JPH02114112A - Fine angle measuring apparatus - Google Patents

Fine angle measuring apparatus

Info

Publication number
JPH02114112A
JPH02114112A JP26706388A JP26706388A JPH02114112A JP H02114112 A JPH02114112 A JP H02114112A JP 26706388 A JP26706388 A JP 26706388A JP 26706388 A JP26706388 A JP 26706388A JP H02114112 A JPH02114112 A JP H02114112A
Authority
JP
Japan
Prior art keywords
light
inspected
product
slit plate
slit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP26706388A
Other languages
Japanese (ja)
Inventor
Makoto Nagano
誠 永野
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Information Systems Ltd
Original Assignee
Hitachi Information Systems Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Information Systems Ltd filed Critical Hitachi Information Systems Ltd
Priority to JP26706388A priority Critical patent/JPH02114112A/en
Publication of JPH02114112A publication Critical patent/JPH02114112A/en
Pending legal-status Critical Current

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  • Length Measuring Devices By Optical Means (AREA)

Abstract

PURPOSE:To enable measurement at a high speed and at a high accuracy with a simple construction by using a light source with a phase adjusted properly while slits are arranged in a light receiving sector on the light transmitting side. CONSTITUTION:To improve reflection efficiency of a product 8 to be inspected, light from a light source 1 is transmitted with a polarizing plate 2. The light transmitted through the polarizing plate 2 is turned to one line of beam with a slit plate 3 to irradiate the product 8 to be inspected vertically. Being one line of vertical beam, the light is not affected in height to eliminate the need for a focusing function. The light reflected on the product 8 to be inspected is bent by 90 deg. with a half mirror 4 to be introduced to the slit plate 5. As the slit plate 5 is deviated by 90 deg. slitting from the slit plate 3, light from the slit plate 5 is given as a spot. Since the position of the spot moves depending on the right or left tilt of the product 8 to be inspected, an image thereof is formed on an area sensor 7 with an imaging lens 6 thereby enabling measurement of an inclination of the product 8 to be inspected.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は微少角度測定装置に係り、特に平面の傾き具合
を高精度に測定できる自動検査装置に好適な微少角度f
llllllll間するものである。
[Detailed Description of the Invention] [Industrial Application Field] The present invention relates to a minute angle measuring device, and in particular, a minute angle f suitable for an automatic inspection device that can measure the inclination of a plane with high precision.
It's between llllllllll.

[従来の技術] 一般的には講談社刊「大事典deskJや日経産業新聞
社列「日経ハイチック辞典」に記載されているように微
小角度のil+1定に関しては、焦点から出る光がレン
ズを通過後平行になる現象を利用し、レンズの焦点に小
孔やスリットあるいは目盛をきざんだガラス板を置き、
後方から光を照射するいわゆるオートコリメーター等を
利用し、人手により行なわれている。しかし、ワーク毎
の焦点合わせが必要であり、測定時間がかかっているの
が現状である。
[Prior art] In general, as described in "Encyclopedia deskJ" published by Kodansha and "Nikkei High Chic Dictionary" published by Nikkei Sangyo Shimbun, regarding the il + 1 constant of a minute angle, the light emitted from the focal point passes through the lens. Taking advantage of the phenomenon of parallelism, a glass plate with small holes, slits, or scales is placed at the focal point of the lens.
This is done manually using a so-called autocollimator that irradiates light from behind. However, the current situation is that focusing is required for each workpiece, and measurement time is required.

[発明が解決しようとする課題] 上記従来技術は以下の点について配慮されておらず、 1:調整が必要であり、測定時間がかかる。[Problem to be solved by the invention] The above conventional technology does not take into account the following points, 1: Adjustment is required and measurement time is required.

2:2次元の角度分布を簡単に測定することができない
2: Two-dimensional angular distribution cannot be easily measured.

などの問題点があった。There were problems such as:

本発明の目的は簡単な光学系と電子回路を組合わせるこ
とにより、自動化が計れ、上記問題点を取り除こうとす
ることにある。
An object of the present invention is to eliminate the above-mentioned problems by combining a simple optical system and an electronic circuit to achieve automation.

