JPH0121544Y2 - - Google Patents
Info
- Publication number
- JPH0121544Y2 JPH0121544Y2 JP1982191060U JP19106082U JPH0121544Y2 JP H0121544 Y2 JPH0121544 Y2 JP H0121544Y2 JP 1982191060 U JP1982191060 U JP 1982191060U JP 19106082 U JP19106082 U JP 19106082U JP H0121544 Y2 JPH0121544 Y2 JP H0121544Y2
- Authority
- JP
- Japan
- Prior art keywords
- film
- metallized
- electrode
- polyethylene terephthalate
- capacitor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
Links
- 239000010408 film Substances 0.000 claims description 50
- 239000003990 capacitor Substances 0.000 claims description 35
- 239000011104 metalized film Substances 0.000 claims description 28
- -1 polyethylene terephthalate Polymers 0.000 claims description 23
- 239000002184 metal Substances 0.000 claims description 15
- 229910052751 metal Inorganic materials 0.000 claims description 15
- 239000004743 Polypropylene Substances 0.000 claims description 13
- 229920001155 polypropylene Polymers 0.000 claims description 13
- 239000005020 polyethylene terephthalate Substances 0.000 claims description 10
- 229920000139 polyethylene terephthalate Polymers 0.000 claims description 10
- 229920000134 Metallised film Polymers 0.000 claims description 8
- 238000009413 insulation Methods 0.000 claims description 6
- 238000005507 spraying Methods 0.000 claims description 4
- 239000011347 resin Substances 0.000 claims description 3
- 229920005989 resin Polymers 0.000 claims description 3
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical group [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims 1
- 238000010438 heat treatment Methods 0.000 description 6
- 230000008020 evaporation Effects 0.000 description 5
- 238000001704 evaporation Methods 0.000 description 5
- 229910052782 aluminium Inorganic materials 0.000 description 3
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 3
- 230000007547 defect Effects 0.000 description 3
- 238000010586 diagram Methods 0.000 description 3
- 238000007740 vapor deposition Methods 0.000 description 3
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 2
- 230000015556 catabolic process Effects 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 238000004804 winding Methods 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- 239000011701 zinc Substances 0.000 description 2
- 239000004793 Polystyrene Substances 0.000 description 1
- 230000006378 damage Effects 0.000 description 1
- 230000006866 deterioration Effects 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000000605 extraction Methods 0.000 description 1
- 230000000977 initiatory effect Effects 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000873 masking effect Effects 0.000 description 1
- 238000001465 metallisation Methods 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 229920003023 plastic Polymers 0.000 description 1
- 239000004033 plastic Substances 0.000 description 1
- 229920006289 polycarbonate film Polymers 0.000 description 1
- 229920002223 polystyrene Polymers 0.000 description 1
- 239000000779 smoke Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
Landscapes
- Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
Description
本考案は乾式金属化フイルムコンデンサの改良
に関するもので、安全性の極めて高い乾式金属化
フイルムコンデンサを提供するものである。
従来、乾式金属化フイルムコンデンサはポリプ
ロピレンフイルム、ポリエチレンテレフタレート
フイルム、ポリカーボネートフイルム、ポリスチ
レンフイルムなどのプラスチツク誘電体フイルム
にアルミニウム、亜鉛などの金属を上記誘電体フ
イルムの幅方向の端部に絶縁マージン部を設けて
