US20100091425A1 (en) * | 2006-12-22 | 2010-04-15 | Panasonic Corporation | Electronic component and method for producing the same |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US3457478A (en) | Wound film capacitors | |
| JPH01215008A (en) | Metallized film capacitor | |
| US2728036A (en) | Electric condensers | |
| US3522498A (en) | Combination capacitor having a marginless metallized dielectric strip and a foil electrode | |
| US2891204A (en) | Metallized electrical capacitor | |
| JPH08288171A (en) | Metallized film capacitor | |
| JPS6127173Y2 (en) | ||
| JPH0121542Y2 (en) | ||
| JPS6127165Y2 (en) | ||
| JPH05135996A (en) | Series deposited metallized film capacitor | |
| JPH0227553Y2 (en) | ||
| JP2562159Y2 (en) | Metallized film capacitors | |
| JPS6336671Y2 (en) | ||
| JPS6331386Y2 (en) | ||
| JPH0143852Y2 (en) | ||
| JPS6336675Y2 (en) | ||
| JPH0215312Y2 (en) | ||
| JPS6128210B2 (en) | ||
| US3015051A (en) | Electrical capacitor | |
| JPH0227552Y2 (en) | ||
| JPS645871Y2 (en) | ||
| JPH0442908Y2 (en) | ||
| GB1390134A (en) | Roll-type capacitor | |
| JPS5823732B2 (en) | capacitor | |
| JPH02905Y2 (en) |