JPH02129731U - - Google Patents

Info

Publication number
JPH02129731U
JPH02129731U JP3808689U JP3808689U JPH02129731U JP H02129731 U JPH02129731 U JP H02129731U JP 3808689 U JP3808689 U JP 3808689U JP 3808689 U JP3808689 U JP 3808689U JP H02129731 U JPH02129731 U JP H02129731U
Authority
JP
Japan
Prior art keywords
substrate
thin film
heat equalizing
equalizing member
holding frame
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3808689U
Other languages
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3808689U priority Critical patent/JPH02129731U/ja
Publication of JPH02129731U publication Critical patent/JPH02129731U/ja
Pending legal-status Critical Current

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Description

【図面の簡単な説明】[Brief explanation of drawings]

第1図および第2図は本考案の一実施例にかか
り、第1図は基板ホルダを示す縦断面図、第2図
は基板が反つた状態を示す部分断面図である。第
3図は本考案の他の実施例の基板ホルダを示す縦
断面図である。また、第4図は従来例の基板ホル
ダを示す縦断面図である。 1……チヤンバ、3……保持枠、5……基板、
51……基板の背面、52……基板の表面、6…
…ヒータ、7……均熱板、71……基板当接面。
1 and 2 show an embodiment of the present invention, in which FIG. 1 is a vertical sectional view showing a substrate holder, and FIG. 2 is a partial sectional view showing the substrate in a warped state. FIG. 3 is a longitudinal sectional view showing a substrate holder according to another embodiment of the present invention. Further, FIG. 4 is a longitudinal sectional view showing a conventional substrate holder. 1...Chamber, 3...Holding frame, 5...Substrate,
51... Back side of the board, 52... Front side of the board, 6...
... Heater, 7 ... Soaking plate, 71 ... Board contact surface.

Claims (1)

【実用新案登録請求の範囲】 薄膜形成装置のチヤンバ内に配置され薄膜を形
成すべき基板が装着される保持枠と、保持枠内部
に設けられ前記基板を加熱する加熱手段と、前記
基板の膜形成面の背面に当接され該基板を均一に
加熱させるための均熱部材とを具備した基板ホル
ダにおいて、 前記均熱部材の基板当接面を、基板とそれに形
成する被膜との両熱膨張率の差により生じる基板
の反りを相殺する形状に湾曲形成し、かつこの均
熱部材と基板とを圧接させる外圧付与手段を設け
たことを特徴とする薄膜形成装置の基板ホルダ。
[Claims for Utility Model Registration] A holding frame disposed in a chamber of a thin film forming apparatus on which a substrate on which a thin film is to be formed is attached, a heating means provided inside the holding frame for heating the substrate, and a film of the substrate. In a substrate holder equipped with a heat equalizing member that is in contact with the back surface of the forming surface and uniformly heats the substrate, the substrate contacting surface of the heat equalizing member is arranged to absorb the thermal expansion of both the substrate and the coating formed on the substrate. 1. A substrate holder for a thin film forming apparatus, characterized in that the substrate holder is curved in a shape to offset the warpage of the substrate caused by a difference in rate, and is provided with an external pressure applying means for bringing the heat equalizing member and the substrate into pressure contact.
JP3808689U 1989-03-31 1989-03-31 Pending JPH02129731U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3808689U JPH02129731U (en) 1989-03-31 1989-03-31

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3808689U JPH02129731U (en) 1989-03-31 1989-03-31

Publications (1)

Publication Number Publication Date
JPH02129731U true JPH02129731U (en) 1990-10-25

Family

ID=31545778

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3808689U Pending JPH02129731U (en) 1989-03-31 1989-03-31

Country Status (1)

Country Link
JP (1) JPH02129731U (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007502538A (en) * 2003-08-11 2007-02-08 東京エレクトロン株式会社 Vacuum chuck apparatus and method for holding a wafer during high pressure processing

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007502538A (en) * 2003-08-11 2007-02-08 東京エレクトロン株式会社 Vacuum chuck apparatus and method for holding a wafer during high pressure processing

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