0.02〜0.03μm厚みに真空蒸着した金属化フイルム
を上記絶縁マージン部が反対側にあるように重ね
て巻回してコンデンサ素子を形成し、該コンデン
サ素子の両端面に半田、亜鉛などの金属を溶射
し、コンタクト層を形成して得られた電極引出部
にリード線または端子を接続し、ケースに収納し
た後封口して乾式金属化フイルムコンデンサが構
成されていた。
このように構成された乾式金属化フイルムコン
デンサは、誘電体フイルム内に含まれる絶縁欠陥
または金属蒸着時に形成される絶縁欠陥が原因
で、課電試験時フイルムが部分的破壊を起こすこ
とがある。ところが電極は上述のような真空蒸着
による極めて薄い蒸着膜であるために、この部分
的破壊時のエネルギーで蒸着金属層の飛散が可能
で一般的には絶縁回復して引続いてコンデンサは
使用可能となる。しかし初期の段階において金属
化フイルムの劣化は無視できる程度であるが、一
部の破壊部分を核として、該破壊は少しづつ進行
し、遂には発火発煙に至る危険を有していた。
このような欠点を改良するために第1図に示
し、かつ特開昭57−114219号公報で公知のように
誘電体フイルムの少なくとも片面に幅方向の端部
に絶縁マージン部2を設けて電極3を形成すると
ともに、その電極3を誘電体フイルムの長さ方向
に複数個の島状に分離するように構成溝4を設け
た金属化フイルム1を巻回し、その両端面に電極
引出部5を形成した金属化フイルムコンデンサが
示されている。
しかし、自己保安機能を得るためには上記絶縁
溝4の間隔Pを極力小さくする必要があり、この
ために絶縁溝4による容量損失が大きくなる欠点
を有していた。またコンデンサ容量が大きいとき
は自己発熱も大きくなるために熱的原因による破
壊が急激に起こる危険があつた。
さらにこれら改善のために特開昭57−20421号
公報、特開昭57−136312号公報に示されるように
金属浴射端部に蒸着膜厚の薄い部分を設けこの部
分で蒸着膜飛散させる方法があるが、これらはい
ずれも蒸着時に補助マスキングテープを用いて部
分的に蒸着膜を薄くしており、このような金属化
フイルムを製造するために設備が複雑になり製造
が容易でなく、またこのような蒸着金属を長期保
存したとき、この条件によつては高膜抵抗部に経
時変化を起こしやすく品質的な安定性が欠ける欠
点があつた。
本考案はこのような欠点を改善し構造が簡素で
自己保安機能を有し、かつ品質的に安定度が高く
生産性の良い乾式金属化フイルムコンデンサを提
供するものである。
以下、本考案を第2図〜第5図に示す実施例に
ついて説明する。
誘電体フイルムすなわち、ポリエチレンテレフ
タレートフイルムとポリプロピレンフイルムの幅
方向の一端に絶縁マージン部2を設けて電極3
a,3bを設けた金属化ポリエチレンテレフタレ
ートフイルム1aと金属化ポリプロピレンフイル
ム1bを形成し、金属化ポリエチレンテレフタレ
ートフイルム1aの電極3aを該フイルムの長さ
方向に絶縁溝4aを設け、この金属化ポリエチレ
ンテレフタレートフイルム1aと金属化ポリプロ
ピレンフイルム1bを絶縁マージン部2が反対側
になるように重ねて巻回してコンデンサ素子6を
形成し、金属溶射によりコンタクト層を形成して
得られた電極引出部5に端子またはリード線と接
続した後、樹脂によつて外装して金属化フイルム
コンデンサを構成するのであるが、特に上記コン
タクト層を形成後に適当な条件で大気中で熱処理
を行なえば、第3図に示すように金属化ポリプロ
ピレンフイルム1bの絶縁マージン部2端部2′
付近で、金属化ポリエチレンテレフタレートフイ
ルム1aの蒸着金属飛散が起こり易い弱点部3
a′が形成され、第4図に示すように誘電体フイル
ムの部分破壊時に弱点部3a′が飛散して、その部
分の電極3aを切離すので、自己保安機能を著し
く安定化せしめ、さらに金属化フイルムの熱的収
縮により容量減少の少ない生産性の高い乾式金属
化フイルムコンデンサを得ることができた。
次に上記の実施例をさらに詳細に説明する。
アルミニウム蒸着膜抵抗値6Ω/口、厚さ6μm
の金属化ポリエチレンテレフタレートフイルム1
aに絶縁溝4aを間隔P=20mmで設け、これとア
ルミニウム蒸着膜抵抗値6Ω/口、厚さ5μmの金
属化ポリプロピレンフイルム1bを絶縁マージン
部2が反対側になるように重ねて巻回して静電容
量20μFのコンデンサ素子を形成し、金属溶射に
よつてコンタクト層を形成した後、大気中で種々
の温度で熱処理を行つた後端子を接続して樹脂外
装した。この試料について初期特性測定後に強制
的にコンデンサを破壊させ、自己保安機能試験を
実施した。
この結果を下表に示す。
The present invention relates to an improvement of a dry metallized film capacitor, and provides an extremely safe dry metallized film capacitor. Conventionally, dry metallized film capacitors are made of a plastic dielectric film such as polypropylene film, polyethylene terephthalate film, polycarbonate film, or polystyrene film, and a metal such as aluminum or zinc is provided at the widthwise end of the dielectric film with an insulating margin. hand
A capacitor element is formed by stacking vacuum-deposited metallized films to a thickness of 0.02 to 0.03 μm so that the insulation margins are on the opposite side, and spraying metals such as solder and zinc on both end faces of the capacitor element. Then, lead wires or terminals were connected to the electrode lead-out portions obtained by forming the contact layer, and the capacitor was housed in a case and then sealed to form a dry metallized film capacitor. In a dry metallized film capacitor constructed in this manner, the film may partially break during a current test due to insulation defects contained within the dielectric film or insulation defects formed during metal deposition. However, since the electrode is an extremely thin vacuum-deposited film as mentioned above, the energy from this partial breakdown can scatter the deposited metal layer, and generally the insulation is restored and the