JPH01278200A - Arranging type ultrasonic probe - Google Patents
Arranging type ultrasonic probeInfo
- Publication number
- JPH01278200A JPH01278200A JP63108390A JP10839088A JPH01278200A JP H01278200 A JPH01278200 A JP H01278200A JP 63108390 A JP63108390 A JP 63108390A JP 10839088 A JP10839088 A JP 10839088A JP H01278200 A JPH01278200 A JP H01278200A
- Authority
- JP
- Japan
- Prior art keywords
- piezoelectric plate
- flexible substrate
- conductive path
- common line
- ultrasonic probe
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 239000000523 sample Substances 0.000 title claims abstract description 25
- 239000000758 substrate Substances 0.000 claims abstract description 47
- 239000000463 material Substances 0.000 claims abstract description 14
- 238000005520 cutting process Methods 0.000 claims description 5
- 238000012856 packing Methods 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 10
- 239000011347 resin Substances 0.000 description 5
- 229920005989 resin Polymers 0.000 description 5
- 229910052451 lead zirconate titanate Inorganic materials 0.000 description 4
- 239000002184 metal Substances 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 239000004020 conductor Substances 0.000 description 2
- 230000000694 effects Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 230000007257 malfunction Effects 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- WTDRDQBEARUVNC-LURJTMIESA-N L-DOPA Chemical compound OC(=O)[C@@H](N)CC1=CC=C(O)C(O)=C1 WTDRDQBEARUVNC-LURJTMIESA-N 0.000 description 1
- 239000004642 Polyimide Substances 0.000 description 1
- 230000002411 adverse Effects 0.000 description 1
- 230000005540 biological transmission Effects 0.000 description 1
- 230000003111 delayed effect Effects 0.000 description 1
- 238000001514 detection method Methods 0.000 description 1
- 230000002542 deteriorative effect Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 230000005284 excitation Effects 0.000 description 1
- 238000005304 joining Methods 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- HFGPZNIAWCZYJU-UHFFFAOYSA-N lead zirconate titanate Chemical compound [O-2].[O-2].[O-2].[O-2].[O-2].[Ti+4].[Zr+4].[Pb+2] HFGPZNIAWCZYJU-UHFFFAOYSA-N 0.000 description 1
- 238000005065 mining Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 229920001721 polyimide Polymers 0.000 description 1
- 238000003825 pressing Methods 0.000 description 1
- 238000004080 punching Methods 0.000 description 1
- 230000011218 segmentation Effects 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
- 230000003313 weakening effect Effects 0.000 description 1
- 239000002023 wood Substances 0.000 description 1
Landscapes
- Ultra Sonic Daignosis Equipment (AREA)
- Transducers For Ultrasonic Waves (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
Description
【発明の詳細な説明】
(産業上の利用分野)
本発明はフレキシブル基板を使用した配列型の超音波探
触子(以下、配列型探触子)を利用分野とし、特に作業
性を良好にして動作不良を防止した配列型探触子に関す
る。[Detailed description of the invention] (Industrial field of application) The field of the present invention is an array-type ultrasonic probe (hereinafter referred to as an array-type probe) using a flexible substrate. This invention relates to an array type probe that prevents malfunctions.
(発明の背景)
配列型探触子は複数個の圧電片を並べて形成され、例え
ば医用、鉱工業用等の診断装置、探傷装置に超音波の送
受波源として有用されろ。例えば複数の圧電片に遅延パ
ルスを順次印加して所謂セクタ走査して超音波を扇状に
送受波し、疾患部を診断する。近年では、小型化、細分
化等により、フレキシブル基板により圧電片の電極導出
を行うようにしている。(Background of the Invention) An array type probe is formed by arranging a plurality of piezoelectric pieces, and is useful as an ultrasonic transmission/reception wave source in, for example, medical, mining and industrial diagnostic equipment and flaw detection equipment. For example, delayed pulses are sequentially applied to a plurality of piezoelectric pieces to perform so-called sector scanning, transmitting and receiving ultrasonic waves in a fan shape, and diagnosing a diseased area. In recent years, due to miniaturization and segmentation, the electrodes of piezoelectric pieces are led out using flexible substrates.
