JPH0187270U - - Google Patents
Info
- Publication number
- JPH0187270U JPH0187270U JP18260587U JP18260587U JPH0187270U JP H0187270 U JPH0187270 U JP H0187270U JP 18260587 U JP18260587 U JP 18260587U JP 18260587 U JP18260587 U JP 18260587U JP H0187270 U JPH0187270 U JP H0187270U
- Authority
- JP
- Japan
- Prior art keywords
- guide
- contact
- board
- guide rods
- measured
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000001514 detection method Methods 0.000 claims description 2
- 239000000523 sample Substances 0.000 claims description 2
- 238000005259 measurement Methods 0.000 claims 1
Landscapes
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18260587U JPH0623976Y2 (ja) | 1987-11-30 | 1987-11-30 | インサーキットテスタ用ピンボード構造 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP18260587U JPH0623976Y2 (ja) | 1987-11-30 | 1987-11-30 | インサーキットテスタ用ピンボード構造 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0187270U true JPH0187270U (fr) | 1989-06-08 |
| JPH0623976Y2 JPH0623976Y2 (ja) | 1994-06-22 |
Family
ID=31474052
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP18260587U Expired - Lifetime JPH0623976Y2 (ja) | 1987-11-30 | 1987-11-30 | インサーキットテスタ用ピンボード構造 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0623976Y2 (fr) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015021867A (ja) * | 2013-07-19 | 2015-02-02 | 三菱電機株式会社 | 半導体装置の試験用治具 |
-
1987
- 1987-11-30 JP JP18260587U patent/JPH0623976Y2/ja not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2015021867A (ja) * | 2013-07-19 | 2015-02-02 | 三菱電機株式会社 | 半導体装置の試験用治具 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0623976Y2 (ja) | 1994-06-22 |