capacitor can be used again. becomes. However, although the deterioration of the metallized film is negligible at the initial stage, the destruction progresses little by little, with some destroyed parts as the core, and there is a danger that it will eventually catch fire and smoke. In order to improve such defects, as shown in FIG. 1 and known in Japanese Patent Application Laid-Open No. 57-114219, an insulating margin portion 2 is provided at the end in the width direction on at least one side of the dielectric film to form an electrode. A metallized film 1 is wound around a metallized film 1 provided with structural grooves 4 so as to separate the electrode 3 into a plurality of islands in the length direction of the dielectric film. A metallized film capacitor is shown. However, in order to obtain a self-safety function, it is necessary to make the interval P between the insulating grooves 4 as small as possible, which has the disadvantage that the capacitance loss due to the insulating grooves 4 becomes large. Furthermore, when the capacitor capacity is large, self-heating also increases, so there is a risk of rapid breakdown due to thermal causes. Furthermore, in order to improve these, as shown in Japanese Patent Laid-Open No. 57-20421 and Japanese Patent Laid-Open No. 57-136312, a thin part of the deposited film is provided at the end of the metal irradiation, and the deposited film is scattered at this part. However, in all of these methods, auxiliary masking tape is used during vapor deposition to partially thin the vapor deposited film, which requires complicated equipment and is difficult to manufacture. When such a vapor-deposited metal is stored for a long period of time, depending on the conditions, the high film resistance portion tends to change over time, resulting in a lack of quality stability. The present invention improves these drawbacks and provides a dry metallized film capacitor which has a simple structure, has a self-protection function, is highly stable in quality, and has good productivity. The present invention will be described below with reference to embodiments shown in FIGS. 2 to 5. An insulating margin portion 2 is provided at one end in the width direction of a dielectric film, that is, a polyethylene terephthalate film and a polypropylene film, and an electrode 3 is formed.
A metallized polyethylene terephthalate film 1a and a metallized polypropylene film 1b are formed, and an insulating groove 4a is provided in the length direction of the film to connect the electrode 3a of the metallized polyethylene terephthalate film 1a. A capacitor element 6 is formed by stacking and winding the film 1a and the metallized polypropylene film 1b so that the insulating margin part 2 is on the opposite side, and a contact layer is formed by metal spraying, and a terminal is attached to the obtained electrode lead part 5. Alternatively, after connecting with the lead wires, the metallized film capacitor is constructed by sheathing with resin. In particular, if heat treatment is performed in the atmosphere under appropriate conditions after forming the contact layer, as shown in Fig. 3. Insulating margin portion 2 end portion 2' of metallized polypropylene film 1b
A weak point 3 in the vicinity of which vapor-deposited metal scattering of the metallized polyethylene terephthalate film 1a is likely to occur.