(従来技術) 第3図はこの種の配列型探触子を説明する図である。(Conventional technology) FIG. 3 is a diagram illustrating this type of array type probe.
配列型探触子は、先ず、例えばジルコン酸チタン酸鉛(
以下、PZTとする)からなる矩形状の圧電板1をフレ
キシブル基板2に取着する。なお、圧電板1の両主面に
は厚み方向の振動を励起する励振電極3n、3bを形成
されている。フレキシブル基板2は中空部4を有する例
えばポリイミドからなる樹脂基体5に導電路6を形成し
、更にその上から図示しない樹脂カバーを積層してなる
。Array type probes are first made of lead zirconate titanate (
A rectangular piezoelectric plate 1 made of PZT (hereinafter referred to as PZT) is attached to a flexible substrate 2. Note that excitation electrodes 3n and 3b are formed on both main surfaces of the piezoelectric plate 1 to excite vibration in the thickness direction. The flexible substrate 2 is formed by forming a conductive path 6 on a resin base 5 made of, for example, polyimide and having a hollow portion 4, and further laminating a resin cover (not shown) thereon.
導電路6は中空部4の対向辺部から千鳥状に等間隔で延
出j7てなる。導電路6は樹ガn基体5の端部から一定
の幅Wでその表面を露出して接合面9とする。The conductive paths 6 extend from opposite sides of the hollow portion 4 in a staggered manner at equal intervals j7. The surface of the conductive path 6 is exposed at a constant width W from the end of the wood base 5 to form a bonding surface 9.
そして、圧電板1の短手方向の両端側をフレキシブル基
板2 (信号線路)の接合面9に例えば半田等により接
合して取着する「第3図(a)」。Then, both ends of the piezoelectric plate 1 in the transverse direction are bonded and attached to the bonding surface 9 of the flexible substrate 2 (signal line) by, for example, soldering, as shown in FIG. 3(a).
なお、圧電板1とフレキシブル基板2とを接合したもの
を基板接合体10とする。Note that the piezoelectric plate 1 and the flexible substrate 2 are bonded together to form a substrate assembly 10.
次に、基板接合体10のフレキシブル基板側をバッキン
グ材11上に取着する「第3図(b)」。Next, as shown in FIG. 3(b), the flexible substrate side of the substrate assembly 10 is attached onto the backing material 11.
バッキング材11は例えば絶縁性ゴムからなる。The backing material 11 is made of, for example, insulating rubber.
フレキシブル基板2はバッキング材11の両側面に折り
曲げられ、圧電板1上から各導電路6間を順次切断され
る。そして、電気的に独立して各導m路6に接続した個
々の圧電片12を得て配列型探触子を形成する「第3図
(C)」。なお、通常では、基板接合体10の切断前後
に、圧電板1(圧電片12)の自由面側に図示しない音
響整合層を形成17、この面を超音波の送受波面とする
。The flexible substrate 2 is bent onto both sides of the backing material 11, and the conductive paths 6 are sequentially cut from the top of the piezoelectric plate 1. Then, as shown in FIG. 3(C), individual piezoelectric pieces 12 are electrically independently connected to each conductive path 6 to form an array type probe. Note that normally, before and after cutting the substrate assembly 10, an acoustic matching layer (not shown) is formed 17 on the free surface side of the piezoelectric plate 1 (piezoelectric piece 12), and this surface is used as a wave surface for transmitting and receiving ultrasonic waves.
(従来技術の問題点)
しかしながら、上記超音波探触子では、通常、フレキシ
ブル基板2の中空部4は、各導電路6の露出した先端部
を長めにして形成されたフレキシブル基板を、例えばプ
レス等の打抜きにより各導電路の先端側一部をも同時に
切断して形成される。(Problems with the Prior Art) However, in the above ultrasonic probe, the hollow portion 4 of the flexible substrate 2 is usually formed by pressing, for example, a flexible substrate formed by making the exposed end portion of each conductive path 6 longer. It is formed by simultaneously cutting a part of the tip side of each conductive path by punching, etc.