[課題を解決するための手段] 上記目的は、光学系を用いて測定を行なうとすると、被
検査品の高さのばらつきによる測定誤差を考えなければ
ならない。一般的には、オートフォーカス機構をつける
が、出来るだけ簡単にするため1位相を揃えた光源を使
い、透光側受光側に各々スリットを設ける事により、フ
ォーカスについて、無視出来るように考えた。又、微少
角度の測定については光学的に拡大する事とした。そし
て、2次元の角度の測定に対しては受光素子として、エ
リアセンサを使用する。
[Means for Solving the Problems] When the above object is measured using an optical system, it is necessary to consider measurement errors due to variations in the height of the inspected product. Generally, an autofocus mechanism is installed, but to make it as simple as possible, we used light sources with one phase aligned and provided slits on the light-transmitting side and the light-receiving side, so that focus could be ignored. In addition, we decided to use optical magnification to measure small angles. For two-dimensional angle measurement, an area sensor is used as a light receiving element.

以上の構成とすることにより、自動化のための高精度無
調整化が達成される。
With the above configuration, high accuracy and no adjustment for automation can be achieved.

[作用〕 本発明の微少角度測定装置は、同一位相の光をスリット
に通し、被検査品上に一条の光を投射する。この投射さ
れた線は、被検査品の高さ方向の変動に対し、何の影響
も与えられないから、フォーカスの機能は不要となる。
[Function] The minute angle measuring device of the present invention passes light of the same phase through a slit and projects a ray of light onto an item to be inspected. Since this projected line has no effect on variations in the height direction of the product to be inspected, a focus function is not required.

そして、被検査品で反射された光を、入射時のスリット
に対し90°回転させたスリットに通し、エリアセンサ
上で結像させる様にすると、その光点は、投射された線
と直角方向の傾きにより、センサ上を移動することによ
り測定しようとするものである。又、被検査品には、前
後及び左右の傾きが考えられるが、これは、透光、受光
側の各スリットを切り替えるか2光路とすることで対応
が可能となる。
Then, when the light reflected by the inspected item is passed through a slit rotated 90 degrees with respect to the slit at the time of incidence, and an image is formed on the area sensor, the light spot will be directed in a direction perpendicular to the projected line. The object is to measure the inclination of the sensor by moving it over the sensor. Furthermore, the product to be inspected may be tilted front to back and left and right, but this can be handled by switching the slits on the light-transmitting and light-receiving sides or by providing two optical paths.

[実施例] 以下、本発明の一実施例を第1図により説明する。[Example] An embodiment of the present invention will be described below with reference to FIG.

本微少角度測定装置は、光源1.偏光板2.スリット3
,5、ハーフミラ4.結像レンズ6およびエリアセンサ
7より構成されている。すなわち。
This minute angle measuring device has a light source 1. Polarizing plate 2. slit 3
, 5, Half Mira 4. It is composed of an imaging lens 6 and an area sensor 7. Namely.

光源1と該光源1から振動が規則的な光を取出す偏光板
2と一条の光を取出すスリット板3と前記−条の光を被
検査品8に照射させその反射光を取出すハーフミラ4と
前記ハーフミラ4を介して取出された一条の反射光と直
交するスリットを設けたスリット板5と前記スリット板
5を通過した光をエリアセンサ7に結像させる結像レン
ズ6とを具備したものである。
A light source 1, a polarizing plate 2 for extracting light with regular vibrations from the light source 1, a slit plate 3 for extracting a single strip of light, a half mirror 4 for irradiating the above-mentioned strip of light onto the inspection object 8 and extracting the reflected light, and the above-mentioned. It is equipped with a slit plate 5 provided with a slit orthogonal to a line of reflected light taken out via the half mirror 4, and an imaging lens 6 that images the light passing through the slit plate 5 on an area sensor 7. .

次にこの装置を用いての測定方法について述べる。Next, a measurement method using this device will be described.

まず、被検査品8での反射効率を改善するため。First, to improve the reflection efficiency at the product 8 to be inspected.

光rX1よりの光を偏光板2に通す。この偏光板2を通
った光は、第1のスリット板3により一条の線となり被
検査品8に重直に照射される。垂直な一条の線であるた
め高さ方向に影響されない。このフォーカス機能が不要
となる。そして被検査品8で反射した光は、ハーフミラ
4により90°曲げられ、第2のスリット板5に導かれ
る。この第2のスリット板5は、第1のスリット板3と
スリットが1]0°ずれているため第2のスリット板5
より出る光は点となる。この点の位置は、被検査品8の
左右の傾きにより移動するから、これを結像レンズ6に
よりエリアセンサ7に結像させることにより、被検査品
8の傾き量を測定することができる。また、第2のスリ
ット板5とエリアセンサ7の距離を長くすれば、それだ
け高感度にすることができる。
The light from the light rX1 is passed through the polarizing plate 2. The light that has passed through the polarizing plate 2 becomes a single line by the first slit plate 3 and is irradiated onto the inspected product 8 in a vertical manner. Since it is a vertical line, it is not affected by the height direction. This focus function becomes unnecessary. The light reflected by the inspected item 8 is bent by 90 degrees by the half mirror 4 and guided to the second slit plate 5. This second slit plate 5 is different from the first slit plate 3 because the slits are shifted by 1]0°.
The light that comes out becomes a point. Since the position of this point moves depending on the left and right inclination of the product to be inspected 8, the amount of inclination of the product to be inspected 8 can be measured by focusing this on the area sensor 7 using the imaging lens 6. Further, by increasing the distance between the second slit plate 5 and the area sensor 7, the sensitivity can be increased accordingly.

