JPH01274048A - Centering device for 6-axis x-ray diffraction apparatus - Google Patents

Centering device for 6-axis x-ray diffraction apparatus

Info

Publication number
JPH01274048A
JPH01274048A JP10247888A JP10247888A JPH01274048A JP H01274048 A JPH01274048 A JP H01274048A JP 10247888 A JP10247888 A JP 10247888A JP 10247888 A JP10247888 A JP 10247888A JP H01274048 A JPH01274048 A JP H01274048A
Authority
JP
Japan
Prior art keywords
ring
chi
incident
axis
rays
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP10247888A
Other languages
Japanese (ja)
Inventor
Ichiro Hirozawa
一郎 廣沢
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NEC Corp
Original Assignee
NEC Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NEC Corp filed Critical NEC Corp
Priority to JP10247888A priority Critical patent/JPH01274048A/en
Publication of JPH01274048A publication Critical patent/JPH01274048A/en
Pending legal-status Critical Current

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Abstract

PURPOSE:To enable a higher efficiency in directional adjustment of incident X rays, by arranging two metal fine wires mounted along the diameter of a chi-ring and a goniometer suspended along the diameter of the chi-ring. CONSTITUTION:A point of a needle 2 so mounted on a goniometer head 3 as to let the tip thereof at the position of a sample is on a rotating shaft of a chi-ring. Metal fine wires 6 are mounted with a mounting device 5 on the ring 1. The fine wires 6 are mounted so as to pass separately through the rotating shaft of the ring 1 and consequently, the intersection of the two fine wires makes a point on the rotating shaft of the ring 1. Under such a condition, X rays are incident from one side of the ring 1 to check an incident state thereof downstream by photography. As a positional difference between the intersection of the fine wires 6 and the needle point 2 in a photograph causes a vertical deviation in the incident X rays. Thus, deviation of the incident X rays from the rotating shaft of the ring 1 can be learned by taking into account of distance to the fine wires 6 from the needle point 2 to make a pint to be corrected in optical systems clear thereby enabling efficient implementation of the centering in an incident direction.

Description

【発明の詳細な説明】 [産業上の利用分野] 本発明は物質の結晶構造をエックス線で解析する際に用
いる六軸エックス線回折装置と入用エックス線との軸合
U具に関するものである。
DETAILED DESCRIPTION OF THE INVENTION [Industrial Application Field] The present invention relates to a tool for aligning a six-axis X-ray diffraction device and a necessary X-ray, which is used when analyzing the crystal structure of a substance using X-rays.

[従来の技術] 従来、六軸エックス線回折装置Nに大割するエックス線
がこの装置のカイ・リングの回転軸とリング径方向のオ
メガ軸との交点を、該オメガ軸と直交して通過するよう
に、カイ・リングの一方の面に、中心がカイ・リングの
回転軸上にある円形の穴のあいた金属板を取付けて調整
を行っている。
[Prior Art] Conventionally, a six-axis X-ray diffraction device N passes through the intersection of the rotational axis of the chi ring and the omega axis in the radial direction of the ring, perpendicular to the omega axis. Adjustments are made by attaching a metal plate with a circular hole on one side of the Chi-ring, the center of which is on the axis of rotation of the Chi-ring.

通常は、この状態においてカイ・リングの回転面かエッ
クス線光源に対しほぼ垂直となるような配置を六軸エッ
クス線回折装置はとっており、エックス線光源に対して
カイ・リングより下流の位置で写真躍影、ケイ先板、シ
ンチレーションカウンター等の検出器を用いてエックス
線の通過状態を確認しながら、検出きれるエックス線が
最大になるように入射エックス線の光学系や、六輪丁−
ツクス線回折装置の位置を調整している。この状態が実
現したときに、エックス線は回折装置に対して望ましい
状態で入射しているといえる。なお、通常は穴のあいた
金属板をカイ・リングに直接取付けることはせず、カイ
・リングの回転自由度を失わず、かつ入射エックス線を
遮ることのない位置に支持臭を取付け、それに穴のあい
た金属板を取付ける方法がとられる。また、金属板にあ
けられた穴の直径に対する穴の長さ、即ら金属板の1中
ざの比が大ぎい程精度が向上するので、穴のあいた金属
板を用いるかわりに、金属製の管を取付けた金属板を用
いるものもある。
Normally, in this state, the six-axis X-ray diffraction device is arranged so that the rotating plane of the Chi-ring is almost perpendicular to the X-ray light source, and the photographic movement is placed downstream of the Chi-ring with respect to the X-ray light source. While checking the passage of X-rays using detectors such as shadows, silicon tip plates, and scintillation counters, we adjust the optical system for incident X-rays to maximize the number of X-rays that can be detected.
Adjusting the position of the Tux ray diffraction device. When this state is achieved, it can be said that the X-rays are incident on the diffraction device in a desirable state. Normally, a metal plate with holes is not attached directly to the chi-ring, but a support plate is installed in a position that does not lose the rotational freedom of the chi-ring and does not block the incident X-rays. A method is used to attach open metal plates. In addition, the accuracy improves as the length of the hole drilled in the metal plate increases relative to the diameter of the hole, that is, the ratio of the center diameter of the metal plate, so instead of using a metal plate with holes, it is possible to Some use a metal plate with a tube attached.

