JPH0197551U - - Google Patents

Info

Publication number
JPH0197551U
JPH0197551U JP19544787U JP19544787U JPH0197551U JP H0197551 U JPH0197551 U JP H0197551U JP 19544787 U JP19544787 U JP 19544787U JP 19544787 U JP19544787 U JP 19544787U JP H0197551 U JPH0197551 U JP H0197551U
Authority
JP
Japan
Prior art keywords
electrode needle
wafer
support frame
terminal
pellet
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP19544787U
Other languages
English (en)
Japanese (ja)
Other versions
JPH0414933Y2 (enrdf_load_stackoverflow
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP19544787U priority Critical patent/JPH0414933Y2/ja
Publication of JPH0197551U publication Critical patent/JPH0197551U/ja
Application granted granted Critical
Publication of JPH0414933Y2 publication Critical patent/JPH0414933Y2/ja
Expired legal-status Critical Current

Links

Landscapes

  • Testing Of Individual Semiconductor Devices (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
JP19544787U 1987-12-22 1987-12-22 Expired JPH0414933Y2 (enrdf_load_stackoverflow)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP19544787U JPH0414933Y2 (enrdf_load_stackoverflow) 1987-12-22 1987-12-22

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP19544787U JPH0414933Y2 (enrdf_load_stackoverflow) 1987-12-22 1987-12-22

Publications (2)

Publication Number Publication Date
JPH0197551U true JPH0197551U (enrdf_load_stackoverflow) 1989-06-29
JPH0414933Y2 JPH0414933Y2 (enrdf_load_stackoverflow) 1992-04-03

Family

ID=31486125

Family Applications (1)

Application Number Title Priority Date Filing Date
JP19544787U Expired JPH0414933Y2 (enrdf_load_stackoverflow) 1987-12-22 1987-12-22

Country Status (1)

Country Link
JP (1) JPH0414933Y2 (enrdf_load_stackoverflow)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012089680A (ja) * 2010-10-20 2012-05-10 Micronics Japan Co Ltd 半導体測定装置
JP2012174873A (ja) * 2011-02-21 2012-09-10 Shibasoku:Kk 試験装置
JP2013120887A (ja) * 2011-12-08 2013-06-17 Mitsubishi Electric Corp 半導体試験装置および半導体試験方法
JP2015049137A (ja) * 2013-09-02 2015-03-16 三菱電機株式会社 半導体チップ試験装置及び方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012141197A (ja) * 2010-12-28 2012-07-26 Advantest Corp 試験装置

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2012089680A (ja) * 2010-10-20 2012-05-10 Micronics Japan Co Ltd 半導体測定装置
JP2012174873A (ja) * 2011-02-21 2012-09-10 Shibasoku:Kk 試験装置
JP2013120887A (ja) * 2011-12-08 2013-06-17 Mitsubishi Electric Corp 半導体試験装置および半導体試験方法
JP2015049137A (ja) * 2013-09-02 2015-03-16 三菱電機株式会社 半導体チップ試験装置及び方法

Also Published As

Publication number Publication date
JPH0414933Y2 (enrdf_load_stackoverflow) 1992-04-03

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