JPH0197809A - Detector of surface defect - Google Patents
Detector of surface defectInfo
- Publication number
- JPH0197809A JPH0197809A JP62253858A JP25385887A JPH0197809A JP H0197809 A JPH0197809 A JP H0197809A JP 62253858 A JP62253858 A JP 62253858A JP 25385887 A JP25385887 A JP 25385887A JP H0197809 A JPH0197809 A JP H0197809A
- Authority
- JP
- Japan
- Prior art keywords
- light
- fixed part
- signal line
- work piece
- case
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 230000007547 defect Effects 0.000 title claims description 6
- 230000005540 biological transmission Effects 0.000 claims abstract 3
- 238000001514 detection method Methods 0.000 claims description 13
- 239000000523 sample Substances 0.000 claims description 5
- 238000007689 inspection Methods 0.000 abstract description 2
- 238000005259 measurement Methods 0.000 abstract description 2
- 238000000034 method Methods 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 239000004065 semiconductor Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 1
- 238000003801 milling Methods 0.000 description 1
- 230000003287 optical effect Effects 0.000 description 1
- 230000008685 targeting Effects 0.000 description 1
Classifications
-
- E—FIXED CONSTRUCTIONS
- E04—BUILDING
- E04F—FINISHING WORK ON BUILDINGS, e.g. STAIRS, FLOORS
- E04F11/00—Stairways, ramps, or like structures; Balustrades; Handrails
- E04F11/18—Balustrades; Handrails
- E04F2011/1868—Miscellaneous features of handrails not otherwise provided for
- E04F2011/1872—Miscellaneous features of handrails not otherwise provided for illuminated
Landscapes
- Length Measuring Devices By Optical Means (AREA)
Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明は表面欠陥の検出器に係り、殊に、例えばエンジ
ンのシリンダーブロックの筒穴のような穴部の内壁面の
巣、傷等の表面不良或は内壁面の荒目の検査用として好
適な検出器に係る。DETAILED DESCRIPTION OF THE INVENTION (Industrial Application Field) The present invention relates to a surface defect detector, and in particular detects holes, scratches, etc. on the inner wall surface of a hole such as a cylindrical hole in an engine cylinder block. The present invention relates to a detector suitable for inspecting surface defects or roughness on an inner wall surface.
(従来の技術)
本発明は、例えば、投光器から一定の強さの光を投光し
、被測定物から反射した光を受光し、受光量の変化を解
析して表面吠態を判定する検出器を対象とする。(Prior Art) The present invention, for example, emits light of a certain intensity from a projector, receives the light reflected from the object to be measured, and analyzes changes in the amount of received light to determine the surface barb state. Targeting vessels.
このような検出器は、一般に、投光器及び受光器などを
含む検出部と、この検出部に接続された信号線とを有し
ている。Such a detector generally has a detection section including a light emitter, a light receiver, etc., and a signal line connected to the detection section.
(発明が解決しようとする問題点)
この検出器によって筒室内壁面の巣、傷等を検出する場
合、従来第2図及び第3図に示す方法で行われていた。(Problems to be Solved by the Invention) When detecting cavities, scratches, etc. on the inner wall surface of the cylinder using this detector, the method shown in FIGS. 2 and 3 has conventionally been used.
第2図の場合は、測定すべきワーク1の筒室2内に上記
の検出部3を入れ、筒室壁面に対峙させた後、ワーク1
をその中心軸線に関して回転させ、同時に上下方向へス
ライドさせて全壁面を探査するものであ、る。この方法
では、ワークを回転させる必要があるが、大きな非円形
のワークを精度よく、比較的高速で回転させることは意
外に困難である。In the case of Fig. 2, the detection unit 3 is placed in the cylinder chamber 2 of the workpiece 1 to be measured, and after facing the wall surface of the cylinder chamber, the workpiece 1
The entire wall surface is explored by rotating the wall about its central axis and sliding it up and down at the same time. In this method, it is necessary to rotate the workpiece, but it is surprisingly difficult to rotate a large non-circular workpiece with high precision and at a relatively high speed.