第2図に示すように第1のスリット板3と第2のスリッ
ト板5を互いに90°回転させることで被検査品8の前
後方向の傾きを測定することができる。
As shown in FIG. 2, by rotating the first slit plate 3 and the second slit plate 5 by 90 degrees, the inclination of the product to be inspected 8 in the front-rear direction can be measured.

[発明の効果コ 以上詳述したように、本発明の請求項1記載の微少角度
測定装置は、簡単な構成で高速でしかも高精度に測定す
ることができ、自動検査装置等において優れた実用効果
がある。
[Effects of the Invention] As described in detail above, the minute angle measuring device according to claim 1 of the present invention has a simple configuration, can measure at high speed and with high precision, and has excellent practical use in automatic inspection equipment, etc. effective.

【図面の簡単な説明】[Brief explanation of drawings]

第1図は本発明の一実施例で被検査物の左右方向の傾き
をfi19定する場合の微少角度測定装置の全体の構成
図、第2図は第1図の2枚のスリットの方向を変え被検
査物の前後方向の傾きをlll’!定する場合の微少角
度測定装置の全体の構成図である61・・・光源、2・
・・偏光板、3・・・スリット、4・・・ハーフミラ、
5・・・スリット、6・・・結像レンズ、7・・・エリ
アセンサ、8・・・被検査品。 特許出願人 日立湘南電子株式会社 代理人 弁理士 秋 本 正 実(外1名)手続ネ+l
i IE書(自発) 昭和63年12月15ト1
Fig. 1 is an overall configuration diagram of a minute angle measuring device for determining the horizontal inclination of an object to be inspected according to an embodiment of the present invention, and Fig. 2 shows the direction of the two slits in Fig. 1. Change the longitudinal inclination of the object to be inspected! 61... Light source, 2.
...Polarizing plate, 3...Slit, 4...Half mirror,
5... Slit, 6... Imaging lens, 7... Area sensor, 8... Item to be inspected. Patent applicant Hitachi Shonan Electronics Co., Ltd. Agent Patent attorney Masami Akimoto (1 other person) Procedures +l
i IE book (spontaneous) December 15, 1988 1

Claims (1)

【特許請求の範囲】[Claims] 1、光源と該光源から振動が規則的な光を取出す偏光板
と条光を被検査品に照射する第1のスリット板と前記被
検査品からの反射光を取出すハーフミラと前記条光と直
交するスリットを有し点状の光を取出す第2のスリット
板とこのスリット通過光をセンサに結像させる結像レン
ズと光の結像位置で被検査物の傾き量を測定するエリア
センサとを具備してなる微少角度測定装置。
1. A light source, a polarizing plate that extracts light with regular vibrations from the light source, a first slit plate that irradiates the inspected item with the striped light, and a half mirror that extracts the reflected light from the inspected item, which is perpendicular to the striped light. a second slit plate having a slit to extract dotted light; an imaging lens that forms an image of the light passing through the slit on a sensor; and an area sensor that measures the amount of inclination of the object to be inspected at the position where the light is focused. A minute angle measuring device equipped with:
JP26706388A 1988-10-25 1988-10-25 Fine angle measuring apparatus Pending JPH02114112A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP26706388A JPH02114112A (en) 1988-10-25 1988-10-25 Fine angle measuring apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP26706388A JPH02114112A (en) 1988-10-25 1988-10-25 Fine angle measuring apparatus

Publications (1)

Publication Number Publication Date
JPH02114112A true JPH02114112A (en) 1990-04-26

Family

ID=17439519

Family Applications (1)

Application Number Title Priority Date Filing Date
JP26706388A Pending JPH02114112A (en) 1988-10-25 1988-10-25 Fine angle measuring apparatus

Country Status (1)

Country Link
JP (1) JPH02114112A (en)

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