JPH0170175U - - Google Patents
Info
- Publication number
- JPH0170175U JPH0170175U JP1987166045U JP16604587U JPH0170175U JP H0170175 U JPH0170175 U JP H0170175U JP 1987166045 U JP1987166045 U JP 1987166045U JP 16604587 U JP16604587 U JP 16604587U JP H0170175 U JPH0170175 U JP H0170175U
- Authority
- JP
- Japan
- Prior art keywords
- input
- output
- comparator
- driver
- integrator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000010586 diagram Methods 0.000 description 5
Landscapes
- Tests Of Electronic Circuits (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16604587U JPH0650787Y2 (ja) | 1987-10-28 | 1987-10-28 | Ｉｃ試験用入出力回路 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP16604587U JPH0650787Y2 (ja) | 1987-10-28 | 1987-10-28 | Ｉｃ試験用入出力回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0170175U true JPH0170175U (en:Method) | 1989-05-10 |
| JPH0650787Y2 JPH0650787Y2 (ja) | 1994-12-21 |
Family
ID=31453079
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP16604587U Expired - Lifetime JPH0650787Y2 (ja) | 1987-10-28 | 1987-10-28 | Ｉｃ試験用入出力回路 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0650787Y2 (en:Method) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001183431A (ja) * | 1999-04-06 | 2001-07-06 | Advantest Corp | 試験装置および試験方法 |
| JP2008525803A (ja) * | 2004-12-23 | 2008-07-17 | テラダイン・インコーポレーテッド | 高電圧機能を備えたピンエレクトロニクス |
-
1987
- 1987-10-28 JP JP16604587U patent/JPH0650787Y2/ja not_active Expired - Lifetime
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001183431A (ja) * | 1999-04-06 | 2001-07-06 | Advantest Corp | 試験装置および試験方法 |
| JP2008525803A (ja) * | 2004-12-23 | 2008-07-17 | テラダイン・インコーポレーテッド | 高電圧機能を備えたピンエレクトロニクス |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0650787Y2 (ja) | 1994-12-21 |