JPH02122288A - Makeup testing device for switch - Google Patents

Abstract

PURPOSE:To surely supply a making current by providing a rectifier for starting a supply of a making current by a flashover of a test switch and an auxiliary making device by which a current is brought to makeup in the first half-wave period in which the making current starts to flow to the rectifier. CONSTITUTION:Before makeup of a test switch 4, a half-wave voltage E1 is applied to a half period of an AC power source 1 by a rectifying operation of a rectifier 9, and in the remaining half period, a half-wave voltage E2 is applied. In this state, when such a makeup control of the switch 4 as a flashover is generated in the switch 4 while a high voltage is applied, the high voltage drops quickly due to the generation of a flashover of the switch 4, and when it becomes lower than the voltage E2 of a tap 2b, the rectifier 9 conducts, and a making current I2 flows. When an auxiliary making device 10 is brought to makeup while the first half-wave of this current I2 is flowing, the current I2 is commutated to the making device 10 and the rectifier 9 becomes an obstructed state. Thereafter, the current I2 is allowed to flow continuously by the making device 10. In such a way, while reducing the operation duty, comparing with a gap, a making current can be supplied surely by an automatic conduction of the rectifier 9.

Description

[Detailed description of the invention] A. Industrial application field The present invention relates to a switching synthesis test device for a switch.

B. Summary of the Invention The present invention provides a switching synthesis test device that applies a high voltage to a test switch and supplies a switching current from a current switching device, in which the current switching device is connected in parallel with a rectifier and an auxiliary switching device. This makes it possible to reliably and easily obtain a charging current while reducing the operational responsibility of the charging device.

0 Conventional Technology Switches such as circuit breakers and grounding devices are subjected to a composite closing test to verify their closing capacity based on their closing duties.

A conventional test device has a configuration shown in FIG. 4, as disclosed in, for example, Japanese Patent Application Laid-Open No. 6123140. In the figure, a transformer 2 whose primary input is an AC power source 1
A low voltage large current (turning current) is obtained between the ground terminal 2c and the tap 2b in the wire to the secondary, and a high voltage small current (turning voltage) is obtained between the terminal 2c and the tap 2a. The high voltage output of the tap 2a is passed through the current limiting impedance element 3 to the test switch 4.
A high voltage is applied to the tap 2b, and the low voltage output of the tap 2b supplies a large current to the test switch 4 through the discharge gap 5 as a current energizer. The flash fault detection current transformer 6 generates a high voltage current I when the flash fault occurs in the test switch 4, and the flash fault detector 7 detects the flash fault from this transformed output, and the trigger circuit is activated by this detection output. 8 causes the discharge gap 5 to trigger discharge.

In the closing synthesis test with this configuration, high voltage El (closing voltage) from the tap 2a is applied to the test switch 4 in an open state, and when the switch 4 starts closing, the high voltage El (closing voltage) is applied to the test switch 4 in an open state. ]
, high voltage current I is caused to flow by the preceding arc when a flash short occurs between the switch electrodes.3. When this current 11 exceeds a predetermined value, the tri-force circuit 8 switches the discharge gear knob 5 to 1-
The trigger is discharged, and a large current 1 is applied from the tap 2b to the test switch 4.
．． (input current) flows. Therefore, high voltage can be applied to the flash fault voltage of the switch 4 from the tap 2a, and the input current after the flash fault can be supplied from the tap 2b.

D Problem to be Solved by the Invention In the conventional test equipment, the discharge cap 5 receives high voltages of -r>, -r> before the test switch 4 flashes. Therefore, at the time of trigger discharge after the test switch 4 flashes, only the low voltage rC2 is applied. For this reason, the discharge gap 5 is required to have high withstand voltage characteristics while a high voltage is applied, and is required to perform a discharge operation in a low voltage applied state after a flash fault. Such a requirement is an opposite requirement in terms of the gap length, for example, and makes it difficult to realize the discharge gear 5.

In order to solve this problem, the above-mentioned publication proposes that a discharge gap (grounding device) be added between the ground side of the test switch and the ground, and the two discharge gaps will cause the low voltage of the transformer 2 to rise. Separate high voltage circuits from large current lines,
A method has been proposed in which the withstand voltage responsibility of the discharge gap is thereby halved.

However, in this conventional device, although the withstand voltage duty of the discharge gap is reduced by 1, it is still a severe duty, and the problem remains that it requires two discharge gears and an auxiliary voltage source, making the device complicated and expensive. . In addition, the detector 7 and l-trigger circuit 8 are provided with high-speed operation in order to quickly discharge the discharge gap 5 upon detection of a flash fault in the test switch 4, and in order to reliably trigger the two discharge gaps at the same time. The trigger voltage generation circuit becomes complicated and expensive.

An object of the present invention is to provide a charge synthesis test device that can reliably and easily obtain a charge current while reducing the operational responsibility of a current charger.