このため、各導Ti路6の露出部分の切断面には外力が
加えられ、必ずしも切断前の直線状とはならず、第4図
に示したように所定方向に曲げられる。For this reason, an external force is applied to the cut surface of the exposed portion of each Ti guiding path 6, and the cut surface does not necessarily become straight as before cutting, but is bent in a predetermined direction as shown in FIG. 4.
従って、このようなものでは、圧電板1と7レキシブル
基板2との取着後に両者を導ri路6路間で切断して個
々の圧電片12を得る場合、各導?IS路6と圧電片1
2の接合面とは一致せず未接合部分(ズレ)を生じる。Therefore, in such a device, when the piezoelectric plates 1 and 7 flexible substrate 2 are attached and then cut between the 6 ri-way paths to obtain individual piezoelectric pieces 12, each conductor 1 is cut off between the 6 ri-way paths. IS path 6 and piezoelectric piece 1
It does not match the joint surface of No. 2, and an unjoined portion (misalignment) occurs.
その結果、電気的・機械的な接合強度を弱め、耐衝撃性
を劣化させる問題があった。As a result, there was a problem of weakening electrical and mechanical bonding strength and deteriorating impact resistance.
この問題を解決するために、例えば中空部4の対向辺部
に11151wの共通線路13を設け、この共通線路1
3から信号線路を延出したフレキシブル基板2を使用(
7て形成したものがある。すなわち、中空部4は、予め
幅Wより大きな幅の図示しない共通線路の形成されたフ
レキシブル基板を、共通線路の一部とともに切断して形
成される。従って、中空部4の形成時には、導電路6に
直接外力が加わらないのでその直線状を維持する。その
結果、このようなものでは、圧電板1の両端部と共通線
路13の端部とを一致させて接合した後、両者を導電路
6間で一体的に切断しても、圧電片と導電路6との電気
的・機械的な接合強度を確実に維持できる。In order to solve this problem, for example, a common line 13 of 11151w is provided on the opposite side of the hollow part 4, and this common line 1
A flexible board 2 with a signal line extended from 3 is used (
There is one formed by 7. That is, the hollow portion 4 is formed by cutting a flexible substrate on which a common line (not shown) having a width larger than the width W is formed in advance together with a part of the common line. Therefore, when forming the hollow portion 4, no external force is directly applied to the conductive path 6, so that its straight shape is maintained. As a result, in such a device, even if both ends of the piezoelectric plate 1 and the end of the common line 13 are aligned and joined, and then both are cut integrally between the conductive paths 6, the piezoelectric piece and the conductive The electrical and mechanical bonding strength with the path 6 can be maintained reliably.
しかしながら、この場合においては、基板接合体10を
形成するとき、半田等の導電性の接合材は圧電板1の電
極3bと接合面9との間に均一に施し、両者を電気的・
機械的に確実に接続しなければならない。すなわち、基
板接合体10とした後、細線状の圧電片12に細かく分
割しても、両者の電気的・機械的な接合を維持するため
である。However, in this case, when forming the substrate assembly 10, a conductive bonding material such as solder is uniformly applied between the electrode 3b of the piezoelectric plate 1 and the bonding surface 9, and both are electrically connected.
The connection must be mechanically secure. That is, even if the substrate assembly 10 is divided finely into thin wire-shaped piezoelectric pieces 12, the electrical and mechanical bond between the two is maintained.
通常では、接合材をやや多めに施17てこれを達成する
ようにしている。このため、第6図に示したように、接
合材14が圧電板1と接合面との間から粒状の余剰分と
なって食み出し、これがt’WIIFJカバー15上に
突出する。このような場合には余剰分14′を人的に検
出して取り除く作業を強いられて生産性を低下する。そ
して、この余剰分14’のうち特に遊離し易いものが放
置された場合には、衝撃等により離散し、例えば各圧電
片12の電極3間を短絡させる。Normally, this is achieved by applying a slightly larger amount of bonding material 17. Therefore, as shown in FIG. 6, the bonding material 14 protrudes from between the piezoelectric plate 1 and the bonding surface in the form of granular excess, and this protrudes onto the t'WIIFJ cover 15. In such a case, the operator is forced to manually detect and remove the surplus 14', which reduces productivity. If a part of this surplus 14' that is particularly likely to come loose is left unattended, it will be scattered by impact or the like, causing a short circuit between the electrodes 3 of each piezoelectric piece 12, for example.