a' is formed, and as shown in FIG. 4, when the dielectric film is partially destroyed, the weak point 3a' scatters and separates the electrode 3a at that part, which significantly stabilizes the self-safety function and further improves the By thermal shrinkage of the metallized film, we were able to obtain a highly productive dry-type metallized film capacitor with little capacity loss. Next, the above embodiment will be explained in more detail. Aluminum vapor deposited film resistance value 6Ω/hole, thickness 6μm
Metallized polyethylene terephthalate film 1
Insulating grooves 4a are provided at intervals P=20 mm in a, and this and a metallized polypropylene film 1b with an aluminum vapor-deposited film resistance of 6 Ω/hole and a thickness of 5 μm are stacked and wound so that the insulating margin portion 2 is on the opposite side. A capacitor element with a capacitance of 20 μF was formed, a contact layer was formed by metal spraying, and after heat treatment at various temperatures in the atmosphere, terminals were connected and resin exterior was applied. After measuring the initial characteristics of this sample, the capacitor was forcibly destroyed and a self-safety function test was conducted. The results are shown in the table below.
【表】
この結果より明らかなように熱処理温度を100
℃以上とすることによつて良好な自己保安機能を
得ることができるが、一方、この処理温度が高く
なると初期特性としてのtanδが高くなり好ましく
ない。従つて初期特性が良好で、かつ自己保安機
能を得るために100〜120℃で熱処理するのがよ
い。
以上はポリエチレンテレフタレートフイルムの
幅方向の端部に絶縁マージン部を設けて電極を形
成するとともに、その電極をポリエチレンテレフ
タレートフイルムの長さ方向に複数本の絶縁溝を
設けて電極を複数個に完全に分割した金属化フイ
ルムについて実験を行なつたが、この他第5図に
示すように金属化ポリエチレンテレフタレートフ
イルム1aの金属溶射側蒸着電極を長さ方向に一
部細幅に残して絶縁溝4aを設け、複数個の蒸着
電極が残された細幅の蒸着電極で互いに連結され
たものについても誘電体が部分的破壊時に生ず一
部細幅に存在する蒸着金属を飛散して蒸着電極を
幅方向に複数個に完全に分割した場合と同様にな
り、その後金属化ポリプロピレンフイルム1bの
絶縁マージン2端部2′付近で金属化ポリエチレ
ンテレフタレートフイルム1aの蒸着金属の飛散
が起こるために同様な結果が得られた。
また上記のように絶縁溝4aを設けた金属化ポ
リエチレンテレフタレートフイルム1aを巻回し
て得たコンデンサの自己保安機能は第4図に示す
ように、対向する金属化ポリプロピレンフイルム
1bの絶縁マージン部2の端部2′付近で蒸着電
極3aの弱点部3a′の長さ方向飛散によつて得ら
れているために、金属化フイルム1の金属溶射側
端部と対向する金属化ポリプロピレンフイルム1
bの絶縁マージン部2の端部2′との間の距離L
が0.1mm以上であれば上記のような効果を出すこ
とができるが、この距離Lが長すぎると蒸着電極
と溶射金属の接触が悪くなり、信頼性への影響が
出るために好ましくない。従つて上記の距離Lは
0.1〜2.0mmが好ましい。
なお、上記の加熱処理は大気中で実施したが、
これを真空中で実施しても熱的挙動は変らないた
めに同様の効果がある。
叙上のように本考案の乾式金属化フイルムコン
デンサは、乾式で極めて安全性の高い自己保安機
能を有し、信頼性が高くかつ生産性のよいコンデ
ンサが得られ、実用的価値の極めて大きいもので
ある。[Table] As is clear from this result, the heat treatment temperature was
A good self-protection function can be obtained by setting the temperature to .degree. C. or above, but on the other hand, if the treatment temperature is increased, tan .delta. as an initial characteristic becomes high, which is not preferable. Therefore, in order to obtain good initial properties and self-protection function, it is preferable to heat treat at 100 to 120°C. In the above method, an insulating margin is provided at the end of the polyethylene terephthalate film in the width direction to form an electrode, and a plurality of insulating grooves are provided in the length direction of the polyethylene terephthalate film to completely form the electrode into multiple pieces. The experiment was carried out on the divided metallized film. In addition, as shown in FIG. 5, the metal sprayed side vapor deposited electrode of the metallized polyethylene terephthalate film 1a was partially left narrow in the