E. Means and Effects for Solving the Problems In order to achieve the object described in -, the present invention applies high voltage from the high voltage tap of the transformer to the test switch, and applies the high voltage to the test switch from the low voltage tap of the transformer. In a switch closing synthesis test device that supplies closing current to the test switch via
The current energizer is connected in parallel to a rectifier that conducts when the test switch flashes and starts supplying the energizing current, and is connected in parallel to this rectifier, and is connected within the first half-wave period when the energizing current begins to flow through the rectifier. It is equipped with an auxiliary energizer that is turned on and the current of the rectifier is commutated, and the auxiliary energizer is equipped with an auxiliary energizer that automatically conducts the rectifier due to the flash fault of the test switch, and before this automatic conduction returns to blocking in the next half wave. The auxiliary energizing device is turned on to commutate the auxiliary energizing current to the auxiliary energizing device, and thereafter continues to supply the L-throwing current to the auxiliary activating device.

F. Example FIG. 1 is a circuit diagram showing an embodiment of the present invention.

In the figure, a rectifier 9 and an auxiliary closing device IO are connected between the tap 2b of the transformer 2 and the test switch 4 as a current closing device.
A parallel connection circuit is provided to connect the conventional current transformer 6 and current detector 7.
The trigger circuit 8 and the discharge gap 5 are replaced with each other. The auxiliary closing device 10 is controlled to close after a flash fault occurs in the test switch 4, and is controlled to close using, for example, a signal with a slight delay in accordance with the closing signal of the test switch 4.

In such a configuration, as shown in the waveform diagram of each part in FIG. 2, before the test switch 4 is turned on, a half-wave voltage E is generated in the half cycle of the AC power source 1 due to the rectifying operation of the rectifier 9. A half-wave voltage E is applied during the remaining half cycle. Therefore, the voltage applied to the current injector is half of EI. Here, if the closing control of the test switch 4 is performed so that a flash fault occurs in the test switch 4 while the high voltage E is applied, a flash fault occurs in the test switch 4 (see Fig. 2). At timing t,), the voltage E rapidly decreases, and tap 2b
When the voltage E becomes lower than (timing t), the rectifier 9 becomes conductive and starts supplying the input current (2). While the first half-wave of the current I is flowing, the auxiliary input
When O is turned on (timing t3), the current I is commutated to the auxiliary input device 10, and the rectifier 9 enters the blocking state. Thereafter, the auxiliary input device 10 continues to flow the current I.

Therefore, the current closing device (9, 10) should have a withstand voltage that is higher than the high voltage E1 until the test switch 4 closes (half the withstand voltage of the discharge gap in Fig. 4). The rectifier 9 automatically conducts at high speed due to the flashing of the test switch 4, and can supply the input current I, compared to the severe operating duty of the conventional discharge gap 5, which requires discharging at a high withstand voltage and a low voltage. The duty is reduced to only 1/2 withstand voltage, the trigger circuit is not required, and current supply is more reliable. The current duty of the rectifier 9 is the input current I for a very short time until the auxiliary input device 10 is closed.

As long as it can flow a large amount of water, it is possible to avoid increasing the capacity. Furthermore, the auxiliary injection device 1O can be controlled by a simple control circuit such as a timer, eliminating the need for a high-speed operation and complicated circuit configuration like a conventional trigger circuit.

In the embodiment, the closing timing of the test switch 4 is limited to the positive half cycle of the voltage E in the direction in which the rectifier 9 is installed; however, as shown in FIG. By providing a changeover switch 11 for switching the test polarity of the switch 4, it is possible to switch the test polarity of the switch 4 to either one.

G. Effects of the Invention" 2. According to the present invention, the current injector is made into a 112-column connection circuit of the rectifier and the auxiliary injector, so that the rectifier can be operated while reducing the operational duty compared to the conventional discharge gap. Automatic conduction enables reliable supply of current, and
This has the effect of simplifying the charging lid itself and the charging control circuit.

[Brief explanation of drawings]

FIG. 1 is a synthetic test circuit diagram showing one embodiment of the present invention, and FIG.
3 is a circuit diagram showing another embodiment of the present invention, and FIG. 4 is a conventional synthesis test circuit diagram. 2...Transformer, 4...Test switch, 9...Rectifier, 1
0... Auxiliary input device.

Claims (1)

[Claims] (1) Switch closing synthesis test in which high voltage is applied from the high voltage tap of the transformer to the test switch, and closing current is supplied from the low voltage tap of the transformer to the test switch via the current closing device. In the device, the current making device includes a rectifier that conducts due to a flash fault of the test switch and starts supplying making current, and a rectifier that is connected in parallel to this rectifier and starts supplying making current in the first half wave when the making current starts flowing through the rectifier. A switch closing synthesis test device comprising: an auxiliary closing device which is turned on within a period to commutate the current of the rectifier.