JPH01317038A - Line switching device - Google Patents
Line switching deviceInfo
- Publication number
- JPH01317038A JPH01317038A JP63148348A JP14834888A JPH01317038A JP H01317038 A JPH01317038 A JP H01317038A JP 63148348 A JP63148348 A JP 63148348A JP 14834888 A JP14834888 A JP 14834888A JP H01317038 A JPH01317038 A JP H01317038A
- Authority
- JP
- Japan
- Prior art keywords
- test
- line
- signal
- attenuation
- switch
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000002955 isolation Methods 0.000 abstract description 6
- 238000010586 diagram Methods 0.000 description 3
- 238000013016 damping Methods 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
Landscapes
- Time-Division Multiplex Systems (AREA)
- Monitoring And Testing Of Transmission In General (AREA)
Abstract
Description
【発明の詳細な説明】
〔産業上の利用分野〕
本発明は無線回線における回線切替装置の送端側試験切
替に関する。DETAILED DESCRIPTION OF THE INVENTION [Field of Industrial Application] The present invention relates to test switching on the sending end side of a line switching device in a wireless line.
従来、無線回線における回線切替装置の送端側の構成は
、第３図に示すように、多重変換装置（図示せず）から
の回線信号と無線回線の試験を行なうだめの試験信号と
を切替る試験切替器１を有することがしばしばある。Conventionally, the configuration of the transmitting end side of a line switching device in a wireless line switches between a line signal from a multiplex converter (not shown) and a test signal for testing the wireless line, as shown in Fig. 3. It is often the case that a test switch 1 is provided.
この試験切替器１を使用して回線試験を行なう場合、現
用回線の信号に影響を与えないようにする必要がある。When performing a line test using this test switching device 1, it is necessary to avoid affecting the signals of the working line.
このために２例えばシステム切替器３Ａによシ現用回線
ＬＡの信号を予備回線ＳＢに切替えた後に、試験信号を
試験切替器ＩＡに印加するようにしていた。また、現用
回線を使用中に試験信号を印加しても現用回線の信号に
影響を与えないように十分なアイソレーション特性を有
する試験切替器を吏用していた。For this purpose, for example, after switching the signal of the working line LA to the protection line SB by the system switch 3A, a test signal is applied to the test switch IA. Furthermore, a test switch having sufficient isolation characteristics is used so that even if a test signal is applied while the working line is in use, the signal on the working line is not affected.
上述したように従来の回線切替装置では、あらかじめ試
験切替器に試験信号を印加する必要がある場合、高いア
イソレーション特性を有する試験切替器が必要である為
、たいへん高価になるという欠点があった。As mentioned above, conventional line switching equipment has the disadvantage that if it is necessary to apply a test signal to the test switch in advance, it is very expensive because a test switch with high isolation characteristics is required. .
以下余白
〔課題を解決するための手段〕
本発明の回線切替装置は、試験切替器の試験信号入力の
前に減衰回路を設け９回線信号を選択している場合には
試験信号に対して大きな減衰を与え９回線試験を行なう
ため試験信号を選択する場合には試験信号に対して減衰
を与えないように構成したことを特徴とする。The following margin [Means for solving the problem] The line switching device of the present invention provides a damping circuit before the test signal input to the test switching device, and when the 9 line signal is selected, the line switching device of the present invention has a large The present invention is characterized in that when a test signal is selected for performing a nine-line test with attenuation applied, no attenuation is applied to the test signal.
次に１本発明の一実施例について図面を参照して説明す
る。Next, an embodiment of the present invention will be described with reference to the drawings.
第１図を参照して１回線切替装置の送端側において２回
線信号は試験切替器ｌに入力される。−方、試験信号は
、減衰回路２を通り試験切替器１に入力されるように構
成する。Referring to FIG. 1, the two-line signal is input to the test switch l on the sending end side of the one-line switching device. - On the other hand, the test signal is configured to pass through the attenuation circuit 2 and be input to the test switch 1.