これに対し第3図の場合は、ワーク1を静止させておき
、検出部3を回転させながら上方または下方へスライド
させるものであり、第2図の場合のような問題点は生じ
ないが、他方において、検出部3を回転させるため、信
号線4にねじれが生じ、このため検出部3の回転数は必
然的に制約され、測定対象が制限されるという問題があ
る。On the other hand, in the case of Fig. 3, the workpiece 1 is kept stationary and the detection part 3 is rotated and slid upward or downward, and the problem as in the case of Fig. 2 does not occur. On the other hand, since the detection section 3 is rotated, the signal line 4 is twisted, which inevitably limits the number of rotations of the detection section 3 and limits the measurement target.
本発明の目的は、ワークを回転させる必要がなり、シか
も検出部の回転数に制約されない検出器を提供すること
にある。An object of the present invention is to provide a detector that requires rotating a workpiece and is not limited by the number of rotations of the detection section.
(問題点を解決するための手段)
本発明は、検出部を、信号線に接続される固定部と、こ
の固定部に対して回転自在の探査部とに分けて構成し、
両者の間の情報伝達を光線にて行うことによって上記の
目的を達成するものである。(Means for Solving the Problems) The present invention configures the detection unit by dividing it into a fixed part connected to the signal line and a probe part rotatable with respect to the fixed part,
The above purpose is achieved by transmitting information between the two using light beams.
(実施例)
第1図に示す本発明の実施例において、図中lOはレー
ザ光線を放射するレーザダイオード(半導体レーザ)を
示し、このダイオードから放射されたレーザ光線は光学
系、即ち、コリメートレンズ11、ビームスプリッタ1
2、プリズム13、対物レンズ14を経由してワーク1
の筒室壁面2に投光され、壁面から反射した光は対物レ
ンズ14にて受光された後、プリズム!3、ビームスプ
リッタ12及び集光レンズ!5を経由してフォトダイオ
ードI6に入る。この受光量の変化が後方の解析装置に
よって解析され、筒室壁面における巣、傷などの有無が
判別される。(Embodiment) In the embodiment of the present invention shown in FIG. 1, lO in the figure indicates a laser diode (semiconductor laser) that emits a laser beam, and the laser beam emitted from this diode is passed through an optical system, that is, a collimating lens. 11, Beam splitter 1
2. Workpiece 1 via prism 13 and objective lens 14
The light is projected onto the wall 2 of the cylinder chamber, and the light reflected from the wall is received by the objective lens 14, and then the prism! 3. Beam splitter 12 and condensing lens! 5 and enters the photodiode I6. This change in the amount of received light is analyzed by a rear analysis device, and the presence or absence of cavities, scratches, etc. on the wall of the cylinder chamber is determined.
上記のレーザダイオード10及びフォトダイオード1B
は公知の態様にて信号線(図示せず)に接続されている
。これら両ダイオードto、isは、コリメートレンズ
111 ビームスプリブタ12及び集光レンズ15と共
に固定部ケースI7もしくは該ケースと一体の部材(図
示せず)に取り付けられている。The above laser diode 10 and photodiode 1B
is connected to a signal line (not shown) in a known manner. Both of these diodes to and is, together with the collimating lens 111, the beam splitter 12, and the condensing lens 15, are attached to the fixed part case I7 or a member (not shown) integrated with the case.
一方、プリズム13及び対物レンズ14は可動部ケース
!8内に装着されている。ケース18はプリズム!3及
び対物レンズ、14を保持する鏡胴18aと、との鏡胴
に対して直角に延び、しかもコリメートレンズ11と同
一の軸線上に配置され、光線のための通路を形成してい
る円筒状の支持部18bとより成っており、支持部18
bは軸受I9により固定部ケース17に回転可能に支持
されている。On the other hand, the prism 13 and objective lens 14 are movable parts! It is installed in 8. Case 18 is a prism! 3 and a lens barrel 18a holding the objective lens 14; The support part 18b consists of a support part 18b.
b is rotatably supported by the fixed part case 17 by a bearing I9.
