JPH0132952B2 - - Google Patents

Info

Publication number
JPH0132952B2
JPH0132952B2 JP57005835A JP583582A JPH0132952B2 JP H0132952 B2 JPH0132952 B2 JP H0132952B2 JP 57005835 A JP57005835 A JP 57005835A JP 583582 A JP583582 A JP 583582A JP H0132952 B2 JPH0132952 B2 JP H0132952B2
Authority
JP
Japan
Prior art keywords
circuit
data
input
ram
logic
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired
Application number
JP57005835A
Other languages
English (en)
Japanese (ja)
Other versions
JPS58123466A (ja
Inventor
Hidemi Yokogawa
Teruo Manome
Yasuhiko Miki
Machiko Tomioka
Myuki Fukuzawa
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tektronix Japan Ltd
Original Assignee
Sony Tektronix Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sony Tektronix Corp filed Critical Sony Tektronix Corp
Priority to JP583582A priority Critical patent/JPS58123466A/ja
Publication of JPS58123466A publication Critical patent/JPS58123466A/ja
Publication of JPH0132952B2 publication Critical patent/JPH0132952B2/ja
Granted legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00Arrangements for displaying electric variables or waveforms
    • G01R13/20Cathode-ray oscilloscopes
    • GPHYSICS
    • G06COMPUTING OR CALCULATING; COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/22Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
    • G06F11/25Testing of logic operation, e.g. by logic analysers

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Quality & Reliability (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
JP583582A 1982-01-18 1982-01-18 ロジツク・アナライザ Granted JPS58123466A (ja)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP583582A JPS58123466A (ja) 1982-01-18 1982-01-18 ロジツク・アナライザ

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP583582A JPS58123466A (ja) 1982-01-18 1982-01-18 ロジツク・アナライザ

Related Child Applications (1)

Application Number Title Priority Date Filing Date
JP58087897A Division JPS58213257A (ja) 1983-05-19 1983-05-19 ロジツク・アナライザ

Publications (2)

Publication Number Publication Date
JPS58123466A JPS58123466A (ja) 1983-07-22
JPH0132952B2 true JPH0132952B2 (enrdf_load_stackoverflow) 1989-07-11

Family

ID=11622087

Family Applications (1)

Application Number Title Priority Date Filing Date
JP583582A Granted JPS58123466A (ja) 1982-01-18 1982-01-18 ロジツク・アナライザ

Country Status (1)

Country Link
JP (1) JPS58123466A (enrdf_load_stackoverflow)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH02151774A (ja) * 1988-12-02 1990-06-11 Matsushita Electric Ind Co Ltd ロジックアナライザ

Family Cites Families (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5342869A (en) * 1976-09-30 1978-04-18 Iwatsu Electric Co Ltd Signal observing apparatus

Also Published As

Publication number Publication date
JPS58123466A (ja) 1983-07-22

Similar Documents

Publication Publication Date Title
US4623984A (en) Logic analyzer having search and comparison capabilities
US4696004A (en) Logic analyzer
US4516119A (en) Logic signal display apparatus
US4608652A (en) Method of displaying a logic signal
EP0163267A2 (en) Logic analyzer
EP0123381B1 (en) Logic waveform display apparatus
US4375635A (en) Signal measurement apparatus
JPH0132952B2 (enrdf_load_stackoverflow)
JP4069414B2 (ja) 波形表示装置
JPH0133784B2 (enrdf_load_stackoverflow)
JPH0122587B2 (enrdf_load_stackoverflow)
JPS6350668B2 (enrdf_load_stackoverflow)
JPH0136907B2 (enrdf_load_stackoverflow)
JPS58216962A (ja) ロジツク・アナライザ
EP0132925B1 (en) Diagnostic system for a raster scan type display device
JPS6342751B2 (enrdf_load_stackoverflow)
JPS6322548B2 (enrdf_load_stackoverflow)
JP3215600B2 (ja) Ic試験装置
KR20020033079A (ko) 번인 시험 프로그램의 시뮬레이션 장치 및 방법과 기억매체
JPH03202783A (ja) ロジックアナライザ
JP4952546B2 (ja) 波形発生装置及び半導体試験装置
JPS6214784B2 (enrdf_load_stackoverflow)
JPH0915303A (ja) Icテスタ
JPH05281292A (ja) Ad回路を使用するicテスタ
JP2006145267A (ja) 波形表示装置