また、基板接合体10を一体的に切断すると、共通線路
13の圧電板1の一端部から突出した部分にパリ等を生
ずる。そ17て、このパリ等は直接・間接的に悪影響を
及ぼして導電路6間の絶縁性を悪化させる。また、金属
屑の発生源ともなり、前述同様に電極3間等を短絡して
動作不良を起こす問題があった。Furthermore, if the substrate assembly 10 is cut into one piece, a crack or the like will be generated in the portion of the common line 13 that protrudes from one end of the piezoelectric plate 1. 17. This Paris etc. have a direct or indirect adverse effect and deteriorate the insulation between the conductive paths 6. In addition, it also becomes a source of metal debris, and as described above, there is a problem in that short-circuiting occurs between the electrodes 3, etc., resulting in malfunction.
(発明の目的)
本発明は、作業性を良好としてフレキシブル基板と圧電
片との電気的・機械的な接合強度を維持して#4衝撃性
を高め、確実な動作を行える配列型探触子を提供するこ
とを目的とする。(Objective of the Invention) The present invention provides an array type probe that has good workability, maintains the electrical and mechanical bonding strength between the flexible substrate and the piezoelectric piece, increases #4 impact resistance, and can operate reliably. The purpose is to provide
(解決手段)
本発明は、フレキシブル基板の中空部の対向片部に設け
た共通線路を矩形状圧電板の一端側より内側に位置させ
、矩形状圧電板の一端部とフレキシブル基板との間に間
隙を設けて°両者を接続した後、分割形成したことを解
決手段とする。以下、本発明の一実施例を説明する。(Solution Means) In the present invention, the common line provided in the opposing piece of the hollow part of the flexible substrate is located inside one end of the rectangular piezoelectric plate, and between the one end of the rectangular piezoelectric plate and the flexible substrate. The solution is to connect the two with a gap and then form them separately. An embodiment of the present invention will be described below.
(実施例)
第1図は本発明の一実施例を説明する超音波探触子の図
である。なお、前実施例図と同一部分に(よ同番号を付
与して説明する。(Embodiment) FIG. 1 is a diagram of an ultrasonic probe illustrating an embodiment of the present invention. Note that the same parts as those in the previous embodiment drawings are given the same numbers for explanation.
配列型探触子は、先ず前述同様に、両主面に電i3n、
3bの形成されたPZTからなる圧電板1を、中空部4
の形成されたフレキシブル基板2に取着する。フレキシ
ブル基板2のfM脂基体5上には、中空部の対向辺に沿
う共通線路16と、これから等間隔で千鳥状に延出した
複数の導電路17とが延出して形成される。共通線路1
6はその幅【Iを前述した幅Wより小さ(する。そして
、共通線路1Gと導電1路17の延出始端部との表面を
露出して幅【1′の二重斜線で示す接合面18とする。First, the array type probe has electric i3n,
A piezoelectric plate 1 made of PZT having a structure 3b formed thereon is placed in a hollow part 4.
It is attached to the flexible substrate 2 formed with . On the fM resin base 5 of the flexible substrate 2, a common line 16 extending along opposite sides of the hollow portion and a plurality of conductive paths 17 extending from the common line 16 in a staggered manner at equal intervals are formed. common track 1
6 is made so that its width [I is smaller than the above-mentioned width W. Then, the surfaces of the common line 1G and the extending start end of the conductive path 17 are exposed to form a joint surface with a width [1' indicated by double diagonal lines. 18.