ケース18を支持部18bの軸線に関して回転駆動させ
るためにモータ20が設けてあり、このモータは皿伏の
ロータ20aの縁部内周面に取り付けられた回転子コイ
ル20bと、固定部ケース17に取り付けられた固定子
コイル20cとををしており、ロータ20aは適宜の取
付部材21によってケース18の支持部tabに装着さ
れている。A motor 20 is provided to rotate the case 18 about the axis of the support part 18b, and this motor is connected to a rotor coil 20b attached to the inner circumferential surface of the edge of the rotor 20a in a horizontal position, and a rotor coil 20b attached to the fixed part case 17. The rotor 20a is mounted on the support portion tab of the case 18 by a suitable mounting member 21.
上記から明らかなように、検出部を構成する部材の内、
レーザダイオード10、コリメートレンズ11、ビーム
スプリッタ12、集光レンズ15、フォトダイオード1
6は固定部を形成しており、またプリズム!3、対物レ
ンズI4は上記の固定部に対して回転自在の探査部を形
成し、両者の間では光線によって情報の伝達が行われる
。As is clear from the above, among the members constituting the detection section,
Laser diode 10, collimating lens 11, beam splitter 12, condensing lens 15, photodiode 1
6 forms a fixed part and is also a prism! 3. The objective lens I4 forms a rotatable exploration part with respect to the fixed part, and information is transmitted between the two by light rays.
作動の際には、探査部の回転軸線がワーク1の筒室2の
軸線と同一線上に置かれた後、モータ20によって探査
部が回転せしめられ、同時に検出部全体が適宜の手段に
より下方または上方ヘスライドされる。もちろん、この
動作の期間中レーザダイオード10からレーザ光線が放
射されており、従って、筒室2の壁面はくまなく探査さ
れる。During operation, after the rotational axis of the probe section is placed on the same line as the axis of the cylinder chamber 2 of the workpiece 1, the probe section is rotated by the motor 20, and at the same time, the entire detection section is rotated downward or downward by appropriate means. It is slid upward. Of course, during this operation, a laser beam is emitted from the laser diode 10, so that the wall surface of the cylinder chamber 2 is thoroughly explored.
なお、上記の鏡胴18aの対物レンズ!4の保持部を下
方に向けて直角に折り曲げ、折曲個所にプリズムを配置
すれば、筒室2の底面のような平面部の傷も、フライス
盤の加工要領で検査可能である。In addition, the objective lens of the above-mentioned lens barrel 18a! If the holding part 4 is bent downward at a right angle and a prism is placed at the bent part, it is possible to inspect flaws on a flat surface such as the bottom of the cylinder chamber 2 using the processing procedure of a milling machine.
(効果)
上記のように本発明によれば、ワークを回転させる必要
はなく、また信号線に制約を受けることなく探査部を所
要の回転数だけ所望の速度で回転できるので、回転させ
ることが難しい大きなワークに対して筒室側壁の外観検
査を筒室の深さなどに関係なく、所望の範囲に亘って正
確且つ迅速に自動的に行うことが可能である。(Effects) As described above, according to the present invention, there is no need to rotate the workpiece, and the exploration part can be rotated by the required number of rotations at a desired speed without being restricted by the signal line. It is possible to accurately and quickly perform an external appearance inspection of the cylinder chamber side wall of a difficult and large workpiece over a desired range, regardless of the depth of the cylinder chamber.
