JPH01279381A - Diode function generater circuit - Google Patents

Diode function generater circuit

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Publication number
JPH01279381A
JPH01279381A JP10965288A JP10965288A JPH01279381A JP H01279381 A JPH01279381 A JP H01279381A JP 10965288 A JP10965288 A JP 10965288A JP 10965288 A JP10965288 A JP 10965288A JP H01279381 A JPH01279381 A JP H01279381A
Authority
JP
Japan
Prior art keywords
circuits
linear function
circuit
signal
linear
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10965288A
Other languages
Japanese (ja)
Inventor
Shinichi Oe
信一 小江
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP10965288A priority Critical patent/JPH01279381A/en
Publication of JPH01279381A publication Critical patent/JPH01279381A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To eliminate the restriction to generate a function approximated by linear segments by respectively forming linear function generation circuits, comparators, switching circuits, and a control circuit of circuits using no diode utilizing parasitic transistor effects, and switching linear functions by detecting the intersection of each linear function. CONSTITUTION:The linear function generation circuits 1A and 1B are respectively provided with amplifiers A1 and resistances R1, R4 and, by changing the values of the resistances R1-R4, etc., signals of desired linear functions are obtained from the circuits 1A and 1B. The switching circuits 3A and 3B are respectively constituted of CMOS transfer gates using transistors Q1 and Q2 and switching of the circuits 3A and 3B are performed by means of the control circuit 4A constituted in an inverter I1. Therefore, a diode utilizing a parasitic transistor effect is not required for constituting each section. Thus restriction to the extent of a generated function can be eliminated.

Description

【発明の詳細な説明】 〔産業上の利用分野〕 本発明は折れ線間数発生回路に関し、特にMO3LSI
等における折れ線間数発生回路に関する。
[Detailed Description of the Invention] [Field of Industrial Application] The present invention relates to a polygonal line number generation circuit, and particularly to a MO3LSI
Regarding the number generation circuit between broken lines in etc.

〔従来の技術〕[Conventional technology]

従来の折れ線間数発生回路の一例としては、第4図に示
すように、ダイオードD1を用いた回路がある。
An example of a conventional line interval number generation circuit is a circuit using a diode D1, as shown in FIG.

この折れ線間数発生回路は、増幅器A2と抵抗R2〜R
8とダイオードD1とを備え、バイアス電圧VBを印加
し入力信号VI′により所定の折れ線間数の出力信号V
o′を出力する構成となっている。
This line-to-line number generation circuit consists of an amplifier A2 and resistors R2 to R.
8 and a diode D1, a bias voltage VB is applied, and an output signal V with a predetermined number of line intervals is generated according to an input signal VI'.
It is configured to output o'.

抵抗R2〜R8の抵抗値をそれぞれ記号と同じR3−R
8とし、バイアス電圧V8を負とすると、入力信号V1
′と出力信号V。′との関係は次式のとおり゛となる。
The resistance values of resistors R2 to R8 are the same as the symbol R3-R.
8 and the bias voltage V8 is negative, the input signal V1
' and the output signal V. The relationship with ′ is as shown in the following equation.

上式において、R1−R8及びV8の値を選び定めるこ
とにより希望の折れ線間数の出力信号■o′を発生する
ことができる。
In the above equation, by selecting and determining the values of R1-R8 and V8, it is possible to generate an output signal ``o'' with a desired number of line intervals.

なお、ダイオードDIは、MO8LSI等の製造工程に
おいて得られる寄生トランジスタ効果により形成される
Note that the diode DI is formed by a parasitic transistor effect obtained in the manufacturing process of MO8LSI and the like.