接合面18以外の樹脂基体5上には図示しない四11M
カバーをM層する。すなわち、共通線路16と各導電路
17の延出始端部との間は、導電路17の厚みによる空
部19とを生じさせろ。そして、圧電板1の一方の主面
の両端部を接合面18に合わせて接合材により取着する
。すなわち、共通線路16は圧電板1の端部より内側に
位置し、空部1っけ圧電板1の両端側部と基板樹脂体5
との間に間隙となって基板接合体20が形成されろ[第
1図(all。There are four 11M not shown on the resin base 5 other than the joint surface 18.
Make M layers of cover. That is, between the common line 16 and the starting end of each conductive path 17, a void 19 should be created due to the thickness of the conductive path 17. Then, both ends of one main surface of the piezoelectric plate 1 are aligned with the bonding surface 18 and attached using a bonding material. That is, the common line 16 is located inside the end of the piezoelectric plate 1, and connects both end sides of the piezoelectric plate 1 and the substrate resin body 5 in the empty space.
The substrate assembly 20 is formed with a gap between them [FIG. 1 (all).
次に、前述同様に、基板接合体20をバッキング材11
に取着してフレキシブル基板2をバッキング材11の両
側面に折り曲げ、圧電板1上からフレキシブル基板2の
導電路間を順次切断する。Next, as described above, the substrate assembly 20 is attached to the backing material 11.
The flexible substrate 2 is bent onto both sides of the backing material 11, and the conductive paths of the flexible substrate 2 are sequentially cut from the top of the piezoelectric plate 1.
そして、電気的に独立して導電路に接続した個々の圧電
片12を得て配列型探触子とする「第1図(b)J
。Then, each piezoelectric piece 12 is electrically independently connected to a conductive path to form an array type probe.
.
このような構成の配列型探触子では、圧電板1を接合面
18に取着する際、第2図に示したように接合材14の
余剰分14′は段差を持った空部19に流出し易くなる
。そして、圧電板1の端部から細胞カバー21上に突出
する量を減少する。In the array type probe having such a configuration, when the piezoelectric plate 1 is attached to the bonding surface 18, the excess portion 14' of the bonding material 14 is inserted into the stepped cavity 19 as shown in FIG. It becomes easier to leak out. Then, the amount of protrusion from the end of the piezoelectric plate 1 onto the cell cover 21 is reduced.
従って、このようなものは、余剰分14の除去作業を簡
単にして作業性を高めろ。そして、余剰分14′は空部
19内に固定されることもあって、衝撃等による離散を
防止する。また、共通線路17は圧電板の内側に位置し
て固着されるので、基板接合体10を一体的に切断して
もパリ等(金属屑)の発生を少なく押さえる。従って、
半田の余剰分や金属屑による電極3や切断後の共n線路
を含む導fri路17間等の短絡を防止して絶縁性を良
好とし、確実な動作を行うことができる。Therefore, in such a case, the work of removing the surplus portion 14 should be simplified to improve work efficiency. The surplus portion 14' may be fixed within the cavity 19, thereby preventing it from becoming separated due to impact or the like. Further, since the common line 17 is located and fixed inside the piezoelectric plate, generation of particles (metal chips) etc. can be suppressed to a minimum even if the substrate assembly 10 is cut integrally. Therefore,
It is possible to prevent short circuits between the electrodes 3 and the conductive path 17 including the cut common n-line due to excess solder or metal scraps, improve insulation, and ensure reliable operation.
(他の事項)
なお、上記実施例では中空部の対向辺部に設けた共通線
路16から千鳥状に導電路を延出てしたものについて説
明したが、本発明は例えば一方の共通線路からのみ信号
線としての導WsFpIを延出し、他方の共通線路をア
ース電位用としたものに遠用できる。要するに、中空部
の対向辺に共通線路を設けて圧電板を取着し、その後者
圧電板に分割して配列型探触子を形成する場合には、本
発明を適用できる。(Other Matters) In the above embodiment, the conductive paths are extended in a staggered manner from the common line 16 provided on the opposite side of the hollow part, but the present invention can extend from only one common line, for example. The conductor WsFpI as a signal line can be extended and the other common line can be used for a long distance as a ground potential line. In short, the present invention can be applied to the case where common lines are provided on opposite sides of a hollow portion, piezoelectric plates are attached, and the latter piezoelectric plates are divided to form an array type probe.