第1図は本゛発明による検出器の概略的中央縦断面図、
第2図は従来の検出方法を示す概略図、第3図は従来の
他の検出方法を示す概略図である。
IO・・・レーザダイオード(半導体レーザ)、11・
・・コリメートレンズ、!2・・・ビームスプリッタ、
13・・・プリズム、+4・・・対物レンズ、15・・
・集光レンズ、+6・・・フォトダイオード、17・・
・固定部ケース、18・・・可動部ケース、20・・・
モータ。
代理人弁理士 1)代 蒸 治
第1図
第2図 第3図FIG. 1 is a schematic central longitudinal sectional view of a detector according to the present invention, FIG. 2 is a schematic diagram showing a conventional detection method, and FIG. 3 is a schematic diagram showing another conventional detection method. IO...Laser diode (semiconductor laser), 11.
...Collimating lens! 2...beam splitter,
13... Prism, +4... Objective lens, 15...
・Condenser lens, +6...Photodiode, 17...
・Fixed part case, 18...Movable part case, 20...
motor. Representative Patent Attorney 1) Osamu Umi Figure 1 Figure 2 Figure 3
Claims (1)
表面不良を判別する表面欠陥検出器において、信号線に
よって他の部分と接続関係にある検出部が、上記の信号
線と接続される部材を有する固定部と、信号線とはかか
わりのない部材のみを有し、上記固定部に対して回転自
在となされた探査部とから構成されており、固定部と探
査部との間の情報伝達が光線にて行われていることを特
徴とする、表面欠陥の検出器。In a surface defect detector that irradiates a workpiece surface with a light beam and determines surface defects based on changes in the amount of reflected light, a detection unit that is connected to other parts by a signal line detects a member that is connected to the signal line. It consists of a fixed part that has a fixed part, and a probe part that has only members that are not related to the signal line and is rotatable with respect to the fixed part, so that information transmission between the fixed part and the probe part is A surface defect detector characterized in that it is performed using a light beam.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62253858A JPH0197809A (en) | 1987-10-09 | 1987-10-09 | Detector of surface defect |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP62253858A JPH0197809A (en) | 1987-10-09 | 1987-10-09 | Detector of surface defect |
Publications (1)
Publication Number | Publication Date |
---|---|
JPH0197809A true JPH0197809A (en) | 1989-04-17 |
Family
ID=17257112
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP62253858A Pending JPH0197809A (en) | 1987-10-09 | 1987-10-09 | Detector of surface defect |
Country Status (1)
Country | Link |
---|---|
JP (1) | JPH0197809A (en) |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5172039A (en) * | 1991-09-16 | 1992-12-15 | Staodyn, Inc. | Device utilizing capacitive coupling to provide an output indicative of angular relationship |
JP2006506628A (en) * | 2002-11-18 | 2006-02-23 | ナノフォーカス アクチエンゲゼルシャフト | Apparatus and method for measuring the surface of a cylinder inner wall using a confocal microscope |
US7602487B2 (en) | 2006-05-16 | 2009-10-13 | Kirin Techno-System Corporation | Surface inspection apparatus and surface inspection head apparatus |
Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6186607A (en) * | 1984-10-04 | 1986-05-02 | Sumitomo Metal Ind Ltd | Apparatus for measuring melted shape of refractory material of container lined by refractory material |
-
1987
- 1987-10-09 JP JP62253858A patent/JPH0197809A/en active Pending
Patent Citations (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6186607A (en) * | 1984-10-04 | 1986-05-02 | Sumitomo Metal Ind Ltd | Apparatus for measuring melted shape of refractory material of container lined by refractory material |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5172039A (en) * | 1991-09-16 | 1992-12-15 | Staodyn, Inc. | Device utilizing capacitive coupling to provide an output indicative of angular relationship |
JP2006506628A (en) * | 2002-11-18 | 2006-02-23 | ナノフォーカス アクチエンゲゼルシャフト | Apparatus and method for measuring the surface of a cylinder inner wall using a confocal microscope |
US7602487B2 (en) | 2006-05-16 | 2009-10-13 | Kirin Techno-System Corporation | Surface inspection apparatus and surface inspection head apparatus |
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