JPH02133885A - Inspecting method for pattern - Google Patents

Inspecting method for pattern

Info

Publication number
JPH02133885A
JPH02133885A JP63288165A JP28816588A JPH02133885A JP H02133885 A JPH02133885 A JP H02133885A JP 63288165 A JP63288165 A JP 63288165A JP 28816588 A JP28816588 A JP 28816588A JP H02133885 A JPH02133885 A JP H02133885A
Authority
JP
Japan
Prior art keywords
pattern
code
density gradient
direction code
circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP63288165A
Other languages
Japanese (ja)
Other versions
JPH0814847B2 (en
Inventor
Tomoharu Nakahara
智治 中原
Shinji Hatazawa
新治 畑澤
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Panasonic Electric Works Co Ltd
Original Assignee
Matsushita Electric Works Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Matsushita Electric Works Ltd filed Critical Matsushita Electric Works Ltd
Priority to JP63288165A priority Critical patent/JPH0814847B2/en
Publication of JPH02133885A publication Critical patent/JPH02133885A/en
Publication of JPH0814847B2 publication Critical patent/JPH0814847B2/en
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Image Analysis (AREA)

Abstract

PURPOSE:To exactly execute the pattern inspection by projecting a direction code of a density gradient in an arbitrary part of an edge image in the X axis direction or in the Y axis direction and deriving a histogram of the direction code. CONSTITUTION:A video signal obtained by executing an image pickup by a TV camera 2 from the upper part of a printed circuit board 1 is converted to a digital signal through an A/D converter 3, differentiated by a differentiating circuit 4, and an absolute value of a differential for showing a density gradient and a direction code for showing the direction of the density gradient are obtained. Subsequently, the absolute value of the differential which is obtained is binarized by a binarization processing circuit 5, and also, brought to line thinning processing by a line thinning processing circuit 6, and obtained edge image data is written in a frame memory 7. A decision processing part 9 projects only the direction code of a part to be taken notice of in the axial direction for showing satisfactorily information to be desired to obtain, and from the statistic of a code histogram obtained by the projection, an inspection of a circuit pattern P is executed. In such a way, it becomes unnecessary to execute a complicated data setting work in advance, and also, the measurement of a pattern can be executed correctly irrespective of existence of a misalignment of an image.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は印刷回路板の外観目視検査を自動化するパター
ン検査方法に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to a pattern inspection method for automating visual inspection of the appearance of printed circuit boards.

[従来の技術] 従来特開昭63−15380号に見られるように2値化
像又は濃淡画像上において、繰り返されるパターンの各
々に、予め設定した位置でパターンのアドレスを測定し
、繰り返しパターンの平均的な位置や、揃い具合を検査
する方法がある。
[Prior Art] As seen in Japanese Patent Application Laid-open No. 15380/1983, the address of the pattern is measured at a preset position for each repeated pattern on a binary image or a grayscale image, and the addresses of the repeated patterns are measured. There is a method to check the average position and alignment.

[発明が解決しようとする課題] しかしながら従来方法は個別のパターン毎に測、定位置
を予め設定しなければならないため、複数のパターンが
存在するときには、設定作業が煩雑となるという問題が
ある。またワークセット時のずれや、パターン自体の変
形による位置ずれが生じると、本来の測定位置からずれ
たところを測定し、正しい測定結果が得られなかった。
[Problems to be Solved by the Invention] However, in the conventional method, it is necessary to measure and set the fixed position for each individual pattern in advance, so when a plurality of patterns exist, there is a problem that the setting work becomes complicated. Furthermore, if a positional shift occurs due to a shift when setting the workpiece or a deformation of the pattern itself, the measurement will be performed at a location that is shifted from the original measurement position, making it impossible to obtain accurate measurement results.

本発明は上述の問題点に鑑みて為されたもので、その目
的とするところは事前の煩雑なデータ設定作業が不要で
、画像の位置ずれの有無にかかわらず正しくパターン検
査が行えるパターン検査方法を提供するにある。
The present invention has been made in view of the above-mentioned problems, and its purpose is to provide a pattern inspection method that does not require complicated data setting work in advance and can perform pattern inspection correctly regardless of the presence or absence of image positional shift. is to provide.

[課題を解決するための手段] 本発明は繰り返し形状のパターンからなる濃淡画像を、
微分細線化してエツジ画像を求め、このエツジ画像の任
意の箇所に於ける濃度勾配の方向コードを、X軸方向、
又はY軸方向へ投影して、方向コードのヒストグラムを
求めことを特徴とするものである。
[Means for Solving the Problems] The present invention provides a method for creating a grayscale image consisting of a pattern of repeated shapes.
Obtain an edge image by converting it into a differential line, and calculate the direction code of the density gradient at any point in this edge image in the X-axis direction,
Alternatively, the histogram of the direction code is obtained by projecting it in the Y-axis direction.

[作用] 而して本発明方法は事前にどの方向の方向コードに着目
するかということと、X軸、Y軸どちらの軸へ投影させ
るかを決める。
[Operation] According to the method of the present invention, it is determined in advance which direction code to focus on and which axis to project, the X-axis or the Y-axis.