(発明の効果)
本発明は、フレキシブル基板の共通線路部を矩形状圧電
板の一端側より内側に位置させ、矩形状圧電板の一端部
とフレキシブル基板との間に間隙を設けて両者を接続し
た後分割形成したので、作業性を良好と17で確実に動
作する配列型探触子を提供できる。(Effects of the Invention) The present invention positions the common line portion of the flexible substrate inside one end of the rectangular piezoelectric plate, and connects the two by providing a gap between the one end of the rectangular piezoelectric plate and the flexible substrate. Since the probe is divided and formed after the process, it is possible to provide an array type probe that has good workability and operates reliably.
第1図(fl)(b)は本発明の配列型探触子を説明す
る工程図で、同図(a)は基板接合体の組立図、同図(
l))は配列型探触子の一部図である。
第2図は第1図(a)に示す基板接合体のA−A’断面
図である。
第3図(a)(b)(c)は従来例を説明する超音波探
触子の各工程図で、同図(a)は基板接合体の組立図、
同図(b)は基板接合体をバッキング材な取着した図、
同図(c)は配列型探触子の一部図である。第4図は従
来例(第3図)の欠点を説明するフレキシブル基板の平
面図である。
第5図は他の従来例を説明する基板接合体の組立図、第
6図は同基板接合体のT’(−B’断面図である。
1 圧電板、2 フレキシブル基板、3 電極、4 中
空部、5−m4n;3基体、6,17一−導M llr
、、9.18 接合面、10 基板接合体、1ドパ、ソ
キング材、13.16・共通線路、14・接合ヰ4.1
5 ・樹胞カバー、19・空部。FIGS. 1(fl) and 1(b) are process diagrams for explaining the array type probe of the present invention, and FIG. 1(a) is an assembly diagram of the substrate assembly, and FIG.
1)) is a partial diagram of an array type probe. FIG. 2 is a sectional view taken along line AA' of the substrate assembly shown in FIG. 1(a). FIGS. 3(a), 3(b), and 3(c) are process diagrams of an ultrasonic probe explaining a conventional example, and FIG. 3(a) is an assembly diagram of a substrate assembly;
Figure (b) is a diagram with the board assembly attached to the backing material.
FIG. 3(c) is a partial diagram of the array type probe. FIG. 4 is a plan view of a flexible substrate illustrating the drawbacks of the conventional example (FIG. 3). FIG. 5 is an assembly diagram of a substrate assembly explaining another conventional example, and FIG. 6 is a T'(-B' sectional view) of the same substrate assembly. 1 Piezoelectric plate, 2 Flexible substrate, 3 Electrode, 4 Hollow part, 5-m4n; 3 base, 6,17-conducting M llr
,,9.18 Bonding surface, 10 Substrate bonded body, 1 Dopa, Socking material, 13.16・Common line, 14・Joining 4.1
5. Tree vesicle cover, 19. Vacant part.
Claims (2)
主面の両端側に、フレキシブル基板の中空部の対向辺部
にそれぞれ設けた共通導電路部を接合材により接続し、
その後前記共通線路部から延出した各信号線路の間とな
る部分の前記矩形状圧電板と共通導電路部とを一体的に
切断して形成した配列型超音波探触子において、前記共
通線路部を矩形状圧電板の一端側より内側に取着し、圧
電板の両端側部とフレキシブル基板との間に間隙を設け
て形成したことを特徴とする配列型超音波探触子。(1) Common conductive path portions provided on opposite sides of the hollow portion of the flexible substrate are connected to both ends of one main surface of a rectangular piezoelectric plate with electrodes formed on both main surfaces using a bonding material,
In the array type ultrasonic probe formed by integrally cutting the rectangular piezoelectric plate and the common conductive path portion between the signal lines extending from the common path portion, 1. An array-type ultrasonic probe characterized in that a rectangular piezoelectric plate is attached inside one end of the piezoelectric plate, and a gap is provided between both end sides of the piezoelectric plate and a flexible substrate.
