JPH0181553U - - Google Patents

Info

Publication number
JPH0181553U
JPH0181553U JP1987176358U JP17635887U JPH0181553U JP H0181553 U JPH0181553 U JP H0181553U JP 1987176358 U JP1987176358 U JP 1987176358U JP 17635887 U JP17635887 U JP 17635887U JP H0181553 U JPH0181553 U JP H0181553U
Authority
JP
Japan
Prior art keywords
stage
temperature sensor
heat source
temperature
microhardness tester
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP1987176358U
Other languages
English (en)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP1987176358U priority Critical patent/JPH0181553U/ja
Publication of JPH0181553U publication Critical patent/JPH0181553U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Investigating Or Analyzing Materials Using Thermal Means (AREA)

Description

【図面の簡単な説明】
第1図は本考案の実施例を示す微小硬度計の斜
視図、第2図は従来の微小硬度計の構成図である
。 10……ステージ、11……上下動シヤフト、
12……測定子、13……カートリツジヒータ、
14,15……ヒートインシユレータ、16……
温度センサ。

Claims (1)

  1. 【実用新案登録請求の範囲】 (1) 被測定物を任意の温度で加温するために被
    測定物を載せるステージに熱源を設けたことを特
    徴とする微小硬度計。 (2) 前記ステージに温度センサを設け、該温度
    センサからの検出温度に基づき、前記熱源を調整
    可能にしてなる実用新案登録請求の範囲第1項記
    載の微小硬度計。
JP1987176358U 1987-11-20 1987-11-20 Pending JPH0181553U (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP1987176358U JPH0181553U (ja) 1987-11-20 1987-11-20

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP1987176358U JPH0181553U (ja) 1987-11-20 1987-11-20

Publications (1)

Publication Number Publication Date
JPH0181553U true JPH0181553U (ja) 1989-05-31

Family

ID=31468099

Family Applications (1)

Application Number Title Priority Date Filing Date
JP1987176358U Pending JPH0181553U (ja) 1987-11-20 1987-11-20

Country Status (1)

Country Link
JP (1) JPH0181553U (ja)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013512545A (ja) * 2009-11-27 2013-04-11 ハイジトロン,インク. ミクロ電気機械ヒータ
US9476816B2 (en) 2011-11-14 2016-10-25 Hysitron, Inc. Probe tip heating assembly
US9804072B2 (en) 2011-11-28 2017-10-31 Hysitron, Inc. High temperature heating system
US9829417B2 (en) 2012-06-13 2017-11-28 Hysitron, Inc. Environmental conditioning assembly for use in mechanical testing at micron or nano-scales

Cited By (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2013512545A (ja) * 2009-11-27 2013-04-11 ハイジトロン,インク. ミクロ電気機械ヒータ
JP2016029662A (ja) * 2009-11-27 2016-03-03 ハイジトロン, インク.Hysitron, Inc. ミクロ電気機械ヒータ
US9316569B2 (en) 2009-11-27 2016-04-19 Hysitron, Inc. Micro electro-mechanical heater
US9759641B2 (en) 2009-11-27 2017-09-12 Hysitron, Inc. Micro electro-mechanical heater
US9476816B2 (en) 2011-11-14 2016-10-25 Hysitron, Inc. Probe tip heating assembly
US9804072B2 (en) 2011-11-28 2017-10-31 Hysitron, Inc. High temperature heating system
US10241017B2 (en) 2011-11-28 2019-03-26 Bruker Nano, Inc. High temperature heating system
US9829417B2 (en) 2012-06-13 2017-11-28 Hysitron, Inc. Environmental conditioning assembly for use in mechanical testing at micron or nano-scales

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