ここで、減衰回路２は試験切替器１が回線信号を選択し
ている場合は試験信号に対して大きな減衰を与え、試験
信号を選択している場合は減衰を与えないように試験切
替器ｌの動作に連動して減衰量が変化するように構成し
ている。なお、減衰回路２の減衰量制御は試験切替器１
への切替制御信号を利用して行われる。勿論、減衰回路
２を半導体素子で構成して無接点化を図ることにより。Here, the attenuation circuit 2 provides large attenuation to the test signal when the test switch 1 selects a line signal, and provides no attenuation when the test signal is selected. The attenuation amount is configured to change in conjunction with the operation of. The attenuation amount of the attenuation circuit 2 is controlled by the test switch 1.
This is done using a switching control signal. Of course, by configuring the attenuation circuit 2 with a semiconductor element and making it contactless.
信頼性を高めることもできる。このようにして。It can also improve reliability. In this way.
試験切替器１のアイソレーション特性を補うことができ
、常時試験信号を印加することができる。The isolation characteristic of the test switch 1 can be supplemented, and a test signal can be constantly applied.
第２図は本発明による回線切替装置を示す。FIG. 2 shows a line switching device according to the present invention.
以上説明したように本発明は、試験切替器の試験信号入
力側に減衰回路を挿入することにより。As explained above, the present invention is achieved by inserting an attenuation circuit on the test signal input side of the test switch.
高いアイソレーション特性の試験切替器は不要であり、
安価な回線切替装置を構成できる効果がある。A test switch with high isolation characteristics is not required.
This has the effect of configuring an inexpensive line switching device.
第１図は本発明による回線切替装置の要部の構成図。 第２図は本発明の回線切替装置の構成図。 第３図は従来の回線切替装置の構成図。 １、ＩＡ：試験切替器、２，２Ａ：減衰回路。 ３Ａ、３Ｂ、３Ｎニジステム切替器。 FIG. 1 is a configuration diagram of main parts of a line switching device according to the present invention. FIG. 2 is a configuration diagram of the line switching device of the present invention. FIG. 3 is a configuration diagram of a conventional line switching device. 1, IA: test switch, 2, 2A: attenuation circuit. 3A, 3B, 3N system switch.
Claims (1)
回線切替装置において、前記試験切替器の入力側に減衰
回路を設け、前記試験切替器が前記回線信号を選択して
いる時には、前記試験信号に対して減衰を与え、前記試
験信号を選択している場合は、該試験信号に対して減衰
を与えないように構成したことを特徴とする回線切替装
置。1. In a line switching device having a test switch that switches between a line signal and a test signal, an attenuation circuit is provided on the input side of the test switch, and when the test switch selects the line signal, the test signal 1. A line switching device characterized in that the line switching device is configured to apply attenuation to the test signal and not to apply attenuation to the test signal when the test signal is selected.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63148348A JPH01317038A (en) | 1988-06-17 | 1988-06-17 | Line switching device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP63148348A JPH01317038A (en) | 1988-06-17 | 1988-06-17 | Line switching device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01317038A true JPH01317038A (en) | 1989-12-21 |
Family
ID=15450753
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP63148348A Pending JPH01317038A (en) | 1988-06-17 | 1988-06-17 | Line switching device |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01317038A (en) |
Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6126341A (en) * | 1984-07-16 | 1986-02-05 | Fujitsu Ltd | Supervisory system of distortion compensation |
| JPS62114343A (en) * | 1985-11-13 | 1987-05-26 | Nippon Telegr & Teleph Corp <Ntt> | Waveform distortion giving circuit for test |
-
1988
- 1988-06-17 JP JP63148348A patent/JPH01317038A/en active Pending
Patent Citations (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6126341A (en) * | 1984-07-16 | 1986-02-05 | Fujitsu Ltd | Supervisory system of distortion compensation |
| JPS62114343A (en) * | 1985-11-13 | 1987-05-26 | Nippon Telegr & Teleph Corp <Ntt> | Waveform distortion giving circuit for test |
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