length direction, and an insulating groove 4a was formed. Even in the case where multiple evaporation electrodes are connected to each other with a narrow evaporation electrode left behind, the dielectric material is not generated when a part of the evaporation electrode is partially broken, and the evaporation metal existing in a narrow width is scattered and the evaporation electrode becomes wider. The result is the same as when the metallized polypropylene film 1b is completely divided into a plurality of pieces, and then the vapor-deposited metal of the metallized polyethylene terephthalate film 1a is scattered near the end portion 2' of the insulation margin 2 of the metallized polypropylene film 1b, resulting in a similar result. Obtained. Furthermore, the self-safety function of the capacitor obtained by winding the metallized polyethylene terephthalate film 1a provided with the insulating grooves 4a as described above is as shown in FIG. Since this is obtained by scattering in the longitudinal direction of the weak point 3a' of the vapor deposition electrode 3a near the end 2', the metallized polypropylene film 1 facing the metal sprayed side end of the metallized film 1
Distance L between b and end 2' of insulating margin part 2
If L is 0.1 mm or more, the above effects can be obtained, but if this distance L is too long, the contact between the vapor deposition electrode and the sprayed metal will deteriorate, which will affect reliability, which is not preferable. Therefore, the above distance L is
0.1 to 2.0 mm is preferred. Note that the above heat treatment was carried out in the atmosphere, but
Even if this is carried out in a vacuum, the thermal behavior remains unchanged and the same effect is obtained. As mentioned above, the dry-type metallized film capacitor of the present invention is dry-type, has an extremely safe self-protection function, provides a highly reliable and highly productive capacitor, and has extremely high practical value. It is.
第1図は従来の乾式金属化フイルムコンデンサ
の要部展開斜視図、第2図は本考案の乾式金属化
フイルムコンデンサの一実施例の電極配置要部の
説明図、第3図は本考案の熱処理して構成された
乾式金属化フイルムコンデンサの電極配置要部の
説明図、第4図イは本考案の自己保安機能が作動
した乾式フイルムコンデンサの電極配置要部の説
明図、ロはイのA−A′切断平面図、第5図は本
考案の乾式金属化フイルムコンデンサの他の実施
例の要部展開斜視図である。
1a……金属化ポリエチレンテレフタレートフ
イルム、1b……金属化ポリプロピレンフイル
ム、2……絶縁マージン部、3,3a,3b……
電極、4,4a……絶縁溝、5……電極引出部、
6……コンデンサ素子。
Figure 1 is an exploded perspective view of the main parts of a conventional dry-type metallized film capacitor, Figure 2 is an explanatory diagram of the main part of the electrode arrangement of an embodiment of the dry-type metallized film capacitor of the present invention, and Figure 3 is an explanatory diagram of the main part of the electrode arrangement of the dry-type metallized film capacitor of the present invention. Figure 4A is an explanatory diagram of the main part of the electrode arrangement of a dry-type metallized film capacitor constructed by heat treatment. FIG. 5 is an exploded perspective view of a main part of another embodiment of the dry metallized film capacitor of the present invention. 1a...Metalized polyethylene terephthalate film, 1b...Metalized polypropylene film, 2...Insulating margin portion, 3, 3a, 3b...
Electrode, 4, 4a... Insulating groove, 5... Electrode extraction part,
6...Capacitor element.