〔発明が解決しようとする課題〕[Problem to be solved by the invention]

上述した従来の折れ線間数発生回路は、ダイオードD1
が必要であり、このダイオードD1はMO3LSIの製
造工程において得られる寄生トランジスタ効果により形
成される構成となっているので、このダイオードD1は
その端子電圧としての使用可能な電圧に制限があり、発
生する折れ線間数の範囲が制限されるという欠点がある
The conventional line-to-line number generation circuit described above has a diode D1.
Since this diode D1 is formed by the parasitic transistor effect obtained in the manufacturing process of MO3LSI, there is a limit to the voltage that can be used as the terminal voltage of this diode D1, and this occurs. There is a drawback that the range of the number of lines between lines is limited.

また、寄生トランジスタ効果によらないダイオードを得
ようとすると、MO3LSIの製造工程が増加するとい
う欠点がある。
Furthermore, if an attempt is made to obtain a diode that is free from parasitic transistor effects, there is a drawback in that the number of manufacturing steps for MO3LSI increases.

本発明の目的は、発生する折れ線間数の範囲に制約がな
く、かつMO3LSIの製造工程が増加することのない
折れ線間数発生回路を提供することにある。
SUMMARY OF THE INVENTION An object of the present invention is to provide a polygon line number generating circuit that has no restrictions on the range of the number of polygon lines generated and does not require an increase in the manufacturing process of MO3LSI.

〔課題を解決するための手段〕[Means to solve the problem]

本発明の折れ線間数発生回路は、入力信号によりそれぞ
れ異なる一次関数の信号を発生する複数の一次関数発生
回路と、それぞれこれら−玄関数発生回路の出力信号の
うちの所定の2つを比較し、これら出力信号と対応する
一次関数の交点を検出して交点検出信号を出力する少な
くとも1つのコンパレータと、前記各−玄関数発生回路
の出力端と出力端子との間にそれぞれ接続され制御信号
によりオン・オフする複数のスイッチ回路と、前記各コ
ンパレータからの交点検出信号により前記複数のスイッ
チ回路のうちの1つをオンとする前記制御信号を発生す
る制御回路とを有している。
The line-to-line number generation circuit of the present invention compares a plurality of linear function generation circuits that generate signals of different linear functions depending on input signals, and predetermined two of the output signals of each of these linear function generation circuits. , at least one comparator that detects the intersection of these output signals and the corresponding linear function and outputs an intersection detection signal, and is connected between the output terminal and the output terminal of each of the gate number generation circuits and is controlled by a control signal. It has a plurality of switch circuits that turn on and off, and a control circuit that generates the control signal that turns on one of the plurality of switch circuits based on the intersection detection signal from each of the comparators.

〔実施例〕〔Example〕

次に、本発明の実施例について図面を参照して説明する
Next, embodiments of the present invention will be described with reference to the drawings.

第1図は本発明の一実施例を示すブロック図である。FIG. 1 is a block diagram showing one embodiment of the present invention.

一次関数発生回路IA〜INは、入力信号V。The linear function generation circuits IA to IN receive an input signal V.

によりそれぞれ異なる一次関数の信号VOA〜VONを
発生する。
Accordingly, signals VOA to VON of different linear functions are generated.

コンパレータ2A〜2Mはそれぞれ、−玄関数発生回路
IA〜INの出力信号VoA〜voFlのうちの所定の
2つを比較し、これら2つの出力信号(VOA〜VON
)と対応する一次関数の交点を検出して交点検出信号V
XA〜VXMを出力する。
The comparators 2A to 2M respectively compare predetermined two of the output signals VoA to voFl of the gate number generation circuits IA to IN, and compare these two output signals (VOA to VON
) and the corresponding linear function to detect the intersection point detection signal V
Outputs XA to VXM.

スイッチ回路3A〜3Nはそれぞれ、対応する一次関数
発生回路(IA〜IN)の出力端と出力端子Toとの間
に接続され制御信号■い〜VCNによりオン・オフする
The switch circuits 3A to 3N are respectively connected between the output ends of the corresponding linear function generation circuits (IA to IN) and the output terminals To, and are turned on and off by control signals I to VCN.