[発明が解決しようとする課題] 従来の方式では、大剣光が所望の方向から茗しくはずれ
ている場合には、金属板にさえぎられて、カイ・リング
の下流にエックス線は全く通過してこない。このために
光学系および回折装置の位置をどのように修正すべきか
の情報がjqられないという欠点があった。
[Problem to be solved by the invention] In the conventional method, if the large sword beam deviates from the desired direction, it will be blocked by a metal plate and no X-rays will pass downstream of the chi ring. Not coming. For this reason, there is a drawback that information on how to correct the positions of the optical system and the diffraction device is not available.

本発明は上記の課題に鑑み、穴のあいた金属板または金
属管が取付けられた金属板を用いるのではなく、入射エ
ックス線の実際の方向と所望の方向との食違いを明らか
にして入射エックス線の方向調整の能率を向上させる六
軸エツクス線回折装置用軸合せ具を提供することを目的
とする。
In view of the above problems, the present invention does not use a metal plate with holes or a metal plate to which a metal tube is attached, but rather reveals the discrepancy between the actual direction of incident X-rays and the desired direction. An object of the present invention is to provide an alignment tool for a six-axis X-ray diffraction apparatus that improves the efficiency of direction adjustment.

[:!!題を解決するための手段] 本発明は、六軸エツクス線回折装置へ入q」するエック
ス線の入射軸と該六軸エツクス線回折装置のカイ・リン
グの回転軸との軸合せ具において、位置微調整手段およ
び張力微調整手段を備えた取付は具によりカイ・リング
の径方向に架設された2本の金属細線と、該カイ・リン
グの径方向に垂設されたゴニオメータとを具備すること
を特徴とする六軸エツクス線回折装置用軸合は具である
[:! ! Means for Solving the Problem] The present invention provides a position adjustment tool for aligning the axis of incidence of X-rays entering a six-axis X-ray diffractometer with the rotation axis of the chi ring of the six-axis X-ray diffractometer. The installation with the fine adjustment means and the tension fine adjustment means shall be equipped with two thin metal wires installed in the radial direction of the chi ring by means of a tool, and a goniometer installed vertically in the radial direction of the chi ring. This is an axis alignment tool for a six-axis X-ray diffractometer characterized by:

[作用] 本発明は、金属細線2本の交点がカイ・リングの回転軸
位置となるように金属細線の取付は具の位置微調整手段
および張力微調整手段により微調整し、その交点とゴニ
オメータの針先を結ぶ方向をカイ・リングの回転軸方向
として前記交点と針先の投影を軸合わせに使用するもの
である。
[Function] According to the present invention, the attachment of the metal wires is finely adjusted using the position fine adjustment means of the tool and the tension fine adjustment means so that the intersection point of the two metal wires is the rotation axis position of the chi ring, and the intersection point and the goniometer are adjusted. The projection of the intersection point and the needle tip is used for axis alignment, with the direction in which the tips of the needles are connected as the axis of rotation of the chi ring.

[実施例〕 以下、図面を参照して、本発明の実施例を詳細に説明す
る。
[Example] Hereinafter, an example of the present invention will be described in detail with reference to the drawings.

第1図は本発明の一実施例を示し、2本1絹の金属細線
とゴニオメータヘッドに取付けられた針先を用いた軸合
U具をカイ・リングに取付けた状態の斜視図である。同
図において、1は六軸エツクス線回折装置のカイ・リン
グ、2は針先が試料位置にくるようにオメガ回転軸上の
ゴニオメータヘッド3に取付けられた針で、針先はカイ
・リングの回転軸上にある。4はオメガテーブルである
FIG. 1 shows one embodiment of the present invention, and is a perspective view of a state in which an alignment U tool using two silk thin metal wires and a needle tip attached to a goniometer head is attached to a chi ring. In the figure, 1 is the chi ring of the six-axis X-ray diffraction device, 2 is the needle attached to the goniometer head 3 on the Omega rotation axis so that the needle tip is at the sample position, and the needle tip is the chi ring. It is on the axis of rotation. 4 is the omega table.