Claims (1)
ン部を設けて電極を形成した金属化フイルム
を、上記絶縁マージン部が反対側になるように
重ねて巻回し両端面に電極引出部を形成したコ
ンデンサ素子を外装してなる乾式金属化フイル
ムコンデンサにおいて、ポリエチレンテレフタ
レートフイルムに蒸着した電極をポリエチレン
テレフタレートフイルムの長さ方向に複数本の
絶縁溝を設けた金属化ポリエチレンテレフタレ
ートフイルムと、ポリプロピレンフイルムに蒸
着した電極を設けた金属化ポリプロピレンフイ
ルムとを重ねて巻回し両端面に電極引出部を形
成して大気中または真空中で加熱処理したコン
デンサ素子と、上記電極引出部に接続した端子
またはリード線と、上記コンデンサ素子を外装
する樹脂とを備えたことを特徴とする乾式金属
化フイルムコンデンサ。 (2) 上記絶縁溝は電極をポリエチレンテレフタレ
ートフイルムの長さ方向に複数個の島状に分離
するように構成したことを特徴とする実用新案
登録請求の範囲第1項記載の乾式金属化フイル
ムコンデンサ。 (3) 上記絶縁溝は電極を金属溶射側の一部を細幅
に残してポリエチレンテレフタレートフイルム
の長さ方向に複数個に分離するように構成した
ことを特徴とする実用新案登録請求の範囲第1
項記載の乾式金属化フイルムコンデンサ。 (4) 上記金属化ポリエチレンテレフタレートフイ
ルムの金属溶射側端部と、対向する金属化ポリ
プロピレンフイルムの絶縁マージン側端部との
間の距離Lを0.1〜2.0mmの範囲内になるよう構
成したことを特徴とする実用新案登録請求の範
囲第2項または第3項記載の乾式金属化フイル
ムコンデンサ。[Claims for Utility Model Registration] (1) A metallized film in which an electrode is formed by providing an insulating margin at the end of the dielectric film in the width direction is rolled in a stacked manner so that the insulating margin is on the opposite side. In a dry-type metallized film capacitor that is made up of an exterior capacitor element with electrode extensions formed on both end faces, the electrodes are vapor-deposited on a polyethylene terephthalate film and metallized with multiple insulating grooves in the length direction of the polyethylene terephthalate film. A capacitor element in which a polyethylene terephthalate film and a metallized polypropylene film having electrodes deposited on the polypropylene film are layered and wound, electrode extensions are formed on both end faces, and heat-treated in air or vacuum, and the electrode extensions are A dry metallized film capacitor comprising: a terminal or lead wire connected to the capacitor element; and a resin sheathing the capacitor element. (2) The dry metallized film capacitor according to claim 1, wherein the insulating groove is configured to separate the electrode into a plurality of islands in the length direction of the polyethylene terephthalate film. . (3) The above-mentioned insulating groove is configured to separate the electrode into a plurality of pieces in the length direction of the polyethylene terephthalate film, leaving a part of the electrode on the metal spraying side narrow. 1
Dry metallized film capacitors as described in . (4) The distance L between the metal sprayed end of the metallized polyethylene terephthalate film and the insulation margin end of the opposing metallized polypropylene film is within the range of 0.1 to 2.0 mm. A dry metallized film capacitor according to claim 2 or 3 of the utility model registration claim.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19106082U JPS5995620U (en) | 1982-12-16 | 1982-12-16 | dry metallized film capacitor |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP19106082U JPS5995620U (en) | 1982-12-16 | 1982-12-16 | dry metallized film capacitor |
Publications (2)
Publication Number | Publication Date |
---|---|
JPS5995620U JPS5995620U (en) | 1984-06-28 |
JPH0121544Y2 true JPH0121544Y2 (en) | 1989-06-27 |
Family
ID=30411525
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP19106082U Granted JPS5995620U (en) | 1982-12-16 | 1982-12-16 | dry metallized film capacitor |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPS5995620U (en) |
Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51119962A (en) * | 1975-04-11 | 1976-10-20 | Matsushita Electric Ind Co Ltd | Method of making capacitors |
JPS5220258A (en) * | 1975-08-08 | 1977-02-16 | Matsushita Electric Ind Co Ltd | Method of manufacturing metallized film capacitor |
JPS5228221A (en) * | 1975-08-28 | 1977-03-03 | Toshiba Corp | Power supply unit |
JPS55150219A (en) * | 1979-05-10 | 1980-11-22 | Matsushita Electric Ind Co Ltd | Method of fabricating metallized film capacitor |
JPS5623880U (en) * | 1979-07-26 | 1981-03-04 | ||
JPS5739519A (en) * | 1980-08-21 | 1982-03-04 | Matsushita Electric Ind Co Ltd | Laminated metallized film capacitor |