制御回路4は、コンパレータ2^〜2Mからの交点検出
信号VXA〜VXHにより、スイッチ回路3A〜3Nの
うちの1つをオンする制御信号■cA〜VCNを発生す
る。
The control circuit 4 generates control signals cA to VCN that turn on one of the switch circuits 3A to 3N based on the intersection detection signals VXA to VXH from the comparators 2^ to 2M.

第2図はこの実施例の動作を説明するための各部の入力
信号■!に対する出力信号Vo 、 VOA〜VOCの
特性図である。
Figure 2 shows the input signals of each part to explain the operation of this embodiment. FIG. 4 is a characteristic diagram of output signals Vo and VOA to VOC for the output signals V0 and VOA.

入力信号VIのベレルが大きくなるに従い、−玄関数発
生回路IA〜1cの出力信号V。AzVoCのレベルは
それぞれ所定の一次関数に従って変化する。
As the level of the input signal VI increases, the output signal V of the gate number generating circuits IA to 1c increases. The levels of AzVoC each vary according to a predetermined linear function.

制御回路4は、まず、コンパレータ2Aの出力信号(V
XA)に従って制御信号vcBによりスイッチ回路3B
をオンにし一次関数発生回路1nの出力信号■oBを出
力端子Toへ伝達する。
The control circuit 4 first receives the output signal (V
XA), the switch circuit 3B is activated by the control signal vcB.
is turned on and the output signal ■oB of the linear function generating circuit 1n is transmitted to the output terminal To.

次に、コンパレータ2^が一次関数発生回路LA、IB
の出力信号VOA、 VOBの交点を検出すると、交点
検出信号VXAに従って制御回路4がらの制御信号■。
Next, the comparator 2^ is the primary function generator circuit LA, IB.
When the intersection of the output signals VOA and VOB is detected, the control circuit 4 outputs a control signal (2) according to the intersection detection signal VXA.

A+ vCBによりスイッチ回路3Aがオン、スイッチ
回路3Bがオフとなり、−玄関数発生回路IAの出力信
号VOAが出力端子T0がら出力される。
A+ vCB turns on the switch circuit 3A and turns off the switch circuit 3B, and the output signal VOA of the -gateway number generation circuit IA is output from the output terminal T0.

以下同様に゛して、第2図に示すような出力信号V、が
得られる。
In the same manner, an output signal V as shown in FIG. 2 is obtained.

第3図は本発明の具体的な回路例を一次関数発生回路が
2つの場合について示したものである。
FIG. 3 shows a specific circuit example of the present invention in a case where there are two linear function generating circuits.

一次関数発生回路1^、IBはそれぞれ、増幅器A1と
抵抗R,,R2、R8,R4を含んで構成され、これら
抵抗R1〜R4の値などを変えることにより所望の一次
関数の信号を得ることができる。
The linear function generating circuits 1^ and IB each include an amplifier A1 and resistors R, , R2, R8, and R4, and a desired linear function signal can be obtained by changing the values of these resistors R1 to R4. I can do it.

スイッチ回路3A、3BはトランジスタQ+。Switch circuits 3A and 3B are transistors Q+.

Q2を用いたCMO3)ランスファゲートで構成し、こ
れらの切換えはインバータ■、構成の制御回路4八によ
り行なわれる。
It is composed of a CMO3) transfer gate using Q2, and these switching is performed by an inverter (2) and a control circuit 48 of the structure.

このように、各部を構成するのに、寄生トランジスタ効
果によるダイオードを使用しなくて済み、またこれら各
部は通常のMO3LSIの製造工程と同時に形成するこ
とができるので製造工程を増加させないで済む。
In this way, it is not necessary to use diodes due to parasitic transistor effects to construct each part, and since these parts can be formed simultaneously with the normal MO3LSI manufacturing process, there is no need to increase the manufacturing process.