5は位置微調整機能と張力微調整機能を備えた取付は具
で、これで金属細線6をカイ・リング1に取付ける。こ
こで金属細線6は、それぞれがカイ・リング1の回転軸
を通過するように架設される。
Reference numeral 5 denotes a mounting tool having a position fine adjustment function and a tension fine adjustment function, and is used to attach the thin metal wire 6 to the chi ring 1. Here, the thin metal wires 6 are installed so as to each pass through the rotation axis of the chi ring 1.

よって、2本の金属細線の交点はカイ・リング1の回転
軸上の点になる。この状態でカイ・リング1のどららか
一方の側からエックス線を人則し、カイ・リングの下流
で写真Va影によりエックス線の入射状態を確認する。
Therefore, the intersection of the two thin metal wires is a point on the rotation axis of the chi ring 1. In this state, the X-rays are directed from one side of the Chi-ring 1, and the incident state of the X-rays is confirmed by the shadow of the photo Va downstream of the Chi-ring.

写真におCブる金属細線6の交点と針先2どの位置の違
いがその時点での入射エックス線に垂直方向のずれを与
えでいるから、針先2から金属細線6までの距離を考慮
1れば、カイ・リング1の回転軸からの入射エックス線
のずれがわかるため、各光学系の修正すべき点がわかり
、大剣方向の軸合わせが能率よく行える。
The difference between the intersection point of the thin metal wire 6 shown in the photo and the position of the needle tip 2 gives a vertical deviation to the incident X-ray at that point, so consider the distance from the needle tip 2 to the thin metal wire 6. If so, the deviation of the incident X-ray from the rotational axis of the Chi-ring 1 can be determined, so the points to be corrected in each optical system can be determined, and the axis alignment in the direction of the sword can be performed efficiently.

第2図はカイ・リングへの取付は具の斜視図であり、2
1はカイ・リングへの取付は具本体で、この中にカイ・
リングを挟みこみ、22の押しねじにより固定する。2
3は左右への微動機能をもった金属細線の支持棒である
。これは、この棒自身とは直角方向に向いた金属細線の
通る穴または細管24を備えている。この棒の一方は弦
巻ばね25を取付け、更に棒の端の部分にはねじを切っ
た領域を設け、これにねじこまれたナツト26を回転し
、本体21に対する位置を変えることにより左右の微動
を行う。27は金属細線を巻上げて、カイ・リングの面
に沿って金属細線が張られるように張力の調整を行う巻
上げ棒である。この巻上げ棒27の一端にギア28を取
付け、それに擦り合わせのウオーム29の回転に上り巻
上げを行う。
Figure 2 is a perspective view of the tool attached to the chi ring.
1 is the tool body that is attached to the chi ring, and the chi ring is attached to the tool itself.
Insert the ring and secure with the set screw 22. 2
3 is a support rod made of thin metal wire that has a fine movement function to the left and right. It is provided with a hole or capillary 24 through which a thin metal wire passes, oriented at right angles to the rod itself. A helical spring 25 is attached to one side of the rod, and a threaded area is provided at the end of the rod, and a nut 26 screwed into this area is rotated to change its position relative to the main body 21, thereby making fine movement from side to side. I do. 27 is a winding rod for winding up a thin metal wire and adjusting the tension so that the thin metal wire is stretched along the surface of the chi ring. A gear 28 is attached to one end of this winding rod 27, and a worm 29 that rubs against it rotates to perform winding.

第3図は、第2図で微調整部30として示した部分の拡
大図で、金属細線の位置調整に用いられる支持棒の位置
微調整を行う部分の斜視図である。
FIG. 3 is an enlarged view of the portion shown as the fine adjustment section 30 in FIG. 2, and is a perspective view of the portion that finely adjusts the position of the support rod used to adjust the position of the thin metal wire.

25は弦巻ばねで、その一端は支持棒23のバネ取付板
33に取付けられ、他の端は支持棒23を受ける枠体3
4に取付けられている。26はナツトであり、これの回
転により位置の微調整を行う。
25 is a helical spring, one end of which is attached to the spring mounting plate 33 of the support rod 23, and the other end of which is attached to the frame 3 that receives the support rod 23.
It is attached to 4. Reference numeral 26 is a nut, and fine adjustment of the position is performed by rotating this nut.