次いで投影されて得た方向コードのヒストグラムを求め
、このヒストグラムにより検出判定を行うのである。か
ように本発明方法によれば事前の設定作業が簡便で、し
かも個々のパターンずれによる測定ミスが発生すること
がないのである。
Next, a histogram of the projected direction code is obtained, and detection is determined based on this histogram. As described above, according to the method of the present invention, the preliminary setting work is simple, and measurement errors due to individual pattern deviations do not occur.

[実施例コ 以下本発明を実施例によって説明する。[Example code] The present invention will be explained below with reference to Examples.

第1図は本発明方法を用いたパターン検査装置の実施例
構成を示しており、この実施例では印刷回路板1上方か
らTVカメラ2により撮像して得られる映像信号を、A
/D変換器3を通してデジタル信号に変換する。
FIG. 1 shows the configuration of an embodiment of a pattern inspection apparatus using the method of the present invention. In this embodiment, a video signal obtained by imaging with a TV camera 2 from above a printed circuit board 1 is
/D converter 3 to convert it into a digital signal.

デジタル変換した信号を微分回路4によって微分し、濃
度勾配を表す微分の絶対値と、濃度勾配の方向を表す方
向コードとを得る。得られた微分の絶対値は2値化処理
回路5にてパターンの形状を表すように2値化し、更に
細線化処理回路6で細線化処理を施し、エツジ画像デー
タを得る。この細線化処理回路6で得られたエツジ画像
データをフレームメモリ7に書き込む。
The digitally converted signal is differentiated by a differentiating circuit 4 to obtain the absolute value of the differential representing the density gradient and a direction code representing the direction of the density gradient. The absolute value of the obtained differential is binarized in a binarization processing circuit 5 so as to represent the shape of the pattern, and further thinned in a line thinning processing circuit 6 to obtain edge image data. The edge image data obtained by this thinning processing circuit 6 is written into the frame memory 7.

また方向コードは方向コードメモリ8に格納される。Further, the direction code is stored in the direction code memory 8.

上記のエツジ画像は第2図(a)に示されるようにパタ
ーンの形状を良く表したものとなる。ここで第2図(a
)において回路パターンPの先端の矢印は方向コードの
向きを示し、パターン形状の一部を示すものである。
The above edge image clearly represents the shape of the pattern as shown in FIG. 2(a). Here, Figure 2 (a
), the arrow at the tip of the circuit pattern P indicates the direction of the direction code and indicates a part of the pattern shape.

次に判定処理部9における方向コードヒストグラムの作
成方法を第2図〜第4図に基づいて説明する。
Next, a method of creating a direction code histogram in the determination processing section 9 will be explained based on FIGS. 2 to 4.

まず得られた画像上において着目するパターンの部分を
決定する0例えば、画像のX軸方向のずれを知りたいと
すれば回路パターンPの先端に着目する。
First, determine the part of the pattern of interest on the obtained image. For example, if you want to know the shift in the X-axis direction of the image, focus on the tip of the circuit pattern P.

次いで着目する部分の方向コードを調べ、その着目する
部分の方向コードのみを、得たい情報を良く表わす軸方
向へ投影する。第2図(a)において、X軸方向の位置
ずれを知りたいとすると、回路パターンPの先端の方向
コードをX軸方向へ投影する。この投影により得られた
コードヒストグラムが第2図(b)である。
Next, the direction code of the part of interest is examined, and only the direction code of the part of interest is projected in the axis direction that best represents the information desired. In FIG. 2(a), if it is desired to know the positional deviation in the X-axis direction, the direction code at the tip of the circuit pattern P is projected in the X-axis direction. The code histogram obtained by this projection is shown in FIG. 2(b).

第4図はこの投影処理の流れを示す、フレームメモリ7
上のエツジ画像を走査し、エツジ画像を検出したらエツ
ジ画像上のアドレスに対応する方向コードメモリ8上の
方向コード値を参照し、着目する方向コードであればヒ
ストグラムに加算する。
FIG. 4 shows the flow of this projection process, and the frame memory 7
The upper edge image is scanned, and when an edge image is detected, the direction code value in the direction code memory 8 corresponding to the address on the edge image is referred to, and if it is the direction code of interest, it is added to the histogram.

方向コードのヒストグラムが得られたら、このヒストグ
ラムの中央値、分布の幅等の統計量を計算する。これら
の統計量より回路パターンPの検査を行う。
Once a histogram of direction codes is obtained, statistics such as the median value and distribution width of this histogram are calculated. The circuit pattern P is inspected based on these statistics.

例えば、中央値からは、第2図(b)に示すように、回
路パターンPのX軸方向の位置が得られ、分布の幅から
は例えば第3図(b)に示すような分布の幅であれば第
3図(a)に示すように回路パターンPの先端が一直線
上に整列されていないことが分かる。即ち分布の幅で回
路パターンPの先端の整列度合を検査することができる
のである。
For example, from the median value, the position of the circuit pattern P in the X-axis direction can be obtained as shown in FIG. 2(b), and from the width of the distribution, for example, the width of the distribution as shown in FIG. If so, it can be seen that the tips of the circuit pattern P are not aligned in a straight line as shown in FIG. 3(a). That is, the degree of alignment of the tips of the circuit pattern P can be inspected based on the width of the distribution.