が延出した特許請求の範囲第1項記載の配列型超音波探
触子。(2) The array type ultrasonic probe according to claim 1, wherein signal lines extend in a staggered manner from the opposing common line portions.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63108390A JP2589542B2 (en) | 1988-04-28 | 1988-04-28 | Array type ultrasonic probe |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63108390A JP2589542B2 (en) | 1988-04-28 | 1988-04-28 | Array type ultrasonic probe |
Publications (2)
Publication Number | Publication Date |
---|---|
JPH01278200A true JPH01278200A (en) | 1989-11-08 |
JP2589542B2 JP2589542B2 (en) | 1997-03-12 |
Family
ID=14483549
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
JP63108390A Expired - Fee Related JP2589542B2 (en) | 1988-04-28 | 1988-04-28 | Array type ultrasonic probe |
Country Status (1)
Country | Link |
---|---|
JP (1) | JP2589542B2 (en) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005341085A (en) * | 2004-05-26 | 2005-12-08 | Ge Medical Systems Global Technology Co Llc | Ultrasonic probe and manufacturing method thereof |
JP2020184694A (en) * | 2019-05-08 | 2020-11-12 | 株式会社日立製作所 | Ultrasonic probe and ultrasonic transmitter/receiver using the same |
-
1988
- 1988-04-28 JP JP63108390A patent/JP2589542B2/en not_active Expired - Fee Related
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2005341085A (en) * | 2004-05-26 | 2005-12-08 | Ge Medical Systems Global Technology Co Llc | Ultrasonic probe and manufacturing method thereof |
JP4541761B2 (en) * | 2004-05-26 | 2010-09-08 | ジーイー・メディカル・システムズ・グローバル・テクノロジー・カンパニー・エルエルシー | Ultrasonic probe and manufacturing method thereof |
JP2020184694A (en) * | 2019-05-08 | 2020-11-12 | 株式会社日立製作所 | Ultrasonic probe and ultrasonic transmitter/receiver using the same |
Also Published As
Publication number | Publication date |
---|---|
JP2589542B2 (en) | 1997-03-12 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
EP0294826B1 (en) | Ultrasonic transducer structure | |
US4404489A (en) | Acoustic transducer with flexible circuit board terminals | |
US4773140A (en) | Phased array transducer construction | |
KR100666976B1 (en) | Ultrasonic probe and method for fabricating the probe | |
JPH0629072A (en) | Method for connection of circuit board | |
JPS5920240B2 (en) | Ultrasonic probe and method for manufacturing the ultrasonic probe | |
JP2001509901A (en) | Method of manufacturing acoustic probe | |
JP3384889B2 (en) | Ultrasonic probe | |
JP3469386B2 (en) | Ultrasonic transducer and method of manufacturing the same | |
JPH10136491A (en) | Ultrasonic transducer | |
JPH01278200A (en) | Arranging type ultrasonic probe | |
US5044370A (en) | Probe with bar of piezoelectric elements for ultrasound apparatus | |
JP2002359897A (en) | Array-type ultrasonic wave probe | |
JPS58118739A (en) | Ultasonic probe and production thereof | |
JPH0614396A (en) | Ultrasonic probe | |
JP4153576B2 (en) | Ultrasonic transducer | |
JP2589541B2 (en) | Array type ultrasonic probe | |
JP3507655B2 (en) | Backing material for probe, method for manufacturing ultrasonic probe using the same, and ultrasonic probe | |
JP2990884B2 (en) | Array transducer | |
JP3206214B2 (en) | Ink jet recording head and method of manufacturing the same | |
JP2948610B2 (en) | Ultrasonic probe manufacturing method | |
JP2935514B2 (en) | Array type ultrasonic probe and manufacturing method thereof | |
JP3277013B2 (en) | Ultrasonic probe device and manufacturing method thereof | |
JP2945978B2 (en) | Array type ultrasonic probe | |
JPS6161599A (en) | Array-type ultrasonic prove and its manufacture |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
LAPS | Cancellation because of no payment of annual fees |