このように本発明の実施例は、金属板を用いるのでなく
、位置微調整手段および張力微調整丁段を備えた取付は
具を用いて2本1組の金属細線をカイ・リングに取付け
、その交点と、ゴニオメータの$1先とから入射エック
ス線の実際の方向と所望の方向との食違いを明らかにし
て、入用エックス線の方向調整の能率を向上させること
ができる。
In this way, the embodiment of the present invention does not use a metal plate, but uses a mounting tool equipped with a position fine adjustment means and a tension fine adjustment stage to attach a set of two thin metal wires to the chi ring. The difference between the actual direction and the desired direction of the incident X-ray can be revealed from the intersection point and the point ahead of the goniometer, thereby improving the efficiency of adjusting the direction of the required X-ray.

[発明の効果] 以上説明したとおり、本発明によれば、入射エックス線
の方向調整を向上させる人情エックス線回折装置用軸合
せ具を提供することができる。
[Effects of the Invention] As described above, according to the present invention, it is possible to provide an alignment tool for an X-ray diffraction apparatus that improves the direction adjustment of incident X-rays.

【図面の簡単な説明】[Brief explanation of the drawing]

第1図は本発明の一実施例の斜視図、第2図は取付は具
の斜視図、第3図は微調整部の拡大斜視図である。 1・・・カイ・リング   2・・・針3・・・ゴニオ
メータヘッド 4・・・オメガテーブル  5・・・取付は具6・・・
金属細線
FIG. 1 is a perspective view of an embodiment of the present invention, FIG. 2 is a perspective view of a mounting tool, and FIG. 3 is an enlarged perspective view of a fine adjustment section. 1... Chi ring 2... Needle 3... Goniometer head 4... Omega table 5... Mounting tool 6...
metal thin wire

Claims (1)

【特許請求の範囲】[Claims] (1)六軸エックス線回折装置へ入射するエックス線の
入射軸と該六軸エックス線回折装置のカイ・リングの回
転軸との軸合せ具において、位置微調整手段および張力
微調整手段を備えた取付け具によりカイ・リングの径方
向に架設された2本の金属細線と、該カイ・リングの径
方向に垂設されたゴニオメータとを具備することを特徴
とする六軸エツクス線回折装置用軸合せ具。
(1) A fixture equipped with a position fine adjustment means and a tension fine adjustment means in an alignment tool for aligning the incident axis of X-rays incident on a six-axis X-ray diffraction device with the rotational axis of the chi ring of the six-axis X-ray diffraction device. An axis alignment tool for a six-axis X-ray diffractometer, characterized by comprising two thin metal wires installed in the radial direction of a chi-ring, and a goniometer installed vertically in the radial direction of the chi-ring. .
JP10247888A 1988-04-27 1988-04-27 Centering device for 6-axis x-ray diffraction apparatus Pending JPH01274048A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP10247888A JPH01274048A (en) 1988-04-27 1988-04-27 Centering device for 6-axis x-ray diffraction apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP10247888A JPH01274048A (en) 1988-04-27 1988-04-27 Centering device for 6-axis x-ray diffraction apparatus

Publications (1)

Publication Number Publication Date
JPH01274048A true JPH01274048A (en) 1989-11-01

Family

ID=14328562

Family Applications (1)

Application Number Title Priority Date Filing Date
JP10247888A Pending JPH01274048A (en) 1988-04-27 1988-04-27 Centering device for 6-axis x-ray diffraction apparatus

Country Status (1)

Country Link
JP (1) JPH01274048A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005227251A (en) * 2004-02-13 2005-08-25 Japan Synchrotron Radiation Research Inst Method for determining structure factor tensor element, and method for using x-ray diffractometer therefor
CN109443577A (en) * 2018-11-15 2019-03-08 中国工程物理研究院材料研究所 A kind of metal alternating temperature process temperature measuring equipment and its application method

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005227251A (en) * 2004-02-13 2005-08-25 Japan Synchrotron Radiation Research Inst Method for determining structure factor tensor element, and method for using x-ray diffractometer therefor
JP4578832B2 (en) * 2004-02-13 2010-11-10 財団法人高輝度光科学研究センター Structure factor tensor element determination method and X-ray diffractometer utilization method therefor
CN109443577A (en) * 2018-11-15 2019-03-08 中国工程物理研究院材料研究所 A kind of metal alternating temperature process temperature measuring equipment and its application method

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