[発明の効果] 本発明は繰り返し形状のパターンからなる濃淡画像を、
微分細線化してエツジ画像を求め、このエツジ画像の任
意の箇所に於ける濃度勾配の方向コードを、X軸方向、
又はY軸方向へ投影して、方向コードのヒストグラムを
求めるから、事前の煩雑なデータ設定作業が不要となり
、しかも画像の位置ずれの有無に拘らず正しくパターン
の測定が行えるという効果を奏する。
[Effects of the Invention] The present invention can create a grayscale image consisting of a pattern of repeated shapes,
Obtain an edge image by converting it into a differential line, and calculate the direction code of the density gradient at any point in this edge image in the X-axis direction,
Alternatively, since the histogram of the direction code is obtained by projecting it in the Y-axis direction, there is no need for complicated data setting work in advance, and the pattern can be accurately measured regardless of the presence or absence of positional deviation of the image.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明方法を用いた実施例のシステム構成図、
第2図(a)は同上によって得たエツジ画像の側口、第
2図(b)は同上によって得た第2図(a)の方向コー
ドヒストグラムの側口、第3図(a)は同上によって得
たエツジ画像の別の側口、第3図(b)は同上によって
得た第3図(a)の方向コードヒストグラムの側口、第
4図は同上の投影処理のフローチャートである。 1は印刷回路板、2はTVカメラ、3はA/D変換器、
4は微分回路、5は2値化処理回路、6は細線化処理回
路、7はフレームメモリ、8は方向コードメモリ、9は
判定処理部、Pは回路パターンである。 代理人 弁理士 石 1)長 七 第4図 手続補正書く自発)
FIG. 1 is a system configuration diagram of an embodiment using the method of the present invention,
Figure 2 (a) is the side view of the edge image obtained by the same method as above, Figure 2 (b) is the side view of the direction code histogram of Figure 2 (a) obtained by the same method, and Figure 3 (a) is the same as above. FIG. 3(b) is another side view of the edge image obtained by the above process, and FIG. 4 is a flowchart of the projection process of the above process. 1 is a printed circuit board, 2 is a TV camera, 3 is an A/D converter,
4 is a differentiation circuit, 5 is a binarization processing circuit, 6 is a thinning processing circuit, 7 is a frame memory, 8 is a direction code memory, 9 is a determination processing section, and P is a circuit pattern. Agent Patent Attorney Ishi 1) Chief Voluntary author of amendments to Figure 4 procedures)

Claims (1)

【特許請求の範囲】[Claims] (1)繰り返し形状のパターンからなる濃淡画像を、微
分細線化してエッジ画像を求め、このエッジ画像の任意
の箇所に於ける濃度勾配の方向コードを、X軸方向、又
はY軸方向へ投影して、方向コードのヒストグラムを求
めて成ることを特徴とするパターン検査方法。
(1) Obtain an edge image by converting a grayscale image consisting of a pattern of repeated shapes into differential thin lines, and projecting the direction code of the density gradient at any location of this edge image in the X-axis direction or Y-axis direction. 1. A pattern inspection method characterized by determining a histogram of direction codes.
JP63288165A 1988-11-15 1988-11-15 Pattern inspection method Expired - Lifetime JPH0814847B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP63288165A JPH0814847B2 (en) 1988-11-15 1988-11-15 Pattern inspection method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP63288165A JPH0814847B2 (en) 1988-11-15 1988-11-15 Pattern inspection method

Publications (2)

Publication Number Publication Date
JPH02133885A true JPH02133885A (en) 1990-05-23
JPH0814847B2 JPH0814847B2 (en) 1996-02-14

Family

ID=17726650

Family Applications (1)

Application Number Title Priority Date Filing Date
JP63288165A Expired - Lifetime JPH0814847B2 (en) 1988-11-15 1988-11-15 Pattern inspection method

Country Status (1)

Country Link
JP (1) JPH0814847B2 (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0535610A2 (en) * 1991-09-30 1993-04-07 Ezel Inc. Printed matter inspection method
WO2010004914A1 (en) * 2008-07-11 2010-01-14 株式会社メガトレード Critical flaw detecting method

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61877A (en) * 1984-06-14 1986-01-06 Amada Co Ltd Form recognizer

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS61877A (en) * 1984-06-14 1986-01-06 Amada Co Ltd Form recognizer

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0535610A2 (en) * 1991-09-30 1993-04-07 Ezel Inc. Printed matter inspection method
EP0535610A3 (en) * 1991-09-30 1994-08-31 Ezel Inc
WO2010004914A1 (en) * 2008-07-11 2010-01-14 株式会社メガトレード Critical flaw detecting method
JP2010019730A (en) * 2008-07-11 2010-01-28 Mega Trade:Kk Critical flaw detecting method

Also Published As

Publication number Publication date
JPH0814847B2 (en) 1996-02-14

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