JPS5785216A (en) * | 1980-11-18 | 1982-05-27 | Matsushita Electric Ind Co Ltd | Method of producing dry metallized polypropylene film condenser |
JPS57114219A (en) * | 1981-01-07 | 1982-07-16 | Matsushita Electric Ind Co Ltd | Metallized film capacitor |
JPS57115808A (en) * | 1981-01-09 | 1982-07-19 | Matsushita Electric Ind Co Ltd | Metallized film capacitor |
JPS57117226A (en) * | 1981-01-14 | 1982-07-21 | Matsushita Electric Ind Co Ltd | Metallized film capacitor |
JPS57133618A (en) * | 1981-02-10 | 1982-08-18 | Matsushita Electric Ind Co Ltd | Metallized film capacitor |
JPS57133621A (en) * | 1981-02-10 | 1982-08-18 | Matsushita Electric Ind Co Ltd | Metallized film capacitor |
JPS57154823A (en) * | 1981-03-19 | 1982-09-24 | Matsushita Electric Ind Co Ltd | Metallized film capacitor |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS5623880Y2 (en) * | 1973-09-25 | 1981-06-04 | ||
JPS549341U (en) * | 1977-06-22 | 1979-01-22 | ||
JPS5991719U (en) * | 1982-12-10 | 1984-06-21 | ニチコン株式会社 | dry metallized film capacitor |
-
1982
- 1982-12-16 JP JP19106082U patent/JPS5995620U/en active Granted
Patent Citations (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS51119962A (en) * | 1975-04-11 | 1976-10-20 | Matsushita Electric Ind Co Ltd | Method of making capacitors |
JPS5220258A (en) * | 1975-08-08 | 1977-02-16 | Matsushita Electric Ind Co Ltd | Method of manufacturing metallized film capacitor |
JPS5228221A (en) * | 1975-08-28 | 1977-03-03 | Toshiba Corp | Power supply unit |
JPS55150219A (en) * | 1979-05-10 | 1980-11-22 | Matsushita Electric Ind Co Ltd | Method of fabricating metallized film capacitor |
JPS5623880U (en) * | 1979-07-26 | 1981-03-04 | ||
JPS5739519A (en) * | 1980-08-21 | 1982-03-04 | Matsushita Electric Ind Co Ltd | Laminated metallized film capacitor |
JPS5785216A (en) * | 1980-11-18 | 1982-05-27 | Matsushita Electric Ind Co Ltd | Method of producing dry metallized polypropylene film condenser |
JPS57114219A (en) * | 1981-01-07 | 1982-07-16 | Matsushita Electric Ind Co Ltd | Metallized film capacitor |
JPS57115808A (en) * | 1981-01-09 | 1982-07-19 | Matsushita Electric Ind Co Ltd | Metallized film capacitor |
JPS57117226A (en) * | 1981-01-14 | 1982-07-21 | Matsushita Electric Ind Co Ltd | Metallized film capacitor |
JPS57133618A (en) * | 1981-02-10 | 1982-08-18 | Matsushita Electric Ind Co Ltd | Metallized film capacitor |
JPS57133621A (en) * | 1981-02-10 | 1982-08-18 | Matsushita Electric Ind Co Ltd | Metallized film capacitor |
JPS57154823A (en) * | 1981-03-19 | 1982-09-24 | Matsushita Electric Ind Co Ltd | Metallized film capacitor |
Also Published As
Publication number | Publication date |
---|---|
JPS5995620U (en) | 1984-06-28 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0032738A2 (en) | Metallized film capacitor | |
US3457478A (en) | Wound film capacitors | |
JPH0121544Y2 (en) | ||
JPS645870Y2 (en) | ||
JPS6052009A (en) | Automatically rechargeable storage battery and method of producing same | |
JPS645871Y2 (en) | ||
US3522498A (en) | Combination capacitor having a marginless metallized dielectric strip and a foil electrode | |
JPH0227553Y2 (en) | ||
JPH0143852Y2 (en) | ||
JPH0227552Y2 (en) | ||
JP3126490B2 (en) | Metallized film capacitors | |
JPS59115510A (en) | Oil-immersed metallized film condenser | |
JPH02905Y2 (en) | ||
JPS5947723A (en) | Metallized film condenser | |
JPH0227551Y2 (en) | ||
JP4435381B2 (en) | Dry metallized film capacitor | |
GB2026241A (en) | Radio anti-interference capacitor | |
JPS61287119A (en) | Metalized film capacitor | |
KR960016761B1 (en) | Film condenser | |
JPS639648B2 (en) | ||
JP2002008940A (en) | Dry metallized film capacitor | |
JPH08264386A (en) | Manufacture of electrolytic capacitor | |
JPS5943716Y2 (en) | capacitor | |
JPS6331388Y2 (en) | ||
JPS5943713Y2 (en) | metallized film capacitor |