〔発明の効果〕〔Effect of the invention〕

以上説明したように本発明は、一次関数発生回路、コン
パレータ、スイッチ回路及び制御回路を寄生トランジス
タ効果によるダイオードを使用しない回路で形成し、こ
れらにより各−次間数の交点を検出してこれら一次関数
の切換えを行う構成とすることにより、寄生トランジス
タ効果によるダイオードを使用しないので、発生する折
れ線間数の範囲に対する制約をなくすことができ、また
、通常のMOSFETの製造工程を増加させないで形成
することができる効果がある。
As explained above, in the present invention, the linear function generation circuit, comparator, switch circuit, and control circuit are formed by circuits that do not use diodes due to parasitic transistor effects, and by these, the intersection of each -order number is detected and the By adopting a configuration in which functions are switched, a diode due to a parasitic transistor effect is not used, so restrictions on the range of the number of broken lines that occur can be eliminated, and the MOSFET can be formed without increasing the manufacturing process of a normal MOSFET. There is an effect that can be done.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例を示すブロック図、第2図は
第1図に示された実施例の動作を説明するための各部信
号の特性図、第3図は本発明の具体的回路例を示す回路
図、第4図は従来の折れ線間数発生回路の一例を示す回
路図である。 IA〜IN・・・一次関数発生回路、2A〜2M・・・
コンパレータ、3A〜3N・・・スイッチ回路、4゜4
A・・・制御回路、A 1. A 2・・・増幅器、D
l・・・ダイオード、Ql、Q2・・・トランジスタ、
R1−R8・・・抵抗、′
FIG. 1 is a block diagram showing an embodiment of the present invention, FIG. 2 is a characteristic diagram of each part signal to explain the operation of the embodiment shown in FIG. FIG. 4 is a circuit diagram showing an example of a conventional line interval number generation circuit. IA~IN...linear function generation circuit, 2A~2M...
Comparator, 3A~3N...Switch circuit, 4゜4
A...Control circuit, A1. A2...Amplifier, D
l...diode, Ql, Q2... transistor,
R1-R8...Resistance,'

Claims (1)

【特許請求の範囲】[Claims] 入力信号によりそれぞれ異なる一次関数の信号を発生す
る複数の一次関数発生回路と、それぞれこれら一次関数
発生回路の出力信号のうちの所定の2つを比較し、これ
ら出力信号と対応する一次関数の交点を検出して交点検
出信号を出力する少なくとも1つのコンパレータと、前
記各一次関数発生回路の出力端と出力端子との間にそれ
ぞれ接続され制御信号によりオン・オフする複数のスイ
ッチ回路と、前記各コンパレータからの交点検出信号に
より前記複数のスイッチ回路のうちの1つをオンとする
前記制御信号を発生する制御回路とを有することを特徴
とする折れ線関数発生回路。
A plurality of linear function generating circuits each generating a signal of a different linear function depending on an input signal are compared with predetermined two of the output signals of each of these linear function generating circuits, and the intersection of these output signals and the corresponding linear function is determined. at least one comparator that detects and outputs an intersection detection signal; a plurality of switch circuits connected between the output ends and output terminals of each of the linear function generating circuits and turned on and off by a control signal; and a control circuit that generates the control signal that turns on one of the plurality of switch circuits in response to an intersection detection signal from a comparator.
JP10965288A 1988-05-02 1988-05-02 Diode function generater circuit Pending JPH01279381A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10965288A JPH01279381A (en) 1988-05-02 1988-05-02 Diode function generater circuit

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10965288A JPH01279381A (en) 1988-05-02 1988-05-02 Diode function generater circuit

Publications (1)

Publication Number Publication Date
JPH01279381A true JPH01279381A (en) 1989-11-09

Family

ID=14515714

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10965288A Pending JPH01279381A (en) 1988-05-02 1988-05-02 Diode function generater circuit

Country Status (1)

Country Link
JP (1) JPH01279381A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0711034A1 (en) * 1994-11-07 1996-05-08 THOMSON multimedia Generating means for transfer functions defined by intervals

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0711034A1 (en) * 1994-11-07 1996-05-08 THOMSON multimedia Generating means for transfer functions defined by intervals

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